JPS54116263A - Radiation thickness measuring method - Google Patents

Radiation thickness measuring method

Info

Publication number
JPS54116263A
JPS54116263A JP2198778A JP2198778A JPS54116263A JP S54116263 A JPS54116263 A JP S54116263A JP 2198778 A JP2198778 A JP 2198778A JP 2198778 A JP2198778 A JP 2198778A JP S54116263 A JPS54116263 A JP S54116263A
Authority
JP
Japan
Prior art keywords
working curve
detector
measurement
plate
plate thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2198778A
Other languages
English (en)
Inventor
Takaaki Okino
Tatsuo Tsujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP2198778A priority Critical patent/JPS54116263A/ja
Publication of JPS54116263A publication Critical patent/JPS54116263A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2198778A 1978-03-01 1978-03-01 Radiation thickness measuring method Pending JPS54116263A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2198778A JPS54116263A (en) 1978-03-01 1978-03-01 Radiation thickness measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2198778A JPS54116263A (en) 1978-03-01 1978-03-01 Radiation thickness measuring method

Publications (1)

Publication Number Publication Date
JPS54116263A true JPS54116263A (en) 1979-09-10

Family

ID=12070369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2198778A Pending JPS54116263A (en) 1978-03-01 1978-03-01 Radiation thickness measuring method

Country Status (1)

Country Link
JP (1) JPS54116263A (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5684506A (en) * 1979-12-14 1981-07-09 Toshiba Corp Measuring device for radioactive thickness
JPS56100307A (en) * 1980-01-16 1981-08-12 Toshiba Corp Thickness measuring device of radiation
JPS56106107A (en) * 1980-01-29 1981-08-24 Toshiba Corp Radiation thickness measuring device
JPS5740604A (en) * 1980-08-25 1982-03-06 Toshiba Corp Thickness measuring apparatus with radiation
JPS63171306A (ja) * 1987-01-08 1988-07-15 Kubota Ltd 放射線による厚さ測定方法
JPH01296107A (ja) * 1988-05-24 1989-11-29 Yokogawa Electric Corp シート状物体測定装置のフレーム補正方法

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5684506A (en) * 1979-12-14 1981-07-09 Toshiba Corp Measuring device for radioactive thickness
JPS56100307A (en) * 1980-01-16 1981-08-12 Toshiba Corp Thickness measuring device of radiation
JPS56106107A (en) * 1980-01-29 1981-08-24 Toshiba Corp Radiation thickness measuring device
JPS5740604A (en) * 1980-08-25 1982-03-06 Toshiba Corp Thickness measuring apparatus with radiation
JPS6327643B2 (ja) * 1980-08-25 1988-06-03 Tokyo Shibaura Electric Co
JPS63171306A (ja) * 1987-01-08 1988-07-15 Kubota Ltd 放射線による厚さ測定方法
JPH01296107A (ja) * 1988-05-24 1989-11-29 Yokogawa Electric Corp シート状物体測定装置のフレーム補正方法

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