PL3719484T3 - Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiego - Google Patents
Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiegoInfo
- Publication number
- PL3719484T3 PL3719484T3 PL19167406.8T PL19167406T PL3719484T3 PL 3719484 T3 PL3719484 T3 PL 3719484T3 PL 19167406 T PL19167406 T PL 19167406T PL 3719484 T3 PL3719484 T3 PL 3719484T3
- Authority
- PL
- Poland
- Prior art keywords
- ray beam
- beam shaping
- shaping apparatus
- ray
- shaping
- Prior art date
Links
- 238000000034 method Methods 0.000 title 1
- 238000007493 shaping process Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/046—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers varying the contour of the field, e.g. multileaf collimators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/306—Accessories, mechanical or electrical features computer control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/316—Accessories, mechanical or electrical features collimators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/606—Specific applications or type of materials texture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/607—Specific applications or type of materials strain
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP19167406.8A EP3719484B1 (en) | 2019-04-04 | 2019-04-04 | X-ray beam shaping apparatus and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL3719484T3 true PL3719484T3 (pl) | 2024-05-13 |
Family
ID=66334149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL19167406.8T PL3719484T3 (pl) | 2019-04-04 | 2019-04-04 | Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiego |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US12007343B2 (pl) |
| EP (1) | EP3719484B1 (pl) |
| JP (1) | JP7503076B2 (pl) |
| CN (1) | CN113661389B (pl) |
| PL (1) | PL3719484T3 (pl) |
| WO (1) | WO2020201565A1 (pl) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| PL3719484T3 (pl) * | 2019-04-04 | 2024-05-13 | Malvern Panalytical B.V. | Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiego |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3852594A (en) * | 1973-07-25 | 1974-12-03 | Pepi Inc | X-ray diffraction apparatus |
| NL8201343A (nl) * | 1982-03-31 | 1983-10-17 | Philips Nv | Roentgen analyse apparaat met instelbare strooistralenspleet. |
| NL8300420A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen analyse apparaat. |
| US4592082A (en) * | 1984-08-10 | 1986-05-27 | The United States Of America As Represented By The United States Department Of Energy | Quantitative determination of mineral composition by powder X-ray diffraction |
| US4875226A (en) * | 1988-04-21 | 1989-10-17 | University Of Rochester | X-ray machine |
| NL8903044A (nl) * | 1989-12-12 | 1991-07-01 | Philips Nv | Roentgen analyse apparaat met een instelbaar spleetdiafragma. |
| EP0753140A1 (en) | 1995-01-27 | 1997-01-15 | Koninklijke Philips Electronics N.V. | Method for ge-xrf x-ray analysis of materials, and apparatus for carrying out the method |
| JP4359116B2 (ja) | 2003-10-23 | 2009-11-04 | 株式会社リガク | Ｘ線回折装置の微小部ｘ線照射装置及び微小部ｘ線照射方法 |
| JP4711430B2 (ja) * | 2006-08-01 | 2011-06-29 | 株式会社リガク | Ｘ線回折装置 |
| FR2918501B1 (fr) | 2007-07-02 | 2009-11-06 | Xenocs Soc Par Actions Simplif | Dispositif de delivrance d'un faisceau de rayons x a haute energie |
| JP6821700B2 (ja) | 2016-04-22 | 2021-01-27 | ケーエルエー コーポレイション | 小スポットサイズ透過型小角ｘ線スキャタロメトリ用ビーム整形スリット |
| DE102016111932B4 (de) | 2016-06-29 | 2018-02-08 | Trumpf Laser Gmbh | Frequenzkonversionseinheit und Verfahren zur Frequenzkonversion |
| US10481111B2 (en) * | 2016-10-21 | 2019-11-19 | Kla-Tencor Corporation | Calibration of a small angle X-ray scatterometry based metrology system |
| PL3553506T3 (pl) * | 2018-04-13 | 2025-06-23 | Malvern Panalytical B.V. | Urządzenie i sposób analizy promieniowania rentgenowskiego z hybrydową kontrolą dywergencji wiązki |
| EP3553507A1 (en) * | 2018-04-13 | 2019-10-16 | Malvern Panalytical B.V. | X-ray analysis apparatus |
| EP3553508B1 (en) * | 2018-04-13 | 2025-04-02 | Malvern Panalytical B.V. | X-ray analysis apparatus and method |
| KR102710484B1 (ko) * | 2018-07-05 | 2024-09-27 | 브루커 테크놀로지스 리미티드 | 소각 ｘ선 산란 계측 |
| US11703464B2 (en) * | 2018-07-28 | 2023-07-18 | Bruker Technologies Ltd. | Small-angle x-ray scatterometry |
| PL3719484T3 (pl) * | 2019-04-04 | 2024-05-13 | Malvern Panalytical B.V. | Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiego |
| JP7492261B2 (ja) * | 2021-01-29 | 2024-05-29 | 株式会社リガク | Ｘ線分析装置 |
-
2019
- 2019-04-04 PL PL19167406.8T patent/PL3719484T3/pl unknown
- 2019-04-04 EP EP19167406.8A patent/EP3719484B1/en active Active
-
2020
- 2020-04-03 JP JP2021558944A patent/JP7503076B2/ja active Active
- 2020-04-03 WO PCT/EP2020/059683 patent/WO2020201565A1/en not_active Ceased
- 2020-04-03 CN CN202080027081.8A patent/CN113661389B/zh active Active
- 2020-04-03 US US17/600,803 patent/US12007343B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3719484A1 (en) | 2020-10-07 |
| US20220163466A1 (en) | 2022-05-26 |
| WO2020201565A1 (en) | 2020-10-08 |
| CN113661389B (zh) | 2024-11-22 |
| JP7503076B2 (ja) | 2024-06-19 |
| US12007343B2 (en) | 2024-06-11 |
| EP3719484B1 (en) | 2024-02-14 |
| CN113661389A (zh) | 2021-11-16 |
| JP2022527816A (ja) | 2022-06-06 |
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