JPS533052A - Method of checking crt window - Google Patents

Method of checking crt window

Info

Publication number
JPS533052A
JPS533052A JP7771977A JP7771977A JPS533052A JP S533052 A JPS533052 A JP S533052A JP 7771977 A JP7771977 A JP 7771977A JP 7771977 A JP7771977 A JP 7771977A JP S533052 A JPS533052 A JP S533052A
Authority
JP
Japan
Prior art keywords
checking
crt window
crt
window
checking crt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7771977A
Other languages
English (en)
Inventor
Andoriyu Gurosu Haabei
Robaato Furei Harii
Deibitsudo Mesunaa Jiyon
Furederitsuku Uorutaa Reimondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of JPS533052A publication Critical patent/JPS533052A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/02—Electrodes; Screens; Mounting, supporting, spacing or insulating thereof
    • H01J29/10—Screens on or from which an image or pattern is formed, picked up, converted or stored
    • H01J29/18—Luminescent screens
    • H01J29/24—Supports for luminescent material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture

Landscapes

  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
JP7771977A 1976-06-29 1977-06-28 Method of checking crt window Pending JPS533052A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/700,892 US4076426A (en) 1976-06-29 1976-06-29 Method for inspecting cathode-ray-tube window for objectionable cord

Publications (1)

Publication Number Publication Date
JPS533052A true JPS533052A (en) 1978-01-12

Family

ID=24815271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7771977A Pending JPS533052A (en) 1976-06-29 1977-06-28 Method of checking crt window

Country Status (8)

Country Link
US (1) US4076426A (ja)
JP (1) JPS533052A (ja)
CA (1) CA1077258A (ja)
DE (1) DE2729403A1 (ja)
FI (1) FI771954A (ja)
FR (1) FR2357054A1 (ja)
GB (1) GB1582185A (ja)
IT (1) IT1077541B (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5731781U (ja) * 1980-07-31 1982-02-19
JPS5731780U (ja) * 1980-07-31 1982-02-19
JPS6023956A (ja) * 1983-07-18 1985-02-06 Japan Storage Battery Co Ltd アルカリ蓄電池およびその製造方法
JPS6028163A (ja) * 1983-07-25 1985-02-13 Japan Storage Battery Co Ltd アルカリ蓄電池
JPS60105166A (ja) * 1983-11-10 1985-06-10 Japan Storage Battery Co Ltd アルカリ蓄電池

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119404A (ja) * 1983-12-01 1985-06-26 Nippon Sheet Glass Co Ltd 板ガラスの歪検査装置
US4563088A (en) * 1983-02-15 1986-01-07 Rca Corporation Device for maintaining a moving curved surface a constant distance from a stationary point
US4586817A (en) * 1984-02-27 1986-05-06 Rca Corporation Method for determining the MTF of a viewing window
US4695157A (en) * 1985-10-11 1987-09-22 Benchmark Industries Incorporated Solder process inspection diffuser assembly
JP3003562B2 (ja) * 1995-04-25 2000-01-31 関西日本電気株式会社 蛍光面検査装置
AUPO023596A0 (en) * 1996-05-31 1996-06-27 University Of Queensland, The Detection of defects in glass
US6100990A (en) * 1999-06-14 2000-08-08 Ford Motor Company Method and apparatus for determining reflective optical quality using gray-scale patterns
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2795166A (en) 1955-08-15 1957-06-11 Rauland Corp Method of inspecting a cathode-ray tube
FR1245488A (fr) * 1960-01-25 1960-09-26 Appareil pour examiner l'état de surface d'un corps quelconque
US3185022A (en) * 1961-06-15 1965-05-25 Gen Electric Optical gage for testing surface imperfections
FR2250427A5 (ja) 1973-07-19 1975-05-30 Electricite De France
FR2266899A1 (en) 1974-04-04 1975-10-31 Cem Comp Electro Mec Parallel strip grid for light pattern projection - projected on plane inclined at other than ninety deg. to optical axis
FR2279066A1 (fr) 1974-07-15 1976-02-13 Morin Secretan Rech Perfection Procede de visualisation directe de la forme et des deformations d'un objet tridimensionnel
US3976383A (en) 1975-02-28 1976-08-24 The Bendix Corporation Visual method of locating faults in printed circuit boards

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5731781U (ja) * 1980-07-31 1982-02-19
JPS5731780U (ja) * 1980-07-31 1982-02-19
JPS6029805Y2 (ja) * 1980-07-31 1985-09-07 新神戸電機株式会社 アルカリ蓄電池
JPS6029804Y2 (ja) * 1980-07-31 1985-09-07 新神戸電機株式会社 アルカリ蓄電池
JPS6023956A (ja) * 1983-07-18 1985-02-06 Japan Storage Battery Co Ltd アルカリ蓄電池およびその製造方法
JPS6028163A (ja) * 1983-07-25 1985-02-13 Japan Storage Battery Co Ltd アルカリ蓄電池
JPS60105166A (ja) * 1983-11-10 1985-06-10 Japan Storage Battery Co Ltd アルカリ蓄電池
JPH0324739B2 (ja) * 1983-11-10 1991-04-04 Japan Storage Battery Co Ltd

Also Published As

Publication number Publication date
FR2357054B1 (ja) 1980-07-11
US4076426A (en) 1978-02-28
IT1077541B (it) 1985-05-04
CA1077258A (en) 1980-05-13
FI771954A (ja) 1977-12-30
FR2357054A1 (fr) 1978-01-27
GB1582185A (en) 1980-12-31
DE2729403A1 (de) 1978-01-05

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