JPS5021682A - - Google Patents

Info

Publication number
JPS5021682A
JPS5021682A JP49057239A JP5723974A JPS5021682A JP S5021682 A JPS5021682 A JP S5021682A JP 49057239 A JP49057239 A JP 49057239A JP 5723974 A JP5723974 A JP 5723974A JP S5021682 A JPS5021682 A JP S5021682A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49057239A
Other languages
Japanese (ja)
Other versions
JPS5753663B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5021682A publication Critical patent/JPS5021682A/ja
Publication of JPS5753663B2 publication Critical patent/JPS5753663B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70733Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • G03F7/7075Handling workpieces outside exposure position, e.g. SMIF box
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67784Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks
    • H01L21/6779Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks the workpieces being stored in a carrier, involving loading and unloading
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/139Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP49057239A 1973-05-21 1974-05-21 Expired JPS5753663B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US362447A US3865254A (en) 1973-05-21 1973-05-21 Prealignment system for an optical alignment and exposure instrument

Publications (2)

Publication Number Publication Date
JPS5021682A true JPS5021682A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-03-07
JPS5753663B2 JPS5753663B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1982-11-13

Family

ID=23426159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49057239A Expired JPS5753663B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1973-05-21 1974-05-21

Country Status (5)

Country Link
US (1) US3865254A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5753663B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2423999C3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2230964B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1452704A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52175A (en) * 1975-06-23 1977-01-05 Hitachi Ltd Loader/unloader
JPS5485679A (en) * 1977-12-20 1979-07-07 Canon Inc Wafer aligning unit
JPS5599738A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Automatic conveying equipment for wafer
JPS6014449A (ja) * 1983-06-15 1985-01-25 エスヴィージー・リトグラフィー・システムズ・インコーポレイテッド ウエハ処理機構
JPS60214912A (ja) * 1985-03-11 1985-10-28 株式会社日立製作所 ダイシング装置
JPS60214911A (ja) * 1985-03-11 1985-10-28 株式会社日立製作所 ダイシング装置
JPH01129436A (ja) * 1987-11-16 1989-05-22 Nec Corp 半導体基板処理装置
JPH02292842A (ja) * 1989-05-08 1990-12-04 Toshiba Corp 基板部材処理装置

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4187052A (en) * 1974-08-17 1980-02-05 Hergeth KG. Maschinenfabrik und Apparatebau Method of opening bales
US4047627A (en) * 1974-09-30 1977-09-13 Gca Corporation Mask plate handling method
US3960277A (en) * 1974-09-30 1976-06-01 Flint Alan G Mask plate handling apparatus
US4024944A (en) * 1975-12-24 1977-05-24 Texas Instruments Incorporated Semiconductor slice prealignment system
CA1097770A (en) * 1977-02-28 1981-03-17 Robert L. Judge Controls for semiconductor wafer orientor
FR2416087A1 (fr) * 1978-02-01 1979-08-31 Seita Dispositif automatique de prelevement d'elements formes sur des pieces, en particulier sur des feuilles de tabac
JPS54157478A (en) * 1978-06-01 1979-12-12 Canon Inc Alignment method
US4345836A (en) * 1979-10-22 1982-08-24 Optimetrix Corporation Two-stage wafer prealignment system for an optical alignment and exposure machine
JPS5666036A (en) * 1979-11-05 1981-06-04 Canon Inc Wafer positioner
DD151387A1 (de) 1980-06-02 1981-10-14 Erich Adler Verfahren und vorrichtung zum automatischen transport und zur lageorientierung scheibenfoermiger objekte
US4465416A (en) * 1982-05-17 1984-08-14 The Perkin-Elmer Corporation Wafer handling mechanism
GB2121333B (en) * 1982-06-05 1986-01-22 Service Eng Ltd Trimming ceramic flatware
NL8300220A (nl) * 1983-01-21 1984-08-16 Philips Nv Inrichting voor het stralingslithografisch behandelen van een dun substraat.
US4662811A (en) * 1983-07-25 1987-05-05 Hayden Thomas J Method and apparatus for orienting semiconductor wafers
US4570058A (en) * 1983-10-03 1986-02-11 At&T Technologies, Inc. Method and apparatus for automatically handling and identifying semiconductor wafers
JPS60155358A (ja) * 1984-01-23 1985-08-15 Disco Abrasive Sys Ltd 半導体ウエ−ハの表面を研削する方法及び装置
JPS60158626A (ja) * 1984-01-30 1985-08-20 Canon Inc 半導体露光装置
JPS61208841A (ja) * 1985-03-14 1986-09-17 Sony Corp 半導体ウエハの位置合せ装置
US4794061A (en) * 1985-10-25 1988-12-27 M&T Chemicals Inc. Device for aligning a photomask onto a printed wiring board
US4698284A (en) * 1985-10-25 1987-10-06 M&T Chemicals Inc. Device for aligning a photomask onto a printed wiring board
US4765793A (en) * 1986-02-03 1988-08-23 Proconics International, Inc. Apparatus for aligning circular objects
JP2639459B2 (ja) * 1986-04-28 1997-08-13 バリアン・アソシエイツ・インコーポレイテッド モジューラ半導体ウェーハ移送及び処理装置
US4917556A (en) * 1986-04-28 1990-04-17 Varian Associates, Inc. Modular wafer transport and processing system
US5217550A (en) * 1990-09-28 1993-06-08 Dai Nippon Printing Co., Ltd Alignment transfer method
US6188467B1 (en) * 1997-06-13 2001-02-13 Canon Kabushiki Kaisha Method and apparatus for fabricating semiconductor devices
CN1238882C (zh) * 1998-12-02 2006-01-25 纽波特公司 试片夹持机械手末端执行器
EP1052548B1 (en) * 1999-04-21 2005-06-08 ASML Netherlands B.V. Lithographic projection apparatus
TW513617B (en) 1999-04-21 2002-12-11 Asml Corp Lithographic projection apparatus and method of manufacturing a device using a lithographic projection apparatus
EP1052546B1 (en) * 1999-04-21 2004-09-15 ASML Netherlands B.V. Substrate handler for use in lithographic projection apparatus
US6357996B2 (en) * 1999-05-14 2002-03-19 Newport Corporation Edge gripping specimen prealigner
US6676365B2 (en) * 2001-03-16 2004-01-13 Toda Kogyo Corporation Air track conveyor system for disk production
US6612418B2 (en) * 2002-01-14 2003-09-02 General Mills, Inc. System for use in an assembly line
US7037063B2 (en) * 2002-04-18 2006-05-02 Display Manufacturing Services Co., Ltd. Substrate floating apparatus and method of manufacturing liquid crystal display apparatus using the same
US7389622B2 (en) * 2003-01-13 2008-06-24 General Mills, Inc. System for use in an assembly line
KR100956348B1 (ko) * 2003-09-05 2010-05-06 삼성전자주식회사 인라인 반송 시스템
US8834073B2 (en) * 2010-10-29 2014-09-16 Corning Incorporated Transport apparatus having a measuring system and methods therefor
US9889995B1 (en) * 2017-03-15 2018-02-13 Core Flow Ltd. Noncontact support platform with blockage detection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3109530A (en) * 1960-11-02 1963-11-05 Ass Elect Ind Means for orienting valve bases and similar components
US3198311A (en) * 1962-09-24 1965-08-03 Western Electric Co Apparatus for transferring and orienting articles
US3220331A (en) * 1965-01-27 1965-11-30 Kulicke And Soffa Mfg Company Contact printing mask alignment apparatus for semiconductor wafer geometry
US3490846A (en) * 1967-06-01 1970-01-20 Kasper Instruments Optical alignment and exposure apparatus
US3552584A (en) * 1968-01-03 1971-01-05 Hamco Machine And Electronics Work handling device
US3521953A (en) * 1968-03-13 1970-07-28 Kulicke & Soffa Ind Inc Adjustable separation wafer clamp

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52175A (en) * 1975-06-23 1977-01-05 Hitachi Ltd Loader/unloader
JPS5485679A (en) * 1977-12-20 1979-07-07 Canon Inc Wafer aligning unit
JPS5599738A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Automatic conveying equipment for wafer
JPS6014449A (ja) * 1983-06-15 1985-01-25 エスヴィージー・リトグラフィー・システムズ・インコーポレイテッド ウエハ処理機構
JPS60214912A (ja) * 1985-03-11 1985-10-28 株式会社日立製作所 ダイシング装置
JPS60214911A (ja) * 1985-03-11 1985-10-28 株式会社日立製作所 ダイシング装置
JPH01129436A (ja) * 1987-11-16 1989-05-22 Nec Corp 半導体基板処理装置
JPH02292842A (ja) * 1989-05-08 1990-12-04 Toshiba Corp 基板部材処理装置

Also Published As

Publication number Publication date
DE2423999B2 (de) 1981-01-15
FR2230964B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1976-06-25
DE2423999A1 (de) 1974-12-05
US3865254A (en) 1975-02-11
DE2423999C3 (de) 1981-11-26
FR2230964A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1974-12-20
JPS5753663B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1982-11-13
GB1452704A (en) 1976-10-13

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