JPS5257876A - Fruit flaw identifying apparatus - Google Patents

Fruit flaw identifying apparatus

Info

Publication number
JPS5257876A
JPS5257876A JP13453775A JP13453775A JPS5257876A JP S5257876 A JPS5257876 A JP S5257876A JP 13453775 A JP13453775 A JP 13453775A JP 13453775 A JP13453775 A JP 13453775A JP S5257876 A JPS5257876 A JP S5257876A
Authority
JP
Japan
Prior art keywords
fruit
identifying apparatus
flaw
flaw identifying
flaws
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13453775A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5528011B2 (enrdf_load_html_response
Inventor
Kunihiko Edamatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP13453775A priority Critical patent/JPS5257876A/ja
Publication of JPS5257876A publication Critical patent/JPS5257876A/ja
Publication of JPS5528011B2 publication Critical patent/JPS5528011B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP13453775A 1975-11-07 1975-11-07 Fruit flaw identifying apparatus Granted JPS5257876A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13453775A JPS5257876A (en) 1975-11-07 1975-11-07 Fruit flaw identifying apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13453775A JPS5257876A (en) 1975-11-07 1975-11-07 Fruit flaw identifying apparatus

Publications (2)

Publication Number Publication Date
JPS5257876A true JPS5257876A (en) 1977-05-12
JPS5528011B2 JPS5528011B2 (enrdf_load_html_response) 1980-07-24

Family

ID=15130621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13453775A Granted JPS5257876A (en) 1975-11-07 1975-11-07 Fruit flaw identifying apparatus

Country Status (1)

Country Link
JP (1) JPS5257876A (enrdf_load_html_response)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS552985A (en) * 1978-06-21 1980-01-10 Sunkist Growers Inc Method and device for detecting and measuring surface flaw of article
JPS5682435A (en) * 1979-12-08 1981-07-06 Fuji Electric Co Ltd Defect inspecting apparatus
JPS57196139A (en) * 1981-05-28 1982-12-02 Fuji Electric Co Ltd Processing circuit for defect detecting signal
JPH03226658A (ja) * 1990-02-01 1991-10-07 Iseki & Co Ltd 青果物の傷総面積算出装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS552985A (en) * 1978-06-21 1980-01-10 Sunkist Growers Inc Method and device for detecting and measuring surface flaw of article
JPS6333652A (ja) * 1978-06-21 1988-02-13 サンキスト　グロ−ワ−ズ　インコ−ポレイテツド 物品の表面のきずを検出して測定する方法並びに装置
JPS5682435A (en) * 1979-12-08 1981-07-06 Fuji Electric Co Ltd Defect inspecting apparatus
JPS57196139A (en) * 1981-05-28 1982-12-02 Fuji Electric Co Ltd Processing circuit for defect detecting signal
JPH03226658A (ja) * 1990-02-01 1991-10-07 Iseki & Co Ltd 青果物の傷総面積算出装置

Also Published As

Publication number Publication date
JPS5528011B2 (enrdf_load_html_response) 1980-07-24

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