JPH1167825A - Method and equipment for mounting semiconductor chip - Google Patents

Method and equipment for mounting semiconductor chip

Info

Publication number
JPH1167825A
JPH1167825A JP9224061A JP22406197A JPH1167825A JP H1167825 A JPH1167825 A JP H1167825A JP 9224061 A JP9224061 A JP 9224061A JP 22406197 A JP22406197 A JP 22406197A JP H1167825 A JPH1167825 A JP H1167825A
Authority
JP
Japan
Prior art keywords
semiconductor chip
film
substrate
heating jig
pressing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9224061A
Other languages
Japanese (ja)
Other versions
JP3369082B2 (en
Inventor
Norio Kainuma
則夫 海沼
Hidehiko Kira
秀彦 吉良
Kenji Koyae
健二 小八重
Naoki Ishikawa
直樹 石川
Satoru Emoto
哲 江本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP22406197A priority Critical patent/JP3369082B2/en
Publication of JPH1167825A publication Critical patent/JPH1167825A/en
Application granted granted Critical
Publication of JP3369082B2 publication Critical patent/JP3369082B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/113Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/1134Stud bumping, i.e. using a wire-bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • H01L2224/83192Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]

Abstract

PROBLEM TO BE SOLVED: To have no effect on the control of pressure application of a pressure heating jig and on positioning, even if an adhesion preventive film is used when mounting a semiconductor chip component on a substrate by a flip-chip mounting method. SOLUTION: A semiconductor chip 20 has bumps, formed by bringing gold balls made by melting the end of a gold wire into pressure contact with pads. When pressure heating this semiconductor chip 20 against a substrate 21 by a pressure heating jig 23, through a resin adhesive and then mounting it on the substrate 21, an adhesion preventive film 27 is supplied between the pressure heating jig 23 and the semiconductor chip 20. At this time, the film 27 is tension- relaxed and received on a backup plate 32 first and then sucked and held by the pressure heating jig 23, and then the semiconductor chip 20 is bonded onto the substrate 21 through the sucked and held film 27.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体チップ実装方
法及び実装装置に関する。詳しくは、半導体チップ部品
を接着剤を挟んで基板に載置し加圧加熱治具により加圧
加熱して実装する場合、加圧加熱治具への接着剤の付着
を防止するためのテープを供給する時に生ずる不具合を
解決した半導体チップ実装方法及び実装装置に関する。
The present invention relates to a semiconductor chip mounting method and a mounting apparatus. Specifically, when a semiconductor chip component is mounted on a substrate with an adhesive interposed therebetween and mounted by pressing and heating with a pressing and heating jig, a tape for preventing adhesion of the adhesive to the pressing and heating jig is used. The present invention relates to a semiconductor chip mounting method and a mounting device which solve the problem that occurs when supplying.

【0002】[0002]

【従来の技術】半導体チップ部品(ベアチップ)を基板
上に直接実装するCOB(CHIPON BOARD)
技術には目的や用途に応じて種々の方式が提案されてお
り、その一つの方式としてフリップチップ実装方式があ
る。この実装方法は、半導体チップ部品と基板との間を
ワイヤを使用することなく、半導体チップ部品を直接基
板に搭載するものであり、ワイヤレスボンディング実装
方式とも呼ばれている。
2. Description of the Related Art COB (CHIPON BOARD) for mounting semiconductor chip parts (bare chips) directly on a substrate
Various methods have been proposed for the technology according to the purpose and application. One of the methods is a flip-chip mounting method. This mounting method directly mounts a semiconductor chip component on a substrate without using wires between the semiconductor chip component and the substrate, and is also called a wireless bonding mounting method.

【0003】従来のフリップチップ実装方式の実装工程
を図4および図5を用いて説明すると、先ず、図4
(a)に示すように、ボンディングツールのキャピラリ
1の中を通した金線(金ワイヤ)2の先端と放電用電極
3との間に高電圧を印加して放電させ、その放電エネル
ギにより図4(b)の如く金線2の先端を溶融させ、そ
の表面張力により金ボール4を形成する。
[0003] The mounting process of the conventional flip-chip mounting method will be described with reference to FIGS. 4 and 5.
As shown in FIG. 1A, a high voltage is applied between a tip of a gold wire (gold wire) 2 passing through a capillary 1 of a bonding tool and a discharge electrode 3 to cause a discharge. 4 (b), the tip of the gold wire 2 is melted, and the gold ball 4 is formed by the surface tension.

【0004】次に、図4(c)に示すように、半導体チ
ップ部品5の表面に形成されている電極パッド6に前記
キャピラリ1により金ボール4を押圧し、同時に超音波
振動を与えて図4(d)の如く金ボール4をパッド6に
圧着する。このとき、キャピラリ1の先端内面に形成さ
れた凹型により金ボール4を塑性変形させて図4(e)
に示すような大径部と小径部よりなる2段形状のバンプ
7を形成する。
Next, as shown in FIG. 4C, the gold ball 4 is pressed by the capillary 1 on the electrode pad 6 formed on the surface of the semiconductor chip component 5, and at the same time, ultrasonic vibration is applied. The gold ball 4 is pressed against the pad 6 as shown in FIG. At this time, the gold ball 4 is plastically deformed by a concave mold formed on the inner surface of the tip of the capillary 1 and FIG.
Then, a two-stage bump 7 composed of a large diameter portion and a small diameter portion as shown in FIG.

【0005】次いで、図4(e)の如く、金線2をクラ
ンパー8によりクランプして上方に引張りバンプ7の上
方で金線2を切断する。このようにして各パッド6にバ
ンプ7を形成したのち、各バンプ7の高さにバラツキが
あるため、図4(f)に示すように、半導体チップ部品
5を裏返し、平面度の良いガラス板9に押圧して各バン
プ7の先端を塑性変形させて高さを揃える。
Next, as shown in FIG. 4E, the gold wire 2 is clamped by a clamper 8 and pulled upward to cut the gold wire 2 above the bump 7. After the bumps 7 are formed on the pads 6 in this manner, since the heights of the bumps 7 vary, the semiconductor chip component 5 is turned over as shown in FIG. 9, the tip of each bump 7 is plastically deformed to make the height uniform.

【0006】次いで、図5(g)の如く、平板上に数ミ
クロンの厚さに塗布した導電性ペースト10にバンプ7
を押し付けて図5(h)の如く、導電性ペースト10を
バンプ7に転写する。この導電性ペースト10は基板上
に半導体チップ部品5を実装した時に、バンプ7と基板
のパッドとの電気的な導通をより確実に行うものであ
り、エポキシ樹脂中に銀のフィラーを多数分散したもの
が使用される。
Next, as shown in FIG. 5 (g), bumps 7 are applied to conductive paste 10 applied on a flat plate to a thickness of several microns.
To transfer the conductive paste 10 to the bumps 7 as shown in FIG. The conductive paste 10 more reliably performs electrical conduction between the bumps 7 and the pads of the substrate when the semiconductor chip component 5 is mounted on the substrate, and a number of silver fillers are dispersed in the epoxy resin. Things are used.

【0007】次いで、この導電性ペースト10を後工程
(樹脂接着工程)で流れ出さないように半硬化させる。
次いで、図5(i)の如く、半導体チップ部品5を搭載
する基板11の所定位置に熱硬化性の樹脂接着剤12を
盛り、基板11の表面に形成されている配線パターンに
接続されたパッド13に半導体チップ部品のバンプ7を
位置合わせして載置し、次いで、図5(j)の如く、半
導体チップ部品5の上から加圧加熱治具14により加圧
・加熱して樹脂接着剤12を硬化させ完成する。
Next, the conductive paste 10 is semi-cured so as not to flow out in a later step (resin bonding step).
Next, as shown in FIG. 5 (i), a thermosetting resin adhesive 12 is applied to a predetermined position of the substrate 11 on which the semiconductor chip component 5 is mounted, and the pads connected to the wiring pattern formed on the surface of the substrate 11 are formed. 13, the bumps 7 of the semiconductor chip component are aligned and placed, and then, as shown in FIG. 12 is cured and completed.

【0008】この場合、樹脂接着剤12が半導体チップ
部品5により押し広げられた際、バンプ7に塗布されて
いる導電性ペースト10と基板11のパッド13との間
に入り込まないように、樹脂接着剤12はバンブ7に塗
布されている導電性ペースト10が基板11のパッド1
3に接するまではバンプ7に到達せず、その到達後に半
導体チップ部品5の端部に到達して該半導体チップ部品
5を密封するようになっている。
In this case, when the resin adhesive 12 is spread out by the semiconductor chip component 5, the resin adhesive 12 is prevented from entering between the conductive paste 10 applied to the bump 7 and the pad 13 of the substrate 11. The conductive paste 10 applied to the bump 7 is applied to the pad 1 of the substrate 11.
The bumps 7 do not reach the bumps 7 until they come into contact with the bumps 3, and then reach the ends of the semiconductor chip components 5 to seal the semiconductor chip components 5.

【0009】[0009]

【発明が解決しようとする課題】上記従来のフリップチ
ップ実装方式においては、図5(j)の如く、半導体チ
ップ部品5の上から加圧加熱治具14により加圧・加熱
して樹脂接着剤12を硬化させる時、樹脂接着材12が
加圧加熱治具14の方へ回り込み半導体チップ部品5に
加圧加熱治具14が接着してしまうことがある。このた
め、図6に示すように半導体チップ部品5と加圧加熱治
具14との間に接着剤貼り付き防止用のフィルム15を
挟んで加圧加熱し接着を防止している。なお、接着剤貼
り付き防止用フィルム15は供給リール16から巻き取
りリール17の間に設けた2個のローラ18,18′間
に張り渡されている。
In the above-mentioned conventional flip chip mounting method, as shown in FIG. 5 (j), the resin adhesive is pressed and heated from above the semiconductor chip component 5 by a pressing and heating jig 14. When the resin 12 is cured, the resin adhesive 12 may move toward the pressing and heating jig 14 and adhere to the semiconductor chip component 5 in some cases. For this reason, as shown in FIG. 6, a film 15 for preventing adhesion of an adhesive is interposed between the semiconductor chip component 5 and the pressing and heating jig 14 to heat under pressure to prevent adhesion. The adhesive sticking prevention film 15 is stretched between two rollers 18 and 18 ′ provided between the supply reel 16 and the take-up reel 17.

【0010】ところが、フィルム15が2個のローラ1
8,18′間に緊張して掛け渡されていると加圧加熱治
具14の加圧にバラツキを生じ正確な加圧制御ができな
くなるという問題がある。このためフィルム15をたる
ませると、フィルム15が基板11上に載置された半導
体チップ部品5に接触し、該半導体チップ部品5を移動
させ、所定の位置に実装できなくなるという問題が生ず
る。
However, the film 15 has two rollers 1
If it is stretched between 8, 18 ', there is a problem in that the pressurization of the pressurizing and heating jig 14 varies, and accurate pressurization control cannot be performed. For this reason, when the film 15 is sagged, the film 15 comes into contact with the semiconductor chip component 5 placed on the substrate 11 and moves the semiconductor chip component 5 to cause a problem that the semiconductor chip component 5 cannot be mounted at a predetermined position.

【0011】本発明は、上記従来の問題点に鑑み、半導
体チップ部品をフリップチップ実装方式で基板に実装す
る時、接着剤貼り付き防止用フィルムを用いても、加圧
加熱治具の加圧制御及び正確な位置決めに影響のない半
導体チップ実装方法及び実装装置を実現することを目的
とする。
The present invention has been made in view of the above-mentioned conventional problems, and when a semiconductor chip component is mounted on a substrate by a flip-chip mounting method, even if a film for preventing sticking of an adhesive is used, the pressure of a pressing and heating jig is reduced. It is an object of the present invention to realize a semiconductor chip mounting method and a mounting device which do not affect control and accurate positioning.

【0012】[0012]

【課題を解決するための手段】本発明の請求項1の発明
の半導体チップ実装方法は、パッド上にバンプが形成さ
れた半導体チップを、基板との間に充填された樹脂接着
剤を介して、加圧加熱治具にて加圧・加熱して基板に搭
載する半導体チップ実装方法において、前記加圧加熱治
具と半導体チップとの間に接着剤貼りつき防止用のフィ
ルムを供給する場合、バックアッププレート上にテンシ
ョンを弛めたフィルムを受け、そのフィルムを加圧加熱
治具で吸着保持し、この吸着保持されたフィルムを介し
て半導体チップを基板にボンデイングすることを特徴と
する。この構成を採ることにより、接着剤貼りつき防止
用のフィルムを弛めたため加圧加熱治具の加圧力に影響
を与えず、また弛めたフィルムはバックアッププレート
で受けるため半導体チップ部品には接触せず、その位置
を乱すことはない。
According to a first aspect of the present invention, there is provided a method of mounting a semiconductor chip, comprising: bonding a semiconductor chip having bumps formed on pads to a substrate via a resin adhesive filled between the semiconductor chip and a substrate. In a semiconductor chip mounting method of mounting on a substrate by pressing and heating with a pressing and heating jig, when supplying a film for preventing adhesive sticking between the pressing and heating jig and the semiconductor chip, The method is characterized in that a film whose tension is loosened is received on a backup plate, the film is sucked and held by a pressure and heating jig, and the semiconductor chip is bonded to a substrate via the sucked and held film. By adopting this configuration, the film for preventing the adhesive from sticking was loosened, so it did not affect the pressing force of the pressurizing and heating jig. Without disturbing its position.

【0013】本発明の請求項2の発明の半導体チップ実
装装置は、パッド上にバンプが形成された半導体チップ
を、基板との間に充填された樹脂接着剤を介して、加圧
加熱治具にて加圧・加熱するフリップチップ方式にて基
板に搭載する場合に加圧加熱治具と半導体チップとの間
に接着剤貼りつき防止用のフィルムを挟む半導体チップ
実装装置であって、加圧加熱治具に真空吸着手段を設け
ると共に、該加圧加熱治具の下方に接着剤貼りつき防止
用のフィルムを支持する手段と、該フィルムの張力を緩
める手段と、該フィルムを下方より支持および退避可能
なバックアッププレートとを設けてなることを特徴とす
る。この構成をとることにより、請求項1と同様な効果
を得ることができる。
According to a second aspect of the present invention, there is provided a semiconductor chip mounting apparatus comprising: a semiconductor chip having a bump formed on a pad; A semiconductor chip mounting device that sandwiches a film for preventing adhesive from sticking between a pressing and heating jig and a semiconductor chip when mounted on a substrate by a flip chip method in which pressure is applied and heated. The heating jig is provided with vacuum suction means, means for supporting a film for preventing adhesive sticking below the pressurizing and heating jig, means for loosening the tension of the film, and supporting and supporting the film from below. A retractable backup plate is provided. With this configuration, the same effect as the first aspect can be obtained.

【0014】[0014]

【発明の実施の形態】図1は本発明の半導体チップ実装
装置の実施の形態を半導体チップ部品および該半導体チ
ップ部品を実装する基板と共に示す図である。同図にお
いて、20は半導体チップ部品、21は該半導体チップ
部品を搭載する基板、22は該基板を載置するステージ
である。
FIG. 1 is a view showing an embodiment of a semiconductor chip mounting apparatus according to the present invention, together with a semiconductor chip component and a substrate on which the semiconductor chip component is mounted. In the figure, 20 is a semiconductor chip component, 21 is a substrate on which the semiconductor chip component is mounted, and 22 is a stage on which the substrate is mounted.

【0015】また、23は半導体チップ部品を加圧・加
熱する加圧加熱治具であり、真空吸着用の孔23aが設
けられ、該孔23aはパイプ24および電磁切り換え弁
25を介して真空ポンプ26に接続されている。また2
7は接着剤貼りつき防止用のフィルムであり、2個のロ
ーラ28,28′により加圧加熱治具23の下方に張り
渡されたている。29はそのフィルム供給リール、30
は巻取リール、31は巻取リール駆動モータである。
Reference numeral 23 denotes a pressurizing and heating jig for pressurizing and heating the semiconductor chip component, which is provided with a hole 23a for vacuum suction, and the hole 23a is connected to a vacuum pump via a pipe 24 and an electromagnetic switching valve 25. 26. Also 2
Reference numeral 7 denotes a film for preventing the adhesive from sticking, and is stretched below the pressing and heating jig 23 by two rollers 28, 28 '. 29 is the film supply reel, 30
Denotes a take-up reel, and 31 denotes a take-up reel drive motor.

【0016】また、32はバックアッププレートであ
り、エアシリンダ又は油圧シリンダ等の移動手段(図は
エアシリンダ33)に支持され、該エアシリンダ33の
エア供給パイプ33a,33bは電磁切り換え弁34を
通り圧縮空気ポンプ35に接続されている。また、前記
電磁切り換え弁25,34および巻取リール駆動モータ
31は制御装置36に電気的に接続されている。
Reference numeral 32 denotes a backup plate, which is supported by moving means (an air cylinder 33 in the figure) such as an air cylinder or a hydraulic cylinder. The air supply pipes 33a and 33b of the air cylinder 33 pass through an electromagnetic switching valve 34. It is connected to a compressed air pump 35. The electromagnetic switching valves 25 and 34 and the take-up reel drive motor 31 are electrically connected to a control device 36.

【0017】このように構成された半導体チップ実装装
置を用いた本発明の半導体チップ実装方法を図2および
図3を用いて説明する。先ず、図2(a)はステージ2
2の上に基板21が載置され、その上にに樹脂接着剤を
介して所定の位置に半導体チップ部品20が載置された
初期の状態である。この状態から図2(b)の如く、制
御装置36はエアシリンダ33を作動させてバックアッ
ププレート32を半導体チップ部品20の上方に移動さ
せる。
A method of mounting a semiconductor chip according to the present invention using the semiconductor chip mounting apparatus thus configured will be described with reference to FIGS. First, FIG.
2 is an initial state in which the substrate 21 is mounted on the substrate 2 and the semiconductor chip component 20 is mounted on the substrate 21 at a predetermined position via a resin adhesive. From this state, as shown in FIG. 2B, the control device 36 operates the air cylinder 33 to move the backup plate 32 above the semiconductor chip component 20.

【0018】次いで、図2(c)の如く、巻取リール駆
動モータ31を逆転(巻き取りと反対方向)させ、接着
剤貼りつき防止用のフィルム27を弛ませる。この弛ま
せられたフィルム27は同図の如く、バックアッププレ
ート32に受け止められ半導体チップ部品20には接触
しない。従って、半導体チップ部品20はフィルム27
により移動させられることはない。
Next, as shown in FIG. 2C, the take-up reel drive motor 31 is rotated in the reverse direction (in the direction opposite to the take-up) to loosen the film 27 for preventing the adhesive from sticking. The loosened film 27 is received by the backup plate 32 and does not contact the semiconductor chip component 20, as shown in FIG. Accordingly, the semiconductor chip component 20 is
Will not be moved.

【0019】次いで、図3(d)の如く、加圧加熱治具
23をバックアッププレート32まで降下させ、同時に
電磁切り換え弁25を切り換えてフィルム27を吸着す
る。次いで、図3(e)の如く、エアシリンダ33を作
動させてバックアッププレート32を退避させる。次い
で、図3(f)の如く、加圧加熱治具23を半導体チッ
プ部品20に接触するまで降下させ、フィルム27を介
して半導体チップ部品20を加圧・加熱する。加圧加熱
治具23による加圧・加熱が終了すれば、加圧加熱治具
23を上昇させ、同時に巻取リール駆動モータ31を正
転させフィルム27を巻き取る。これにより図2(a)
の状態に復帰する。
Next, as shown in FIG. 3D, the pressing and heating jig 23 is lowered to the backup plate 32, and at the same time, the electromagnetic switching valve 25 is switched to attract the film 27. Next, as shown in FIG. 3E, the air cylinder 33 is operated to retract the backup plate 32. Next, as shown in FIG. 3 (f), the pressing / heating jig 23 is lowered until it comes into contact with the semiconductor chip component 20, and the semiconductor chip component 20 is pressed / heated via the film 27. When the pressing and heating by the pressing and heating jig 23 is completed, the pressing and heating jig 23 is raised, and at the same time, the take-up reel drive motor 31 is rotated forward to wind up the film 27. As a result, FIG.
It returns to the state of.

【0020】このように作用する本実施の形態の半導体
チップ実装方法及び装置は、接着剤貼りつき防止用のフ
ィルム27により半導体チップ部品20と加圧加熱治具
23との接着剤による接着を防止し、且つ接着剤貼りつ
き防止用のフィルム27の張力を弛めることにより加圧
加熱治具23の加圧力のバラツキを防止でき、さらにフ
ィルム27の弛みをバックアッププレート32で受ける
ため、該フィルムの接触による半導体チップ部品20の
移動を防止することができる。
In the semiconductor chip mounting method and apparatus according to the present embodiment, the film 27 for preventing the adhesive from sticking prevents the semiconductor chip component 20 and the pressing / heating jig 23 from being bonded by the adhesive. In addition, since the tension of the film 27 for preventing the adhesive from sticking is loosened, the variation in the pressing force of the pressurizing and heating jig 23 can be prevented. And the movement of the semiconductor chip component 20 can be prevented.

【0021】[0021]

【発明の効果】本発明の半導体チップ実装方法及び実装
装置に依れば、半導体チップ部品をフリップチップ実装
方式で、且つ接着剤貼り付き防止用フィルムを用いて基
板に実装する時、接着剤貼り付き防止用フィルムの張力
を弛めることにより、加圧加熱治具23の加圧力のバラ
ツキを防止可能とし、且つ弛めたフィルムをバックアッ
ププレートで受けることにより、該フィルムの接触によ
る半導体チップ部品20の移動を防止し正確な位置に実
装でき、実装品質の向上に寄与することができる。
According to the semiconductor chip mounting method and the mounting apparatus of the present invention, when the semiconductor chip component is mounted on the substrate by the flip-chip mounting method and using the film for preventing the adhesion of the adhesive, the adhesive is applied. By relaxing the tension of the film for preventing sticking, it is possible to prevent variation in the pressing force of the pressurizing and heating jig 23, and by receiving the loosened film by the backup plate, the semiconductor chip component 20 is brought into contact with the film. Movement can be prevented and mounting can be performed at an accurate position, which can contribute to improvement in mounting quality.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の半導体チップ実装装置の実施の形態を
半導体チップ部品および該半導体チップ部品を実装する
基板と共に示す図である。
FIG. 1 is a view showing an embodiment of a semiconductor chip mounting apparatus of the present invention together with a semiconductor chip component and a substrate on which the semiconductor chip component is mounted.

【図2】本発明の半導体チップ実装装置の実施の形態を
用いた本発明の半導体チップ実装方法を説明するための
図である。
FIG. 2 is a diagram for explaining a semiconductor chip mounting method of the present invention using the embodiment of the semiconductor chip mounting apparatus of the present invention.

【図3】本発明の半導体チップ実装装置の実施の形態を
用いた本発明の半導体チップ実装方法を説明するための
図である。
FIG. 3 is a view for explaining a semiconductor chip mounting method of the present invention using the embodiment of the semiconductor chip mounting apparatus of the present invention;

【図4】従来のフリップチップ実装方式の実装工程を説
明するための図である。
FIG. 4 is a diagram for explaining a mounting process of a conventional flip-chip mounting method.

【図5】従来のフリップチップ実装方式の実装工程を説
明するための図である。
FIG. 5 is a diagram for explaining a mounting step of a conventional flip-chip mounting method.

【図6】発明が解決しようとする課題を説明するための
図である。
FIG. 6 is a diagram for explaining a problem to be solved by the invention.

【符号の説明】[Explanation of symbols]

20…半導体チップ部品 21…基板 22…ステージ 23…加圧加熱治具 24…パイプ 25,34…電磁切り換え弁 26…真空ポンプ 27…フィルム 28,28′…ローラ 29…フィルム供給リール 30…フィルム巻取リール 31…巻取リール駆動モータ 32…バックアッププレート 33…エアシリンダ 35…圧縮空気ポンプ 36…制御装置 DESCRIPTION OF SYMBOLS 20 ... Semiconductor chip component 21 ... Substrate 22 ... Stage 23 ... Pressure heating jig 24 ... Pipe 25, 34 ... Electromagnetic switching valve 26 ... Vacuum pump 27 ... Film 28, 28 '... Roller 29 ... Film supply reel 30 ... Film winding Take-up reel 31 ... Take-up reel drive motor 32 ... Backup plate 33 ... Air cylinder 35 ... Compressed air pump 36 ... Control device

フロントページの続き (72)発明者 小八重 健二 神奈川県川崎市中原区上小田中4丁目1番 1号 富士通株式会社内 (72)発明者 石川 直樹 神奈川県川崎市中原区上小田中4丁目1番 1号 富士通株式会社内 (72)発明者 江本 哲 神奈川県川崎市中原区上小田中4丁目1番 1号 富士通株式会社内Continuing from the front page (72) Inventor Kenji Koyae 4-1-1, Kamiodanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture Inside Fujitsu Limited (72) Inventor Naoki Ishikawa 4-1-1, Kamiodanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture Inside Fujitsu Limited (72) Inventor Tetsu Emoto 4-1-1 Kamikadanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture Inside Fujitsu Limited

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 パッド上にバンプが形成された半導体チ
ップを、基板との間に充填された樹脂接着剤を介して、
加圧加熱治具にて加圧・加熱して基板に搭載する半導体
チップ実装方法において、 前記加圧加熱治具と半導体チップとの間に接着剤貼りつ
き防止用のフィルムを供給する場合、バックアッププレ
ート上にテンションを弛めたフィルムを受け、そのフィ
ルムを加圧加熱治具で吸着保持し、この吸着保持された
フィルムを介して半導体チップを基板にボンデイングす
ることを特徴とする半導体チップ実装方法。
A semiconductor chip having bumps formed on pads is bonded to a substrate via a resin adhesive filled between the semiconductor chip and the substrate.
In a semiconductor chip mounting method of mounting on a substrate by pressing and heating with a pressing and heating jig, when a film for preventing adhesive sticking is supplied between the pressing and heating jig and the semiconductor chip, a backup is provided. A method of mounting a semiconductor chip, comprising: receiving a film on which tension has been loosened on a plate, holding the film by suction using a pressure and heating jig, and bonding a semiconductor chip to a substrate via the suction-held film. .
【請求項2】 パッド上にバンプが形成された半導体チ
ップを、基板との間に充填された樹脂接着剤を介して、
加圧加熱治具にて加圧・加熱するフリップチップ方式に
て基板に搭載する場合に加圧加熱治具と半導体チップと
の間に接着剤貼りつき防止用のフィルムを挟む半導体チ
ップ実装装置であって、 加圧加熱治具に真空吸着手段を設けると共に、該加圧加
熱治具の下方に接着剤貼りつき防止用のフィルムを支持
する手段と、該フィルムの張力を緩める手段と、該フィ
ルムを下方より支持および退避可能なバックアッププレ
ートとを設けてなることを特徴とする半導体チップ実装
装置。
2. A semiconductor chip having a bump formed on a pad is bonded to a substrate via a resin adhesive filled between the semiconductor chip and the substrate.
When mounting on a substrate by the flip chip method of pressing and heating with a pressure heating jig, a semiconductor chip mounting device that sandwiches a film for preventing adhesive sticking between the pressure heating jig and the semiconductor chip Means for providing a vacuum suction means to the pressing and heating jig, means for supporting a film for preventing the adhesive from sticking below the pressing and heating jig, means for relaxing the tension of the film, And a backup plate capable of supporting and retracting from below.
JP22406197A 1997-08-20 1997-08-20 Semiconductor chip mounting method and mounting device Expired - Fee Related JP3369082B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22406197A JP3369082B2 (en) 1997-08-20 1997-08-20 Semiconductor chip mounting method and mounting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22406197A JP3369082B2 (en) 1997-08-20 1997-08-20 Semiconductor chip mounting method and mounting device

Publications (2)

Publication Number Publication Date
JPH1167825A true JPH1167825A (en) 1999-03-09
JP3369082B2 JP3369082B2 (en) 2003-01-20

Family

ID=16807967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22406197A Expired - Fee Related JP3369082B2 (en) 1997-08-20 1997-08-20 Semiconductor chip mounting method and mounting device

Country Status (1)

Country Link
JP (1) JP3369082B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002184807A (en) * 2000-12-11 2002-06-28 Mitsubishi Electric Corp Semiconductor device and its manufacturing method and device
JP2006210464A (en) * 2005-01-26 2006-08-10 Fuji Mach Mfg Co Ltd Apparatus for supplying shock absorbing material tape and device for crimping electronic part using this
KR100707096B1 (en) * 2001-03-19 2007-04-13 앰코 테크놀로지 코리아 주식회사 Manufacturing method of adhesive means for manufacturing semiconductor package
KR20180032043A (en) * 2016-09-21 2018-03-29 주식회사 엘지화학 Deep Drawing Apparatus for Laminated Sheet Capable of Adjusting Tension and Method for Deep Drawing Using the Same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002184807A (en) * 2000-12-11 2002-06-28 Mitsubishi Electric Corp Semiconductor device and its manufacturing method and device
KR100707096B1 (en) * 2001-03-19 2007-04-13 앰코 테크놀로지 코리아 주식회사 Manufacturing method of adhesive means for manufacturing semiconductor package
JP2006210464A (en) * 2005-01-26 2006-08-10 Fuji Mach Mfg Co Ltd Apparatus for supplying shock absorbing material tape and device for crimping electronic part using this
JP4503448B2 (en) * 2005-01-26 2010-07-14 富士機械製造株式会社 Buffer material tape supply device and electronic component crimping device used for electronic component crimping device
KR20180032043A (en) * 2016-09-21 2018-03-29 주식회사 엘지화학 Deep Drawing Apparatus for Laminated Sheet Capable of Adjusting Tension and Method for Deep Drawing Using the Same

Also Published As

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