JPS5212576A - Wafer washing drying device - Google Patents

Wafer washing drying device

Info

Publication number
JPS5212576A
JPS5212576A JP8832475A JP8832475A JPS5212576A JP S5212576 A JPS5212576 A JP S5212576A JP 8832475 A JP8832475 A JP 8832475A JP 8832475 A JP8832475 A JP 8832475A JP S5212576 A JPS5212576 A JP S5212576A
Authority
JP
Japan
Prior art keywords
drying device
washing drying
wafer washing
wafer
drying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8832475A
Other languages
English (en)
Other versions
JPS5528549B2 (ja
Inventor
Hiroto Nagatomo
Ryoichi Okuda
Hisao Seki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8832475A priority Critical patent/JPS5212576A/ja
Publication of JPS5212576A publication Critical patent/JPS5212576A/ja
Publication of JPS5528549B2 publication Critical patent/JPS5528549B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Cleaning By Liquid Or Steam (AREA)
  • Drying Of Solid Materials (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
JP8832475A 1975-07-21 1975-07-21 Wafer washing drying device Granted JPS5212576A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8832475A JPS5212576A (en) 1975-07-21 1975-07-21 Wafer washing drying device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8832475A JPS5212576A (en) 1975-07-21 1975-07-21 Wafer washing drying device

Publications (2)

Publication Number Publication Date
JPS5212576A true JPS5212576A (en) 1977-01-31
JPS5528549B2 JPS5528549B2 (ja) 1980-07-29

Family

ID=13939712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8832475A Granted JPS5212576A (en) 1975-07-21 1975-07-21 Wafer washing drying device

Country Status (1)

Country Link
JP (1) JPS5212576A (ja)

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5669830A (en) * 1979-11-13 1981-06-11 Nec Kyushu Ltd Photo resist processing device for semiconductor device
WO1984004583A1 (en) * 1980-04-23 1984-11-22 Seiichiro Aigoo Dryer
JPS62166524A (ja) * 1986-01-20 1987-07-23 Mitsubishi Electric Corp 遠心脱水機
US4750505A (en) * 1985-04-26 1988-06-14 Dainippon Screen Mfg. Co., Ltd. Apparatus for processing wafers and the like
US5224504A (en) * 1988-05-25 1993-07-06 Semitool, Inc. Single wafer processor
US5224503A (en) * 1992-06-15 1993-07-06 Semitool, Inc. Centrifugal wafer carrier cleaning apparatus
WO1999046065A1 (en) * 1998-03-13 1999-09-16 Semitool, Inc. Micro-environment reactor for processing a microelectronic workpiece
US6264752B1 (en) 1998-03-13 2001-07-24 Gary L. Curtis Reactor for processing a microelectronic workpiece
US6318385B1 (en) 1998-03-13 2001-11-20 Semitool, Inc. Micro-environment chamber and system for rinsing and drying a semiconductor workpiece
US6350319B1 (en) 1998-03-13 2002-02-26 Semitool, Inc. Micro-environment reactor for processing a workpiece
US6413436B1 (en) 1999-01-27 2002-07-02 Semitool, Inc. Selective treatment of the surface of a microelectronic workpiece
US6423642B1 (en) 1998-03-13 2002-07-23 Semitool, Inc. Reactor for processing a semiconductor wafer
US6432214B2 (en) 1998-07-10 2002-08-13 Semitool, Inc. Cleaning apparatus
US6492284B2 (en) 1999-01-22 2002-12-10 Semitool, Inc. Reactor for processing a workpiece using sonic energy
US6505634B2 (en) * 2001-03-23 2003-01-14 Will Be S & T Co., Ltd. Semiconductor wafer cleaning apparatus
US6511914B2 (en) 1999-01-22 2003-01-28 Semitool, Inc. Reactor for processing a workpiece using sonic energy
US6543156B2 (en) 2000-01-12 2003-04-08 Semitool, Inc. Method and apparatus for high-pressure wafer processing and drying
US6548411B2 (en) 1999-01-22 2003-04-15 Semitool, Inc. Apparatus and methods for processing a workpiece
US6632292B1 (en) 1998-03-13 2003-10-14 Semitool, Inc. Selective treatment of microelectronic workpiece surfaces
US6680253B2 (en) 1999-01-22 2004-01-20 Semitool, Inc. Apparatus for processing a workpiece
US6792959B2 (en) * 2001-05-30 2004-09-21 S.E.S. Company Limited Single wafer type cleaning method and apparatus
US7217325B2 (en) 1999-01-22 2007-05-15 Semitool, Inc. System for processing a workpiece
CN110369393A (zh) * 2019-08-13 2019-10-25 安徽晶天新能源科技有限责任公司 一种硅片生产用超声波清洗机
JP2020134495A (ja) * 2019-02-26 2020-08-31 エスペック株式会社 環境試験装置及び試験装置

Cited By (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5669830A (en) * 1979-11-13 1981-06-11 Nec Kyushu Ltd Photo resist processing device for semiconductor device
WO1984004583A1 (en) * 1980-04-23 1984-11-22 Seiichiro Aigoo Dryer
US4750505A (en) * 1985-04-26 1988-06-14 Dainippon Screen Mfg. Co., Ltd. Apparatus for processing wafers and the like
JPS62166524A (ja) * 1986-01-20 1987-07-23 Mitsubishi Electric Corp 遠心脱水機
US5224504A (en) * 1988-05-25 1993-07-06 Semitool, Inc. Single wafer processor
US5224503A (en) * 1992-06-15 1993-07-06 Semitool, Inc. Centrifugal wafer carrier cleaning apparatus
US5562113A (en) * 1992-06-15 1996-10-08 Semitool, Inc. Centrifugal wafer carrier cleaning apparatus
US5738128A (en) * 1992-06-15 1998-04-14 Semitool, Inc. Centrifugal wafer carrier cleaning apparatus
US6447633B1 (en) 1998-03-13 2002-09-10 Semitdol, Inc. Reactor for processing a semiconductor wafer
US6446643B2 (en) 1998-03-13 2002-09-10 Semitool, Inc. Micro-environment chamber and system for rinsing and drying a semiconductor workpiece
US6318385B1 (en) 1998-03-13 2001-11-20 Semitool, Inc. Micro-environment chamber and system for rinsing and drying a semiconductor workpiece
US6350319B1 (en) 1998-03-13 2002-02-26 Semitool, Inc. Micro-environment reactor for processing a workpiece
US6997988B2 (en) 1998-03-13 2006-02-14 Semitool, Inc. System for processing a workpiece
US6423642B1 (en) 1998-03-13 2002-07-23 Semitool, Inc. Reactor for processing a semiconductor wafer
US6632292B1 (en) 1998-03-13 2003-10-14 Semitool, Inc. Selective treatment of microelectronic workpiece surfaces
US6558470B2 (en) 1998-03-13 2003-05-06 Semitool, Inc. Reactor for processing a microelectronic workpiece
WO1999046065A1 (en) * 1998-03-13 1999-09-16 Semitool, Inc. Micro-environment reactor for processing a microelectronic workpiece
US6695914B2 (en) 1998-03-13 2004-02-24 Semitool, Inc. System for processing a workpiece
US6494956B2 (en) 1998-03-13 2002-12-17 Semitool, Inc. System for processing a workpiece
US6264752B1 (en) 1998-03-13 2001-07-24 Gary L. Curtis Reactor for processing a microelectronic workpiece
US6666922B2 (en) 1998-03-13 2003-12-23 Semitool, Inc. System for processing a workpiece
US6660098B2 (en) 1998-03-13 2003-12-09 Semitool, Inc. System for processing a workpiece
US6432214B2 (en) 1998-07-10 2002-08-13 Semitool, Inc. Cleaning apparatus
US6680253B2 (en) 1999-01-22 2004-01-20 Semitool, Inc. Apparatus for processing a workpiece
US6548411B2 (en) 1999-01-22 2003-04-15 Semitool, Inc. Apparatus and methods for processing a workpiece
US6511914B2 (en) 1999-01-22 2003-01-28 Semitool, Inc. Reactor for processing a workpiece using sonic energy
US6492284B2 (en) 1999-01-22 2002-12-10 Semitool, Inc. Reactor for processing a workpiece using sonic energy
US7217325B2 (en) 1999-01-22 2007-05-15 Semitool, Inc. System for processing a workpiece
US6413436B1 (en) 1999-01-27 2002-07-02 Semitool, Inc. Selective treatment of the surface of a microelectronic workpiece
US6543156B2 (en) 2000-01-12 2003-04-08 Semitool, Inc. Method and apparatus for high-pressure wafer processing and drying
US6505634B2 (en) * 2001-03-23 2003-01-14 Will Be S & T Co., Ltd. Semiconductor wafer cleaning apparatus
US6792959B2 (en) * 2001-05-30 2004-09-21 S.E.S. Company Limited Single wafer type cleaning method and apparatus
JP2020134495A (ja) * 2019-02-26 2020-08-31 エスペック株式会社 環境試験装置及び試験装置
CN110369393A (zh) * 2019-08-13 2019-10-25 安徽晶天新能源科技有限责任公司 一种硅片生产用超声波清洗机
CN110369393B (zh) * 2019-08-13 2021-04-06 安徽晶天新能源科技有限责任公司 一种硅片生产用超声波清洗机

Also Published As

Publication number Publication date
JPS5528549B2 (ja) 1980-07-29

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