CA1016669A - X-ray diffraction apparatus - Google Patents

X-ray diffraction apparatus

Info

Publication number
CA1016669A
CA1016669A CA205,335A CA205335A CA1016669A CA 1016669 A CA1016669 A CA 1016669A CA 205335 A CA205335 A CA 205335A CA 1016669 A CA1016669 A CA 1016669A
Authority
CA
Canada
Prior art keywords
ray diffraction
diffraction apparatus
ray
diffraction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA205,335A
Other languages
English (en)
Other versions
CA205335S (en
Inventor
Frank R. Paolini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips North America LLC
Original Assignee
North American Philips Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by North American Philips Corp filed Critical North American Philips Corp
Application granted granted Critical
Publication of CA1016669A publication Critical patent/CA1016669A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CA205,335A 1973-07-25 1974-07-22 X-ray diffraction apparatus Expired CA1016669A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00382481A US3852594A (en) 1973-07-25 1973-07-25 X-ray diffraction apparatus

Publications (1)

Publication Number Publication Date
CA1016669A true CA1016669A (en) 1977-08-30

Family

ID=23509145

Family Applications (1)

Application Number Title Priority Date Filing Date
CA205,335A Expired CA1016669A (en) 1973-07-25 1974-07-22 X-ray diffraction apparatus

Country Status (4)

Country Link
US (1) US3852594A (en, 2012)
JP (1) JPS5328222B2 (en, 2012)
CA (1) CA1016669A (en, 2012)
GB (1) GB1473414A (en, 2012)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2748501C3 (de) * 1977-10-28 1985-05-30 Born, Eberhard, Dr. Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen
JPS55112554A (en) * 1979-01-05 1980-08-30 Philips Corp Diffraction beam monochrometer assembly
US4322618A (en) * 1979-01-05 1982-03-30 North American Philips Corporation Diffracted beam monochromator
DE2907160C2 (de) * 1979-02-23 1986-09-25 Siemens AG, 1000 Berlin und 8000 München Röntgen-Pulverdiffraktometer
US4278883A (en) * 1979-12-27 1981-07-14 The United States Of America As Represented By The Secretary Of The Interior Sample mount for X-ray diffraction
NL8201343A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met instelbare strooistralenspleet.
NL8300419A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
EP0137078B1 (en) * 1983-10-12 1989-01-25 Koninklijke Philips Electronics N.V. X-ray examination apparatus
NL8304009A (nl) * 1983-11-22 1985-06-17 Philips Nv Roentgen analyse apparaat met afbuigsysteem.
JPS6163370U (en, 2012) * 1984-09-28 1986-04-30
DE3439471A1 (de) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende
NL8903044A (nl) * 1989-12-12 1991-07-01 Philips Nv Roentgen analyse apparaat met een instelbaar spleetdiafragma.
US5008909A (en) * 1990-02-07 1991-04-16 The United States Of America As Represented By The Department Of Energy Diffractometer data collecting method and apparatus
SE502223C2 (sv) 1994-01-14 1995-09-18 Sandvik Ab Sätt och alster vid beläggning av ett skärande verktyg med ett aluminiumoxidskikt
JPH11502312A (ja) * 1996-01-12 1999-02-23 フィリップス エレクトロニクス エヌ ベー 回転可能な一次コリメータを含むｘ線分析装置
JP4532478B2 (ja) * 2003-02-28 2010-08-25 オスミック、インコーポレイテッド 収束を調整可能なｘ線光学システム
DE60312489T2 (de) * 2003-05-14 2008-01-17 Bruker Axs Gmbh Röntgendiffraktometer für die Diffraktion von horizontal und vertikal orientierten Proben unter streifendem Einfallswinkel
US7310410B2 (en) * 2004-07-28 2007-12-18 General Electric Co. Single-leaf X-ray collimator
JP4711430B2 (ja) * 2006-08-01 2011-06-29 株式会社リガク Ｘ線回折装置
US7443952B2 (en) * 2006-10-06 2008-10-28 Rigaku Corporation X-ray diffraction measurement method and X-ray diffraction apparatus
PL3719484T3 (pl) * 2019-04-04 2024-05-13 Malvern Panalytical B.V. Urządzenie i sposób kształtowania wiązki promieniowania rentgenowskiego
JP7492261B2 (ja) 2021-01-29 2024-05-29 株式会社リガク Ｘ線分析装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3124681A (en) * 1964-03-10 Zingaro
DE1080320B (de) * 1954-04-09 1960-04-21 Siemens Ag Einrichtung zur Beugung von Roentgenstrahlen
NL113488C (en, 2012) * 1958-06-19
DE1472373B2 (de) * 1964-05-23 1970-02-26 Chirana Praha n.p., Prag Spindel, insbesondere für Röntgengo niomet er
US3411000A (en) * 1965-04-14 1968-11-12 Siemens Ag X-ray diffractometer diaphragm which is synchronously rotated with the specimen
DE1497531A1 (de) * 1965-07-22 1969-03-27 Jeol Ltd Goniometer
GB1219647A (en) * 1967-06-19 1971-01-20 Siemens Ag Arrangement for use in a fully focussing x-ray spectro meter

Also Published As

Publication number Publication date
JPS5328222B2 (en, 2012) 1978-08-12
GB1473414A (en) 1977-05-11
US3852594A (en) 1974-12-03
JPS5063982A (en, 2012) 1975-05-30
AU7154374A (en) 1976-01-29

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