JPS5328380A - Function inspecting method of semiconductor elements - Google Patents

Function inspecting method of semiconductor elements

Info

Publication number
JPS5328380A
JPS5328380A JP9635276A JP9635276A JPS5328380A JP S5328380 A JPS5328380 A JP S5328380A JP 9635276 A JP9635276 A JP 9635276A JP 9635276 A JP9635276 A JP 9635276A JP S5328380 A JPS5328380 A JP S5328380A
Authority
JP
Japan
Prior art keywords
semiconductor elements
inspecting method
function inspecting
function
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9635276A
Other languages
English (en)
Japanese (ja)
Other versions
JPS543347B2 (OSRAM
Inventor
Yasuo Furukawa
Yushi Inagaki
Yoshiaki Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP9635276A priority Critical patent/JPS5328380A/ja
Publication of JPS5328380A publication Critical patent/JPS5328380A/ja
Publication of JPS543347B2 publication Critical patent/JPS543347B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9635276A 1976-08-11 1976-08-11 Function inspecting method of semiconductor elements Granted JPS5328380A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9635276A JPS5328380A (en) 1976-08-11 1976-08-11 Function inspecting method of semiconductor elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9635276A JPS5328380A (en) 1976-08-11 1976-08-11 Function inspecting method of semiconductor elements

Publications (2)

Publication Number Publication Date
JPS5328380A true JPS5328380A (en) 1978-03-16
JPS543347B2 JPS543347B2 (OSRAM) 1979-02-21

Family

ID=14162594

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9635276A Granted JPS5328380A (en) 1976-08-11 1976-08-11 Function inspecting method of semiconductor elements

Country Status (1)

Country Link
JP (1) JPS5328380A (OSRAM)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120255A (en) * 1974-08-13 1976-02-18 Nippon Zeon Co Kakyokanona epiharohidorinjugotaisoseibutsu

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120255A (en) * 1974-08-13 1976-02-18 Nippon Zeon Co Kakyokanona epiharohidorinjugotaisoseibutsu

Also Published As

Publication number Publication date
JPS543347B2 (OSRAM) 1979-02-21

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