JPS52147488A - X ray spectroscope - Google Patents

X ray spectroscope

Info

Publication number
JPS52147488A
JPS52147488A JP6350776A JP6350776A JPS52147488A JP S52147488 A JPS52147488 A JP S52147488A JP 6350776 A JP6350776 A JP 6350776A JP 6350776 A JP6350776 A JP 6350776A JP S52147488 A JPS52147488 A JP S52147488A
Authority
JP
Japan
Prior art keywords
ray
ray spectroscope
characteristic
neighbourhood
diffracted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6350776A
Other languages
Japanese (ja)
Inventor
Koichi Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6350776A priority Critical patent/JPS52147488A/en
Publication of JPS52147488A publication Critical patent/JPS52147488A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Abstract

PURPOSE:To measure characteristic X ray from measured sample, by carrying out low speed scanning operation only at neighbourhood of spot which gives glancing angle corresponding to wave length of each characteristic X ray to be diffracted.
JP6350776A 1976-06-02 1976-06-02 X ray spectroscope Pending JPS52147488A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6350776A JPS52147488A (en) 1976-06-02 1976-06-02 X ray spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6350776A JPS52147488A (en) 1976-06-02 1976-06-02 X ray spectroscope

Publications (1)

Publication Number Publication Date
JPS52147488A true JPS52147488A (en) 1977-12-07

Family

ID=13231199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6350776A Pending JPS52147488A (en) 1976-06-02 1976-06-02 X ray spectroscope

Country Status (1)

Country Link
JP (1) JPS52147488A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58196446A (en) * 1982-05-11 1983-11-15 Jeol Ltd Analysis employing x-rays microanalyzer
JPS59173738A (en) * 1983-03-23 1984-10-01 Jeol Ltd Electronic spectroscope
WO2013061676A1 (en) * 2011-10-28 2013-05-02 浜松ホトニクス株式会社 X-ray spectrometry detector device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58196446A (en) * 1982-05-11 1983-11-15 Jeol Ltd Analysis employing x-rays microanalyzer
JPS59173738A (en) * 1983-03-23 1984-10-01 Jeol Ltd Electronic spectroscope
WO2013061676A1 (en) * 2011-10-28 2013-05-02 浜松ホトニクス株式会社 X-ray spectrometry detector device
JP2013096750A (en) * 2011-10-28 2013-05-20 Hamamatsu Photonics Kk X-ray spectral detection device

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