JPS4913109B1 - - Google Patents

Info

Publication number
JPS4913109B1
JPS4913109B1 JP45024778A JP2477870A JPS4913109B1 JP S4913109 B1 JPS4913109 B1 JP S4913109B1 JP 45024778 A JP45024778 A JP 45024778A JP 2477870 A JP2477870 A JP 2477870A JP S4913109 B1 JPS4913109 B1 JP S4913109B1
Authority
JP
Japan
Prior art keywords
march
semi
electrode
transistor
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45024778A
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4913109B1 publication Critical patent/JPS4913109B1/ja
Pending legal-status Critical Current

Links

Classifications

    • H10W72/20—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
    • G01R27/205—Measuring contact resistance of connections, e.g. of earth connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00—Subject matter not provided for in other groups of this subclass
    • H10W72/5363—
    • H10W72/5449—
    • H10W72/59—
    • H10W72/884—
    • H10W72/926—
    • H10W72/932—
    • H10W90/753—
    • H10W90/754—

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP45024778A 1969-03-29 1970-03-24 Pending JPS4913109B1 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691916209 DE1916209A1 (de) 1969-03-29 1969-03-29 Halbleiteranordnung

Publications (1)

Publication Number Publication Date
JPS4913109B1 true JPS4913109B1 (enExample) 1974-03-29

Family

ID=5729727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45024778A Pending JPS4913109B1 (enExample) 1969-03-29 1970-03-24

Country Status (3)

Country Link
JP (1) JPS4913109B1 (enExample)
DE (1) DE1916209A1 (enExample)
GB (1) GB1291782A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5526065U (enExample) * 1978-08-09 1980-02-20

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5526065U (enExample) * 1978-08-09 1980-02-20

Also Published As

Publication number Publication date
DE1916209A1 (de) 1970-10-08
GB1291782A (en) 1972-10-04

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