JP3846240B2 - Liquid crystal panel inspection apparatus and liquid crystal panel inspection method - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a liquid crystal panel inspection apparatus and a liquid crystal panel inspection method for inspecting, for example, a short circuit or disconnection of a liquid crystal panel.
[0002]
[Prior art]
In the TFT-LCD manufacturing process, a liquid crystal panel is completed through an array process and a cell process, and a module process for mounting an electronic circuit of a drive system and incorporating other necessary parts and materials is performed.
[0003]
Conventionally, in this module process, an electrical test such as an inspection of a short circuit or disconnection of a liquid crystal panel has been performed. Such inspection of a short circuit or disconnection of the liquid crystal panel is performed by applying a voltage to the liquid crystal panel by bringing the inspection probe terminals into contact with the signal electrode terminals and the scanning electrode terminals of the liquid crystal panel in a one-to-one relationship. The lighting state of is inspected.
[0004]
[Problems to be solved by the invention]
By the way, since the width of the conventional probe terminal for inspection is larger than the width between the electrodes of the liquid crystal panel, one probe terminal may come into contact with the two electrode terminals to cause an erroneous determination. For this reason, inspection has been carried out with strict alignment based on an enlarged image by introducing a CCD camera or the like. However, much labor is required for alignment, and the inspection apparatus becomes large and expensive. There was a problem.
[0005]
Thus, for example, it is conceivable to reduce the width of the probe terminal. In such a case, however, there is a problem that the wiring resistance is increased and problems such as disconnection of the probe terminal are caused.
[0006]
The present invention has been made based on such circumstances, and can eliminate an increase in wiring resistance of the inspection apparatus itself, disconnection of terminals, etc., and the apparatus configuration is simple and liquid crystal is not required for alignment. It is an object of the present invention to provide a liquid crystal panel inspection apparatus and a liquid crystal pal inspection method capable of inspecting a short circuit or disconnection of a panel.
[0007]
[Means for Solving the Problems]
In order to solve such a problem, the liquid crystal panel inspection apparatus according to the present invention, a voltage is applied to each of a plurality of electrodes having a first width arranged on the glass substrate of the liquid crystal panel at a predetermined interval, and the liquid crystal panel In the inspection apparatus for performing the inspection, a contact region having a second width smaller than the first width is arranged on the substrate for the probe terminal and arranged on the substrate at a distance substantially the same as the distance between the electrodes. A probe terminal group in which the non-contact region has a third width larger than the second width, and the non-contact region of the probe terminal is covered with an insulator, and the contact region of the probe terminal Is characterized in that the surface is exposed.
[0008]
According to such a configuration, the second width of the contact region of the probe terminal is smaller than the first width of the electrode, so that the contact region of the probe terminal and the electrode are in a one-to-one contact. It becomes. Further, as described above, an increase in wiring resistance due to the decrease in the second width can be prevented by increasing the third width in the non-contact region other than the contact region of the probe terminal. As a result, the probe terminal can be prevented from coming into contact with two or more electrode terminals or the wiring resistance is increased, and the short-circuit inspection of the liquid crystal panel can be performed stably.
[0009]
According to an aspect of the present invention, the probe terminal extends beyond the contact area, the extension area is covered with an insulator together with the non-contact area, and the probe terminal in the extension area is It has a third width.
[0010]
According to such a configuration, since the extended region having a third width larger than the second width of the contact region exists at the tip of the probe terminal, the probe terminal is hardly peeled off. As a result, the possibility of disconnection of the probe terminal is drastically reduced, and erroneous determination can be prevented.
[0011]
According to one aspect of the present invention, a rigid pressing member is provided on a surface opposite to the surface on which the probe terminal of the substrate is formed, at least in a position corresponding to the contact region. To do.
[0012]
According to such a configuration, the contact area between the contact area and the electrode terminal of the liquid crystal panel may be caused by the thickness of the insulator covering the non-contact area and the extension area. Is pressed so as to be in contact with the electrode terminal. This allows the contact area to be in full contact with the electrode terminals. In addition, the extension region and the non-contact region that are not related to contact are covered with an insulator so that they do not come into contact with the electrode terminal, and erroneous determination can be prevented.
[0013]
According to one form of this invention, the space | interval between the probe terminals in the said contact area is 1.5 times-2 times the said 2nd width | variety, It is characterized by the above-mentioned.
[0014]
According to such a configuration, the second width of the contact region described above is smaller than the conventional width, and the interval between the probe terminals in the contact region is larger than the conventional one. In addition, the width of the electrode is increased by reducing the width of the contact region. As a result, two or more electrodes do not come into contact with the contact area. Further, the pitch of the interval including the width of each electrode or each contact area is the same. As a result, the width of the contact area of the probe terminal is small, and contact with two or more electrodes can be prevented.
[0015]
An inspection method for a liquid crystal panel according to the present invention is an inspection method for inspecting a liquid crystal panel by applying a voltage to each of a plurality of electrodes having a first width arranged on a glass substrate of the liquid crystal panel at a predetermined interval. And a contact region having a second width smaller than the first width, the contact region having a second width smaller than the first width. A probe terminal group having a third width larger than the width of 2 is brought into contact with the electrode of the liquid crystal panel, and the disconnection or short circuit of the liquid crystal panel is inspected according to the display state of the liquid crystal panel.
[0016]
According to such a configuration, the second width of the contact region of the probe terminal is smaller than the first width of the electrode, so that the contact region of the probe terminal and the electrode are in a one-to-one contact. Thus, when contacting the electrodes of the liquid crystal panel, the probe terminal does not contact two or more electrode terminals, so it is sufficient to visually check the liquid crystal display panel. Further, as described above, an increase in wiring resistance due to the decrease in the second width can be prevented by increasing the third width in the non-contact region other than the contact region of the probe terminal. As a result, an increase in wiring resistance can be prevented, so that short-circuiting of electrodes can be reduced.
[0017]
According to an aspect of the present invention, the probe terminal extends beyond the contact area, the extension area is covered with an insulator together with the non-contact area, and the probe terminal in the extension area is It has a third width.
[0018]
According to such a configuration, since the extended region having a third width larger than the second width of the contact region exists at the tip of the probe terminal, the probe terminal is hardly peeled off. As a result, the disconnection of the probe terminal is drastically reduced, so that the inspection can be performed smoothly.
[0019]
According to one aspect of the present invention, a rigid pressing member is provided on a surface opposite to the surface on which the probe terminals of the substrate are formed and corresponding to the contact region, and the probe terminal group is a liquid crystal. When contacting with the electrode of a panel, the said press member is pressed to the said probe terminal side, It is characterized by the above-mentioned.
[0020]
According to such a configuration, there is a possibility that the contact area and the electrode terminal of the liquid crystal panel are in contact with each other depending on the thickness of the insulator covering the non-contact area and the extension area. As a result, the contact region comes into full contact with the electrode terminal. Thereby, it is possible to prevent erroneous determination due to a defect between the contact region and the electrode terminal. In addition, the extension region and the non-contact region that are not related to contact are covered with an insulator so that they do not come into contact with the electrode terminal, and erroneous determination can be prevented.
[0021]
According to the form of the position of the present invention, the distance between the probe terminals in the contact region is 1.5 to 2 times the second width.
[0022]
According to such a configuration, the second width of the contact region described above is smaller than the conventional width, and the interval between the probe terminals in the contact region is larger than the conventional one. In addition, the width of the electrode is increased by reducing the width of the contact region. As a result, two or more electrodes do not come into contact with the contact area. Further, the pitch of the interval including the width of each electrode or each contact area is the same. Thereby, it is possible to easily check whether or not the contact area and the electrode in the inspection correspond one-to-one by visual confirmation of the liquid crystal display panel.
[0023]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0024]
<Overall configuration>
First, the liquid crystal panel according to the present embodiment will be described.
[0025]
FIG. 1 is a perspective view showing a configuration of a liquid crystal panel according to the present invention.
[0026]
In the liquid crystal panel 100 constituting the liquid crystal panel, the first substrate 200 and the second substrate 300 are bonded to each other with a predetermined gap by a sealing material 130 mixed with conductive particles 114. Liquid crystal 160 is sealed (conductive particles 114, sealing material 130, and liquid crystal 160 are not shown). The sealant 130 is formed on one of the substrates along the inner edge of the first substrate 200, but a part of the sealant 130 is opened to enclose the liquid crystal 160. For this reason, after the liquid crystal is sealed, the opening is sealed with a sealing material 112 (not shown).
[0027]
On the surface of the first substrate 200 facing the second substrate 300, a plurality of scan electrodes made of ITO are formed extending in the X direction. On the other hand, on the surface of the second substrate facing the first substrate 200, a plurality of signal electrodes, which are also made of ITO, are formed extending in the Y direction. Accordingly, in the region where the scanning electrode 210 and the signal electrode 310 intersect with each other, a voltage is applied to the liquid crystal 160 by both electrodes, and this intersecting region functions as a pixel region. The electrode pattern of the scan electrode and the signal electrode will be described later.
[0028]
A driver (driving) IC chip 124 for driving the scanning electrode 210 and the signal electrode 310 is mounted on a connection region with the flexible wiring board 150 on the second substrate 300 by a COG (Chip on Glass) technique. ing.
[0029]
The scanning electrodes 210 formed on the first substrate 200 were formed on the left and right sides of the second substrate 300 protruding from the first substrate 200 through the conductive particles 114 mixed in the sealing material 130. The wirings 350 and 360 are connected to one end. The wirings 350 and 360 are routed at the left and right protruding portions and connected to the scan electrode connection regions 124a and 124b of the driver IC chip 124, respectively.
[0030]
Further, the signal electrode 310 formed on the second substrate 300 is directly connected to the output terminal of the driver IC chip 124. That is, the driver IC chip 124 is configured to supply a voltage directly to the signal electrode 310. The driver IC chip 124 and the flexible wiring board 150 are connected by a third wiring 370.
[0031]
Note that the liquid crystal panel 100 is actually provided with a polarizing plate and a retardation plate on the upper surface side of the first substrate 200, while a polarizing plate and a retardation plate are provided on the lower surface side of the second substrate 300. 1 is not shown in FIG.
[0032]
<Partial configuration of LCD panel>
FIG. 2 is a partial plan view of the liquid crystal panel 100 in the liquid crystal panel according to the present invention.
[0033]
For example, about 600 electrodes 110 are arranged at equal intervals along one side of the second substrate 300 in the liquid crystal panel 100. The width L1 of each electrode 110 is, for example, 22 μm, and the distance L2 between the electrodes 110 is, for example, 20 μm.
[0034]
The pitch interval L3 is 42 μm because it is the sum of the first width L1 and the interval L2. The width of the electrodes 110 is about 16 μm to 20 μm, and the distance L2 between the electrodes 110 is in the range of about 22 μm to 26 μm, for example.
[0035]
As described above, these electrodes 110 include the signal electrode 310 and the scanning electrode 210, the signal electrode terminal 320 is disposed at the center, and the scanning electrode terminals 220 are disposed at both ends thereof.
[0036]
If the signal electrode terminal 320 and the scan electrode terminal 220 of the liquid crystal panel 100 are not short-circuited or disconnected, the liquid crystal panel 100 is displayed normally. Therefore, the signal electrode terminal 320 and the scan electrode terminal 220 will be described later. By inspecting the display of the liquid crystal panel 100 by, for example, visual observation by applying a predetermined voltage at the probe terminal 1, it is possible to inspect these short circuits and disconnections.
[0037]
<Partial configuration of inspection device>
FIG. 3 is a plan view showing the configuration of the inspection device 3 of the liquid crystal panel 100. 4 is a cross-sectional view taken along the line AA ′ in FIG.
[0038]
This inspection device 3 is for applying a voltage to the signal electrode terminal 320 and the scan electrode terminal 220 to inspect the liquid crystal panel 100 for short circuit or disconnection.
[0039]
On the substrate 15 of the inspection apparatus 3, the probe terminals 1 are arranged at equal intervals. The probe terminal 1 has an extended region 11 and a non-contact region 13 covered with an insulator 14, and a contact region 12 whose surface is exposed. Here, the substrate 15 is made of, for example, polyimide resin, the probe terminal 1 is made of, for example, nickel alloy, and the insulator 14 is made of, for example, polyimide resin.
[0040]
Here, the probe terminal 1 in the contact region 12 is smaller in width than the probe terminal 1 in the extended region 11 or the non-contact region 13 covered with the insulator 14.
[0041]
By reducing the width of the probe terminal 1 in the contact region 12 in this way, each probe terminal 1 does not contact over two or more of the electrodes 110 of the liquid crystal panel 100 facing each other at the time of inspection. Moreover, it is possible to prevent the wiring resistance from increasing due to the width of the extended region 11 and the non-contact region 13 being larger than the contact region 12. If the width of the probe terminal 1 itself is reduced for the purpose of simply having a one-to-one correspondence with the electrode 110, the wiring resistance increases and the liquid crystal panel 100 is not displayed normally. Therefore, according to the present invention, only the width of the contact region 12 that is in contact is reduced, and the width of the other region is larger than that of the contact region 12, so that the wiring resistance is not increased and more than two electrodes 110 are in contact. The inspection can be performed stably.
[0042]
Further, by covering the extended region 11 other than the contact region 12 and the non-contact region 13 with the insulator 14, the portion of the probe terminal 1 covered with the insulator 14 can be prevented from contacting the electrode 110. That is, the inspection error due to the short circuit can be prevented by covering the portion of the probe terminal 1 unnecessary for contact with the insulator 14.
[0043]
Depending on the thickness of the insulator 14 that covers the extended region 11 and the non-contact region 13 as described above, there is a possibility of causing a problem in contact with the electrode 110 of the liquid crystal panel 100. In order to eliminate such a problem, in this embodiment, the pressing part 10 is particularly provided. The pressing portion 10 is made of a rigid body, for example, a nickel alloy, and is provided on the surface opposite to the surface on which the probe terminal 1 of the substrate 15 is provided. Further, the pressing portion 10 presses the probe terminal 1 in the contact area 12 and the electrode 110 of the liquid crystal panel 100 so as to contact with each other, and therefore is disposed at a position corresponding to the contact area 12. Thereby, the probe terminal 1 in the contact area | region 12 and the electrode 110 of the liquid crystal panel 100 can be made to contact reliably.
[0044]
FIG. 5 is a diagram schematically showing a state where the electrode 110 of the liquid crystal panel 100 and the probe terminal 1 of the inspection apparatus 3 are in contact with each other.
[0045]
For example, about 600 probe terminals 1 in the inspection apparatus 3 are arranged at equal intervals so as to correspond to the electrodes 110 of the liquid crystal panel 100. The number of the probe terminals 1 may be the same as the number of the electrodes 110 of the liquid crystal panel 100, but may be more than that. By increasing the number of probe terminals 1 to some extent than the number of electrodes 110 of the liquid crystal panel 100, alignment between them can be performed more easily and reliably.
[0046]
The width L4 of each probe terminal 1 in the contact region 12 is, for example, 16 μm, and the interval L5 between the probe terminals 1 in the contact region 12 is, for example, 26 μm. The pitch L3 between the probe terminals 1 is, for example, 42 μm because it is the sum of the first width L1 and the interval L2.
[0047]
Further, the width L4 of each probe terminal 1 in the contact region 12 is about 16 μm to 20 μm, and the interval L5 between the probe terminals 1 in the contact region 12 is in the range of about 22 μm to 26 μm, for example. That is, the probe terminals 1 are arranged such that 1.5 to 2 times the width L4 of the probe terminals 1 in the contact region 12 is the interval L5 of the probe terminals 1 in the contact region 12.
[0048]
With such a configuration, the contact area 12 is always in contact with the electrode 110, and the contact area 12 is not in contact with two or more electrodes 110. Thereby, the misjudgment of a short circuit and a disconnection test | inspection can be prevented.
[0049]
<Inspection process>
FIG. 6 is a flowchart of an inspection process such as a short circuit or disconnection in the liquid crystal panel 100. First, in STEP 1, the probe terminal 1 for inspection is brought into contact with the electrode 110 of the liquid crystal panel 100 while applying a voltage. In STEP2, the liquid crystal panel 100 is lit if it is touched in STEP1, so that it is not necessary to align the position. However, if it is not touched, it is not lit so that the probe terminal 1 is moved until it is lit. Here, the probe terminal 1 in contact with the electrode 110 inspects the liquid crystal display screen actually lit in STEP 3 for visual disconnection or short circuit. If the liquid crystal panel 100 is normally displayed by this inspection, it is used as a product.
[0050]
<Comparison with conventional products>
FIG. 7 is a comparison diagram with the conventional case when the electrode 110 of the liquid crystal panel 100 and the inspection probe terminal 1 are in contact with each other. (A) is the figure which the conventional probe terminal 2 and the electrode 110 of the liquid crystal panel 100 contacted, (b) is the figure which the probe terminal 1 which concerns on this invention, and the electrode 110 of the liquid crystal panel 100 contacted. In (a), the conventional probe terminal 2 has a width L4 ′ of μm, an interval L5 ′ of μm, and the first width L1 of the electrode 110 is as narrow as 22 μm. For this reason, there is a possibility of contact with two or more electrodes 110. Since erroneous determination is caused when two or more electrodes 110 are brought into contact with each other, it is necessary to perform alignment while confirming whether or not the CCD camera supports one-to-one correspondence. However, the CCD camera is very expensive, and there is a problem that the apparatus itself becomes large by incorporating it in the apparatus. In (b) which is an example of the present invention, the second width L4 of the probe terminal 1 for inspection is narrowed to 16 μm. As a result, there is no possibility that one probe terminal 1 is in contact with two or more electrodes 110, so that there is no need for alignment with a CCD camera or the like. Moreover, when it does not contact, all do not contact. In other words, it is possible to determine whether or not the liquid crystal panel 100 is in contact with each other by checking the liquid crystal panel 100 with the naked eye, instead of confirming the minute portion that is in contact. With such a configuration, it is easy to check whether the liquid crystal screen is lit by visual inspection without checking a minute part that is in contact with the CCD camera, so that the liquid crystal panel can be easily short-circuited or disconnected. Inspection can be performed.
[Brief description of the drawings]
FIG. 1 is a perspective view showing a configuration of a liquid crystal panel device of a liquid crystal panel according to the present invention.
FIG. 2 is a partially enlarged plan view of the liquid crystal panel device shown in FIG.
FIG. 3 is a plan view of a probe terminal for inspection.
FIG. 4 is a cross-sectional view of an inspection probe terminal.
FIG. 5 is a plan view when an electrode terminal and a probe terminal are in contact with each other.
FIG. 6 is a flowchart of an inspection process.
FIG. 7 is a comparison diagram between the prior art and the present invention when an electrode and a probe terminal are in contact with each other.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Probe terminal 2 Conventional probe terminal 3 Inspection apparatus 10 Press part 11 Extension area 12 Contact area 13 Non-contact area 100 Liquid crystal panel 220 Scan electrode terminal 320 Signal electrode terminal L1 1st width L2 Space | interval L3 Pitch L4 2nd Width L5 interval

Claims (5)

In an inspection apparatus for inspecting the liquid crystal panel by applying a voltage to each of a plurality of electrodes having a first width arranged at a predetermined interval on a glass substrate of the liquid crystal panel,
A substrate for probe terminals;
The substrate has a contact region having a second width smaller than the first width, the contact region being arranged at substantially the same spacing as the spacing between the electrodes, and the non-contact region being larger than the second width. A probe terminal group having a third width;
A non-contact area of the probe terminal is covered with an insulator, and a surface of the contact area of the probe terminal is exposed.   The probe terminal extends beyond a contact area, the extension area is covered with an insulator together with the non-contact area, and the probe terminal in the extension area has the third width. The liquid crystal panel inspection apparatus according to claim 1.   3. The rigid pressing member is provided on a surface opposite to the surface on which the probe terminal of the substrate is formed, at least at a position corresponding to the contact area. 4. LCD panel inspection equipment.   4. The liquid crystal panel according to claim 1, wherein an interval between the probe terminals in the contact region is 1.5 to 2 times the second width. 5. Inspection device. In an inspection method for inspecting the liquid crystal panel by applying a voltage to each of a plurality of electrodes having a first width arranged on the glass substrate of the liquid crystal panel at a predetermined interval,
A contact region having a second width smaller than the first width is arranged on the substrate for the probe terminal with a spacing substantially the same as the spacing between the electrodes, and the non-contact region is the second width. A probe terminal group having a third width larger than the width is brought into contact with an electrode of the liquid crystal panel, and a disconnection or a short circuit of the liquid crystal panel is inspected according to a display state of the liquid crystal panel. Inspection method.

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