JPS53117494A - Method and apparatus of detecting defects - Google Patents

Method and apparatus of detecting defects

Info

Publication number
JPS53117494A
JPS53117494A JP3159777A JP3159777A JPS53117494A JP S53117494 A JPS53117494 A JP S53117494A JP 3159777 A JP3159777 A JP 3159777A JP 3159777 A JP3159777 A JP 3159777A JP S53117494 A JPS53117494 A JP S53117494A
Authority
JP
Japan
Prior art keywords
detecting defects
defects
discolors
radiations
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3159777A
Other languages
Japanese (ja)
Inventor
Ryoichi Ishii
Fukusaburo Ishikawa
Yoshishige Sakurai
Tadashi Kurihara
Takeemon Nagashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKUSHU TORYO KK
Toshiba Corp
Nippon Atomic Industry Group Co Ltd
Original Assignee
TOKUSHU TORYO KK
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Nippon Atomic Industry Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOKUSHU TORYO KK, Toshiba Corp, Tokyo Shibaura Electric Co Ltd, Nippon Atomic Industry Group Co Ltd filed Critical TOKUSHU TORYO KK
Priority to JP3159777A priority Critical patent/JPS53117494A/en
Publication of JPS53117494A publication Critical patent/JPS53117494A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink

Abstract

PURPOSE:To detect the presence or not of defects from the change in the color of a defect detecting material which discolors upon receiving of radiations by cleaning the surface of the face to be put in contact with a radioactive object thereafter applying said material on the surface.
JP3159777A 1977-03-24 1977-03-24 Method and apparatus of detecting defects Pending JPS53117494A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3159777A JPS53117494A (en) 1977-03-24 1977-03-24 Method and apparatus of detecting defects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3159777A JPS53117494A (en) 1977-03-24 1977-03-24 Method and apparatus of detecting defects

Publications (1)

Publication Number Publication Date
JPS53117494A true JPS53117494A (en) 1978-10-13

Family

ID=12335595

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3159777A Pending JPS53117494A (en) 1977-03-24 1977-03-24 Method and apparatus of detecting defects

Country Status (1)

Country Link
JP (1) JPS53117494A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50116084A (en) * 1974-02-26 1975-09-11

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50116084A (en) * 1974-02-26 1975-09-11

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