JPH11279752A - Production of sputtering target for phase transition-type optical recording - Google Patents

Production of sputtering target for phase transition-type optical recording

Info

Publication number
JPH11279752A
JPH11279752A JP8004498A JP8004498A JPH11279752A JP H11279752 A JPH11279752 A JP H11279752A JP 8004498 A JP8004498 A JP 8004498A JP 8004498 A JP8004498 A JP 8004498A JP H11279752 A JPH11279752 A JP H11279752A
Authority
JP
Japan
Prior art keywords
sputtering target
atomic
optical recording
sputtering
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8004498A
Other languages
Japanese (ja)
Inventor
Toshito Kishi
俊人 岸
Hiroyuki Ito
弘幸 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal Mining Co Ltd
Original Assignee
Sumitomo Metal Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Mining Co Ltd filed Critical Sumitomo Metal Mining Co Ltd
Priority to JP8004498A priority Critical patent/JPH11279752A/en
Publication of JPH11279752A publication Critical patent/JPH11279752A/en
Pending legal-status Critical Current

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  • Powder Metallurgy (AREA)
  • Physical Vapour Deposition (AREA)
  • Manufacturing Optical Record Carriers (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide the method for producing a sputtering target for a phase transition type optical recording medium being a hardly sinterable material so as to regulate the structure with high mass-productivity. SOLUTION: In this method for producing the sputtering target for phase transition type optical recording having a compsn. contg. at least one kind among Ge, Ag and In by 3 to 50 atomic % and 10 to 50 atomic % Sb, contg., at need, <5 atomic % additive, and the balance substantial Te, as the raw material powder, alloy powder contg. at least one kind among Ge, Ag and In, a prescribed amt. of Sb and a prescribed amt. of Te, preferably atomizing alloy powder stomized from the molten state and rapidly cooled is used and is sintered by a discharge plasma method. The temp. rising to a prescribed temp. at the time of the discharge plasma sintering is executed within 30 min, and the holding to the prescribed temp. is executed within 30 min.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、相変化型光記録媒
体をスパッタリング法によって製造するときに用いるス
パッタリングターゲットの製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a sputtering target used for manufacturing a phase-change optical recording medium by a sputtering method.

【0002】[0002]

【従来の技術】相変化型光記録用スパッタリングターゲ
ットは難焼結材料であるため、通常は真空ホットプレス
またはHIP等により製造されている。しかし、いずれ
の方法も設備費用が高価である上、量産性に劣るため、
製品コストの上昇につながるという欠点をもっている。
また、当該ターゲットは、成膜中に生じる異常放電の防
止や、成膜された膜の膜厚分布や膜質を均質に保つため
に、ターゲットの組織を制御する必要がある。そのた
め、焼結条件に制約が生じ、十分な高密度焼結体が得に
くいという間題もある。
2. Description of the Related Art Since a phase change type optical recording sputtering target is a hardly sinterable material, it is usually manufactured by vacuum hot pressing or HIP. However, both methods are expensive in equipment cost and inferior in mass productivity.
It has the drawback of increasing the product cost.
In addition, it is necessary to control the structure of the target in order to prevent abnormal discharge that occurs during film formation and to maintain uniform film thickness distribution and film quality of the formed film. For this reason, there is a problem that sintering conditions are restricted, and it is difficult to obtain a sufficiently high-density sintered body.

【0003】[0003]

【発明が解決しようとする課題】本発明は、上記の間題
点を解決し、量産性に優れ、また組織の制御が可能な、
ターゲットの製造方法を提供することにある。
DISCLOSURE OF THE INVENTION The present invention solves the above problems, is excellent in mass productivity, and can control the organization.
An object of the present invention is to provide a method for manufacturing a target.

【0004】[0004]

【課題を解決するための手段】本発明者らは種々検討し
た結果、放電プラズマ焼結法を用いることで、上記目的
を解決可能であることを見出し本発明に至った。すなわ
ち、上記課題を解決する本発明は、Ge、Ag、Inの
うちの少なくとも一種を3〜50原子%、Sbを10〜
50原子%含み、必要に応じ5原子%未満の添加物を含
み、残部が実質的にTeの相変化型光記録用スパッタリ
ングターゲットの製造方法において、原料粉末としてG
e、Ag、Inのうちの少なくとも一種と、所定量のS
bと、所定量のTeとを合む合金粉末、好ましくは溶融
状態からアトマイズして急冷されたアトマイズ合金粉末
を用い、放電プラズマ法により焼結するものであり、放
電プラズマ焼結時の所定温度までの昇温を30分以内で
行い、所定温度での保持を30分以内とするものであ
る。
As a result of various studies, the present inventors have found that the above object can be solved by using a discharge plasma sintering method, and have reached the present invention. In other words, the present invention for solving the above-mentioned problem is that at least one of Ge, Ag, and In is 3 to 50 atomic% and Sb is 10 to 10 atomic%.
In a method for producing a phase change optical recording sputtering target containing 50 atomic%, optionally containing less than 5 atomic% of additives, and the balance being substantially Te, G is used as a raw material powder.
e, Ag, In and at least one of S
b, and an alloy powder obtained by combining a predetermined amount of Te, preferably an atomized alloy powder that has been atomized from a molten state and quenched, and sintered by a discharge plasma method. Is maintained within 30 minutes, and holding at a predetermined temperature is performed within 30 minutes.

【0005】[0005]

【発明の実施の形態】スパッタリングターゲットを用い
て成膜する場合、得られる膜が均質であることが必要と
なる。また、成膜中に異常放電等が起きないことが必要
である。この目的をかなえるためにはスパッタリングタ
ーゲットの組成が均一で、かつ複数相に分離していない
ことが望まれる。よって、得られるスパッタリングター
ゲットの組織を制御することが必要となる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS When a film is formed using a sputtering target, it is necessary that the obtained film is homogeneous. Further, it is necessary that abnormal discharge or the like does not occur during film formation. For this purpose, it is desired that the composition of the sputtering target be uniform and not separated into a plurality of phases. Therefore, it is necessary to control the structure of the obtained sputtering target.

【0006】本発明で原料粉末として合金粉末を用いる
のはこのためであり、より制御しやすくするために溶融
状態からガスアトマイズ法等により急冷して得られた粉
末を用いることが望まれる。また、本発明において所定
温度までの昇温時間を30分以内、所定温度での保持時
間を30分以内とするのも上記組織制御の観点より行う
ものである。この組織制御をより良好にするためには、
所定温度までの昇温に20分以内とし、所定温度での保
持時間を15分以内とすることが望ましい。
This is why the alloy powder is used as the raw material powder in the present invention, and it is desirable to use a powder obtained by quenching from a molten state by a gas atomizing method or the like in order to make it easier to control. Further, in the present invention, the time required to raise the temperature to the predetermined temperature is set to 30 minutes or less, and the holding time at the predetermined temperature is set to 30 minutes or less from the viewpoint of the above-mentioned tissue control. For better organizational control,
It is desirable that the temperature rise to the predetermined temperature be within 20 minutes and the holding time at the predetermined temperature be within 15 minutes.

【0007】なお、用いる合金粉の粒径は特に限定され
ないが、平均粒径で10〜200μmとすると十分な給
粉密度が得られ、高密度焼結体が得られやすいので好ま
しい。
The particle size of the alloy powder to be used is not particularly limited. However, it is preferable that the average particle size is 10 to 200 μm because a sufficient powder supply density can be obtained and a high-density sintered body can be easily obtained.

【0008】スパッタリングターゲットの密度は、膜質
に特に目立った影響を与えないが、ターゲットの寿命を
考慮すると高密度であることが望まれる。よって、相対
密度90%以上を確保することが好ましい。本発明で
は、焼結保持温度を制御することで比較的容易に90%
以上の高密度ターゲットを得ることができる。
Although the density of the sputtering target does not particularly affect the film quality, it is desirable that the density be high in consideration of the life of the target. Therefore, it is preferable to secure a relative density of 90% or more. In the present invention, it is relatively easy to control the sintering temperature by 90%.
The above high-density target can be obtained.

【0009】[0009]

【実施例】次に実施例を用いて本発明をさらに説明す
る。
Next, the present invention will be further described with reference to examples.

【0010】(実施例1)Geを22原子%、Sbを2
2原子%、Teを56原子%合む鋳塊を粉砕して平均粒
径100μmの合金粉末とし、これを直径130mmの
グラファイト型に給粉し、放電プラズマ焼結機を用い
て、圧力を100kg/cm2とし、400℃まで15
分で昇温し、400℃で10分保持して焼結体を得た。
この焼結体を127mmφ、厚さ5mmに加工後密度を
測定したところ相対密度95%であった。
(Example 1) Ge 22 at%, Sb 2
An ingot containing 2 at% and 56 at% Te was pulverized to obtain an alloy powder having an average particle diameter of 100 μm, supplied to a graphite mold having a diameter of 130 mm, and then pressured to 100 kg using a discharge plasma sintering machine. / Cm 2 and 15 to 400 ° C
And heated at 400 ° C. for 10 minutes to obtain a sintered body.
After processing this sintered body to 127 mmφ and a thickness of 5 mm, the density was measured and the relative density was 95%.

【0011】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性に特に問題はなく、良好なものであ
った。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 angstrom thick Ge, Sb, and Te alloy film. The obtained film had no problem in film thickness distribution and recording characteristics, and was good.

【0012】なお、スパッタリング中1〜2回/分程度
の異常放電が観察された。
During the sputtering, an abnormal discharge of about 1 to 2 times / minute was observed.

【0013】(実施例2)Geを22原子%、Sbを2
2原子%、Teを56原子%合む融体を用い、アルゴン
ガスを用いたガスアトマイズ法により平均粒径150μ
mの合金粉を作製し、これを直径130mmのグラファ
イト型に給粉し、放電プラズマ焼結機を用いて、圧力を
100kg/cm2とし、400℃まで15分で昇温
し、400℃で10分保持して焼結体を得た。この焼結
体を直径127mm、厚さ5mmに加工後密度を測定し
たところ相対密度95%であった。
(Example 2) 22% by atom of Ge and 2% of Sb
Using a melt containing 2 atomic% and 56 atomic% of Te, the average particle diameter was 150 μm by a gas atomizing method using argon gas.
m was prepared and supplied to a graphite mold having a diameter of 130 mm, and the pressure was increased to 100 kg / cm 2 using a discharge plasma sintering machine. After holding for 10 minutes, a sintered body was obtained. The density was measured after processing this sintered compact into a diameter of 127 mm and a thickness of 5 mm, and the relative density was 95%.

【0014】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性に特に問題はなく、良好なものであ
った。
After joining the processed sputtering target to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 Å thick Ge, Sb, and Te alloy film. The obtained film had no problem in film thickness distribution and recording characteristics, and was good.

【0015】なお、スパッタリング中に異常放電は観察
されず、成膜速度も使用開始から使用終了までの間に5
%低下したのみであった。
No abnormal discharge was observed during sputtering, and the deposition rate was 5 times between the start of use and the end of use.
%.

【0016】(実施例3)焼結時に400℃まで30分
で昇温し、400℃で30分保持して焼結体を得た以外
は実施例2と同様にして焼結体を得た。この焼結体を直
径127mm、厚さ5mmに加工後密度を測定したとこ
ろ相対密度95%であった。
Example 3 A sintered body was obtained in the same manner as in Example 2 except that the temperature was raised to 400 ° C. in 30 minutes at the time of sintering and the temperature was maintained at 400 ° C. for 30 minutes to obtain a sintered body. . The density was measured after processing this sintered compact into a diameter of 127 mm and a thickness of 5 mm, and the relative density was 95%.

【0017】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性に特に問題はなく、良好なものであ
った。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a Ge, Sb, and Te alloy film having a thickness of 500 angstroms. The obtained film had no problem in film thickness distribution and recording characteristics, and was good.

【0018】なお、スパッタリング中1〜2回/分程度
の異常放電が観察された。
Incidentally, an abnormal discharge of about 1 to 2 times / minute was observed during sputtering.

【0019】(実施例4)用いる合金粉の平均粒径を5
0μmにした以外は実施例1と同様にして焼結体を得
た。この焼結体を直径127mm、厚さ5mmに加工後
密度を測定したところ相対密度98%であった。
Example 4 The average particle size of the alloy powder used was 5
A sintered body was obtained in the same manner as in Example 1 except that the thickness was set to 0 μm. The density was measured after processing this sintered compact into a diameter of 127 mm and a thickness of 5 mm, and the relative density was 98%.

【0020】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性に特に問題はなく、良好なものであ
った。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 Å thick Ge, Sb, and Te alloy film. The obtained film had no problem in film thickness distribution and recording characteristics, and was good.

【0021】なお、スパッタリング中1〜2回/分程度
の異常放電が観察された。
Incidentally, an abnormal discharge of about 1 to 2 times / minute was observed during sputtering.

【0022】(実施例5)実施例2で得られたアトマイ
ズ粉を粉砕し平均粒径が10μmの粉末を作製した。こ
の合金粉末を用いた以外は実施例1と同様にして焼結体
を得た。この焼結体を直径127mm、厚さ5mmに加
工後密度を測定したところ相対密度94%であった。
Example 5 The atomized powder obtained in Example 2 was pulverized to produce a powder having an average particle diameter of 10 μm. A sintered body was obtained in the same manner as in Example 1 except that this alloy powder was used. After processing this sintered body to a diameter of 127 mm and a thickness of 5 mm, the density was measured and the relative density was 94%.

【0023】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性に特に問題はないものの、実施例1
と比較した場合膜厚分布のばらつきが若干大きめであっ
た。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 Å thick Ge, Sb, and Te alloy film. Although the obtained film had no particular problem in the film thickness distribution and the recording characteristics, Example 1 was used.
When compared with, the variation in the film thickness distribution was slightly larger.

【0024】なお、スパッタリング中の異常放電も2〜
3回/分程度に増加していた。
It should be noted that the abnormal discharge during sputtering is also 2 to 2.
It increased to about 3 times / minute.

【0025】(実施例6)用いる合金粉の平均粒径を2
00μmにした以外は実施例1と同様にして焼結体を得
た。この焼結体を直径127mm、厚さ5mmに加工後
密度を測定したところ相対密度91%であった。
Example 6 The average particle size of the alloy powder used was 2
A sintered body was obtained in the same manner as in Example 1 except that the thickness was set to 00 μm. After processing this sintered body into a diameter of 127 mm and a thickness of 5 mm, the density was measured and the relative density was 91%.

【0026】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性に特に問題はないものの、実施例1
と比較した場合膜厚分布のばらつきが若干大きめであっ
た。
After the processed sputtering target was joined to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 Å thick Ge, Sb, and Te alloy film. Although the obtained film had no particular problem in the film thickness distribution and the recording characteristics, Example 1 was used.
When compared with, the variation in the film thickness distribution was slightly larger.

【0027】(実施例7)実施例2で得られたアトマイ
ズ粉を粉砕し平均粒径が8μmの粉末を作製した。この
合金粉末を用いた以外は実施例1と同様にして焼結体を
得た。この焼結体を直径127mm、厚さ5mmに加工
後密度を測定したところ相対密度92%であった。
Example 7 The atomized powder obtained in Example 2 was pulverized to produce a powder having an average particle size of 8 μm. A sintered body was obtained in the same manner as in Example 1 except that this alloy powder was used. After processing this sintered body into a diameter of 127 mm and a thickness of 5 mm, the density was measured and the relative density was 92%.

【0028】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性が実施例1,2より劣るものの使用
可能なものであった。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 angstrom thick Ge, Sb, and Te alloy film. The obtained film was usable although it was inferior to Examples 1 and 2 in film thickness distribution and recording characteristics.

【0029】なお、スパッタリング中の異常放電は7〜
9回/分程度となっていた。
The abnormal discharge during sputtering is 7 to
It was about 9 times / minute.

【0030】(実施例8)用いる合金粉の平均粒径を2
50μmにした以外は実施例1と同様にして焼結体を得
た。この焼結体を直径127mm、厚さ5mmに加工後
密度を測定したところ相対密度93%であった。
Example 8 The average particle size of the alloy powder used was 2
A sintered body was obtained in the same manner as in Example 1 except that the thickness was 50 μm. After processing this sintered body to a diameter of 127 mm and a thickness of 5 mm, the density was measured and the relative density was 93%.

【0031】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性が実施例1,2より劣るものの使用
可能なものであった。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a 500 angstrom thick Ge, Sb, and Te alloy film. The obtained film was usable although it was inferior to Examples 1 and 2 in film thickness distribution and recording characteristics.

【0032】なお、スパッタリング中の異常放電は5〜
6回/分程度となっていた。
The abnormal discharge during sputtering is 5 to
It was about 6 times / minute.

【0033】(比較例1)焼結時に400℃まで45分
で昇温し、400℃で45分保持して焼結体を得た以外
は実施例2と同様にして焼結体を得た。この焼結体を直
径127mm、厚さ5mmに加工後密度を測定したとこ
ろ相対密度95%であった。
Comparative Example 1 A sintered body was obtained in the same manner as in Example 2 except that the temperature was raised to 400 ° C. in 45 minutes during sintering and held at 400 ° C. for 45 minutes to obtain a sintered body. . The density was measured after processing this sintered compact into a diameter of 127 mm and a thickness of 5 mm, and the relative density was 95%.

【0034】加工して得たスパッタリングターゲットを
銅製のバッキングプレートに接合した後、ガラス基板上
に常法に従いDCスパッタを行い厚さ500オングスト
ロームのGe、Sb、Te合金膜を得た。得られた膜は
膜厚分布、記録特性が劣り使用に適さないものであるこ
とがわかった。
After the processed sputtering target was bonded to a copper backing plate, DC sputtering was performed on a glass substrate according to a conventional method to obtain a Ge, Sb, and Te alloy film having a thickness of 500 Å. It was found that the obtained film had poor film thickness distribution and recording characteristics and was unsuitable for use.

【0035】なお、スパッタリング中の異常放電も23
〜28回/分程度に増加していた。
It should be noted that abnormal discharge during sputtering is also 23
It increased to about 28 times / minute.

【0036】スパッタリング終了後にスパッタリングタ
ーゲットの組織分析を行ったところ一部に二相分離して
いる部分が観察された。
When the structure of the sputtering target was analyzed after the completion of the sputtering, a part where two phases were separated was observed.

【0037】[0037]

【発明の効果】本発明では、放電プラズマ焼結法を用い
るため、昇温速度を速くすることが可能であり、組織が
二相分離する前にターゲットの作製が終了するため良好
なスパッタリングターゲットを得ることが可能である。
また、本発明の方法は量産性に優れているため経済的効
果も大となる。
According to the present invention, since the discharge plasma sintering method is used, the rate of temperature rise can be increased, and the production of the target is completed before the structure is separated into two phases. It is possible to get.
Further, the method of the present invention is excellent in mass productivity, so that the economic effect is also large.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 Ge、Ag、Inのうちの少なくとも
一種を3〜50原子%、Sbを10〜50原子%含み、
必要に応じ5原子%未満の添加物を含み、残部が実質的
にTeの相変化型光記録用スパッタリングターゲットの
製造方法において、原料粉末としてGe、Ag、Inの
うちの少なくとも一種と、所定量のSbと、所定量のT
eとを合む合金粉末、好ましくは溶融状態からアトマイ
ズして急冷されたアトマイズ合金粉末を用い、放電プラ
ズマ法により焼結するものであり、放電プラズマ焼結時
の所定温度までの昇温を30分以内で行い、所定温度で
の保持を30分以内とすることを特徴とする相変化型光
記録用スパッタリングターゲットの製造方法。
1. A method according to claim 1, wherein at least one of Ge, Ag, and In is contained in an amount of 3 to 50 atomic% and Sb in an amount of 10 to 50 atomic%.
In a method for producing a sputtering target for phase-change optical recording, which contains an additive of less than 5 atomic% as necessary and the balance is substantially Te, at least one of Ge, Ag, and In as raw material powder and a predetermined amount Sb and a predetermined amount of T
e, and sintering is performed by a discharge plasma method using an atomized alloy powder which is atomized from a molten state and rapidly cooled, and the temperature is raised to a predetermined temperature during discharge plasma sintering by 30%. A method for producing a sputtering target for phase-change optical recording, wherein the sputtering is performed within minutes and the holding at a predetermined temperature is performed within 30 minutes.
【請求項2】 原料粉末として溶融状態からアトマイ
ズして急冷されたアトマイズ合金粉末を用いる請求項1
記載の方法。
2. An atomized alloy powder which is atomized from a molten state and quenched as a raw material powder.
The described method.
【請求項3】 原料粉末として平均粒径が10〜20
0μmの粉末を用いる請求項1または2記載の方法。
3. The raw material powder has an average particle size of 10 to 20.
3. The method according to claim 1, wherein a powder of 0 μm is used.
JP8004498A 1998-03-27 1998-03-27 Production of sputtering target for phase transition-type optical recording Pending JPH11279752A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8004498A JPH11279752A (en) 1998-03-27 1998-03-27 Production of sputtering target for phase transition-type optical recording

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8004498A JPH11279752A (en) 1998-03-27 1998-03-27 Production of sputtering target for phase transition-type optical recording

Publications (1)

Publication Number Publication Date
JPH11279752A true JPH11279752A (en) 1999-10-12

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ID=13707255

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004067798A1 (en) * 2003-01-27 2004-08-12 Nikko Materials Co., Ltd. Ge-Cr ALLOY SPUTTERING TARGET AND PROCESS FOR PRODUCING THE SAME
WO2005005683A1 (en) * 2003-07-15 2005-01-20 Nikko Materials Co., Ltd. Sputtering target and optical recording medium
JP2006137962A (en) * 2004-11-10 2006-06-01 Mitsubishi Materials Corp Method for producing target for forming phase change recording film with which presputtering time is shortened
KR100599396B1 (en) * 2004-08-31 2006-07-10 한양대학교 산학협력단 A method of manufacturing a Ge-Sb-Te sputtering target with a high density
US7182815B2 (en) 2001-01-15 2007-02-27 Seiko Epson Corporation Apparatus and method for producing color filters by discharging material
KR100711833B1 (en) * 2006-01-04 2007-05-02 한국생산기술연구원 Alloy target and method for manufacturing ti-al-si alloy target by mechanical alloying and spark plasma sintering
JP2007131941A (en) * 2006-05-26 2007-05-31 Mitsubishi Materials Corp Method for producing sputtering target for forming phase change film having reduced generation of particle
KR101024971B1 (en) 2008-12-12 2011-03-25 희성금속 주식회사 A Method of Powder and Target of Precious Metals by Thermal Plasma

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7182815B2 (en) 2001-01-15 2007-02-27 Seiko Epson Corporation Apparatus and method for producing color filters by discharging material
US7901741B2 (en) 2001-01-15 2011-03-08 Seiko Epson Corporation Apparatus and method for producing color filters by discharging material
WO2004067798A1 (en) * 2003-01-27 2004-08-12 Nikko Materials Co., Ltd. Ge-Cr ALLOY SPUTTERING TARGET AND PROCESS FOR PRODUCING THE SAME
WO2005005683A1 (en) * 2003-07-15 2005-01-20 Nikko Materials Co., Ltd. Sputtering target and optical recording medium
KR100599396B1 (en) * 2004-08-31 2006-07-10 한양대학교 산학협력단 A method of manufacturing a Ge-Sb-Te sputtering target with a high density
JP2006137962A (en) * 2004-11-10 2006-06-01 Mitsubishi Materials Corp Method for producing target for forming phase change recording film with which presputtering time is shortened
JP4687949B2 (en) * 2004-11-10 2011-05-25 三菱マテリアル株式会社 Method for producing target for forming phase change recording film with short pre-sputtering time
KR100711833B1 (en) * 2006-01-04 2007-05-02 한국생산기술연구원 Alloy target and method for manufacturing ti-al-si alloy target by mechanical alloying and spark plasma sintering
JP2007131941A (en) * 2006-05-26 2007-05-31 Mitsubishi Materials Corp Method for producing sputtering target for forming phase change film having reduced generation of particle
KR101024971B1 (en) 2008-12-12 2011-03-25 희성금속 주식회사 A Method of Powder and Target of Precious Metals by Thermal Plasma

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