JPS4847394A - - Google Patents

Info

Publication number
JPS4847394A
JPS4847394A JP46080889A JP8088971A JPS4847394A JP S4847394 A JPS4847394 A JP S4847394A JP 46080889 A JP46080889 A JP 46080889A JP 8088971 A JP8088971 A JP 8088971A JP S4847394 A JPS4847394 A JP S4847394A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP46080889A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP46080889A priority Critical patent/JPS4847394A/ja
Publication of JPS4847394A publication Critical patent/JPS4847394A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP46080889A 1971-10-15 1971-10-15 Pending JPS4847394A (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP46080889A JPS4847394A (de) 1971-10-15 1971-10-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP46080889A JPS4847394A (de) 1971-10-15 1971-10-15

Publications (1)

Publication Number Publication Date
JPS4847394A true JPS4847394A (de) 1973-07-05

Family

ID=13730903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP46080889A Pending JPS4847394A (de) 1971-10-15 1971-10-15

Country Status (1)

Country Link
JP (1) JPS4847394A (de)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55104748A (en) * 1979-02-06 1980-08-11 Permelec Electrode Ltd Non dispersion type fluorescence x-ray analyzing device
JP2003526871A (ja) * 1998-05-22 2003-09-09 ユーロ−セルティーク，エス．エイ． 環境走査電子顕微鏡の溶解ステージ
JP2007294365A (ja) * 2006-04-27 2007-11-08 Jeol Ltd 試料検査方法、試料保持体、及び試料検査装置並びに試料検査システム
JP2007292702A (ja) * 2006-04-27 2007-11-08 Jeol Ltd 試料検査装置及び試料検査方法並びに試料検査システム
JP2008153086A (ja) * 2006-12-19 2008-07-03 Jeol Ltd 試料検査装置及び試料検査方法並びに試料検査システム
JP2008180521A (ja) * 2007-01-23 2008-08-07 Jeol Ltd 試料検査装置及び試料検査方法
JP2008210765A (ja) * 2007-01-31 2008-09-11 Jeol Ltd 試料保持体、試料検査装置及び試料検査方法、並びに試料保持体の製造方法
JP2008210715A (ja) * 2007-02-27 2008-09-11 Ebara Corp 荷電粒子線装置及びこれを用いた試料表面観察方法
JP2009158222A (ja) * 2007-12-26 2009-07-16 Jeol Ltd 試料保持体及び観察・検査方法並びに観察・検査装置
JP2009250904A (ja) * 2008-04-10 2009-10-29 Jeol Ltd 検査装置及び検査方法
JP2010521656A (ja) * 2007-03-02 2010-06-24 プロトチップス，インコーポレイテッド 補強フィーチャを有する膜支持体
WO2015044665A1 (en) * 2013-09-25 2015-04-02 Oxford Instruments Nanotechnology Tools Limited X-ray analysis in air

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55104748A (en) * 1979-02-06 1980-08-11 Permelec Electrode Ltd Non dispersion type fluorescence x-ray analyzing device
JP2003526871A (ja) * 1998-05-22 2003-09-09 ユーロ−セルティーク，エス．エイ． 環境走査電子顕微鏡の溶解ステージ
JP2007294365A (ja) * 2006-04-27 2007-11-08 Jeol Ltd 試料検査方法、試料保持体、及び試料検査装置並びに試料検査システム
JP2007292702A (ja) * 2006-04-27 2007-11-08 Jeol Ltd 試料検査装置及び試料検査方法並びに試料検査システム
JP2008153086A (ja) * 2006-12-19 2008-07-03 Jeol Ltd 試料検査装置及び試料検査方法並びに試料検査システム
JP2008180521A (ja) * 2007-01-23 2008-08-07 Jeol Ltd 試料検査装置及び試料検査方法
JP2008210765A (ja) * 2007-01-31 2008-09-11 Jeol Ltd 試料保持体、試料検査装置及び試料検査方法、並びに試料保持体の製造方法
JP2008210715A (ja) * 2007-02-27 2008-09-11 Ebara Corp 荷電粒子線装置及びこれを用いた試料表面観察方法
US9040939B2 (en) 2007-03-02 2015-05-26 Protochips, Inc. Membrane supports with reinforcement features
JP2010521656A (ja) * 2007-03-02 2010-06-24 プロトチップス，インコーポレイテッド 補強フィーチャを有する膜支持体
JP2009158222A (ja) * 2007-12-26 2009-07-16 Jeol Ltd 試料保持体及び観察・検査方法並びに観察・検査装置
JP2009250904A (ja) * 2008-04-10 2009-10-29 Jeol Ltd 検査装置及び検査方法
WO2015044665A1 (en) * 2013-09-25 2015-04-02 Oxford Instruments Nanotechnology Tools Limited X-ray analysis in air
JP2016533612A (ja) * 2013-09-25 2016-10-27 オックスフォード インストルメンツ ナノテクノロジー ツールス リミテッド 空気中でのｘ線分析
US9704688B2 (en) 2013-09-25 2017-07-11 Oxford Instruments Nanotechnology Tools Limited X-ray analysis in air
US10354834B2 (en) 2013-09-25 2019-07-16 Oxford Instruments Nanotechnology Tools Limited X-ray analysis in air

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