JPS5289477A - Input protecting circuit - Google Patents
Input protecting circuitInfo
- Publication number
- JPS5289477A JPS5289477A JP542876A JP542876A JPS5289477A JP S5289477 A JPS5289477 A JP S5289477A JP 542876 A JP542876 A JP 542876A JP 542876 A JP542876 A JP 542876A JP S5289477 A JPS5289477 A JP S5289477A
- Authority
- JP
- Japan
- Prior art keywords
- protecting circuit
- input
- input protecting
- input voltage
- semiconductor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005611 electricity Effects 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 230000003068 static effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Amplifiers (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To protect gate of MIS semiconductor element by constituting input protecting circuit which has high impedance with input voltage within specified ratings and whose impedance changes to low rapidly when it exceeds over input voltage in order to prevent input damage due to static electricity.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP542876A JPS5289477A (en) | 1976-01-22 | 1976-01-22 | Input protecting circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP542876A JPS5289477A (en) | 1976-01-22 | 1976-01-22 | Input protecting circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5289477A true JPS5289477A (en) | 1977-07-27 |
Family
ID=11610895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP542876A Pending JPS5289477A (en) | 1976-01-22 | 1976-01-22 | Input protecting circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5289477A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0042305A2 (en) * | 1980-06-18 | 1981-12-23 | Kabushiki Kaisha Toshiba | MOS transistor circuit with breakdown protection |
JPS59126663A (en) * | 1983-01-11 | 1984-07-21 | Seiko Epson Corp | Semiconductor device |
JPS6086587A (en) * | 1983-10-18 | 1985-05-16 | セイコーインスツルメンツ株式会社 | Liquid crystal display unit |
JPS63220289A (en) * | 1987-03-10 | 1988-09-13 | 日本電気株式会社 | Thin film transistor array |
JP2013535811A (en) * | 2010-06-30 | 2013-09-12 | ザイリンクス インコーポレイテッド | Electrostatic discharge protection for multi-chip module dies |
-
1976
- 1976-01-22 JP JP542876A patent/JPS5289477A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0042305A2 (en) * | 1980-06-18 | 1981-12-23 | Kabushiki Kaisha Toshiba | MOS transistor circuit with breakdown protection |
JPS59126663A (en) * | 1983-01-11 | 1984-07-21 | Seiko Epson Corp | Semiconductor device |
JPH0549966B2 (en) * | 1983-01-11 | 1993-07-27 | Seiko Epson Corp | |
JPS6086587A (en) * | 1983-10-18 | 1985-05-16 | セイコーインスツルメンツ株式会社 | Liquid crystal display unit |
JPS63220289A (en) * | 1987-03-10 | 1988-09-13 | 日本電気株式会社 | Thin film transistor array |
JPH0567953B2 (en) * | 1987-03-10 | 1993-09-27 | Nippon Electric Co | |
JP2013535811A (en) * | 2010-06-30 | 2013-09-12 | ザイリンクス インコーポレイテッド | Electrostatic discharge protection for multi-chip module dies |
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