JPH11281716A5 - - Google Patents

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Publication number
JPH11281716A5
JPH11281716A5 JP1999028218A JP2821899A JPH11281716A5 JP H11281716 A5 JPH11281716 A5 JP H11281716A5 JP 1999028218 A JP1999028218 A JP 1999028218A JP 2821899 A JP2821899 A JP 2821899A JP H11281716 A5 JPH11281716 A5 JP H11281716A5
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JP
Japan
Prior art keywords
test
additional
fault
detect
list
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1999028218A
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English (en)
Japanese (ja)
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JPH11281716A (ja
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Publication date
Priority claimed from US09/027,106 external-priority patent/US6067651A/en
Application filed filed Critical
Publication of JPH11281716A publication Critical patent/JPH11281716A/ja
Publication of JPH11281716A5 publication Critical patent/JPH11281716A5/ja
Withdrawn legal-status Critical Current

Links

JP11028218A 1998-02-20 1999-02-05 圧縮された一組の試験シ―ケンスを生成する方法 Withdrawn JPH11281716A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/027,106 US6067651A (en) 1998-02-20 1998-02-20 Test pattern generator having improved test sequence compaction
US027106 1998-02-20

Publications (2)

Publication Number Publication Date
JPH11281716A JPH11281716A (ja) 1999-10-15
JPH11281716A5 true JPH11281716A5 (https=) 2006-03-09

Family

ID=21835718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11028218A Withdrawn JPH11281716A (ja) 1998-02-20 1999-02-05 圧縮された一組の試験シ―ケンスを生成する方法

Country Status (3)

Country Link
US (1) US6067651A (https=)
JP (1) JPH11281716A (https=)
DE (1) DE19855488A1 (https=)

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DE10034897B4 (de) * 2000-07-18 2004-08-05 Infineon Technologies Ag Adresszähler zur Adressierung von synchronen hochfrequenten Digitalschaltungen, insbesondere Speicherbauelementen
US7103816B2 (en) * 2001-01-23 2006-09-05 Cadence Design Systems, Inc. Method and system for reducing test data volume in the testing of logic products
US6886124B2 (en) * 2001-02-07 2005-04-26 Nec Corporation Low hardware overhead scan based 3-weight weighted random BIST architectures
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US6845479B2 (en) * 2001-03-14 2005-01-18 Tality Uk Limited Method for testing for the presence of faults in digital circuits
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US6865704B2 (en) * 2001-11-09 2005-03-08 Agilent Technologies, Inc. Scan multiplexing for increasing the effective scan data exchange rate
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JP5017603B2 (ja) * 2005-11-30 2012-09-05 国立大学法人九州工業大学 変換装置、変換方法、変換方法をコンピュータに実行させることが可能なプログラム、及び、このプログラムを記録した記録媒体
JP5066684B2 (ja) * 2006-03-28 2012-11-07 国立大学法人九州工業大学 生成装置、生成方法、生成方法をコンピュータに実行させることが可能なプログラム、及び、このプログラムを記録した記録媒体
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US8059547B2 (en) * 2008-12-08 2011-11-15 Advantest Corporation Test apparatus and test method
US8483073B2 (en) * 2008-12-08 2013-07-09 Advantest Corporation Test apparatus and test method
US8666691B2 (en) 2008-12-08 2014-03-04 Advantest Corporation Test apparatus and test method
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US8743702B2 (en) * 2008-12-08 2014-06-03 Advantest Corporation Test apparatus and test method
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JP7214440B2 (ja) * 2018-11-01 2023-01-30 三菱重工エンジニアリング株式会社 検証処理装置、検証処理方法及びプログラム

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