JPS5229280A - Flaw detecting machine for seam pipes - Google Patents

Flaw detecting machine for seam pipes

Info

Publication number
JPS5229280A
JPS5229280A JP50105447A JP10544775A JPS5229280A JP S5229280 A JPS5229280 A JP S5229280A JP 50105447 A JP50105447 A JP 50105447A JP 10544775 A JP10544775 A JP 10544775A JP S5229280 A JPS5229280 A JP S5229280A
Authority
JP
Japan
Prior art keywords
detecting machine
flaw detecting
seam pipes
seam
pipes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50105447A
Other languages
Japanese (ja)
Inventor
Katsuyuki Imai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimadzu Seisakusho Ltd
Original Assignee
Shimadzu Corp
Shimadzu Seisakusho Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimadzu Seisakusho Ltd filed Critical Shimadzu Corp
Priority to JP50105447A priority Critical patent/JPS5229280A/en
Publication of JPS5229280A publication Critical patent/JPS5229280A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:Two pieces of reflection type photoelectric detectors are placed parallel under contactless condition to face the surface of the material to be detected, and the probe of the detecting machine is let to follow-up the seam of pipes, whereby accurate detection and flaw searching of the pipe seams can be made.
JP50105447A 1975-08-30 1975-08-30 Flaw detecting machine for seam pipes Pending JPS5229280A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50105447A JPS5229280A (en) 1975-08-30 1975-08-30 Flaw detecting machine for seam pipes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50105447A JPS5229280A (en) 1975-08-30 1975-08-30 Flaw detecting machine for seam pipes

Publications (1)

Publication Number Publication Date
JPS5229280A true JPS5229280A (en) 1977-03-04

Family

ID=14407832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50105447A Pending JPS5229280A (en) 1975-08-30 1975-08-30 Flaw detecting machine for seam pipes

Country Status (1)

Country Link
JP (1) JPS5229280A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5655852A (en) * 1979-10-15 1981-05-16 Nippon Steel Corp Profiling method for flaw-detecting device
JPS57124377U (en) * 1981-01-30 1982-08-03
JPS57139660A (en) * 1981-01-27 1982-08-28 British Steel Corp Non-destructive inspection apparatus
JPS5824856A (en) * 1981-08-05 1983-02-14 Hitachi Zosen Corp Automatic flaw detector
JP2009510419A (en) * 2005-09-27 2009-03-12 シーメンス アクチエンゲゼルシヤフト Measuring apparatus and measuring system for inspecting the surface of a substrate

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5655852A (en) * 1979-10-15 1981-05-16 Nippon Steel Corp Profiling method for flaw-detecting device
JPS57139660A (en) * 1981-01-27 1982-08-28 British Steel Corp Non-destructive inspection apparatus
JPS57124377U (en) * 1981-01-30 1982-08-03
JPS5824856A (en) * 1981-08-05 1983-02-14 Hitachi Zosen Corp Automatic flaw detector
JP2009510419A (en) * 2005-09-27 2009-03-12 シーメンス アクチエンゲゼルシヤフト Measuring apparatus and measuring system for inspecting the surface of a substrate
JP4940242B2 (en) * 2005-09-27 2012-05-30 シーメンス アクチエンゲゼルシヤフト Measuring system for inspecting the surface of a substrate

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