JPS57196139A - Processing circuit for defect detecting signal - Google Patents

Processing circuit for defect detecting signal

Info

Publication number
JPS57196139A
JPS57196139A JP8012881A JP8012881A JPS57196139A JP S57196139 A JPS57196139 A JP S57196139A JP 8012881 A JP8012881 A JP 8012881A JP 8012881 A JP8012881 A JP 8012881A JP S57196139 A JPS57196139 A JP S57196139A
Authority
JP
Japan
Prior art keywords
signal
scanning period
edge
delayed
theoretical product
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8012881A
Other languages
Japanese (ja)
Other versions
JPS6355654B2 (en
Inventor
Tatsuo Yamamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP8012881A priority Critical patent/JPS57196139A/en
Publication of JPS57196139A publication Critical patent/JPS57196139A/en
Publication of JPS6355654B2 publication Critical patent/JPS6355654B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Abstract

PURPOSE:To detect a size of a defect from a theoretical product output of a first signal, which indicates a period extending from a scanning start of a binary-coded image signal to detection of fall edge and a second signal ranging from an edge of a signal, which is delayed by a full scanning period and is inversed, to completion of a scanning. CONSTITUTION:A shift register 1 is a circuit which delays a binary-coded signal input A by a full scanning period to output it. If an initial rise detecting circuit 3 detects an initial rise edge of a wave-form of the signal intput A, delayed by a full scanning period, it outputs a high-level signal till terminal of a scanning period. A final fall detecting circuit 2 detects a final fall edge (d) of the signal input A to set an amount, being equivalent to a time extending from a start point of a scanning period to the edge (d), in a down counter 4 which outputs a high level till a count zero. Thus, a theoretical product of an inversion output of a signal wave form A, delayed by a full scanning period, and a theoretical product of signal wave-forms B and C are formed in a theoretical product circuit 5, and this permits obtaining of a signal, indicating a size of a defect, in a D.
JP8012881A 1981-05-28 1981-05-28 Processing circuit for defect detecting signal Granted JPS57196139A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8012881A JPS57196139A (en) 1981-05-28 1981-05-28 Processing circuit for defect detecting signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8012881A JPS57196139A (en) 1981-05-28 1981-05-28 Processing circuit for defect detecting signal

Publications (2)

Publication Number Publication Date
JPS57196139A true JPS57196139A (en) 1982-12-02
JPS6355654B2 JPS6355654B2 (en) 1988-11-04

Family

ID=13709575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8012881A Granted JPS57196139A (en) 1981-05-28 1981-05-28 Processing circuit for defect detecting signal

Country Status (1)

Country Link
JP (1) JPS57196139A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5257876A (en) * 1975-11-07 1977-05-12 Fuji Electric Co Ltd Fruit flaw identifying apparatus
JPS55161486A (en) * 1979-05-31 1980-12-16 Fuji Electric Co Ltd Defect detection system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5257876A (en) * 1975-11-07 1977-05-12 Fuji Electric Co Ltd Fruit flaw identifying apparatus
JPS55161486A (en) * 1979-05-31 1980-12-16 Fuji Electric Co Ltd Defect detection system

Also Published As

Publication number Publication date
JPS6355654B2 (en) 1988-11-04

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