JPS5326195A - Fluorescent x-ray analyzer - Google Patents

Fluorescent x-ray analyzer

Info

Publication number
JPS5326195A
JPS5326195A JP10093276A JP10093276A JPS5326195A JP S5326195 A JPS5326195 A JP S5326195A JP 10093276 A JP10093276 A JP 10093276A JP 10093276 A JP10093276 A JP 10093276A JP S5326195 A JPS5326195 A JP S5326195A
Authority
JP
Japan
Prior art keywords
fluorescent
ray analyzer
sensitivity
accuracy
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10093276A
Other languages
Japanese (ja)
Inventor
Tsukasa Tanoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10093276A priority Critical patent/JPS5326195A/en
Publication of JPS5326195A publication Critical patent/JPS5326195A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To reduce size and weight and improve the accuracy and sensitivity of analysis by using an X-ray tube as a radiation source and a small size generator as a power source.
JP10093276A 1976-08-24 1976-08-24 Fluorescent x-ray analyzer Pending JPS5326195A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10093276A JPS5326195A (en) 1976-08-24 1976-08-24 Fluorescent x-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10093276A JPS5326195A (en) 1976-08-24 1976-08-24 Fluorescent x-ray analyzer

Publications (1)

Publication Number Publication Date
JPS5326195A true JPS5326195A (en) 1978-03-10

Family

ID=14287112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10093276A Pending JPS5326195A (en) 1976-08-24 1976-08-24 Fluorescent x-ray analyzer

Country Status (1)

Country Link
JP (1) JPS5326195A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6453008U (en) * 1987-09-28 1989-03-31

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6453008U (en) * 1987-09-28 1989-03-31

Similar Documents

Publication Publication Date Title
JPS5326195A (en) Fluorescent x-ray analyzer
JPS5331188A (en) Measuring method for x-ray stress inside of tube
JPS52146688A (en) Fluorescent x ray analyzer
JPS545778A (en) Gas density analyzer
JPS5289984A (en) Method of testing arccshaped piece by radiation
JPS52104289A (en) Atomic spectrum generator
JPS5425862A (en) Inside diameter measuring device
JPS5419122A (en) Fryback transformer
JPS53119089A (en) Self output type neutron detector
JPS5425889A (en) Atomic absorption analysis apparatus
JPS5216293A (en) Cooling equipment of photomultiplier for detection chemical radiation
JPS533884A (en) Stress measuring apparatus x-ray
JPS5423373A (en) Photoelectric converter
JPS5224585A (en) X-ray analysis apparatus
JPS5430068A (en) Load cell balance
JPS5298587A (en) Atomic spectrum generating discharge tube
JPS5396783A (en) Semiconductor radiation detector
JPS5240190A (en) X-ray analysis device
JPS53139591A (en) Radiation measuring apparatus
JPS5327091A (en) White x-ray analyzer
JPS5396788A (en) Semiconductor radiation detector
JPS543594A (en) Solid surface element analyzer
JPS5226270A (en) Ultraviolet ray intensity measuring apparatus
JPS53134491A (en) Tester for oxygen concentration detector
JPS53142295A (en) Fluorescent x-ray analyzer