JPS51123684A - A long wave fluorescent x-ray analyzer - Google Patents
A long wave fluorescent x-ray analyzerInfo
- Publication number
- JPS51123684A JPS51123684A JP50047522A JP4752275A JPS51123684A JP S51123684 A JPS51123684 A JP S51123684A JP 50047522 A JP50047522 A JP 50047522A JP 4752275 A JP4752275 A JP 4752275A JP S51123684 A JPS51123684 A JP S51123684A
- Authority
- JP
- Japan
- Prior art keywords
- long wave
- ray analyzer
- ray
- wave fluorescent
- fluorescent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:A long wave fluoresvent X-ray analyzer which has improved its sensitivity by reducing the influence of primary X-ray dispersion as well as enabling the measurement of weak fluorescent X-ray.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50047522A JPS51123684A (en) | 1975-04-21 | 1975-04-21 | A long wave fluorescent x-ray analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50047522A JPS51123684A (en) | 1975-04-21 | 1975-04-21 | A long wave fluorescent x-ray analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51123684A true JPS51123684A (en) | 1976-10-28 |
Family
ID=12777438
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50047522A Pending JPS51123684A (en) | 1975-04-21 | 1975-04-21 | A long wave fluorescent x-ray analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51123684A (en) |
-
1975
- 1975-04-21 JP JP50047522A patent/JPS51123684A/en active Pending
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