JPS5283046A - Check system of error detection circuit - Google Patents

Check system of error detection circuit

Info

Publication number
JPS5283046A
JPS5283046A JP15811975A JP15811975A JPS5283046A JP S5283046 A JPS5283046 A JP S5283046A JP 15811975 A JP15811975 A JP 15811975A JP 15811975 A JP15811975 A JP 15811975A JP S5283046 A JPS5283046 A JP S5283046A
Authority
JP
Japan
Prior art keywords
detection circuit
error detection
check system
erroneous operation
checking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15811975A
Other languages
English (en)
Other versions
JPS5540894B2 (ja
Inventor
Yasuo Kurihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15811975A priority Critical patent/JPS5283046A/ja
Priority to US05/750,649 priority patent/US4107649A/en
Priority to GB53693/76A priority patent/GB1566309A/en
Priority to DE2659200A priority patent/DE2659200C2/de
Priority to FR7639388A priority patent/FR2337375A1/fr
Publication of JPS5283046A publication Critical patent/JPS5283046A/ja
Publication of JPS5540894B2 publication Critical patent/JPS5540894B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/09—Error detection only, e.g. using cyclic redundancy check [CRC] codes or single parity bit
JP15811975A 1975-12-30 1975-12-30 Check system of error detection circuit Granted JPS5283046A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP15811975A JPS5283046A (en) 1975-12-30 1975-12-30 Check system of error detection circuit
US05/750,649 US4107649A (en) 1975-12-30 1976-12-15 Check system for detecting malfunction of an error detection circuit
GB53693/76A GB1566309A (en) 1975-12-30 1976-12-22 Error detection checking circuitry
DE2659200A DE2659200C2 (de) 1975-12-30 1976-12-28 Prüfanordnung für einen Fehlererkennungskreis in einer Datenverarbeitungsschaltung
FR7639388A FR2337375A1 (fr) 1975-12-30 1976-12-29 Dispositif de controle d'un circuit de detection d'erreur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15811975A JPS5283046A (en) 1975-12-30 1975-12-30 Check system of error detection circuit

Publications (2)

Publication Number Publication Date
JPS5283046A true JPS5283046A (en) 1977-07-11
JPS5540894B2 JPS5540894B2 (ja) 1980-10-21

Family

ID=15664704

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15811975A Granted JPS5283046A (en) 1975-12-30 1975-12-30 Check system of error detection circuit

Country Status (5)

Country Link
US (1) US4107649A (ja)
JP (1) JPS5283046A (ja)
DE (1) DE2659200C2 (ja)
FR (1) FR2337375A1 (ja)
GB (1) GB1566309A (ja)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1148900B (it) * 1980-09-05 1986-12-03 Sits Soc It Telecom Siemens Disposizione circuitale atta a rilevare la presenza di malfunzionamenti degli organi preposti al trasferimento diretto di dati in un sistema utilizzante un microprocessore di tipo commerciale
US4441182A (en) * 1981-05-15 1984-04-03 Rockwell International Corporation Repetitious logic state signal generation apparatus
US4398233A (en) * 1982-03-03 1983-08-09 Electronics Corporation Of America Fail-safe device for electronic control circuit
US4574343A (en) * 1982-09-29 1986-03-04 Kabushiki Kaisha Komatsu Seisakusho Contactless press control device
NL8302722A (nl) * 1983-08-01 1985-03-01 Philips Nv Inrichting voor het bewaken van de telfunctie van tellers.
US4878168A (en) * 1984-03-30 1989-10-31 International Business Machines Corporation Bidirectional serial test bus device adapted for control processing unit using parallel information transfer bus
US4670876A (en) * 1985-05-15 1987-06-02 Honeywell Inc. Parity integrity check logic
GB2179179B (en) * 1985-08-12 1989-10-18 British Gas Corp Improvements in or relating to burner control systems
JPH0756503B2 (ja) * 1985-11-26 1995-06-14 株式会社日立製作所 論理回路診断方法
JPS63102517A (ja) * 1986-10-20 1988-05-07 Nec Corp 機器障害信号伝送方式
US4740968A (en) * 1986-10-27 1988-04-26 International Business Machines Corporation ECC circuit failure detector/quick word verifier
DE3771663D1 (de) * 1986-10-31 1991-08-29 Siemens Ag Verfahren zur paritaetsbitermittlung und zur ueberwachung der uebertragung beim datenschieben sowie schaltungsanordnung zur durchfuehrung der verfahren.
GB2200476B (en) * 1987-01-29 1991-02-06 British Gas Plc Monitor system
US4884273A (en) * 1987-02-03 1989-11-28 Siemens Aktiengesellschaft Method and apparatus for monitoring the consistency of successive binary code signal groups in data processing equipment
DE3784496T2 (de) * 1987-06-11 1993-09-16 Ibm Taktgeneratorsystem.
US5195093A (en) * 1991-02-14 1993-03-16 Motorola, Inc. Method and apparatus for ensuring CRC error generation by a data communication station experiencing transmitter exceptions
US5276690A (en) * 1992-01-30 1994-01-04 Intel Corporation Apparatus utilizing dual compare logic for self checking of functional redundancy check (FRC) logic
US5440604A (en) * 1994-04-26 1995-08-08 Unisys Corporation Counter malfunction detection using prior, current and predicted parity
KR100346123B1 (ko) * 1999-12-29 2002-08-01 삼성전자 주식회사 데이터 통신 시스템에서 패러티 검사 장치 및 방법
US7020811B2 (en) * 2001-04-24 2006-03-28 Sun Microsystems, Inc. System and method for verifying error detection/correction logic
JP4090988B2 (ja) * 2001-06-01 2008-05-28 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ デジタルシステム及び該デジタルシステムのエラー検出方法
JP2006242569A (ja) * 2005-02-28 2006-09-14 Advantest Corp 試験装置、及び試験方法
JP5179726B2 (ja) * 2006-06-27 2013-04-10 マーベル ワールド トレード リミテッド 半導体デバイス
CN102541719A (zh) * 2010-12-24 2012-07-04 鸿富锦精密工业（深圳）有限公司 排除错误观测值的系统及方法
US11374576B1 (en) * 2020-12-30 2022-06-28 Texas Instruments Incorporated Self-diagnostic counter

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3119098A (en) * 1960-10-31 1964-01-21 Ibm Stream editing unit
US3342983A (en) * 1963-06-25 1967-09-19 Ibm Parity checking and parity generating means for binary adders
US3562711A (en) * 1968-07-16 1971-02-09 Ibm Apparatus for detecting circuit malfunctions
US3567916A (en) * 1969-01-22 1971-03-02 Us Army Apparatus for parity checking a binary register
US3911261A (en) * 1974-09-09 1975-10-07 Ibm Parity prediction and checking network

Also Published As

Publication number Publication date
GB1566309A (en) 1980-04-30
JPS5540894B2 (ja) 1980-10-21
DE2659200A1 (de) 1977-07-21
FR2337375B1 (ja) 1980-09-12
FR2337375A1 (fr) 1977-07-29
DE2659200C2 (de) 1982-06-03
US4107649A (en) 1978-08-15

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