JPS543347B2 - - Google Patents
Info
- Publication number
- JPS543347B2 JPS543347B2 JP9635276A JP9635276A JPS543347B2 JP S543347 B2 JPS543347 B2 JP S543347B2 JP 9635276 A JP9635276 A JP 9635276A JP 9635276 A JP9635276 A JP 9635276A JP S543347 B2 JPS543347 B2 JP S543347B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9635276A JPS5328380A (en) | 1976-08-11 | 1976-08-11 | Function inspecting method of semiconductor elements |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9635276A JPS5328380A (en) | 1976-08-11 | 1976-08-11 | Function inspecting method of semiconductor elements |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5328380A JPS5328380A (en) | 1978-03-16 |
| JPS543347B2 true JPS543347B2 (OSRAM) | 1979-02-21 |
Family
ID=14162594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9635276A Granted JPS5328380A (en) | 1976-08-11 | 1976-08-11 | Function inspecting method of semiconductor elements |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5328380A (OSRAM) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5120255A (en) * | 1974-08-13 | 1976-02-18 | Nippon Zeon Co | Kakyokanona epiharohidorinjugotaisoseibutsu |
-
1976
- 1976-08-11 JP JP9635276A patent/JPS5328380A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5328380A (en) | 1978-03-16 |