FR2833081B1 - Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de pieces - Google Patents
Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de piecesInfo
- Publication number
- FR2833081B1 FR2833081B1 FR0115523A FR0115523A FR2833081B1 FR 2833081 B1 FR2833081 B1 FR 2833081B1 FR 0115523 A FR0115523 A FR 0115523A FR 0115523 A FR0115523 A FR 0115523A FR 2833081 B1 FR2833081 B1 FR 2833081B1
- Authority
- FR
- France
- Prior art keywords
- parts
- volume analysis
- crystallographic characteristics
- ray volume
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0115523A FR2833081B1 (fr) | 2001-11-30 | 2001-11-30 | Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de pieces |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0115523A FR2833081B1 (fr) | 2001-11-30 | 2001-11-30 | Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de pieces |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2833081A1 FR2833081A1 (fr) | 2003-06-06 |
FR2833081B1 true FR2833081B1 (fr) | 2004-05-07 |
Family
ID=8869981
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0115523A Expired - Fee Related FR2833081B1 (fr) | 2001-11-30 | 2001-11-30 | Procede d'analyse volumique aux rayons x de caracteristiques cristallographiques de pieces |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2833081B1 (fr) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2312507A1 (de) * | 1973-03-13 | 1974-09-26 | Max Planck Gesellschaft | Geraet fuer roentgenbeugungsmessungen mittels weisser roentgenstrahlen |
DE2817742C2 (de) * | 1978-04-22 | 1980-07-24 | Hoesch Werke Ag, 4600 Dortmund | Verfahren und Vorrichtung zum Bestimmen technologischer Kennwerte |
DE3909147A1 (de) * | 1988-09-22 | 1990-09-27 | Philips Patentverwaltung | Anordnung zur messung des impulsuebertrages |
FR2668262B1 (fr) * | 1990-10-23 | 1994-04-01 | Centre Nal Recherc Scientifique | Procede d'analyse aux rayons x de pieces monocristallines. |
US5589690A (en) * | 1995-03-21 | 1996-12-31 | National Institute Of Standards And Technology | Apparatus and method for monitoring casting process |
US6269144B1 (en) * | 1998-03-04 | 2001-07-31 | William P. Dube | Method and apparatus for diffraction measurement using a scanning x-ray source |
-
2001
- 2001-11-30 FR FR0115523A patent/FR2833081B1/fr not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2833081A1 (fr) | 2003-06-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |