JPS54133179A - Standard scattering member for calibrating scattering photometer - Google Patents

Standard scattering member for calibrating scattering photometer

Info

Publication number
JPS54133179A
JPS54133179A JP4068578A JP4068578A JPS54133179A JP S54133179 A JPS54133179 A JP S54133179A JP 4068578 A JP4068578 A JP 4068578A JP 4068578 A JP4068578 A JP 4068578A JP S54133179 A JPS54133179 A JP S54133179A
Authority
JP
Japan
Prior art keywords
scattering
calibrating
standard
photometer
scattering member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4068578A
Other languages
English (en)
Other versions
JPS5741688B2 (ja
Inventor
Masaaki Oonishi
Akio Saitou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Arkray Inc
Original Assignee
Kyoto Daiichi Kagaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyoto Daiichi Kagaku KK filed Critical Kyoto Daiichi Kagaku KK
Priority to JP4068578A priority Critical patent/JPS54133179A/ja
Priority to US06/023,407 priority patent/US4291981A/en
Priority to GB7910852A priority patent/GB2022282B/en
Priority to IT21392/79A priority patent/IT1113225B/it
Priority to DE19797909404U priority patent/DE7909404U1/de
Priority to FR7908536A priority patent/FR2422157A1/fr
Publication of JPS54133179A publication Critical patent/JPS54133179A/ja
Publication of JPS5741688B2 publication Critical patent/JPS5741688B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor
JP4068578A 1978-04-05 1978-04-05 Standard scattering member for calibrating scattering photometer Granted JPS54133179A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP4068578A JPS54133179A (en) 1978-04-05 1978-04-05 Standard scattering member for calibrating scattering photometer
US06/023,407 US4291981A (en) 1978-04-05 1979-03-23 Reference scatter for use in the correction of scattering photometers
GB7910852A GB2022282B (en) 1978-04-05 1979-03-28 Reference scattering photometers
IT21392/79A IT1113225B (it) 1978-04-05 1979-03-28 Dispersore di riferimento per l'impiego nella correzione di fotometri a dispersione
DE19797909404U DE7909404U1 (de) 1978-04-05 1979-03-31 Referenz-streuvorrichtung zur verwendung bei der korrektion von streuphotometern
FR7908536A FR2422157A1 (fr) 1978-04-05 1979-04-04 Diffuseur de reference destine a la correction des mesures d'un photometre pour milieu trouble

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4068578A JPS54133179A (en) 1978-04-05 1978-04-05 Standard scattering member for calibrating scattering photometer

Publications (2)

Publication Number Publication Date
JPS54133179A true JPS54133179A (en) 1979-10-16
JPS5741688B2 JPS5741688B2 (ja) 1982-09-04

Family

ID=12587388

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4068578A Granted JPS54133179A (en) 1978-04-05 1978-04-05 Standard scattering member for calibrating scattering photometer

Country Status (6)

Country Link
US (1) US4291981A (ja)
JP (1) JPS54133179A (ja)
DE (1) DE7909404U1 (ja)
FR (1) FR2422157A1 (ja)
GB (1) GB2022282B (ja)
IT (1) IT1113225B (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6379039A (ja) * 1986-09-24 1988-04-09 Jgc Corp 細胞培養方法
JPH02162242A (ja) * 1988-12-15 1990-06-21 Toa Medical Electronics Co Ltd 光学系調整用の標準物質およびその製造方法
JPH02236143A (ja) * 1989-03-09 1990-09-19 Toa Medical Electronics Co Ltd 光学系試料分析装置における品質確認用の標準物質およびその使用方法
JPH03146850A (ja) * 1989-10-31 1991-06-21 Shimadzu Corp 光走査装置用ファントム
JP2016517965A (ja) * 2013-05-13 2016-06-20 ハッハ ランゲ ゲゼルシャフト ミット ベシュレンクテル ハフツングＨａｃｈ Ｌａｎｇｅ Ｇｍｂｈ 濁度計

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4367950A (en) * 1980-12-24 1983-01-11 The United States Of America As Represented By The Secretary Of The Interior Combined aerosol monitor and calibrateable light ray scattering reference rod
US4380392A (en) * 1981-03-18 1983-04-19 Karabegov Mikhail A Method and apparatus for calibration of instruments serving to count and to determine the size of particles suspended in dispersion medium
JPS5974799U (ja) * 1982-11-10 1984-05-21 三洋電機株式会社 表示素子取付装置
DE3903031A1 (de) * 1989-02-02 1990-08-16 Berthold Koch Referenzgefaess zum beurteilen der truebung von fluessigkeiten
US6983176B2 (en) * 2001-04-11 2006-01-03 Rio Grande Medical Technologies, Inc. Optically similar reference samples and related methods for multivariate calibration models used in optical spectroscopy
DE10229491C2 (de) * 2001-07-23 2003-05-22 Siemens Ag Kernspin-Tomographiegerät mit dämpfenden Schichtblechen zur Schwingungsreduktion
US6912049B2 (en) * 2001-12-19 2005-06-28 Nir Diagnostics, Inc. Electromagnetic radiation attenuating and scattering member with improved thermal stability
US7027848B2 (en) 2002-04-04 2006-04-11 Inlight Solutions, Inc. Apparatus and method for non-invasive spectroscopic measurement of analytes in tissue using a matched reference analyte
CN100449304C (zh) * 2005-06-28 2009-01-07 洛阳卓航测控设备有限责任公司 保证能见度仪测距性能一致的校准方法
AU2008299205B2 (en) * 2007-09-12 2014-07-17 Hach Company Standard media suspension body, optical particulate measurement instrument, and verification method for an optical particulate measurement instrument
DE102010002423A1 (de) * 2010-02-26 2011-09-01 Robert Bosch Gmbh Vorrichtung und Verfahren zum Kalibrieren eines Streulichtmessgerätes
AT12313U3 (de) * 2011-11-30 2013-01-15 Ditest Fahrzeugdiagnose Gmbh Kalibrierelement und verfahren zum kalibrieren eines streulichtmessgeräts
AT513186B1 (de) 2013-09-06 2015-01-15 Ditest Fahrzeugdiagnose Gmbh Kalibrierelement und Verfahren zur Herstellung eines solchen Kalibrierelements
AT513185B1 (de) 2013-11-13 2015-12-15 Ditest Fahrzeugdiagnose Gmbh Kalibrierelement
DE102014100774A1 (de) * 2014-01-23 2015-07-23 Byk-Gardner Gmbh Vorrichtung zum Kalibrieren von optischen Messgeräten

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120914A (en) * 1974-08-14 1976-02-19 Hitachi Ltd Bono renzokuseizohoho
CH613352B (de) * 1977-07-26 Bbc Brown Boveri & Cie Geraet mit fluessigkristall-anzeige.

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6379039A (ja) * 1986-09-24 1988-04-09 Jgc Corp 細胞培養方法
JPH02162242A (ja) * 1988-12-15 1990-06-21 Toa Medical Electronics Co Ltd 光学系調整用の標準物質およびその製造方法
JPH02236143A (ja) * 1989-03-09 1990-09-19 Toa Medical Electronics Co Ltd 光学系試料分析装置における品質確認用の標準物質およびその使用方法
JPH03146850A (ja) * 1989-10-31 1991-06-21 Shimadzu Corp 光走査装置用ファントム
JP2016517965A (ja) * 2013-05-13 2016-06-20 ハッハ ランゲ ゲゼルシャフト ミット ベシュレンクテル ハフツングＨａｃｈ Ｌａｎｇｅ Ｇｍｂｈ 濁度計

Also Published As

Publication number Publication date
IT7921392A0 (it) 1979-03-28
GB2022282B (en) 1983-01-19
IT1113225B (it) 1986-01-20
FR2422157B1 (ja) 1984-02-24
DE7909404U1 (de) 1979-10-25
FR2422157A1 (fr) 1979-11-02
JPS5741688B2 (ja) 1982-09-04
GB2022282A (en) 1979-12-12
US4291981A (en) 1981-09-29

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