JPS50116058A - - Google Patents

Info

Publication number
JPS50116058A
JPS50116058A JP50018446A JP1844675A JPS50116058A JP S50116058 A JPS50116058 A JP S50116058A JP 50018446 A JP50018446 A JP 50018446A JP 1844675 A JP1844675 A JP 1844675A JP S50116058 A JPS50116058 A JP S50116058A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50018446A
Other languages
Japanese (ja)
Other versions
JPS5944582B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS50116058A publication Critical patent/JPS50116058A/ja
Publication of JPS5944582B2 publication Critical patent/JPS5944582B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G10—MUSICAL INSTRUMENTS; ACOUSTICS
    • G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
    • G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
    • G10K11/18—Methods or devices for transmitting, conducting or directing sound
    • G10K11/26—Sound-focusing or directing, e.g. scanning
    • G10K11/30—Sound-focusing or directing, e.g. scanning using refraction, e.g. acoustic lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H3/00—Measuring characteristics of vibrations by using a detector in a fluid
    • G01H3/10—Amplitude; Power
    • G01H3/12—Amplitude; Power by electric means
    • G01H3/125—Amplitude; Power by electric means for representing acoustic field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Multimedia (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Microscoopes, Condenser (AREA)
JP50018446A 1974-02-15 1975-02-15 走査型音波顕微鏡 Expired JPS5944582B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44278274A 1974-02-15 1974-02-15
US442782 1974-02-15

Publications (2)

Publication Number Publication Date
JPS50116058A true JPS50116058A (enrdf_load_html_response) 1975-09-11
JPS5944582B2 JPS5944582B2 (ja) 1984-10-30

Family

ID=23758118

Family Applications (5)

Application Number Title Priority Date Filing Date
JP50018446A Expired JPS5944582B2 (ja) 1974-02-15 1975-02-15 走査型音波顕微鏡
JP58223058A Pending JPS59160754A (ja) 1974-02-15 1983-11-26 走査型音波顕微鏡
JP58223057A Pending JPS6035254A (ja) 1974-02-15 1983-11-26 音波顕微鏡
JP58223059A Pending JPS59160755A (ja) 1974-02-15 1983-11-26 音波顕微鏡
JP58243131A Granted JPS6035255A (ja) 1974-02-15 1983-12-24 走査型音波顕微鏡

Family Applications After (4)

Application Number Title Priority Date Filing Date
JP58223058A Pending JPS59160754A (ja) 1974-02-15 1983-11-26 走査型音波顕微鏡
JP58223057A Pending JPS6035254A (ja) 1974-02-15 1983-11-26 音波顕微鏡
JP58223059A Pending JPS59160755A (ja) 1974-02-15 1983-11-26 音波顕微鏡
JP58243131A Granted JPS6035255A (ja) 1974-02-15 1983-12-24 走査型音波顕微鏡

Country Status (7)

Country Link
JP (5) JPS5944582B2 (enrdf_load_html_response)
AT (1) AT351283B (enrdf_load_html_response)
CA (1) CA1029462A (enrdf_load_html_response)
CH (1) CH581368A5 (enrdf_load_html_response)
DE (1) DE2504988C2 (enrdf_load_html_response)
FR (1) FR2261527B1 (enrdf_load_html_response)
GB (1) GB1503734A (enrdf_load_html_response)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5492794U (enrdf_load_html_response) * 1977-12-14 1979-06-30
JPS56142465U (enrdf_load_html_response) * 1980-03-26 1981-10-27
JPS61280562A (ja) * 1986-06-20 1986-12-11 Hitachi Ltd 超音波顕微鏡
JPS6242068U (enrdf_load_html_response) * 1986-06-25 1987-03-13
CN115307718A (zh) * 2022-08-10 2022-11-08 重庆建安仪器有限责任公司 电磁式宽量程压力波发生器及其使用方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4012950A (en) * 1974-12-12 1977-03-22 The Board Of Trustees Of The Leland Stanford University Method of and apparatus for acoustic imaging
US4030342A (en) * 1975-09-18 1977-06-21 The Board Of Trustees Of Leland Stanford Junior University Acoustic microscope for scanning an object stereo-optically and with dark field imaging
EP0033751B1 (en) * 1980-02-08 1983-06-22 Hitachi, Ltd. Ultrasonic transducer using ultra high frequency
US4434669A (en) 1980-10-08 1984-03-06 National Research Development Corporation Apparatus for transmitting and receiving sound
JPS589063A (ja) * 1981-07-08 1983-01-19 Noritoshi Nakabachi 超音波顕微鏡
JPS6254159A (ja) * 1985-09-03 1987-03-09 Olympus Optical Co Ltd 位相差型超音波顕微鏡
JP2657949B2 (ja) * 1987-04-30 1997-09-30 北海製罐株式会社 管状体の成形装置
DE202006020870U1 (de) 2005-04-11 2010-07-29 Pva Tepla Analytical Systems Gmbh Akustisches Rastermikroskop
DE202006020867U1 (de) 2005-04-11 2010-09-02 Pva Tepla Analytical Systems Gmbh Akustisches Rastermikroskop
DE102006032431B4 (de) * 2006-06-22 2011-12-01 Siltronic Ag Verfahren und Vorrichtung zur Detektion von mechanischen Defekten in einem aus Halbleitermaterial bestehenden Stabstück
SG138524A1 (en) 2006-06-22 2008-01-28 Siltronic Ag Method and apparatus for detection of mechanical defects in an ingot piece composed of semiconductor material
EP2780726A4 (en) 2011-11-18 2015-07-15 Sonix Inc METHOD AND APPARATUS FOR EQUALIZING SIGNAL PATH IN ACOUSTIC SCAN MICROSCOPE
CN111208200B (zh) * 2020-02-28 2020-10-20 北京理工大学 一种Ti-Al系合金药型罩组织一致性检测装置和检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2912853A (en) * 1955-04-18 1959-11-17 Gen Motors Corp Ultrasonic transmission testing method
US3024644A (en) * 1957-01-16 1962-03-13 Univ Illinois Ultrasonic microscope
JPS5237383B2 (enrdf_load_html_response) * 1971-08-06 1977-09-21
US3774717A (en) * 1971-12-27 1973-11-27 Univ Leland Stanford Junior Method of and apparatus for particle detection and identification
US4295078A (en) * 1980-05-12 1981-10-13 Rca Corporation Color television receiver degaussing circuit

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5492794U (enrdf_load_html_response) * 1977-12-14 1979-06-30
JPS56142465U (enrdf_load_html_response) * 1980-03-26 1981-10-27
JPS61280562A (ja) * 1986-06-20 1986-12-11 Hitachi Ltd 超音波顕微鏡
JPS6242068U (enrdf_load_html_response) * 1986-06-25 1987-03-13
CN115307718A (zh) * 2022-08-10 2022-11-08 重庆建安仪器有限责任公司 电磁式宽量程压力波发生器及其使用方法

Also Published As

Publication number Publication date
JPS6035254A (ja) 1985-02-23
JPS59160755A (ja) 1984-09-11
DE2504988A1 (de) 1976-01-08
DE2504988C2 (de) 1984-08-23
JPS59160754A (ja) 1984-09-11
JPS6035255A (ja) 1985-02-23
JPS6224741B2 (enrdf_load_html_response) 1987-05-29
JPS5944582B2 (ja) 1984-10-30
CA1029462A (en) 1978-04-11
ATA100575A (de) 1978-12-15
GB1503734A (en) 1978-03-15
FR2261527A1 (enrdf_load_html_response) 1975-09-12
AT351283B (de) 1979-07-10
FR2261527B1 (enrdf_load_html_response) 1977-07-08
CH581368A5 (enrdf_load_html_response) 1976-10-29

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