JPS5141863A - - Google Patents

Info

Publication number
JPS5141863A
JPS5141863A JP50097420A JP9742075A JPS5141863A JP S5141863 A JPS5141863 A JP S5141863A JP 50097420 A JP50097420 A JP 50097420A JP 9742075 A JP9742075 A JP 9742075A JP S5141863 A JPS5141863 A JP S5141863A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50097420A
Inventor
Akusu Akin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPS5141863A publication Critical patent/JPS5141863A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
JP50097420A 1974-08-12 1975-08-11 Pending JPS5141863A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/496,385 US3970934A (en) 1974-08-12 1974-08-12 Printed circuit board testing means

Publications (1)

Publication Number Publication Date
JPS5141863A true JPS5141863A (ja) 1976-04-08

Family

ID=23972402

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50097420A Pending JPS5141863A (ja) 1974-08-12 1975-08-11

Country Status (2)

Country Link
US (1) US3970934A (ja)
JP (1) JPS5141863A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59121896U (ja) * 1983-12-08 1984-08-16 富士通株式会社 プリント板試験装置
JPS63196308U (ja) * 1987-06-01 1988-12-16

Families Citing this family (109)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1508884A (en) * 1975-05-17 1978-04-26 Int Computers Ltd Apparatus for testing printed circuit board assemblies
US4063172A (en) * 1976-06-01 1977-12-13 International Business Machines Corporation Multiple site, differential displacement, surface contacting assembly
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
US4225819A (en) * 1978-10-12 1980-09-30 Bell Telephone Laboratories, Incorporated Circuit board contact contamination probe
US4245189A (en) * 1979-06-14 1981-01-13 Upa Technology, Inc. Probe assembly for measuring conductivity of plated through holes
US4232928A (en) * 1979-06-27 1980-11-11 Dit-Mco International Corporation Apparatus employing flexible diaphragm for effecting substantially uniform force, individual couplings with multiple electrical contacts or the like
US4357062A (en) * 1979-12-10 1982-11-02 John Fluke Mfg. Co., Inc. Universal circuit board test fixture
US4288745A (en) * 1980-07-22 1981-09-08 Ostby & Barton Company Printed circuit board testing means
FR2493671A1 (fr) * 1980-10-30 1982-05-07 Everett Charles Inc Decaleur de contacts, appareil d'essai muni d'un decaleur de contacts et procede de fabrication d'un decaleur de contacts
US4500836A (en) * 1980-10-31 1985-02-19 Pacific Western Systems, Inc. Automatic wafer prober with programmable tester interface
US4531799A (en) * 1982-01-04 1985-07-30 Raytheon Company Electrical connector
US4598246A (en) * 1982-09-08 1986-07-01 Pylon Company, Inc. Printed circuit board tester having a flex and wiping action free vacuum actuated edge connector
FR2559588B1 (fr) * 1984-02-14 1986-09-19 Inf Milit Spatiale Aero Element de test des connexions electriques d'une carte de circuit imprime, dispositif et procedes de test utilisant un tel element
US4636722A (en) * 1984-05-21 1987-01-13 Probe-Rite, Inc. High density probe-head with isolated and shielded transmission lines
US4694245A (en) * 1984-09-07 1987-09-15 Precision Drilling, Inc. Vacuum-actuated top access test probe fixture
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
US4746861A (en) * 1986-08-21 1988-05-24 Tti Testron, Inc. Test fixture for printed circuit board assembly
US4818933A (en) * 1986-10-08 1989-04-04 Hewlett-Packard Company Board fixturing system
US4812754A (en) * 1987-01-07 1989-03-14 Tracy Theodore A Circuit board interfacing apparatus
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
DE8703044U1 (ja) * 1987-02-27 1988-03-31 We-Electronic Gmbh, 3320 Salzgitter, De
DE3778548D1 (de) * 1987-11-09 1992-05-27 Mania Gmbh Adapter fuer eine vorrichtung zur elektronischen pruefung von leiterplatten.
US4985107A (en) * 1988-03-01 1991-01-15 Sci Systems, Inc. Component location device and method for surface-mount printed circuit boards
US4857009A (en) * 1988-07-21 1989-08-15 Hewlett-Packard Company Fixture latching mechanism
US4962356A (en) * 1988-08-19 1990-10-09 Cray Research, Inc. Integrated circuit test socket
US4912400A (en) * 1988-09-13 1990-03-27 Design And Manufacturing Specialties, Inc. Apparatus for testing circuit boards
US4950981A (en) * 1989-04-14 1990-08-21 Tektronix, Inc. Apparatus for testing a circuit board
US5055779A (en) * 1989-06-19 1991-10-08 Hewlett-Packard Company Integrated board testing system
US4968931A (en) * 1989-11-03 1990-11-06 Motorola, Inc. Apparatus and method for burning in integrated circuit wafers
US5008615A (en) * 1989-11-03 1991-04-16 Motorola, Inc. Means and method for testing integrated circuits attached to a leadframe
US5124633A (en) * 1991-01-10 1992-06-23 Electronic Packaging Co. Dual sided printed circuit board test system
US5157325A (en) * 1991-02-15 1992-10-20 Compaq Computer Corporation Compact, wireless apparatus for electrically testing printed circuit boards
DE69109869T2 (de) * 1991-12-06 1995-09-21 Sigmatech Co Ltd Apparat zur Inspektion der inneren Schaltung eines Halbleiters.
US5270641A (en) * 1992-01-22 1993-12-14 Everett Charles Technologies, Inc. Dual side access test fixture
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5530375A (en) * 1992-12-24 1996-06-25 International Business Machines Corporation Method of testing circuits and/or burning-in chips
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts
US5572144A (en) * 1993-02-22 1996-11-05 Seagate Technology Test jig and method for probing a printed circuit board
US5500606A (en) * 1993-09-16 1996-03-19 Compaq Computer Corporation Completely wireless dual-access test fixture
IT1266653B1 (it) * 1993-11-02 1997-01-09 Circuit Line Spa Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati
JPH0883825A (ja) * 1994-09-09 1996-03-26 Tokyo Electron Ltd プローブ装置
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
TW360790B (en) 1996-10-28 1999-06-11 Atg Test Systems Gmbh Printed circuit board test apparatus and method
US5898313A (en) * 1997-03-14 1999-04-27 Cugini; Mario A. Test fixture for two sided circuit boards
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6002264A (en) * 1997-08-19 1999-12-14 Hewlett-Packard Company Interconnect adapter to printed circuit assembly for testing in an operational environment
US6137298A (en) * 1997-12-05 2000-10-24 Compaq Computer Corporation Method and apparatus for clamping land grid array integrated circuit devices
US6411112B1 (en) 1998-02-19 2002-06-25 International Business Machines Corporation Off-axis contact tip and dense packing design for a fine pitch probe
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6333637B1 (en) * 1998-10-09 2001-12-25 International Business Machines Corporation Electronic card assembly fixture
JP2000199780A (ja) * 1998-12-29 2000-07-18 I C T:Kk プリント基板の検査装置
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6255834B1 (en) * 1999-10-21 2001-07-03 Dell Usa, L.P. Test fixture having a floating self-centering connector
US6504378B1 (en) 1999-11-24 2003-01-07 Micron Technology, Inc. Apparatus for evaluating contact pin integrity of electronic components having multiple contact pins
US6469495B1 (en) * 2000-02-23 2002-10-22 Agilent Technologies, Inc. RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options
US6563297B1 (en) * 2000-02-23 2003-05-13 Agilent Technologies, Inc. RF isolation test device having ease of accessibility
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
GB2367369A (en) * 2000-06-06 2002-04-03 Ate Services Ltd A test fixture for testing a printed circuit board
US6483329B1 (en) * 2000-08-28 2002-11-19 Micron Technology, Inc. Test system, test contactor, and test method for electronic modules
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech Inc Wafersonde
US6775146B1 (en) * 2001-02-23 2004-08-10 Bruce Arnold Laminated printed circuit board fixture assembly and method
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
US6836135B2 (en) 2001-08-31 2004-12-28 Cascade Microtech, Inc. Optical testing device
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US7359207B1 (en) 2002-02-20 2008-04-15 Bruce Arnold Laminated printed circuit board fixture assembly and method
KR100864916B1 (ko) 2002-05-23 2008-10-22 캐스케이드 마이크로테크 인코포레이티드 피시험 디바이스를 테스트하기 위한 프로브
FR2842607B1 (fr) * 2002-07-17 2005-05-27 And Elec "dispositif de controle de cartes electroniques a presse amovible et interface adaptee"
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US6822468B2 (en) * 2003-03-20 2004-11-23 International Business Machines Corporation Method and apparatus for implementing printed circuit board high potential testing to identify latent defects
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7852096B2 (en) * 2004-05-18 2010-12-14 Circuit Check Spring-loaded, removable test fixture for circuit board testers
WO2005121824A2 (en) 2004-06-07 2005-12-22 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
EP1766426B1 (en) 2004-07-07 2013-09-11 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7339368B2 (en) * 2004-07-21 2008-03-04 Intel Corporation Methods and apparatus for testing circuit boards
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
US7034520B1 (en) * 2005-09-09 2006-04-25 Credence Systems Corporation Integrated circuit tester
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US9306491B2 (en) 2011-05-16 2016-04-05 First Solar, Inc. Electrical test apparatus for a photovoltaic component
US9702906B2 (en) 2015-06-26 2017-07-11 International Business Machines Corporation Non-permanent termination structure for microprobe measurements
CN110346667A (zh) * 2019-07-25 2019-10-18 珠海市运泰利自动化设备有限公司苏州分公司 一种自动插拔测试设备
CN113058883B (zh) * 2021-03-25 2023-09-12 中国电子科技集团公司第三十八研究所 一种多工位集成联动式自动化检测机构
CN116124571B (zh) * 2022-11-18 2024-02-09 北京聚仪共享科技有限公司 一种印制电路板拉脱强度测试仪

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2887622A (en) * 1953-08-07 1959-05-19 Charles C Rayburn Electrical circuit pattern tester
US3016489A (en) * 1959-07-17 1962-01-09 Drexel Dynamics Corp Test jig for contacting circuit card positions
US3654585A (en) * 1970-03-11 1972-04-04 Brooks Research And Mfg Inc Coordinate conversion for the testing of printed circuit boards

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59121896U (ja) * 1983-12-08 1984-08-16 富士通株式会社 プリント板試験装置
JPS6219977Y2 (ja) * 1983-12-08 1987-05-21
JPS63196308U (ja) * 1987-06-01 1988-12-16

Also Published As

Publication number Publication date
US3970934A (en) 1976-07-20

Similar Documents

Publication Publication Date Title
FR2266468B3 (ja)
CH574144A5 (ja)
BG19894A1 (ja)
BG19998A1 (ja)
BG20662A1 (ja)
BG20740A1 (ja)
BG21048A1 (ja)
BG21057A1 (ja)
BG21058A1 (ja)
BG21494A1 (ja)
BG21743A1 (ja)
BG22604A1 (ja)
BG26362A3 (ja)
BG26385A4 (ja)
BG26508A3 (ja)
BE828550A (ja)
BG27076A3 (ja)
CH17274A4 (ja)
CH281474A4 (ja)
CH539175A4 (ja)
CH561530A5 (ja)
CH56174A4 (ja)
CH564649A5 (ja)
CH565903A5 (ja)
CH566447A5 (ja)