JPH11512186A - 表面構造変化の決定のための光センサの屈折率の監視 - Google Patents
表面構造変化の決定のための光センサの屈折率の監視Info
- Publication number
- JPH11512186A JPH11512186A JP9511123A JP51112397A JPH11512186A JP H11512186 A JPH11512186 A JP H11512186A JP 9511123 A JP9511123 A JP 9511123A JP 51112397 A JP51112397 A JP 51112397A JP H11512186 A JPH11512186 A JP H11512186A
- Authority
- JP
- Japan
- Prior art keywords
- interaction
- intensity signal
- light intensity
- uniformity
- film layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
- G01N33/53—Immunoassay; Biospecific binding assay; Materials therefor
- G01N33/543—Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals
- G01N33/54366—Apparatus specially adapted for solid-phase testing
- G01N33/54373—Apparatus specially adapted for solid-phase testing involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
Landscapes
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Molecular Biology (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Urology & Nephrology (AREA)
- Hematology (AREA)
- Biotechnology (AREA)
- Microbiology (AREA)
- Cell Biology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.光センサ表面の膜層が、該膜層と相互作用し得る種を含有する流体試料と接 触するとき該膜層で起こる化学的または物理的な相互作用を分析する方法であっ て、該相互作用は、入射光および/または反射光のパラメータと、光強度信号曲 線の最小、最大および重心のうちの1つとの間の関係を測定することにより、光 強度信号生成技術を用いて該膜層の屈折率を測定することによって監視される方 法において、該光強度信号の該最小、最大、または重心における値の経時変動を 監視して、(i)該相互作用が制限された質量輸送であるときおよび該相互作用が 動力学的に制御されるときを決定するための、感知された膜層体積内の試料種濃 度の均一性の程度であって、変動する光強度信号レベルは質量輸送制限を示し、 安定した光強度信号レベルは動力学的制御を示す、試料種濃度の均一性の程度、 および(ii)該相互作用中または該相互作用後の該感知された膜層体積内で得られ る均一性/不均一性の程度であって、安定した光強度信号レベルの変化は均一性 /不均一性の変化の程度を示し、またこの変化の程度に対応する、均一性/不均 一性の程度のうちの少なくとも一方を決定することを特徴とする、方法。 2.前記流体試料は液体であることを特徴とする、請求項1に記載の方法。 3.前記光強度信号値を監視することにより、前記相互作用が動力学的に制御さ れる時間間隔を決定すること、および該時間間隔中に測定された屈折率と時間と の間の関係から、前記試料種の前記表面層との相互作用のための会合および/ま たは解離定数を決定することを特徴とする、請求項1または2に記載の方法。 4.前記相互作用が動力学的に制御されるとき、前記会合および/または解離定 数の決定を自動的に開始することを特徴とする、請求項3に記載の方法。 5.前記光強度信号値を監視することにより、前記相互作用が制限された質量輸 送である時間間隔を決定すること、および該時間間隔中に測定された屈折率と時 間との間の関係から、前記試料種の濃度を決定することを特徴とする、請求項3 に記載の方法。 6.試料種濃度ならびに会合および/または解離定数の両方を決定することを特 徴とする、請求項3または4および5に記載の方法。 7.前記均一性/不均一性は、前記膜層の物理的条件、熱力学的条件、および化 学的条件のうちの1つ以上の条件に関連することを特徴とする、請求項1〜6の いずれか1つに記載の方法。 8.前記表面膜層の均一性/不均一性は、沈殿、凝集または凝析反応により生じ るタンパク質凝集体、生物学的な細胞および細胞膜フラグメントのような膜複合 体、酵素反応によって生じる高分子生成物複合体、および細胞生成物複合体から 選択されることを特徴とする、請求項7に記載の方法。 9.前記測定された均一性/不均一性に関連して前記試料種濃度を追加して測定 することを特徴とする、請求項8に記載の方法。 10.前記センサ表面膜層に反応体リガンドを予め固定し、その内部の得られるリ ガンド濃度または構造の任意の不均一性を決定することを特徴とする、請求項9 に記載の方法。 11.時間に対する前記光強度信号曲線の半値幅を追加して測定することによって 、前記感知された膜体積内の得られる均一性/不均一性の程度についての追加の 情報を得ることを特徴とする、請求項1〜10のいずれか1つに記載の方法。 12.前記光強度信号生成技術が反射計使用法、反射偏光解析法、反射干渉計使用 法または導波管内の共鳴誘導モード検出法に基づくことを特徴とする、請求項1 〜11のいずれか1つに記載の方法。 13.前記技術が、表面プラスモン共鳴、ブルスター角、臨界角、偏光解析または 共鳴モード結合の測定を含む内部反射に基づくか、またはブルスター角または偏 光解析の測定を含む外部反射に基づくことを特徴とする、請求項12に記載の方法 。 14.前記光のパラメータが、波長、入射角および偏光状態から選択されることを 特徴とする、請求項1〜13のいずれか1つに記載の方法。 15.少なくとも2つの異なる波長および固定入射角を用いて前記相互作用を監視 することを特徴とする、請求項14に記載の方法。 16.少なくとも2つの異なる波長および少なくとも2つの異なる入射角を用いて 前記相互作用を監視することを特徴とする、請求項14に記載の方法。 17.所定の入射角または波長範囲の連続スキャンを用いて前記相互作用を監視す ることを特徴とする、請求項14に記載の方法。 18.少なくとも2つの異なる偏光状態、固定入射角および波長を用いて前記相互 作用を監視することを特徴とする、請求項14に記載の方法。 19.所定の偏光状態範囲の連続スキャンを用いて前記相互作用を監視することを 特徴とする、請求項14に記載の方法。 20.多くの波長で測定された内部反射データを用いて、エバネセント波の貫入深 さであって、波長に依り変動する該貫入深さの方向の均一性/不均一性の状態を 決定することを特徴とする、請求項13に記載の方法。 21.単一の光ビームを用いて、相互作用を二つ以上のセンサ表面で同時に分析す ることを特徴とする前記請求項のいずれか1つに記載の方法。 22.前記流体試料は、液体フロー、好ましくはフローセル中で前記膜層と接触す ることを特徴とする、前記請求項のいずれか1つに記載の方法。 23.前記入射光および/または反射光のパラメータ、ならびに前記光強度信号曲 線の最小および重心のいずれか一方が測定され、また該光強度信号の最小値の経 時変動を監視することを特徴とする、前記請求項のいずれか1つに記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9503028-4 | 1995-09-01 | ||
SE9503028A SE9503028D0 (sv) | 1995-09-01 | 1995-09-01 | Method of analysing chemical and physical interactions at a sensor surface |
PCT/SE1996/001074 WO1997009618A1 (en) | 1995-09-01 | 1996-08-30 | Monitoring of refractive index of optical sensor for determination of surface structure changes |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH11512186A true JPH11512186A (ja) | 1999-10-19 |
JP3490458B2 JP3490458B2 (ja) | 2004-01-26 |
Family
ID=20399349
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51112397A Expired - Fee Related JP3490458B2 (ja) | 1995-09-01 | 1996-08-30 | 表面構造変化の決定のための光センサの屈折率の監視 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6127183A (ja) |
EP (1) | EP0852010B1 (ja) |
JP (1) | JP3490458B2 (ja) |
AT (1) | ATE220208T1 (ja) |
DE (1) | DE69622176T2 (ja) |
SE (1) | SE9503028D0 (ja) |
WO (1) | WO1997009618A1 (ja) |
Cited By (5)
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WO2005038442A1 (ja) * | 2003-10-16 | 2005-04-28 | Kabushiki Kaisha Nard Kenkyusho | 表面プラズモン共鳴の測定方法および該方法に使用される貴金属化合物 |
JP2007333535A (ja) * | 2006-06-14 | 2007-12-27 | Nippon Telegr & Teleph Corp <Ntt> | ピーク位置変動量測定装置、その測定方法及びプログラム |
US7602495B2 (en) | 2004-08-24 | 2009-10-13 | Fujifilm Corporation | Method for measuring dissociation constant by surface plasmon resonance analysis |
US7804592B2 (en) | 2003-10-16 | 2010-09-28 | Nard Institute, Ltd. | Method for measuring a surface plasmon resonance and noble metal compound used for the same |
JP2013518280A (ja) * | 2010-01-29 | 2013-05-20 | ジーイー・ヘルスケア・バイオサイエンス・アクチボラグ | 凝集体決定法 |
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WO1999013320A1 (de) | 1997-09-10 | 1999-03-18 | Artificial Sensing Instruments Asi Ag | Optischer sensor und optisches verfahren zur charakterisierung einer chemischen und/oder biochemischen substanz |
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EP1188058B1 (en) | 1999-06-18 | 2005-05-11 | Biacore AB | Method and apparatus for assaying a drug candidate to estimate a pharmacokinetic parameter associated therewith |
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DE10006083B4 (de) | 2000-02-11 | 2004-01-22 | INSTITUT FüR MIKROTECHNIK MAINZ GMBH | Verfahren zur quantitativen und/oder qualitativen Bestimmung von Schichtdicken sowie ein Mikroreaktionsgefäß und eine Titerplatte |
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US5359681A (en) * | 1993-01-11 | 1994-10-25 | University Of Washington | Fiber optic sensor and methods and apparatus relating thereto |
-
1995
- 1995-09-01 SE SE9503028A patent/SE9503028D0/xx unknown
-
1996
- 1996-08-30 US US09/043,006 patent/US6127183A/en not_active Expired - Lifetime
- 1996-08-30 DE DE69622176T patent/DE69622176T2/de not_active Expired - Lifetime
- 1996-08-30 EP EP96929635A patent/EP0852010B1/en not_active Expired - Lifetime
- 1996-08-30 WO PCT/SE1996/001074 patent/WO1997009618A1/en active IP Right Grant
- 1996-08-30 AT AT96929635T patent/ATE220208T1/de not_active IP Right Cessation
- 1996-08-30 JP JP51112397A patent/JP3490458B2/ja not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005038442A1 (ja) * | 2003-10-16 | 2005-04-28 | Kabushiki Kaisha Nard Kenkyusho | 表面プラズモン共鳴の測定方法および該方法に使用される貴金属化合物 |
US7804592B2 (en) | 2003-10-16 | 2010-09-28 | Nard Institute, Ltd. | Method for measuring a surface plasmon resonance and noble metal compound used for the same |
US7602495B2 (en) | 2004-08-24 | 2009-10-13 | Fujifilm Corporation | Method for measuring dissociation constant by surface plasmon resonance analysis |
JP2007333535A (ja) * | 2006-06-14 | 2007-12-27 | Nippon Telegr & Teleph Corp <Ntt> | ピーク位置変動量測定装置、その測定方法及びプログラム |
JP4663590B2 (ja) * | 2006-06-14 | 2011-04-06 | 日本電信電話株式会社 | ピーク位置変動量測定装置、その測定方法及びプログラム |
JP2013518280A (ja) * | 2010-01-29 | 2013-05-20 | ジーイー・ヘルスケア・バイオサイエンス・アクチボラグ | 凝集体決定法 |
Also Published As
Publication number | Publication date |
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ATE220208T1 (de) | 2002-07-15 |
WO1997009618A1 (en) | 1997-03-13 |
SE9503028D0 (sv) | 1995-09-01 |
JP3490458B2 (ja) | 2004-01-26 |
EP0852010A1 (en) | 1998-07-08 |
US6127183A (en) | 2000-10-03 |
EP0852010B1 (en) | 2002-07-03 |
DE69622176T2 (de) | 2002-12-12 |
DE69622176D1 (de) | 2002-08-08 |
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