JPS502588A - - Google Patents

Info

Publication number
JPS502588A
JPS502588A JP49027790A JP2779074A JPS502588A JP S502588 A JPS502588 A JP S502588A JP 49027790 A JP49027790 A JP 49027790A JP 2779074 A JP2779074 A JP 2779074A JP S502588 A JPS502588 A JP S502588A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP49027790A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS502588A publication Critical patent/JPS502588A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP49027790A 1973-03-13 1974-03-12 Pending JPS502588A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2312507A DE2312507A1 (de) 1973-03-13 1973-03-13 Geraet fuer roentgenbeugungsmessungen mittels weisser roentgenstrahlen

Publications (1)

Publication Number Publication Date
JPS502588A true JPS502588A (ja) 1975-01-11

Family

ID=5874653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49027790A Pending JPS502588A (ja) 1973-03-13 1974-03-12

Country Status (3)

Country Link
US (1) US3903415A (ja)
JP (1) JPS502588A (ja)
DE (1) DE2312507A1 (ja)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1004375A (en) * 1975-02-28 1977-01-25 Gabrielle Donnay Resolving cone-axis camera
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
US4247771A (en) * 1979-10-09 1981-01-27 Karl M. Kadish Parafocusing diffractometer
DE3120567A1 (de) * 1981-05-23 1983-01-20 Philips Patentverwaltung Gmbh, 2000 Hamburg Streustrahlen-untersuchungsanordnung
EP0383752B1 (en) * 1987-10-16 1994-05-11 EASTMAN KODAK COMPANY (a New Jersey corporation) Powder diffraction method and apparatus
DE3909147A1 (de) * 1988-09-22 1990-09-27 Philips Patentverwaltung Anordnung zur messung des impulsuebertrages
US5142219A (en) * 1991-05-01 1992-08-25 Winbond Electronics North America Corporation Switchable current-reference voltage generator
DE59308726D1 (de) * 1992-02-06 1998-08-13 Philips Patentverwaltung Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten
GB9519687D0 (en) * 1995-09-27 1995-11-29 Schlumberger Ltd Method of determining earth formation characteristics
GB9816687D0 (en) * 1998-07-30 1998-09-30 Gersan Ets Examining the orientation of the lattice of a crystal
FR2833081B1 (fr) * 2001-11-30 2004-05-07 Centre Nat Rech Scient Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de pieces
US7164533B2 (en) 2003-01-22 2007-01-16 Cyvera Corporation Hybrid random bead/chip based microarray
US7619819B2 (en) 2002-08-20 2009-11-17 Illumina, Inc. Method and apparatus for drug product tracking using encoded optical identification elements
US7900836B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Optical reader system for substrates having an optically readable code
US7872804B2 (en) 2002-08-20 2011-01-18 Illumina, Inc. Encoded particle having a grating with variations in the refractive index
US7923260B2 (en) * 2002-08-20 2011-04-12 Illumina, Inc. Method of reading encoded particles
US7508608B2 (en) 2004-11-17 2009-03-24 Illumina, Inc. Lithographically fabricated holographic optical identification element
US20100255603A9 (en) 2002-09-12 2010-10-07 Putnam Martin A Method and apparatus for aligning microbeads in order to interrogate the same
US7092160B2 (en) 2002-09-12 2006-08-15 Illumina, Inc. Method of manufacturing of diffraction grating-based optical identification element
US7433123B2 (en) * 2004-02-19 2008-10-07 Illumina, Inc. Optical identification element having non-waveguide photosensitive substrate with diffraction grating therein
CN100485373C (zh) * 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法
WO2006055735A2 (en) 2004-11-16 2006-05-26 Illumina, Inc Scanner having spatial light modulator
US7604173B2 (en) 2004-11-16 2009-10-20 Illumina, Inc. Holographically encoded elements for microarray and other tagging labeling applications, and method and apparatus for making and reading the same
WO2006055736A1 (en) 2004-11-16 2006-05-26 Illumina, Inc. And methods and apparatus for reading coded microbeads
US20060134324A1 (en) * 2004-11-17 2006-06-22 Illumina, Inc. Filament with easily removed protective coating and methods for stripping the same
US7623624B2 (en) * 2005-11-22 2009-11-24 Illumina, Inc. Method and apparatus for labeling using optical identification elements characterized by X-ray diffraction
EP2909611B1 (en) 2012-10-18 2016-04-13 Carl Zeiss X-Ray Microscopy, Inc. Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilities
US9222900B2 (en) 2013-03-05 2015-12-29 Danmarks Tekniske Universitet Of Anker Engelundsvej X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
EP2775295B8 (en) 2013-03-05 2016-05-18 Danmarks Tekniske Universitet An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus.
US9222901B2 (en) 2013-03-05 2015-12-29 Danmarks Tekniske Universitet Anker Engelundsvej X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
WO2020051708A1 (en) * 2018-09-14 2020-03-19 Proto Patents Ltd. Ball-mapping system and method of operating the same
SE545585C2 (en) * 2018-10-19 2023-10-31 Commw Scient Ind Res Org An energy dispersive x-ray diffraction analyser having an improved reflection geometry

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805342A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2794127A (en) * 1955-05-20 1957-05-28 J J Magnuire Device for measuring fiber diffraction patterns

Also Published As

Publication number Publication date
US3903415A (en) 1975-09-02
DE2312507A1 (de) 1974-09-26

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