JPH1186561A - シングルエンド読み取りデュアルエンド書き込みsramセル - Google Patents

シングルエンド読み取りデュアルエンド書き込みsramセル

Info

Publication number
JPH1186561A
JPH1186561A JP10195181A JP19518198A JPH1186561A JP H1186561 A JPH1186561 A JP H1186561A JP 10195181 A JP10195181 A JP 10195181A JP 19518198 A JP19518198 A JP 19518198A JP H1186561 A JPH1186561 A JP H1186561A
Authority
JP
Japan
Prior art keywords
line
bit line
storage element
read
bit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP10195181A
Other languages
English (en)
Japanese (ja)
Other versions
JPH1186561A5 (enExample
Inventor
Samuel D Naffziger
サミュエル・ディー・ナフジガー
Kevin X Zhang
ケビン・エックス・ツァング
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH1186561A publication Critical patent/JPH1186561A/ja
Publication of JPH1186561A5 publication Critical patent/JPH1186561A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/16Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)
JP10195181A 1997-07-10 1998-07-10 シングルエンド読み取りデュアルエンド書き込みsramセル Withdrawn JPH1186561A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US891173 1997-07-10
US08/891,173 US5815432A (en) 1997-07-10 1997-07-10 Single-ended read, dual-ended write SCRAM cell

Publications (2)

Publication Number Publication Date
JPH1186561A true JPH1186561A (ja) 1999-03-30
JPH1186561A5 JPH1186561A5 (enExample) 2005-10-20

Family

ID=25397742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10195181A Withdrawn JPH1186561A (ja) 1997-07-10 1998-07-10 シングルエンド読み取りデュアルエンド書き込みsramセル

Country Status (4)

Country Link
US (1) US5815432A (enExample)
EP (1) EP0890954B1 (enExample)
JP (1) JPH1186561A (enExample)
DE (1) DE69835399T2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6829179B2 (en) 2002-04-16 2004-12-07 Oki Electric Industry Co., Ltd. Semiconductor storage device having substrate potential control
US6888768B2 (en) 2003-05-29 2005-05-03 Oki Electric Industry Co., Ltd. Semiconductor integrated device
JP2009020993A (ja) * 2007-07-10 2009-01-29 Sony Computer Entertainment Inc Sramセルおよびそれを用いたメモリシステム、メモリ用の評価回路およびメモリセルの制御方法

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6046930A (en) * 1998-09-01 2000-04-04 International Business Machines Corporation Memory array and method for writing data to memory
US6166946A (en) * 2000-01-21 2000-12-26 Hewlett-Packard Company System and method for writing to and reading from a memory cell
JP2002056681A (ja) * 2000-08-09 2002-02-22 Toshiba Corp メモリ装置
US6560160B1 (en) 2000-11-13 2003-05-06 Agilent Technologies, Inc. Multi-port memory that sequences port accesses
US6501688B2 (en) 2001-05-30 2002-12-31 Micron Technology, Inc. tRCD margin
US6737685B2 (en) 2002-01-11 2004-05-18 International Business Machines Corporation Compact SRAM cell layout for implementing one-port or two-port operation
US20040013946A1 (en) 2002-07-15 2004-01-22 Ube Industries, Ltd. Non-aqueous electrolytic solution and lithium battery
US6838723B2 (en) 2002-08-29 2005-01-04 Micron Technology, Inc. Merged MOS-bipolar capacitor memory cell
US7224024B2 (en) * 2002-08-29 2007-05-29 Micron Technology, Inc. Single transistor vertical memory gain cell
US20040090820A1 (en) * 2002-11-08 2004-05-13 Saroj Pathak Low standby power SRAM
US6804142B2 (en) * 2002-11-12 2004-10-12 Micron Technology, Inc. 6F2 3-transistor DRAM gain cell
US7030436B2 (en) * 2002-12-04 2006-04-18 Micron Technology, Inc. Embedded DRAM gain memory cell having MOS transistor body provided with a bi-polar transistor charge injecting means
JP4186768B2 (ja) * 2003-09-16 2008-11-26 沖電気工業株式会社 マルチポート半導体メモリ
US7403640B2 (en) * 2003-10-27 2008-07-22 Hewlett-Packard Development Company, L.P. System and method for employing an object-oriented motion detector to capture images
US7242609B2 (en) * 2005-09-01 2007-07-10 Sony Computer Entertainment Inc. Methods and apparatus for low power SRAM
US20130141997A1 (en) * 2011-12-06 2013-06-06 International Business Machines Corporation Single-ended volatile memory access
US20130141992A1 (en) 2011-12-06 2013-06-06 International Business Machines Corporation Volatile memory access via shared bitlines
US8817562B2 (en) * 2012-07-31 2014-08-26 Freescale Semiconductor, Inc. Devices and methods for controlling memory cell pre-charge operations
US20140104960A1 (en) * 2012-10-15 2014-04-17 Sundar Iyer Methods and Apparatus for Designing and Constructing High-Speed Memory Circuits
US9542995B2 (en) * 2013-08-30 2017-01-10 Manoj Sachdev Threshold voltage mismatch compensation sense-amplifiers for static random access memories with multiple differential inputs
US11011222B2 (en) * 2019-03-06 2021-05-18 Arm Limited Memory structure with bitline strapping
US11955169B2 (en) 2021-03-23 2024-04-09 Qualcomm Incorporated High-speed multi-port memory supporting collision
US11764764B1 (en) * 2022-09-13 2023-09-19 Nanya Technology Corporation Latch device and operation method thereof

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992703A (en) * 1974-10-09 1976-11-16 Rockwell International Corporation Memory output circuit
US5034923A (en) * 1987-09-10 1991-07-23 Motorola, Inc. Static RAM with soft defect detection
EP0473819A1 (en) * 1990-09-05 1992-03-11 International Business Machines Corporation Multiport memory cell
JP3357382B2 (ja) * 1991-05-28 2002-12-16 株式会社日立製作所 多ポートメモリ
US5642325A (en) * 1995-09-27 1997-06-24 Philips Electronics North America Corporation Register file read/write cell
US5699292A (en) * 1996-01-04 1997-12-16 Micron Technology, Inc. SRAM cell employing substantially vertically elongated pull-up resistors

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6829179B2 (en) 2002-04-16 2004-12-07 Oki Electric Industry Co., Ltd. Semiconductor storage device having substrate potential control
US6888768B2 (en) 2003-05-29 2005-05-03 Oki Electric Industry Co., Ltd. Semiconductor integrated device
US7072206B2 (en) 2003-05-29 2006-07-04 Oki Electric Industry Co., Ltd. Semiconductor integrated device
JP2009020993A (ja) * 2007-07-10 2009-01-29 Sony Computer Entertainment Inc Sramセルおよびそれを用いたメモリシステム、メモリ用の評価回路およびメモリセルの制御方法

Also Published As

Publication number Publication date
EP0890954A2 (en) 1999-01-13
DE69835399D1 (de) 2006-09-14
EP0890954A3 (en) 1999-06-16
US5815432A (en) 1998-09-29
DE69835399T2 (de) 2007-01-04
EP0890954B1 (en) 2006-08-02

Similar Documents

Publication Publication Date Title
JPH1186561A (ja) シングルエンド読み取りデュアルエンド書き込みsramセル
US7808854B2 (en) Systems and methods for data transfers between memory cells
US8208314B2 (en) Sequential access memory elements
JP3322412B2 (ja) 半導体メモリ
JP3131987B2 (ja) 改良されたビット線等化装置を有するメモリ
JPH05290581A (ja) プレチャージ用出力ドライバ回路
KR970000882B1 (ko) 반도체 메모리 장치
US7599237B2 (en) Memory device and method for precharging a memory device
US4751680A (en) Bit line equalization in a memory
JP3541179B2 (ja) メモリセルへの書き込みおよびメモリセルからの読み出しを行うためのシステムおよび方法
US6052328A (en) High-speed synchronous write control scheme
US5748556A (en) Tristatable driver for internal data bus lines
KR100349371B1 (ko) 반도체 메모리 장치의 프리페치/리스토어 방법 및 그 회로
US7764557B2 (en) Sense amplifier driving circuit and semiconductor device having the same
US5825715A (en) Method and apparatus for preventing write operations in a memory device
KR20010005097A (ko) 반도체메모리장치의 글로벌데이터버스 프리차지 방법 및 장치
EP0547890A2 (en) A read/write memory with interlocked write control
US8345497B2 (en) Internal bypassing of memory array devices
US20010017794A1 (en) Semiconductor memory device
EP0405411A2 (en) Semiconductor memory having improved data readout scheme
US6188623B1 (en) Voltage differential sensing circuit and methods of using same
US5740121A (en) Synchronous-type memory
EP0547892A2 (en) An integrated circuit with self-biased differential data lines
US5239237A (en) Control circuit having outputs with differing rise and fall times
US7535777B2 (en) Driving signal generator for bit line sense amplifier driver

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050617

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050617

A761 Written withdrawal of application

Free format text: JAPANESE INTERMEDIATE CODE: A761

Effective date: 20070129