JPS5388782A - Method of inspecting abnormality of surface of long material - Google Patents

Method of inspecting abnormality of surface of long material

Info

Publication number
JPS5388782A
JPS5388782A JP15595976A JP15595976A JPS5388782A JP S5388782 A JPS5388782 A JP S5388782A JP 15595976 A JP15595976 A JP 15595976A JP 15595976 A JP15595976 A JP 15595976A JP S5388782 A JPS5388782 A JP S5388782A
Authority
JP
Japan
Prior art keywords
long material
rays
inspecting abnormality
inspecting
abnormality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15595976A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5646096B2 (enrdf_load_stackoverflow
Inventor
Shusaku Umeda
Kunihiro Matsubara
Akihide Ueki
Niro Kakimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP15595976A priority Critical patent/JPS5388782A/ja
Publication of JPS5388782A publication Critical patent/JPS5388782A/ja
Publication of JPS5646096B2 publication Critical patent/JPS5646096B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP15595976A 1976-12-24 1976-12-24 Method of inspecting abnormality of surface of long material Granted JPS5388782A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15595976A JPS5388782A (en) 1976-12-24 1976-12-24 Method of inspecting abnormality of surface of long material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15595976A JPS5388782A (en) 1976-12-24 1976-12-24 Method of inspecting abnormality of surface of long material

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP12547782A Division JPS58135441A (ja) 1982-07-19 1982-07-19 長尺体表面異常検査方法

Publications (2)

Publication Number Publication Date
JPS5388782A true JPS5388782A (en) 1978-08-04
JPS5646096B2 JPS5646096B2 (enrdf_load_stackoverflow) 1981-10-30

Family

ID=15617264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15595976A Granted JPS5388782A (en) 1976-12-24 1976-12-24 Method of inspecting abnormality of surface of long material

Country Status (1)

Country Link
JP (1) JPS5388782A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5594553U (enrdf_load_stackoverflow) * 1978-12-18 1980-06-30
JPS5594554U (enrdf_load_stackoverflow) * 1978-12-11 1980-06-30
KR20010102703A (ko) * 2000-05-04 2001-11-16 심윤희 비접촉식 선피막 검사장치

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6247370U (enrdf_load_stackoverflow) * 1985-05-09 1987-03-24

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS491281A (enrdf_load_stackoverflow) * 1972-04-17 1974-01-08

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS491281A (enrdf_load_stackoverflow) * 1972-04-17 1974-01-08

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5594554U (enrdf_load_stackoverflow) * 1978-12-11 1980-06-30
JPS5594553U (enrdf_load_stackoverflow) * 1978-12-18 1980-06-30
KR20010102703A (ko) * 2000-05-04 2001-11-16 심윤희 비접촉식 선피막 검사장치

Also Published As

Publication number Publication date
JPS5646096B2 (enrdf_load_stackoverflow) 1981-10-30

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