JPS5621096B2 - - Google Patents

Info

Publication number
JPS5621096B2
JPS5621096B2 JP750076A JP750076A JPS5621096B2 JP S5621096 B2 JPS5621096 B2 JP S5621096B2 JP 750076 A JP750076 A JP 750076A JP 750076 A JP750076 A JP 750076A JP S5621096 B2 JPS5621096 B2 JP S5621096B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP750076A
Other languages
Japanese (ja)
Other versions
JPS5291494A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP750076A priority Critical patent/JPS5291494A/ja
Priority to US05/762,718 priority patent/US4144451A/en
Publication of JPS5291494A publication Critical patent/JPS5291494A/ja
Publication of JPS5621096B2 publication Critical patent/JPS5621096B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP750076A 1976-01-28 1976-01-28 Mass spectrometer Granted JPS5291494A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP750076A JPS5291494A (en) 1976-01-28 1976-01-28 Mass spectrometer
US05/762,718 US4144451A (en) 1976-01-28 1977-01-26 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP750076A JPS5291494A (en) 1976-01-28 1976-01-28 Mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5291494A JPS5291494A (en) 1977-08-01
JPS5621096B2 true JPS5621096B2 (enExample) 1981-05-18

Family

ID=11667490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP750076A Granted JPS5291494A (en) 1976-01-28 1976-01-28 Mass spectrometer

Country Status (2)

Country Link
US (1) US4144451A (enExample)
JP (1) JPS5291494A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005528746A (ja) * 2002-05-31 2005-09-22 ウオーターズ・インベストメンツ・リミテツド 質量分析計用の高速組合せマルチモードイオン源

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4209696A (en) * 1977-09-21 1980-06-24 Fite Wade L Methods and apparatus for mass spectrometric analysis of constituents in liquids
US4239967A (en) * 1979-04-13 1980-12-16 International Business Machines Corporation Trace water measurement
EP0052140A1 (en) * 1980-05-23 1982-05-26 Research Corporation Ion vapor source for mass spectrometry of liquids
DE3226803A1 (de) * 1982-07-17 1984-01-19 Bayer Ag, 5090 Leverkusen Vorrichtung zur emissionsgasthermoanalyse
JPS5935347A (ja) * 1982-08-20 1984-02-27 Masahiko Tsuchiya イオン生成装置
US4542293A (en) * 1983-04-20 1985-09-17 Yale University Process and apparatus for changing the energy of charged particles contained in a gaseous medium
US4667100A (en) * 1985-04-17 1987-05-19 Lagna William M Methods and apparatus for mass spectrometric analysis of fluids
JPS6220231A (ja) * 1985-07-18 1987-01-28 Seiko Instr & Electronics Ltd Ｉｃｐ質量分析装置
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
GB8616940D0 (en) * 1986-07-11 1986-08-20 Vg Instr Group Discharge ionization mass spectrometer
JP2580156B2 (ja) * 1987-03-30 1997-02-12 株式会社日立製作所 大気圧イオン化質量分析計
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
JP2753265B2 (ja) * 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計
US4963735A (en) * 1988-11-11 1990-10-16 Hitachi, Ltd. Plasma source mass spectrometer
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
JP2607698B2 (ja) * 1989-09-29 1997-05-07 株式会社日立製作所 大気圧イオン化質量分析計
JPH03201355A (ja) * 1989-12-27 1991-09-03 Jeol Ltd 大気圧イオン化質量分析装置
JPH03296659A (ja) * 1990-04-17 1991-12-27 Osaka Oxygen Ind Ltd ガス中の一酸化炭素の分析方法
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
JP3385707B2 (ja) * 1994-03-17 2003-03-10 株式会社日立製作所 質量分析装置
US5644223A (en) * 1995-05-12 1997-07-01 International Business Machines Corporation Uniform density charge deposit source
DE19523860A1 (de) * 1995-06-30 1997-01-02 Bruker Franzen Analytik Gmbh Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung
JP3504819B2 (ja) * 1997-03-31 2004-03-08 株式会社日立製作所 質量分析方法及び装置
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US7081620B2 (en) 2001-11-26 2006-07-25 Hitachi High -Technologies Corporation Atmospheric pressure ionization mass spectrometer system
US6781117B1 (en) 2002-05-30 2004-08-24 Ross C Willoughby Efficient direct current collision and reaction cell
US8026477B2 (en) 2006-03-03 2011-09-27 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
CN101449355A (zh) * 2006-03-03 2009-06-03 埃昂森斯股份有限公司 用于表面离子光谱学的采样系统
US7700913B2 (en) 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
EP2669929A1 (en) 2012-05-29 2013-12-04 Technische Universität München High-performance ion source and method for generating an ion beam
DE102013201499A1 (de) * 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
US11948788B2 (en) * 2019-06-12 2024-04-02 Dh Technologies Development Pte. Ltd. TOF mass calibration
EP4052278A4 (en) 2019-10-28 2023-11-22 Ionsense, Inc. REAL-TIME ATMOSPHERIC TIMETIONIZATION WITH PULSATING FLOW
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
JP7793160B1 (ja) * 2025-08-29 2026-01-05 Ｒｅｂｉｖｅ・Ｅ株式会社 ガス分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920987A (en) * 1972-09-14 1975-11-18 Stanford Research Inst Method and system for detecting explosives
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components
JPS5743976B2 (enExample) * 1974-07-10 1982-09-18

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005528746A (ja) * 2002-05-31 2005-09-22 ウオーターズ・インベストメンツ・リミテツド 質量分析計用の高速組合せマルチモードイオン源

Also Published As

Publication number Publication date
JPS5291494A (en) 1977-08-01
US4144451A (en) 1979-03-13

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