JPS5328222B2 - - Google Patents
Info
- Publication number
- JPS5328222B2 JPS5328222B2 JP8404774A JP8404774A JPS5328222B2 JP S5328222 B2 JPS5328222 B2 JP S5328222B2 JP 8404774 A JP8404774 A JP 8404774A JP 8404774 A JP8404774 A JP 8404774A JP S5328222 B2 JPS5328222 B2 JP S5328222B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00382481A US3852594A (en) | 1973-07-25 | 1973-07-25 | X-ray diffraction apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5063982A JPS5063982A (en, 2012) | 1975-05-30 |
| JPS5328222B2 true JPS5328222B2 (en, 2012) | 1978-08-12 |
Family
ID=23509145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8404774A Expired JPS5328222B2 (en, 2012) | 1973-07-25 | 1974-07-22 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3852594A (en, 2012) |
| JP (1) | JPS5328222B2 (en, 2012) |
| CA (1) | CA1016669A (en, 2012) |
| GB (1) | GB1473414A (en, 2012) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6163370U (en, 2012) * | 1984-09-28 | 1986-04-30 |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2748501C3 (de) * | 1977-10-28 | 1985-05-30 | Born, Eberhard, Dr. | Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen |
| JPS55112554A (en) * | 1979-01-05 | 1980-08-30 | Philips Corp | Diffraction beam monochrometer assembly |
| US4322618A (en) * | 1979-01-05 | 1982-03-30 | North American Philips Corporation | Diffracted beam monochromator |
| DE2907160C2 (de) * | 1979-02-23 | 1986-09-25 | Siemens AG, 1000 Berlin und 8000 München | Röntgen-Pulverdiffraktometer |
| US4278883A (en) * | 1979-12-27 | 1981-07-14 | The United States Of America As Represented By The Secretary Of The Interior | Sample mount for X-ray diffraction |
| NL8201343A (nl) * | 1982-03-31 | 1983-10-17 | Philips Nv | Roentgen analyse apparaat met instelbare strooistralenspleet. |
| NL8300419A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen analyse apparaat. |
| EP0137078B1 (en) * | 1983-10-12 | 1989-01-25 | Koninklijke Philips Electronics N.V. | X-ray examination apparatus |
| NL8304009A (nl) * | 1983-11-22 | 1985-06-17 | Philips Nv | Roentgen analyse apparaat met afbuigsysteem. |
| DE3439471A1 (de) * | 1984-10-27 | 1986-04-30 | MTU Motoren- und Turbinen-Union München GmbH, 8000 München | Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende |
| NL8903044A (nl) * | 1989-12-12 | 1991-07-01 | Philips Nv | Roentgen analyse apparaat met een instelbaar spleetdiafragma. |
| US5008909A (en) * | 1990-02-07 | 1991-04-16 | The United States Of America As Represented By The Department Of Energy | Diffractometer data collecting method and apparatus |
| SE502223C2 (sv) | 1994-01-14 | 1995-09-18 | Sandvik Ab | Sätt och alster vid beläggning av ett skärande verktyg med ett aluminiumoxidskikt |
| JPH11502312A (ja) * | 1996-01-12 | 1999-02-23 | フィリップス エレクトロニクス エヌ ベー | 回転可能な一次コリメータを含むｘ線分析装置 |
| JP4532478B2 (ja) * | 2003-02-28 | 2010-08-25 | オスミック、インコーポレイテッド | 収束を調整可能なｘ線光学システム |
| DE60312489T2 (de) * | 2003-05-14 | 2008-01-17 | Bruker Axs Gmbh | Röntgendiffraktometer für die Diffraktion von horizontal und vertikal orientierten Proben unter streifendem Einfallswinkel |
| US7310410B2 (en) * | 2004-07-28 | 2007-12-18 | General Electric Co. | Single-leaf X-ray collimator |
| JP4711430B2 (ja) * | 2006-08-01 | 2011-06-29 | 株式会社リガク | Ｘ線回折装置 |
| US7443952B2 (en) * | 2006-10-06 | 2008-10-28 | Rigaku Corporation | X-ray diffraction measurement method and X-ray diffraction apparatus |
| PL3719484T3 (pl) * | 2019-04-04 | 2024-05-13 | Malvern Panalytical B.V. | Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiego |
| JP7492261B2 (ja) | 2021-01-29 | 2024-05-29 | 株式会社リガク | Ｘ線分析装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3124681A (en) * | 1964-03-10 | Zingaro | ||
| DE1080320B (de) * | 1954-04-09 | 1960-04-21 | Siemens Ag | Einrichtung zur Beugung von Roentgenstrahlen |
| NL113488C (en, 2012) * | 1958-06-19 | |||
| DE1472373B2 (de) * | 1964-05-23 | 1970-02-26 | Chirana Praha n.p., Prag | Spindel, insbesondere für Röntgengo niomet er |
| US3411000A (en) * | 1965-04-14 | 1968-11-12 | Siemens Ag | X-ray diffractometer diaphragm which is synchronously rotated with the specimen |
| DE1497531A1 (de) * | 1965-07-22 | 1969-03-27 | Jeol Ltd | Goniometer |
| GB1219647A (en) * | 1967-06-19 | 1971-01-20 | Siemens Ag | Arrangement for use in a fully focussing x-ray spectro meter |
-
1973
- 1973-07-25 US US00382481A patent/US3852594A/en not_active Expired - Lifetime
-
1974
- 1974-07-22 CA CA205,335A patent/CA1016669A/en not_active Expired
- 1974-07-22 JP JP8404774A patent/JPS5328222B2/ja not_active Expired
- 1974-07-22 GB GB3235674A patent/GB1473414A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6163370U (en, 2012) * | 1984-09-28 | 1986-04-30 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1473414A (en) | 1977-05-11 |
| US3852594A (en) | 1974-12-03 |
| JPS5063982A (en, 2012) | 1975-05-30 |
| AU7154374A (en) | 1976-01-29 |
| CA1016669A (en) | 1977-08-30 |