JPH11352074A - Inspection of connection part - Google Patents

Inspection of connection part

Info

Publication number
JPH11352074A
JPH11352074A JP15693498A JP15693498A JPH11352074A JP H11352074 A JPH11352074 A JP H11352074A JP 15693498 A JP15693498 A JP 15693498A JP 15693498 A JP15693498 A JP 15693498A JP H11352074 A JPH11352074 A JP H11352074A
Authority
JP
Japan
Prior art keywords
flexible substrate
electrode
light source
connection part
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15693498A
Other languages
Japanese (ja)
Inventor
Hideki Niimi
秀樹 新見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP15693498A priority Critical patent/JPH11352074A/en
Publication of JPH11352074A publication Critical patent/JPH11352074A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Wire Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To simply and easily inspect a connection part obtained by making the electrode formed on a flexible substrate in a short strip shape and the electrode formed on a printed circuit board in a short strip shape face each other to connect them under heating and pressure. SOLUTION: A light source is arranged in a state almost crossing the wiring direction of the electrode 4 formed on a flexible substrate 2 and obliquely upward on the side of the connection plate, with respect to the electrode forming surface and the connection part is visually observed from the position 11 facing the light source so as to hold the connection part on the side of the flexible substrate. A shadow is formed along the fine unevenness formed on the surface of the flexible substrate of the connection, part and uneveness is can be visually observed in good contrast in a shading (bright and angle) state from a direction facing opposite the light source through the connection part.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、テープキャリアパ
ッケージ等の可撓性基板の電極とプリント回路配線基板
の電極との接続部の検査方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting a connection between an electrode of a flexible substrate such as a tape carrier package and an electrode of a printed circuit board.

【0002】[0002]

【従来の技術】液晶表示装置は近年、急激な勢いで市場
に浸透しており、その用途はOA用、民生用、産業用と
拡大の一途をたどっており、市場からは品質の向上と同
時に、コストダウンに対する要求が強まっている。この
ような市場要望に伴い、歩留まり向上が課題となる中、
異物に起因する不良の後工程への流出防止が重要な課題
となる。
2. Description of the Related Art In recent years, liquid crystal display devices have rapidly penetrated the market, and their applications have been expanding to OA, consumer, and industrial applications. Demand for cost reduction is increasing. Amid such market demands, improving yield has become an issue.
It is an important issue to prevent outflow of a defect caused by a foreign matter to a post-process.

【0003】例えば、可撓性基板であるテープキャリア
パッケージの入力端子の電極とプリント回路配線基板の
電極との接続部において、確率的に異物が混入して、隣
接する電極間でショートが発生したり、電極の接続不良
を生じる場合がある。テープキャリアパッケージの入力
端子とプリント回路配線基板の電極との接続部に異物の
混入したパネルを検査工程で見逃し、後工程で不良とな
れば、製造コストの面のみならず、工数の面でも不利と
なる。また市場流通後での不良の発見も当然に防止しな
ければならない。以上のように前工程での検出は極めて
重要となる。
For example, at a connection between an electrode of an input terminal of a tape carrier package, which is a flexible substrate, and an electrode of a printed circuit wiring board, foreign matter is stochastically mixed in, and a short circuit occurs between adjacent electrodes. Or poor connection of the electrodes. If a panel containing foreign matter in the connection between the input terminal of the tape carrier package and the electrode of the printed circuit board is overlooked in the inspection process and becomes defective in the subsequent process, it is disadvantageous not only in terms of manufacturing costs but also in terms of man-hours. Becomes In addition, the discovery of defects after market distribution must of course be prevented. As described above, detection in the previous step is extremely important.

【0004】現在、液晶パネルに接続されたテープキャ
リアパッケージとプリント回路配線基板とを接続する方
法として、半田付けによる方法と異方導電性接着剤シー
トによる方法が知られている。前者の半田付けによる接
続方法は従来から用いられていた方法であり、テープキ
ャリアパッケージの入力端子の電極は接続後も露出した
構造になり、接続後の接続部の検査は通常顕微鏡により
容易に行えた。
At present, as a method of connecting a tape carrier package connected to a liquid crystal panel and a printed circuit wiring board, a method using soldering and a method using an anisotropic conductive adhesive sheet are known. The former connection method by soldering is a method that has been used in the past, and the electrode of the input terminal of the tape carrier package is exposed even after connection, and the connection part after connection can usually be easily inspected with a microscope. Was.

【0005】しかし、近年、液晶パネルの高精細化に伴
いテープキャリアパッケージの入力端子の微細化が進
み、より狭ピッチでの接続が可能である後者の異方導電
性接着剤シートによる方法が広く用いられるようになっ
た。このときのテープキャリアパッケージの形状を図2
に、入力端子部の断面を図3にそれぞれ示す。図2およ
び図3に示されるように、テープキャリアパッケージ2
の入力端子3の電極4はベースフィルム6上に形成され
ている。また、5はテープキャリアパッケージ2の出力
端子である。プリント回路配線基板の電極と接続する場
合は、両者の電極形成面同士を対向させて、異方導電性
接着剤シートを介して熱加圧して接着する。したがっ
て、接続後は、電極形成面がベースフィルム6で覆われ
てしまう。
However, in recent years, the input terminal of the tape carrier package has been miniaturized with the increase in the definition of the liquid crystal panel, and the latter method using an anisotropic conductive adhesive sheet which enables connection at a narrower pitch has been widely used. Became used. FIG. 2 shows the shape of the tape carrier package at this time.
FIG. 3 shows a cross section of the input terminal portion. As shown in FIGS. 2 and 3, the tape carrier package 2
The electrodes 4 of the input terminals 3 are formed on a base film 6. Reference numeral 5 denotes an output terminal of the tape carrier package 2. When connecting to the electrodes of the printed circuit wiring board, both electrode forming surfaces are opposed to each other, and they are bonded by hot pressing through an anisotropic conductive adhesive sheet. Therefore, after the connection, the electrode forming surface is covered with the base film 6.

【0006】[0006]

【発明が解決しようとする課題】テープキャリアパッケ
ージ2の入力端子3の電極4とプリント回路配線基板7
の電極8とを熱加圧により接続した後の接続部の様子を
図4に示す。図4のように、可撓性を有するベースフィ
ルム6の表面に電極4に沿って規則的な凹凸が形成され
る。通常の顕微鏡ではテープキャリアパッケージ2の電
極形成面に対して略90度の角度から光源により照射す
るため、テープキャリアパッケージ2の表面に形成され
た微小な凹凸のコントラストが悪く、接続状態を良好に
観察することができない。また、テープキャリアパッケ
ージ2の電極4とプリント回路配線基板7の電極8との
間に異物10が介在した場合、異物10に起因するテー
プキャリアパッケージ2の表面に形成された微小な突起
を見落としやすく、また、テープキャリアパッケージ2
側から直接異物を発見することも困難なために、異物混
入品として判断することができないという課題があっ
た。
The electrodes 4 of the input terminals 3 of the tape carrier package 2 and the printed circuit wiring board 7
FIG. 4 shows a state of the connection portion after the connection with the electrode 8 of FIG. As shown in FIG. 4, regular irregularities are formed along the electrodes 4 on the surface of the flexible base film 6. In an ordinary microscope, since the light is emitted from a light source at an angle of about 90 degrees with respect to the electrode forming surface of the tape carrier package 2, the contrast of minute irregularities formed on the surface of the tape carrier package 2 is poor, and the connection state is improved. I can't observe. Further, when a foreign matter 10 is interposed between the electrode 4 of the tape carrier package 2 and the electrode 8 of the printed circuit wiring board 7, minute projections formed on the surface of the tape carrier package 2 due to the foreign matter 10 are easily overlooked. And tape carrier package 2
Since it is difficult to directly detect the foreign matter from the side, there is a problem that the foreign matter cannot be determined as a foreign matter-containing product.

【0007】本発明は、上記従来の課題を解決するもの
であり、可撓性基板上に短冊状に形成した電極とプリン
ト回路配線基板上に短冊状に形成した電極とを対向さ
せ、熱加圧にて接続して得た接続部の検査を、簡易な方
法で、検査作業を可能かつ容易化する方法を提供するこ
とを目的とする。
The present invention has been made to solve the above-mentioned conventional problems, and has an electrode formed in a strip shape on a flexible substrate and an electrode formed in a strip shape on a printed circuit wiring board are opposed to each other. It is an object of the present invention to provide a method for inspecting a connection portion obtained by connecting with pressure by a simple method, thereby enabling and facilitating an inspection operation.

【0008】[0008]

【課題を解決するための手段】前記の目的を達成するた
めに、本発明にかかる接続部の検査方法は、可撓性基板
上に短冊状に形成した電極とプリント回路配線基板上に
短冊状に形成した電極とを対向させ、熱加圧にて接続し
た後、前記接続部を検査する方法であって、前記可撓性
基板上に形成した電極の配線方向に対してほぼ直交し、
かつ電極形成面に対して前記可撓性基板側の斜め上方に
光源を設置し、前記可撓性基板側の前記接続部を挟んで
前記光源に対向する位置から前記接続部を検査すること
を特徴とする。
In order to achieve the above object, a method for inspecting a connection portion according to the present invention comprises an electrode formed in a strip shape on a flexible substrate and a strip shape on a printed circuit wiring board. A method of inspecting the connection portion after facing the electrodes formed on the flexible substrate and connecting them by heat and pressure, the method being substantially orthogonal to the wiring direction of the electrodes formed on the flexible substrate,
And installing a light source obliquely above the flexible substrate side with respect to the electrode forming surface, and inspecting the connection part from a position facing the light source with the connection part on the flexible substrate side interposed therebetween. Features.

【0009】テープキャリアパッケージ等の可撓性基板
の電極とプリント回路配線基板の電極とを熱加圧により
接続すると、図4に示したように、接続部の可撓性基板
の表面に、電極のある部分は電極の厚みに応じて凸部
が、また、電極のない部分は凹部がそれぞれ形成され
る。本発明の上記の構成によれば、このような接続部を
外観検査する際、可撓性基板上の電極の配線方向に対し
てほぼ直交し、可撓性基板側の斜め上方に光源を設置す
るので、接続部の可撓性基板表面の微小な凹凸に沿って
陰陽が形成され、接続部を挟んで光源に対向する方向か
ら目視にて凹凸を陰陽(明暗)の状態でコントラスト良
く観察することができる。そして、可撓性基板の電極と
プリント回路配線基板の電極との間に異物が介在した場
合は、可撓性基板の表面に電極によるものとは明らかに
異なるの凸部(突起)が形成されるので、その部分の陰
陽が不規則となり、異物が混入していることを容易に確
認することができる。
When electrodes of a flexible substrate such as a tape carrier package and electrodes of a printed circuit wiring board are connected by heat and pressure, as shown in FIG. A portion having a mark has a convex portion according to the thickness of the electrode, and a portion having no electrode has a concave portion. According to the above configuration of the present invention, when inspecting the appearance of such a connection portion, the light source is disposed substantially orthogonal to the wiring direction of the electrodes on the flexible substrate and obliquely above the flexible substrate side. Therefore, the yin and yang are formed along the minute unevenness on the surface of the flexible substrate at the connection portion, and the unevenness is visually observed with good contrast in a yin and yang (bright and dark) state from the direction facing the light source with the connection portion interposed therebetween. be able to. When a foreign substance is interposed between the electrode of the flexible substrate and the electrode of the printed circuit wiring board, a projection (projection) is formed on the surface of the flexible substrate, which is clearly different from that of the electrode. Therefore, the yin and yang of the portion become irregular, and it can be easily confirmed that foreign matter is mixed.

【0010】[0010]

【発明の実施の形態】以下本発明の実施の形態を実施例
を用いて図面を参照しながら説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below using embodiments with reference to the drawings.

【0011】図1は本発明の一実施例における検査方法
の概略図である。
FIG. 1 is a schematic diagram of an inspection method according to an embodiment of the present invention.

【0012】液晶パネル1には電極(図示せず)が形成
されており、電極上に異方導電性接着剤シート(図示せ
ず)を付着させた後、可撓性を有するテープキャリアパ
ッケージ2の出力端子5と液晶パネル1の電極とを対面
させて、位置合わせし重ねる。その後、テープキャリア
パッケージ2側から常時加熱方式のボンディングツール
にて熱加圧し、テープキャリアパッケージ2の出力端子
5の電極と液晶パネル1の電極を電気的に接続する。
Electrodes (not shown) are formed on the liquid crystal panel 1. After an anisotropic conductive adhesive sheet (not shown) is attached on the electrodes, a flexible tape carrier package 2 is formed. The output terminal 5 and the electrode of the liquid crystal panel 1 face each other, and are aligned and overlapped. Thereafter, heat is applied from the tape carrier package 2 side by a constant-heating bonding tool to electrically connect the electrode of the output terminal 5 of the tape carrier package 2 and the electrode of the liquid crystal panel 1.

【0013】次にプリント回路配線基板7の電極8に、
異方導電性接着剤シート(図示せず)を付着させ、テー
プキャリアパッケージ2の入力端子3とプリント回路配
線基板7の電極8とを対面させ、位置合わせし重ねる。
その後、テープキャリアパッケージ2側から常時加熱方
式のボンディングツールにて熱加圧し、テープキャリア
パッケージ2の入力端子3の電極4とプリント回路配線
基板7の電極8を電気的に接続する。
Next, the electrodes 8 of the printed circuit wiring board 7 are
An anisotropic conductive adhesive sheet (not shown) is attached, and the input terminals 3 of the tape carrier package 2 and the electrodes 8 of the printed circuit wiring board 7 face each other, are aligned, and are overlapped.
Thereafter, heat and pressure are applied from the side of the tape carrier package 2 with a bonding tool of a constant heating method, and the electrodes 4 of the input terminals 3 of the tape carrier package 2 and the electrodes 8 of the printed circuit wiring board 7 are electrically connected.

【0014】接続後、テープキャリアパッケージ2の電
極4とプリント回路配線基板7の電極8との接続部の検
査を行う。
After the connection, the connection between the electrode 4 of the tape carrier package 2 and the electrode 8 of the printed circuit board 7 is inspected.

【0015】このとき、接続部に対して観察者11と対
向する位置に光源9を設置する。光源9の位置は、電極
形成面を含む面内において、テープキャリアパッケージ
2上に形成した電極4の配線方向となす角φがほぼ直角
になるように、即ちφが好ましくは70〜110度、よ
り好ましくは略90度になるようにする。また、光源9
の高さは、テープキャリアパッケージ2の斜め上方、即
ち、観察する接続部において電極形成面を含む面となす
角θが、好ましくは30〜60度、より好ましくは略4
5度になるようにする。光源を上記の位置に設置するこ
とにより、電極接続部のテープキャリアパッケージ2上
に形成された規則的な凹凸に基づく陰陽をコントラスト
良く観察することができる。なお、本実施例では、光源
9として蛍光灯を用いた。
At this time, the light source 9 is installed at a position facing the observer 11 with respect to the connection portion. The position of the light source 9 is set so that the angle φ between the wiring direction of the electrode 4 formed on the tape carrier package 2 and the wiring direction is substantially perpendicular to the plane including the electrode forming surface, that is, φ is preferably 70 to 110 degrees. More preferably, it should be approximately 90 degrees. Light source 9
Is preferably 30 to 60 degrees, more preferably approximately 4 degrees, which is an angle θ formed diagonally above the tape carrier package 2, that is, the surface including the electrode forming surface at the connection portion to be observed.
Be 5 degrees. By arranging the light source at the above-described position, it is possible to observe the yin and yang based on the regular unevenness formed on the tape carrier package 2 at the electrode connection portion with good contrast. In this embodiment, a fluorescent lamp is used as the light source 9.

【0016】検査は、観察すべき接続部を挟んで光源9
に対向する方向(観察者11の位置)から目視にてテー
プキャリアパッケージ2の入力端子3の表面を観察する
ことにより行う。
In the inspection, the light source 9 is placed across the connection to be observed.
The observation is performed by visually observing the surface of the input terminal 3 of the tape carrier package 2 from the direction (the position of the observer 11) facing the camera.

【0017】テープキャリアパッケージ2の入力端子3
の電極4とプリント回路配線基板7の電極8とを熱加圧
により接続すると、図4に示したように、テープキャリ
アパッケージ2の入力端子3の上面の電極4のある部分
は電極4の厚み分だけ凸部が形成され、逆に電極4のな
い部分は凹部が形成される。従って、上記の方法によれ
ば、光源9で斜め上方から照射することにより凸部の頂
部の光源側に光が当たり、観察者側から見れば凸部の頂
部の輪郭が明るく、凸部の裾部は影になり、凹凸を陰陽
(明暗)の状態で容易に確認でき、接続の良否を判断で
きる。また、図4に示すように、テープキャリアパッケ
ージ2の電極4とプリント回路配線基板7の電極8との
間に異物10が介在した場合は、テープキャリアパッケ
ージ2の入力端子3の表面に電極によるものとは明らか
に異なる凸部(突起)ができるので、陰陽(明暗)の状
態がその部分だけ他と異なり不規則となって、異物10
が混入していることを容易に確認することができる。こ
れにより異物混入品として判断することができる。
Input terminal 3 of tape carrier package 2
When the electrodes 4 of the printed circuit board 7 are connected to the electrodes 8 of the printed circuit wiring board 7 by heat and pressure, as shown in FIG. Protrusions are formed correspondingly, and conversely, recesses are formed in portions without the electrodes 4. Therefore, according to the above-described method, the light illuminates the light source 9 obliquely from above, so that the light hits the light source side at the top of the projection, and the contour of the top of the projection is bright when viewed from the observer side, and the bottom of the projection is The part becomes a shadow, and the unevenness can be easily confirmed in a yin-yang (light and dark) state, and the quality of the connection can be determined. Further, as shown in FIG. 4, when a foreign substance 10 is interposed between the electrode 4 of the tape carrier package 2 and the electrode 8 of the printed circuit board 7, the electrode is provided on the surface of the input terminal 3 of the tape carrier package 2. Since a projection (projection) that is clearly different from the one is formed, the state of the yin and yang (bright and dark) becomes irregular unlike the others, and the foreign matter 10
Can be easily confirmed to be present. Thereby, it can be determined as a foreign matter-containing product.

【0018】なお本発明は上述の実施例に限られるもの
ではない。例えば光源9は、白熱ランプ、ハロゲンラン
プ、けい光ランプ、水銀ランプ、キセノンランプ等を状
況に応じて適宜選択して用いることができる。
The present invention is not limited to the above embodiment. For example, as the light source 9, an incandescent lamp, a halogen lamp, a fluorescent lamp, a mercury lamp, a xenon lamp, or the like can be appropriately selected and used depending on the situation.

【0019】[0019]

【発明の効果】以上説明したように、本発明による接続
部の検査方法によると、可撓性基板上の電極の配線方向
に対してほぼ直交し、可撓性基板側の斜め上方に光源を
設置するので、接続部の可撓性基板表面に形成された微
小な凹凸に沿って陰陽が形成され、接続部を挟んで光源
に対向する方向から目視にて凹凸を陰陽(明暗)の状態
でコントラスト良く観察することができる。そして、接
続部に異物が介在した場合は、可撓性基板の表面に電極
によるものとは明らかに異なるの凸部(突起)が形成さ
れるので、その部分の陰陽が不規則となり、異物が混入
していることを容易に確認することができる。この結
果、検査工程で異物混入品と直ちに判断できるため、後
工程での不良発生を抑制できる。このことにより製造コ
スト低減、市場品質の信頼性向上の効果が得られ、実用
上極めて有用なものである。
As described above, according to the method for inspecting a connection portion according to the present invention, the light source is disposed substantially orthogonal to the wiring direction of the electrodes on the flexible substrate and obliquely above the flexible substrate side. Since it is installed, the yin and yang are formed along the minute unevenness formed on the surface of the flexible substrate at the connection portion, and the unevenness is visually observed from the direction facing the light source across the connection portion in a state of yin and yang (bright and dark). Observation can be made with good contrast. When foreign matter is present at the connection part, a convex portion (projection) is formed on the surface of the flexible substrate, which is clearly different from that of the electrode, so that the yin and yang of the part becomes irregular, and the foreign matter is removed. It can be easily confirmed that they are mixed. As a result, since it can be immediately determined that the product is a foreign matter-containing product in the inspection process, it is possible to suppress the occurrence of defects in the subsequent process. This has the effect of reducing manufacturing costs and improving the reliability of market quality, and is extremely useful in practice.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の実施例にかかるテープキャリアパッ
ケージの入力端子電極とプリント回路配線基板の電極と
の接続部の検査方法の一例の概略斜視図である。
FIG. 1 is a schematic perspective view of an example of a method for inspecting a connection portion between an input terminal electrode of a tape carrier package and an electrode of a printed circuit wiring board according to an embodiment of the present invention.

【図2】 熱加圧前のテープキャリアパッケージの平面
図である。
FIG. 2 is a plan view of the tape carrier package before hot pressing.

【図3】 熱加圧前のテープキャリアパッケージの一部
拡大断面図である。
FIG. 3 is a partially enlarged cross-sectional view of the tape carrier package before hot pressing.

【図4】 熱加圧後の接続部の一部拡大断面図である。FIG. 4 is a partially enlarged cross-sectional view of a connecting portion after hot pressing.

【符号の説明】 1 液晶パネル 2 テープキャリアパッケージ 3 テープキャリアパッケージの入力端子 4 テープキャリアパッケージの入力端子の電極 5 テープキャリアパッケージの出力端子 6 テープキャリアパッケージのベースフィルム 7 プリント回路配線基板 8 プリント回路配線基板の電極 9 光源 10 異物 11 観察者[Description of Signs] 1 LCD panel 2 Tape carrier package 3 Input terminal of tape carrier package 4 Electrode of input terminal of tape carrier package 5 Output terminal of tape carrier package 6 Base film of tape carrier package 7 Printed circuit wiring board 8 Printed circuit Electrode of wiring board 9 Light source 10 Foreign matter 11 Observer

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 可撓性基板上に短冊状に形成した電極と
プリント回路配線基板上に短冊状に形成した電極とを対
向させ、熱加圧にて接続した後、前記接続部を検査する
方法であって、 前記可撓性基板上に形成した電極の配線方向に対してほ
ぼ直交し、かつ電極形成面に対して前記可撓性基板側の
斜め上方に光源を設置し、 前記可撓性基板側の前記接続部を挟んで前記光源に対向
する位置から前記接続部を検査することを特徴とする接
続部の検査方法。
1. An electrode formed in a strip shape on a flexible substrate and an electrode formed in a strip shape on a printed circuit wiring board are opposed to each other and connected by heat and pressure, and then the connection portion is inspected. A method comprising: disposing a light source substantially orthogonal to a wiring direction of an electrode formed on the flexible substrate and obliquely above the flexible substrate side with respect to an electrode forming surface; An inspection method of the connection portion, wherein the connection portion is inspected from a position facing the light source with the connection portion on the conductive substrate side interposed therebetween.
【請求項2】 前記光源が、白熱ランプ、ハロゲンラン
プ、けい光ランプ、水銀ランプ、又はキセノンランプで
ある請求項1に記載の接続部の検査方法。
2. The method according to claim 1, wherein the light source is an incandescent lamp, a halogen lamp, a fluorescent lamp, a mercury lamp, or a xenon lamp.
【請求項3】 前記可撓性基板が、液晶表示装置を構成
する請求項1に記載の接続部の検査方法。
3. The method according to claim 1, wherein the flexible substrate constitutes a liquid crystal display device.
【請求項4】 前記光源を、前記接続部において、前記
電極形成面に対して30〜60度の位置に設置する請求
項1に記載の接続部の検査方法。
4. The inspection method for a connection part according to claim 1, wherein the light source is installed at a position of 30 to 60 degrees with respect to the electrode forming surface in the connection part.
【請求項5】 前記光源を、前記接続部において、前記
可撓性基板上に形成した電極の配線方向に対して70〜
110度の位置に設置する請求項1に記載の接続部の検
査方法。
5. The method according to claim 5, wherein the light source is connected to the connecting portion by a distance of 70 to 70 with respect to a wiring direction of an electrode formed on the flexible substrate.
The method for inspecting a connection part according to claim 1, wherein the connection part is installed at a position of 110 degrees.
JP15693498A 1998-06-05 1998-06-05 Inspection of connection part Pending JPH11352074A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15693498A JPH11352074A (en) 1998-06-05 1998-06-05 Inspection of connection part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15693498A JPH11352074A (en) 1998-06-05 1998-06-05 Inspection of connection part

Publications (1)

Publication Number Publication Date
JPH11352074A true JPH11352074A (en) 1999-12-24

Family

ID=15638554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15693498A Pending JPH11352074A (en) 1998-06-05 1998-06-05 Inspection of connection part

Country Status (1)

Country Link
JP (1) JPH11352074A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006129873A1 (en) * 2005-06-01 2006-12-07 Tecnos Co., Ltd. Substrate inspection device and inspection method
JP2007317972A (en) * 2006-05-29 2007-12-06 Hitachi High-Technologies Corp Paste status inspection device of electronic parts

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006129873A1 (en) * 2005-06-01 2006-12-07 Tecnos Co., Ltd. Substrate inspection device and inspection method
JP2007013112A (en) * 2005-06-01 2007-01-18 Technos Kk Device and method for substrate inspection
JP2007317972A (en) * 2006-05-29 2007-12-06 Hitachi High-Technologies Corp Paste status inspection device of electronic parts

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