JPS55107911A - Method of average calculation for thickness meter - Google Patents

Method of average calculation for thickness meter

Info

Publication number
JPS55107911A
JPS55107911A JP1424579A JP1424579A JPS55107911A JP S55107911 A JPS55107911 A JP S55107911A JP 1424579 A JP1424579 A JP 1424579A JP 1424579 A JP1424579 A JP 1424579A JP S55107911 A JPS55107911 A JP S55107911A
Authority
JP
Japan
Prior art keywords
time
strip
calculation
namely
counted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1424579A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6233521B2 (enrdf_load_stackoverflow
Inventor
Kazuo Watanabe
Shinichi Yoshida
Shoichi Horiuchi
Yoshikatsu Satomi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Nippon Steel Corp
Original Assignee
Hitachi Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Nippon Steel Corp filed Critical Hitachi Ltd
Priority to JP1424579A priority Critical patent/JPS55107911A/ja
Publication of JPS55107911A publication Critical patent/JPS55107911A/ja
Publication of JPS6233521B2 publication Critical patent/JPS6233521B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP1424579A 1979-02-13 1979-02-13 Method of average calculation for thickness meter Granted JPS55107911A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1424579A JPS55107911A (en) 1979-02-13 1979-02-13 Method of average calculation for thickness meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1424579A JPS55107911A (en) 1979-02-13 1979-02-13 Method of average calculation for thickness meter

Publications (2)

Publication Number Publication Date
JPS55107911A true JPS55107911A (en) 1980-08-19
JPS6233521B2 JPS6233521B2 (enrdf_load_stackoverflow) 1987-07-21

Family

ID=11855695

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1424579A Granted JPS55107911A (en) 1979-02-13 1979-02-13 Method of average calculation for thickness meter

Country Status (1)

Country Link
JP (1) JPS55107911A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5875010A (ja) * 1981-09-05 1983-05-06 ツリュツラ−・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング・ウント・コンパニ−・コマンディトゲゼルシャフト 繊維俵の高さを測定する方法及び装置
JPS61195304A (ja) * 1985-02-26 1986-08-29 Yokogawa Electric Corp シ−ト状物体特性測定装置
JPS6254125A (ja) * 1985-09-03 1987-03-09 Toyota Motor Corp カルマン渦センサの出力信号処理装置
JPS63274806A (ja) * 1987-05-01 1988-11-11 Nippon Steel Corp 連続焼鈍炉におけるストリップの形状検出方法
JPH02161307A (ja) * 1988-12-15 1990-06-21 Matsushita Electric Works Ltd 平板の波打検査方法
CN103994741A (zh) * 2014-05-12 2014-08-20 京东方科技集团股份有限公司 一种测量膜层厚度的方法和装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541653A (en) * 1977-06-06 1979-01-08 Mitsubishi Rayon Co Method and apparatus for detecting abnormality in sheet material

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541653A (en) * 1977-06-06 1979-01-08 Mitsubishi Rayon Co Method and apparatus for detecting abnormality in sheet material

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5875010A (ja) * 1981-09-05 1983-05-06 ツリュツラ−・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング・ウント・コンパニ−・コマンディトゲゼルシャフト 繊維俵の高さを測定する方法及び装置
JPS61195304A (ja) * 1985-02-26 1986-08-29 Yokogawa Electric Corp シ−ト状物体特性測定装置
JPS6254125A (ja) * 1985-09-03 1987-03-09 Toyota Motor Corp カルマン渦センサの出力信号処理装置
JPS63274806A (ja) * 1987-05-01 1988-11-11 Nippon Steel Corp 連続焼鈍炉におけるストリップの形状検出方法
JPH02161307A (ja) * 1988-12-15 1990-06-21 Matsushita Electric Works Ltd 平板の波打検査方法
CN103994741A (zh) * 2014-05-12 2014-08-20 京东方科技集团股份有限公司 一种测量膜层厚度的方法和装置

Also Published As

Publication number Publication date
JPS6233521B2 (enrdf_load_stackoverflow) 1987-07-21

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