JPS5291494A - Mass spectrometer - Google Patents

Mass spectrometer

Info

Publication number
JPS5291494A
JPS5291494A JP750076A JP750076A JPS5291494A JP S5291494 A JPS5291494 A JP S5291494A JP 750076 A JP750076 A JP 750076A JP 750076 A JP750076 A JP 750076A JP S5291494 A JPS5291494 A JP S5291494A
Authority
JP
Japan
Prior art keywords
mass spectrometer
ionizing function
function
slits
pores
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP750076A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5621096B2 (enExample
Inventor
Hideki Kanbara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP750076A priority Critical patent/JPS5291494A/ja
Priority to US05/762,718 priority patent/US4144451A/en
Publication of JPS5291494A publication Critical patent/JPS5291494A/ja
Publication of JPS5621096B2 publication Critical patent/JPS5621096B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP750076A 1976-01-28 1976-01-28 Mass spectrometer Granted JPS5291494A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP750076A JPS5291494A (en) 1976-01-28 1976-01-28 Mass spectrometer
US05/762,718 US4144451A (en) 1976-01-28 1977-01-26 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP750076A JPS5291494A (en) 1976-01-28 1976-01-28 Mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5291494A true JPS5291494A (en) 1977-08-01
JPS5621096B2 JPS5621096B2 (enExample) 1981-05-18

Family

ID=11667490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP750076A Granted JPS5291494A (en) 1976-01-28 1976-01-28 Mass spectrometer

Country Status (2)

Country Link
US (1) US4144451A (enExample)
JP (1) JPS5291494A (enExample)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03201355A (ja) * 1989-12-27 1991-09-03 Jeol Ltd 大気圧イオン化質量分析装置
JP2009529141A (ja) * 2006-03-03 2009-08-13 イオンセンス インコーポレイテッド 表面イオン化分光に使用するためのサンプリングシステム
US9633827B2 (en) 2009-05-08 2017-04-25 Ionsense, Inc. Apparatus and method for sampling of confined spaces
US9824875B2 (en) 2014-06-15 2017-11-21 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9960029B2 (en) 2011-02-05 2018-05-01 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
US11424116B2 (en) 2019-10-28 2022-08-23 Ionsense, Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
JP7793160B1 (ja) * 2025-08-29 2026-01-05 Ｒｅｂｉｖｅ・Ｅ株式会社 ガス分析装置

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4209696A (en) * 1977-09-21 1980-06-24 Fite Wade L Methods and apparatus for mass spectrometric analysis of constituents in liquids
US4239967A (en) * 1979-04-13 1980-12-16 International Business Machines Corporation Trace water measurement
EP0052140A1 (en) * 1980-05-23 1982-05-26 Research Corporation Ion vapor source for mass spectrometry of liquids
DE3226803A1 (de) * 1982-07-17 1984-01-19 Bayer Ag, 5090 Leverkusen Vorrichtung zur emissionsgasthermoanalyse
JPS5935347A (ja) * 1982-08-20 1984-02-27 Masahiko Tsuchiya イオン生成装置
US4542293A (en) * 1983-04-20 1985-09-17 Yale University Process and apparatus for changing the energy of charged particles contained in a gaseous medium
US4667100A (en) * 1985-04-17 1987-05-19 Lagna William M Methods and apparatus for mass spectrometric analysis of fluids
JPS6220231A (ja) * 1985-07-18 1987-01-28 Seiko Instr & Electronics Ltd Ｉｃｐ質量分析装置
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
GB8616940D0 (en) * 1986-07-11 1986-08-20 Vg Instr Group Discharge ionization mass spectrometer
JP2580156B2 (ja) * 1987-03-30 1997-02-12 株式会社日立製作所 大気圧イオン化質量分析計
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
JP2753265B2 (ja) * 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計
US4963735A (en) * 1988-11-11 1990-10-16 Hitachi, Ltd. Plasma source mass spectrometer
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
JP2607698B2 (ja) * 1989-09-29 1997-05-07 株式会社日立製作所 大気圧イオン化質量分析計
JPH03296659A (ja) * 1990-04-17 1991-12-27 Osaka Oxygen Ind Ltd ガス中の一酸化炭素の分析方法
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
JP3385707B2 (ja) * 1994-03-17 2003-03-10 株式会社日立製作所 質量分析装置
US5644223A (en) * 1995-05-12 1997-07-01 International Business Machines Corporation Uniform density charge deposit source
DE19523860A1 (de) * 1995-06-30 1997-01-02 Bruker Franzen Analytik Gmbh Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung
JP3504819B2 (ja) * 1997-03-31 2004-03-08 株式会社日立製作所 質量分析方法及び装置
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US7081620B2 (en) 2001-11-26 2006-07-25 Hitachi High -Technologies Corporation Atmospheric pressure ionization mass spectrometer system
US6781117B1 (en) 2002-05-30 2004-08-24 Ross C Willoughby Efficient direct current collision and reaction cell
AU2003247434A1 (en) * 2002-05-31 2003-12-19 Waters Investments Limited A high speed combination multi-mode ionization source for mass spectrometers
US8026477B2 (en) 2006-03-03 2011-09-27 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
CN101449355A (zh) * 2006-03-03 2009-06-03 埃昂森斯股份有限公司 用于表面离子光谱学的采样系统
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
EP2669929A1 (en) 2012-05-29 2013-12-04 Technische Universität München High-performance ion source and method for generating an ion beam
DE102013201499A1 (de) * 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
US11948788B2 (en) * 2019-06-12 2024-04-02 Dh Technologies Development Pte. Ltd. TOF mass calibration

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517991A (enExample) * 1974-07-10 1976-01-22 Hitachi Ltd

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920987A (en) * 1972-09-14 1975-11-18 Stanford Research Inst Method and system for detecting explosives
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517991A (enExample) * 1974-07-10 1976-01-22 Hitachi Ltd

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03201355A (ja) * 1989-12-27 1991-09-03 Jeol Ltd 大気圧イオン化質量分析装置
JP2009529141A (ja) * 2006-03-03 2009-08-13 イオンセンス インコーポレイテッド 表面イオン化分光に使用するためのサンプリングシステム
US10643834B2 (en) 2009-05-08 2020-05-05 Ionsense, Inc. Apparatus and method for sampling
US9633827B2 (en) 2009-05-08 2017-04-25 Ionsense, Inc. Apparatus and method for sampling of confined spaces
US10090142B2 (en) 2009-05-08 2018-10-02 Ionsense, Inc Apparatus and method for sampling of confined spaces
US11742194B2 (en) 2011-02-05 2023-08-29 Bruker Scientific Llc Apparatus and method for thermal assisted desorption ionization systems
US9960029B2 (en) 2011-02-05 2018-05-01 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US11049707B2 (en) 2011-02-05 2021-06-29 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US10643833B2 (en) 2011-02-05 2020-05-05 Ionsense, Inc. Apparatus and method for thermal assisted desorption ionization systems
US10056243B2 (en) 2014-06-15 2018-08-21 Ionsense, Inc. Apparatus and method for rapid chemical analysis using differential desorption
US10553417B2 (en) 2014-06-15 2020-02-04 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US10825675B2 (en) 2014-06-15 2020-11-03 Ionsense Inc. Apparatus and method for generating chemical signatures using differential desorption
US10283340B2 (en) 2014-06-15 2019-05-07 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US11295943B2 (en) 2014-06-15 2022-04-05 Ionsense Inc. Apparatus and method for generating chemical signatures using differential desorption
US9824875B2 (en) 2014-06-15 2017-11-21 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
US11424116B2 (en) 2019-10-28 2022-08-23 Ionsense, Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
JP7793160B1 (ja) * 2025-08-29 2026-01-05 Ｒｅｂｉｖｅ・Ｅ株式会社 ガス分析装置

Also Published As

Publication number Publication date
US4144451A (en) 1979-03-13
JPS5621096B2 (enExample) 1981-05-18

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