CN100449304C - 保证能见度仪测距性能一致的校准方法 - Google Patents
保证能见度仪测距性能一致的校准方法 Download PDFInfo
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- CN100449304C CN100449304C CNB2005100177407A CN200510017740A CN100449304C CN 100449304 C CN100449304 C CN 100449304C CN B2005100177407 A CNB2005100177407 A CN B2005100177407A CN 200510017740 A CN200510017740 A CN 200510017740A CN 100449304 C CN100449304 C CN 100449304C
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CNB2005100177407A CN100449304C (zh) | 2005-06-28 | 2005-06-28 | 保证能见度仪测距性能一致的校准方法 |
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CNB2005100177407A CN100449304C (zh) | 2005-06-28 | 2005-06-28 | 保证能见度仪测距性能一致的校准方法 |
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CN1888868A CN1888868A (zh) | 2007-01-03 |
CN100449304C true CN100449304C (zh) | 2009-01-07 |
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CN104198443B (zh) * | 2014-09-02 | 2016-08-24 | 四川鼎林信息技术有限公司 | 能见度标校系统对产品机的标校方法 |
CN106802157A (zh) * | 2016-12-28 | 2017-06-06 | 北京小鸟看看科技有限公司 | 用于电子设备的距离传感器的校准方法、装置及电子设备 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US4291981A (en) * | 1978-04-05 | 1981-09-29 | Kabushiki Kaisha Kyoto Daiichi Kagaku | Reference scatter for use in the correction of scattering photometers |
CN85200885U (zh) * | 1985-04-01 | 1986-06-11 | 西南师范学院 | 微量浊度测量仪 |
US20030197867A1 (en) * | 1999-03-12 | 2003-10-23 | Kwon Taek Mu | Video camera-based visibility measurement system |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4291981A (en) * | 1978-04-05 | 1981-09-29 | Kabushiki Kaisha Kyoto Daiichi Kagaku | Reference scatter for use in the correction of scattering photometers |
CN85200885U (zh) * | 1985-04-01 | 1986-06-11 | 西南师范学院 | 微量浊度测量仪 |
US20030197867A1 (en) * | 1999-03-12 | 2003-10-23 | Kwon Taek Mu | Video camera-based visibility measurement system |
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