JPS52113792A - Method of detecting defects of moving belt - Google Patents

Method of detecting defects of moving belt

Info

Publication number
JPS52113792A
JPS52113792A JP2940577A JP2940577A JPS52113792A JP S52113792 A JPS52113792 A JP S52113792A JP 2940577 A JP2940577 A JP 2940577A JP 2940577 A JP2940577 A JP 2940577A JP S52113792 A JPS52113792 A JP S52113792A
Authority
JP
Japan
Prior art keywords
moving belt
detecting defects
defects
detecting
belt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2940577A
Other languages
English (en)
Inventor
Yoahimu Kurain Hansu
Rupurehito Manfuretsuto
Buoneberuku Haintsu
Gaigeru Yuriusu
Maaza Giyunteru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agfa Gevaert AG
Original Assignee
Agfa Gevaert AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agfa Gevaert AG filed Critical Agfa Gevaert AG
Publication of JPS52113792A publication Critical patent/JPS52113792A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2940577A 1976-03-18 1977-03-18 Method of detecting defects of moving belt Pending JPS52113792A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2611539A DE2611539C3 (de) 1976-03-18 1976-03-18 Verfahren zum Erkennen und Orten von sich in Längsrichtung einer laufenden Materialbahn erstreckenden Fehlern

Publications (1)

Publication Number Publication Date
JPS52113792A true JPS52113792A (en) 1977-09-24

Family

ID=5972835

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2940577A Pending JPS52113792A (en) 1976-03-18 1977-03-18 Method of detecting defects of moving belt

Country Status (6)

Country Link
US (1) US4118127A (ja)
JP (1) JPS52113792A (ja)
BE (1) BE852084A (ja)
DE (1) DE2611539C3 (ja)
FR (1) FR2344830A1 (ja)
GB (1) GB1575093A (ja)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS582625B2 (ja) * 1978-08-31 1983-01-18 ティーディーケイ株式会社 ドロップアウト位置マ−キング装置
US4323311A (en) * 1979-05-11 1982-04-06 Sira Institute Limited Apparatus and method for detecting holes in sheet material
US4286880A (en) * 1979-07-30 1981-09-01 The Bendix Corporation Scanning light beam lumber defect position system and method of using same
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
EP0056416A1 (en) * 1980-07-24 1982-07-28 Labsystems Oy Method and apparatus for the measurement of the properties of an agglutination
DE3212438C2 (de) * 1982-04-02 1984-10-25 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Verfahren zur Auswertung der analogen elektrischen Ausgangssignale einer photoelektrischen Lichtempfangsvorrichtung in optischen Bahnabtastvorrichtungen
GB2125538A (en) * 1982-08-10 1984-03-07 Glaverbel Detecting sheet markings
JPH0643901Y2 (ja) * 1983-03-15 1994-11-14 パイオニア株式会社 汚れ検出表示機能を備えた光学式情報読取装置
EP0123929B1 (de) * 1983-04-22 1988-06-22 Erwin Sick GmbH Optik-Elektronik Fehlerfeststellungsvorrichtung
DE3408106A1 (de) * 1984-03-05 1985-09-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optischer rauheits-scanner
US5068799A (en) * 1985-04-24 1991-11-26 Jarrett Jr Harold M System and method for detecting flaws in continuous web materials
DE3534018A1 (de) * 1985-09-24 1987-04-02 Sick Optik Elektronik Erwin Optische bahnueberwachungsvorrichtung
SE456532B (sv) * 1985-10-18 1988-10-10 Asea Ab Arrangemang for ytavsokning av ett provobjekt
DE3701267A1 (de) * 1987-01-17 1988-07-28 Achenbach Buschhuetten Gmbh Planheitsmesseinrichtung fuer bandfoermiges walzgut
JPH01143945A (ja) * 1987-11-30 1989-06-06 Fuji Photo Film Co Ltd テープ欠陥検出方法
DE3816392A1 (de) * 1988-05-13 1989-11-23 Ver Glaswerke Gmbh Verfahren zur bestimmung der optischen qualitaet von flachglas oder flachglasprodukten
DE3819183A1 (de) * 1988-06-06 1989-12-07 Sick Optik Elektronik Erwin Verfahren zur fehlererkennung bei laufenden materialbahnen
US5589940A (en) * 1994-12-21 1996-12-31 Hughes Electronics Apparatus for measuring the curvature of a surface using moveable reflecting and focusing elements
EP0816825A3 (en) * 1996-06-26 1998-08-12 Toshiba Engineering Corporation Method and apparatus for inspecting streak
JP3373367B2 (ja) * 1996-08-09 2003-02-04 松下電器産業株式会社 ３次元計測装置及び３次元計測方法
DE10019274C1 (de) * 2000-04-19 2001-08-09 Agfa Gevaert Ag Verfahren und Vorrichtung zur Visualisierung von Oberflächenfehlern einer Filmbahn
CN105606622B (zh) * 2016-03-21 2019-09-03 广州视源电子科技股份有限公司 一种aoi图像采集方法和装置
CN113752090B (zh) * 2021-07-15 2023-04-07 德铧恩特工业自动化技术(上海)有限公司 切断机中缺陷工件移出切断位置的判断方法及系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL259070A (ja) * 1959-12-22
NL279098A (ja) * 1961-05-31
US3510664A (en) * 1968-01-08 1970-05-05 Gaf Corp Automatic laser beam scanning film flaw detector
JPS5213952B2 (ja) * 1972-07-31 1977-04-18
US3958128A (en) * 1973-09-28 1976-05-18 Kawasaki Steel Corporation System for determining a transversal position of any defect in a traveling sheet material
US3972624A (en) * 1973-12-20 1976-08-03 Agfa-Gevaert, A.G. Process and apparatus for detecting longitudinal faults on moving webs of material
US4011457A (en) * 1975-08-06 1977-03-08 E. I. Du Pont De Nemours And Company Web defect monitor for abrupt changes in web density

Also Published As

Publication number Publication date
FR2344830A1 (fr) 1977-10-14
DE2611539B2 (de) 1979-06-13
US4118127A (en) 1978-10-03
BE852084A (nl) 1977-09-05
DE2611539C3 (de) 1982-09-09
FR2344830B1 (ja) 1982-07-02
DE2611539A1 (de) 1977-09-29
GB1575093A (en) 1980-09-17

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