JPS53138387A - Inspecting method of welding members - Google Patents

Inspecting method of welding members

Info

Publication number
JPS53138387A
JPS53138387A JP5256577A JP5256577A JPS53138387A JP S53138387 A JPS53138387 A JP S53138387A JP 5256577 A JP5256577 A JP 5256577A JP 5256577 A JP5256577 A JP 5256577A JP S53138387 A JPS53138387 A JP S53138387A
Authority
JP
Japan
Prior art keywords
inspecting method
welding members
conductors
light
wedling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5256577A
Other languages
Japanese (ja)
Inventor
Shinobu Takahashi
Hiroyuki Aono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5256577A priority Critical patent/JPS53138387A/en
Publication of JPS53138387A publication Critical patent/JPS53138387A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Abstract

PURPOSE:To judge the goodness or not of wedling by projecting light through conductors to weld zones, receiving the transmitted light thereof in photo detectors through conductors, converting the quantity of received light to electrical signals and comparing the values with a reference value.
JP5256577A 1977-05-10 1977-05-10 Inspecting method of welding members Pending JPS53138387A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5256577A JPS53138387A (en) 1977-05-10 1977-05-10 Inspecting method of welding members

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5256577A JPS53138387A (en) 1977-05-10 1977-05-10 Inspecting method of welding members

Publications (1)

Publication Number Publication Date
JPS53138387A true JPS53138387A (en) 1978-12-02

Family

ID=12918314

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5256577A Pending JPS53138387A (en) 1977-05-10 1977-05-10 Inspecting method of welding members

Country Status (1)

Country Link
JP (1) JPS53138387A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60188362U (en) * 1984-05-23 1985-12-13 島田化成株式会社 Welding inspection equipment
US6952491B2 (en) 1990-11-16 2005-10-04 Applied Materials, Inc. Optical inspection apparatus for substrate defect detection

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60188362U (en) * 1984-05-23 1985-12-13 島田化成株式会社 Welding inspection equipment
US6952491B2 (en) 1990-11-16 2005-10-04 Applied Materials, Inc. Optical inspection apparatus for substrate defect detection

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