JPH11239758A - Substrate treatment apparatus - Google Patents

Substrate treatment apparatus

Info

Publication number
JPH11239758A
JPH11239758A JP10044893A JP4489398A JPH11239758A JP H11239758 A JPH11239758 A JP H11239758A JP 10044893 A JP10044893 A JP 10044893A JP 4489398 A JP4489398 A JP 4489398A JP H11239758 A JPH11239758 A JP H11239758A
Authority
JP
Japan
Prior art keywords
substrate
holding
rotating member
rotating
magnet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10044893A
Other languages
Japanese (ja)
Inventor
Manabu Yabe
学 矢部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP10044893A priority Critical patent/JPH11239758A/en
Publication of JPH11239758A publication Critical patent/JPH11239758A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a substrate treatment apparatus in which the contamination of the substrate by the mist of treating liquid adhered to a member for rotating/ holding the substrate is prevented. SOLUTION: The rotation member 11 of a substrate holding part is equipped with support pins 14 for supporting the substrate and a rotary holding pin 15 for regulating the horizontal position of the substrate, fixed to the upper end of the rotary shaft of a motor, rotated, and driven. A member in which the surface of a metal is coated with a fluororesin or the surface of an aluminum base material is plated with nickel-polytetrafluoroethylene and others are used as the rotation member 11. The pin fixing part 17 of the rotary holding pin 15, a magnet housing part 19, and a fitting member 22 are formed from a water repellent resin such as polypropylene, and the clearances A, B between the fixing part 17 and fitting member 22 and between the magnet housing part 19 and the fitting part 17 are adjusted to be 0.5-1.0 mm.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、基板を回転させつ
つ処理液を基板に供給して所定の処理を行う基板処理装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate processing apparatus for performing a predetermined process by supplying a processing liquid to a substrate while rotating the substrate.

【0002】[0002]

【従来の技術】半導体ウエハ、液晶表示装置用ガラス基
板、フォトマスク用ガラス基板、光ディスク用ガラス基
板等の基板に種々の処理を行うために回転式の基板処理
装置が用いられている。たとえば、基板の表面に形成さ
れた感光性膜の現像処理には、回転式の現像装置が用い
られている。この現像装置を用いた基板の現像処理は、
現像液供給、現像液保持、純水洗浄および乾燥の各工程
からなる。
2. Description of the Related Art Rotary substrate processing apparatuses are used to perform various processes on substrates such as semiconductor wafers, glass substrates for liquid crystal display devices, glass substrates for photomasks, and glass substrates for optical disks. For example, a rotary developing device is used for developing a photosensitive film formed on the surface of a substrate. The development processing of the substrate using this developing device is as follows.
It comprises the steps of developer supply, developer maintenance, pure water washing and drying.

【0003】図5は従来の現像装置の概略断面図であ
り、現像液供給工程を示している。図5において、現像
装置は基板Wを保持する基板保持部41を備える。基板
保持部41は、モータ(図示せず)の回転軸50の先端
部に水平に固定されかつ鉛直方向の軸の周りで回転駆動
される回転部材42を備える。回転部材42の上面に
は、基板Wの裏面を支持する複数の支持ピン43が設け
られるとともに、基板Wの外周端部に当接して基板Wの
水平方向の位置を規制する複数の規制ピン44が設けら
れている。
FIG. 5 is a schematic sectional view of a conventional developing device, showing a developing solution supply step. In FIG. 5, the developing device includes a substrate holding unit 41 that holds a substrate W. The substrate holding unit 41 includes a rotating member 42 fixed horizontally to a distal end of a rotating shaft 50 of a motor (not shown) and driven to rotate around a vertical axis. A plurality of support pins 43 for supporting the back surface of the substrate W are provided on the upper surface of the rotating member 42, and a plurality of restriction pins 44 for contacting the outer peripheral edge of the substrate W to regulate the horizontal position of the substrate W. Is provided.

【0004】基板保持部41の上方には、現像液を吐出
する現像ノズル51が上下方向および水平方向に移動可
能に設けられている。現像ノズル51は、現像液供給前
および現像液供給後に基板Wの上方から外れた位置に待
機し、現像液供給時に基板Wの中心部の上方に移動す
る。
[0004] Above the substrate holding section 41, a developing nozzle 51 for discharging a developing solution is provided so as to be movable in the vertical and horizontal directions. The developing nozzle 51 stands by at a position deviated from above the substrate W before supplying the developing solution and after supplying the developing solution, and moves above the central portion of the substrate W when supplying the developing solution.

【0005】この現像装置を用いた現像液供給工程で
は、基板Wが基板保持部41に保持された後、モータに
より基板保持部41が回転駆動され、この状態で基板W
の上方に移動した現像ノズル51から基板W上に現像液
30が吐出され、回転に伴う遠心力により基板Wの全面
に塗り広げられる。
In the developing solution supply step using this developing device, after the substrate W is held by the substrate holding portion 41, the substrate holding portion 41 is driven to rotate by a motor.
The developer 30 is discharged onto the substrate W from the developing nozzle 51 that has moved upward, and is spread over the entire surface of the substrate W by centrifugal force due to rotation.

【0006】現像液保持工程では、基板保持部41の回
転が停止され、現像液30が基板Wの全面に塗り広げら
れた状態で基板Wが一定時間静止される。これにより、
基板Wの感光性膜の現像が進行する。
In the developing solution holding step, the rotation of the substrate holding portion 41 is stopped, and the substrate W is stopped for a certain time while the developing solution 30 is spread over the entire surface of the substrate W. This allows
The development of the photosensitive film on the substrate W proceeds.

【0007】純水洗浄工程では、基板保持部41が再び
回転駆動され、基板Wの表面に純水供給ノズル(図示せ
ず)から純水が供給され、基板Wの表面の純水洗浄が行
われる。
In the pure water cleaning step, the substrate holding section 41 is driven to rotate again, pure water is supplied to the surface of the substrate W from a pure water supply nozzle (not shown), and the surface of the substrate W is cleaned with pure water. Will be

【0008】乾燥工程では、純水の供給が停止された
後、基板保持部41が高速で回転駆動され、回転に伴う
遠心力により基板Wの表面から純水が振り切られる。こ
れにより、基板Wが乾燥する。その後、基板保持部41
の回転が停止し、基板Wの現像処理が終了する。
In the drying step, after the supply of the pure water is stopped, the substrate holding unit 41 is driven to rotate at a high speed, and the pure water is shaken off from the surface of the substrate W by the centrifugal force accompanying the rotation. Thereby, the substrate W is dried. Thereafter, the substrate holding unit 41
Stops, and the development processing of the substrate W ends.

【0009】[0009]

【発明が解決しようとする課題】図5に示す現像液供給
工程では、基板保持部41に保持された基板Wが低速で
回転駆動された状態で現像液ノズル51から現像液30
が基板Wの表面に吐出される。現像液30が基板Wの全
面に均一に行き渡るように多量に吐出されると、現像液
30は基板Wの外周部から支持ピン43や規制ピン44
を伝わり回転部材42に流れ落ち、回転部材42の外周
部に付着する。
In the developing solution supply step shown in FIG. 5, the developing solution 30 is supplied from the developing solution nozzle 51 to the developing solution nozzle 51 while the substrate W held by the substrate holding portion 41 is rotated at a low speed.
Is discharged onto the surface of the substrate W. When a large amount of the developer 30 is discharged so as to uniformly spread over the entire surface of the substrate W, the developer 30 is supplied from the outer peripheral portion of the substrate W to the support pins 43 and the regulating pins 44.
And flows down to the rotating member 42 and adheres to the outer peripheral portion of the rotating member 42.

【0010】その後、基板Wの回転が停止されると、回
転部材42に落下した現像液30の付着領域が広がり、
現像液30の一部は回転部材42の下面側に回り込み、
付着する。
Thereafter, when the rotation of the substrate W is stopped, the area of the developer 30 which has fallen on the rotating member 42 is expanded,
Part of the developer 30 goes around the lower surface of the rotating member 42,
Adhere to.

【0011】上記したように、現像液供給工程の後に
は、現像液保持工程を経て純水洗浄工程が行われる。純
水洗浄工程では、基板Wの表面に純水が供給され、基板
Wの表面が洗浄される。このとき、純水は回転部材42
側にも流れ落ち、先の現像液供給工程において回転部材
42に付着した現像液30を部分的に洗い流す。
As described above, after the developing solution supply step, the pure water washing step is performed through the developing solution holding step. In the pure water cleaning step, pure water is supplied to the surface of the substrate W, and the surface of the substrate W is cleaned. At this time, pure water is supplied to the rotating member 42.
The developer 30 also flows down to the side, and the developer 30 attached to the rotating member 42 in the previous developer supply step is partially washed away.

【0012】しかしながら、純水は基板保持部41が回
転している状態で供給されるため、基板Wの外方側に向
かって遠心力を受ける。このため、純水は、静止時に回
転部材42の上面や下面に広がった現像液30を完全に
洗い流すことができず、回転部材42の上面や下面に現
像液30の付着領域が残余する。
However, since the pure water is supplied while the substrate holder 41 is rotating, the pure water receives a centrifugal force toward the outside of the substrate W. For this reason, the pure water cannot completely wash away the developer 30 that has spread on the upper and lower surfaces of the rotating member 42 at rest, leaving a region where the developer 30 adheres to the upper and lower surfaces of the rotating member 42.

【0013】この現像液の付着領域は、乾燥工程におい
て基板保持部41が高速回転されると、カップ45内に
ミスト(液体粒子)となって浮遊し、基板Wの表面に再
付着して基板Wを汚染する。また、長期間にわたって回
転部材42の上面および下面に付着した現像液が固化す
ると、現像液の固化物によるパーティクル(塵埃)が発
生し、カップ45内に浮遊して基板Wを汚染する。
When the substrate holding portion 41 is rotated at a high speed in the drying step, the developing liquid adheres to the developing region and floats as mist (liquid particles) in the cup 45, and re-adheres to the surface of the substrate W to be re-adhered. Contaminates W. When the developer adhering to the upper and lower surfaces of the rotating member 42 is solidified for a long period of time, particles (dust) due to the solidified product of the developer are generated, and float in the cup 45 to contaminate the substrate W.

【0014】本発明の目的は、基板を回転保持する部材
に付着した処理液のミストによる基板の汚染が防止され
た基板処理装置を提供することである。
It is an object of the present invention to provide a substrate processing apparatus in which contamination of a substrate by a mist of a processing liquid adhered to a member for holding a substrate in rotation is prevented.

【0015】[0015]

【課題を解決するための手段および発明の効果】第1の
発明に係る基板処理装置は、基板を回転させつつ基板に
所定の処理を行う基板処理装置であって、回転自在な回
転部材と、基板の外周部に沿うように回転部材上に設け
られ、基板の外周端部に当接して基板を保持する複数の
保持部材と、回転部材を回転駆動する駆動手段と、複数
の保持部材により保持された基板に処理液を供給する処
理液供給手段とを備え、複数の保持部材により保持され
た基板の表面に対向する回転部材の表面が撥水性を有す
るものである。
Means for Solving the Problems and Effects of the Invention A substrate processing apparatus according to a first aspect of the present invention is a substrate processing apparatus for performing a predetermined process on a substrate while rotating the substrate. A plurality of holding members provided on the rotating member along the outer peripheral portion of the substrate and holding the substrate in contact with the outer peripheral edge of the substrate, driving means for rotating and driving the rotating member, and holding by the plurality of holding members And a processing liquid supply means for supplying a processing liquid to the substrate, wherein the surface of the rotating member facing the surface of the substrate held by the plurality of holding members has water repellency.

【0016】第1の発明に係る基板処理装置において
は、複数の保持部材によって回転部材上に保持された基
板が駆動手段により回転駆動される。処理液供給手段は
回転部材上の基板に処理液を供給し、基板に対して所定
の処理を行わせる。処理液供給手段から多量の処理液が
基板に供給されると、その一部は基板から回転部材上に
流れ落ちる。回転部材の表面は撥水性を有している。こ
のため、回転部材上に流れ落ちた処理液は回転部材の表
面で弾かれ、回転部材の回転により外方へ飛散される。
これにより、処理液が回転部材の表面に付着することが
妨げられ、回転部材の表面に付着した処理液がミストと
なって基板表面を汚染することを防止することができ
る。
In the substrate processing apparatus according to the first invention, the substrate held on the rotating member by the plurality of holding members is rotationally driven by the driving means. The processing liquid supply unit supplies the processing liquid to the substrate on the rotating member, and causes the substrate to perform predetermined processing. When a large amount of processing liquid is supplied to the substrate from the processing liquid supply unit, a part of the processing liquid flows down from the substrate onto the rotating member. The surface of the rotating member has water repellency. For this reason, the processing liquid that has flowed down onto the rotating member is repelled on the surface of the rotating member and is scattered outward by the rotation of the rotating member.
This prevents the processing liquid from adhering to the surface of the rotating member, thereby preventing the processing liquid adhering to the surface of the rotating member from becoming mist and contaminating the substrate surface.

【0017】第2の発明に係る基板処理装置は、第1の
発明に係る基板処理装置の構成において、各保持部材
が、回転部材を貫通して鉛直方向に延びる回転軸と、回
転部材に固定され、回転軸を回転自在に支持する取り付
け部と、回転軸の上端に取り付けられた支持部と、支持
部の回動に伴って基板の外周端部に当接するように回転
軸に対して偏心して支持部上に設けられた保持部と、回
転軸の下端に取り付けられ、支持部の回動のための磁力
を発生する磁石を収納する磁石収納部とを備える。さら
に、少なくとも取り付け部と支持部との間の隙間におけ
る取り付け部および支持部の表面と、取り付け部と磁石
収納部との間の隙間における取り付け部および磁石収納
部の表面とが撥水性を有するものである。
According to a second aspect of the present invention, in the configuration of the substrate processing apparatus according to the first aspect, each of the holding members is fixed to the rotating member by a rotating shaft extending vertically through the rotating member. A mounting portion for rotatably supporting the rotating shaft, a supporting portion mounted on the upper end of the rotating shaft, and a biasing portion with respect to the rotating shaft such that the rotating shaft is in contact with the outer peripheral end of the substrate with the rotation of the supporting portion. A holding portion is provided on the supporting portion while being centered, and a magnet storage portion is provided at a lower end of the rotating shaft and stores a magnet for generating a magnetic force for rotating the supporting portion. Further, at least the surfaces of the mounting portion and the support portion in the gap between the mounting portion and the support portion and the surfaces of the mounting portion and the magnet storage portion in the gap between the mounting portion and the magnet storage portion have water repellency. It is.

【0018】各保持部材の保持部は基板の外周端部に当
接して基板を水平方向に保持する。このため、基板に供
給された処理液の一部は保持部を通り、取り付け部、支
持部および磁石収納部を伝って流れ落ちる。保持部材で
は、回転部材に対して回転軸が回転自在となるように取
り付け部と支持部の間および取り付け部と磁石収納部の
間に隙間が設けられている。そして、この隙間における
取り付け部と支持部の表面および取り付け部と磁石収納
部の表面が撥水性を有するように形成されている。この
ため、基板から流れ落ちた処理液はこれら表面の撥水性
により隙間内に侵入することが妨げられる。それゆえ、
取り付け部および磁石収納部と支持部との各隙間に処理
液が侵入し、侵入した処理液が後工程においてミストと
なって飛散して基板を汚染することが防止される。さら
に、各隙間に侵入した処理液が固化して保持部材の回転
軸の回転動作を妨げることを防止することができる。
The holding portion of each holding member contacts the outer peripheral end of the substrate to hold the substrate in the horizontal direction. For this reason, a part of the processing liquid supplied to the substrate passes through the holding unit, and flows down along the mounting unit, the support unit, and the magnet storage unit. In the holding member, gaps are provided between the mounting portion and the support portion and between the mounting portion and the magnet housing portion so that the rotation shaft is rotatable with respect to the rotating member. Then, the surfaces of the mounting portion and the support portion and the surfaces of the mounting portion and the magnet housing portion in this gap are formed so as to have water repellency. For this reason, the treatment liquid that has flowed down from the substrate is prevented from entering the gap due to the water repellency of these surfaces. therefore,
The processing liquid intrudes into each of the gaps between the mounting part and the magnet housing part and the support part, and the infiltrating processing liquid is prevented from becoming a mist in a later step and scattering and contaminating the substrate. Further, it is possible to prevent the processing liquid that has entered each gap from solidifying and hindering the rotation operation of the rotation shaft of the holding member.

【0019】第3の発明に係る基板処理装置は、第2の
発明に係る基板処理装置の構成において、取り付け部と
支持部との間の隙間および取り付け部と磁石保持部との
隙間が0.5mm以上1.0mm以下であるものであ
る。
A substrate processing apparatus according to a third aspect of the present invention is the substrate processing apparatus according to the second aspect of the present invention, wherein the gap between the mounting section and the support section and the gap between the mounting section and the magnet holding section are set to 0. It is not less than 5 mm and not more than 1.0 mm.

【0020】取り付け部と支持部との隙間および取り付
け部と磁石保持部との隙間を0.5mm以上1.0mm
以下とすることにより、各隙間内の表面の撥水作用によ
り処理液が各隙間に侵入することを防止することができ
る。各隙間が0.5mmより小さい場合には、取り付け
部と支持部および取り付け部と磁石保持部との隙間が微
小となり、各部材の取り付けに高精度が要求され、組み
立て作業が困難となる。また、各隙間が1.0mmより
大きい場合には、各隙間内の表面の撥水性の作用が小さ
くなり、各隙間に処理液が侵入する。したがって、各隙
間を上記の値に設定することにより各隙間への処理液の
侵入を防止することができる。
The gap between the mounting part and the support part and the gap between the mounting part and the magnet holding part are 0.5 mm or more and 1.0 mm or more.
By doing so, it is possible to prevent the treatment liquid from entering the gaps due to the water repellency of the surface in each gap. If each gap is smaller than 0.5 mm, the gap between the mounting portion and the supporting portion and between the mounting portion and the magnet holding portion becomes very small, and high accuracy is required for mounting each member, and assembling work becomes difficult. When each gap is larger than 1.0 mm, the effect of water repellency on the surface in each gap is reduced, and the processing liquid enters each gap. Therefore, by setting each gap to the above value, it is possible to prevent the processing liquid from entering each gap.

【0021】第4の発明に係る基板処理装置は、第1〜
第3のいずれかの発明に係る基板処理装置の構成におい
て、回転部材の表面における水に対する接触角が70°
以上180°以下であるものである。
According to a fourth aspect of the present invention, there is provided a substrate processing apparatus comprising:
In the configuration of the substrate processing apparatus according to any one of the third inventions, the contact angle of water on the surface of the rotating member is 70 °.
At least 180 °.

【0022】この場合、回転部材の表面の水に接する接
触角が70°より小さい場合には、処理液を十分に弾く
ことが困難となる。したがって、水に対する接触角が7
0°以上で180°以下とすることにより、回転部材に
流れ落ちる処理液を外方へ飛散して処理液の付着を防止
することができる。
In this case, if the contact angle of the surface of the rotating member in contact with water is smaller than 70 °, it becomes difficult to sufficiently repel the processing liquid. Therefore, the contact angle with water is 7
By setting the angle to 0 ° or more and 180 ° or less, the processing liquid flowing down to the rotating member can be scattered outward to prevent the processing liquid from adhering.

【0023】[0023]

【発明の実施の形態】図1は本発明の一実施例による回
転式の現像装置の断面図であり、図2は図1中の現像装
置の平面図である。
FIG. 1 is a sectional view of a rotary developing device according to an embodiment of the present invention, and FIG. 2 is a plan view of the developing device in FIG.

【0024】図1および図2において、基板保持部1は
円形板状の回転部材11を備える。回転部材11は、ア
ルミニウムを母材に使用し、基板Wの表面に対向する表
面にニッケル−ポリテトラフルオロエチレンめっきが施
されている。ニッケル−ポリテトラフルオロエチレンめ
っきの水に対する接触角は約100°と大きく、現像液
を弾くことができる。また、他の例としては、アルマイ
トに撥水性の樹脂を含浸処理したもの、あるいはチタン
合金等の金属材料の表面にフッ素系樹脂をコーティング
(被膜処理)したものを用いてもよい。
In FIGS. 1 and 2, the substrate holder 1 includes a rotating member 11 having a circular plate shape. The rotating member 11 uses aluminum as a base material, and has a surface facing the surface of the substrate W plated with nickel-polytetrafluoroethylene. The contact angle of nickel-polytetrafluoroethylene plating with water is as large as about 100 °, and can repel the developer. Further, as another example, a material obtained by impregnating a water-repellent resin into alumite or a material obtained by coating (coating) a fluorine-based resin on the surface of a metal material such as a titanium alloy may be used.

【0025】回転部材11は、モータ3の回転軸2の先
端に取り付け部材12を介して水平に固定され、鉛直方
向の軸の周りで回転駆動される。
The rotating member 11 is horizontally fixed to the tip of the rotating shaft 2 of the motor 3 via a mounting member 12, and is driven to rotate around a vertical axis.

【0026】回転部材11の上面には、樹脂からなる環
状のカバー部材13が形成されており、このカバー部材
13の上面から、基板Wの裏面を支持する複数の支持ピ
ン14が突出している。
An annular cover member 13 made of resin is formed on the upper surface of the rotating member 11, and a plurality of support pins 14 for supporting the back surface of the substrate W project from the upper surface of the cover member 13.

【0027】また、回転部材11には、基板Wの水平位
置を規制する複数の回転式保持ピン15が鉛直方向の軸
の周りで回動可能に取り付けられている。図3は回転式
保持ピン(a)および取り付け部材(b)の斜視図であ
る。さらに、図4は現像装置における回転式保持ピン近
傍の拡大断面図である。図3(a)および図4におい
て、回転式保持ピン15は、円柱状のピン固定部17、
円柱状(棒状)のピン部材16、連結軸18および磁石
収納部19を備える。ピン部材16は、ピン固定部17
の上面に、ピン固定部17の中心に対して偏心して設け
られている。磁石収納部19は、ピン固定部17の下部
に連結軸18を介して固定されている。磁石収納部19
内には棒状の永久磁石20が収納されている。
A plurality of rotatable holding pins 15 for regulating the horizontal position of the substrate W are attached to the rotating member 11 so as to be rotatable around a vertical axis. FIG. 3 is a perspective view of the rotary holding pin (a) and the mounting member (b). FIG. 4 is an enlarged sectional view of the vicinity of the rotary holding pin in the developing device. In FIG. 3A and FIG. 4, the rotary holding pin 15 includes a cylindrical pin fixing portion 17,
It includes a columnar (rod-shaped) pin member 16, a connecting shaft 18 and a magnet housing 19. The pin member 16 includes a pin fixing portion 17.
Are provided eccentrically with respect to the center of the pin fixing portion 17. The magnet housing portion 19 is fixed to a lower portion of the pin fixing portion 17 via a connecting shaft 18. Magnet storage unit 19
A rod-shaped permanent magnet 20 is housed therein.

【0028】回転式保持ピン15は取り付け部材22に
より回転部材11に取り付けられる。図3(b)におい
て、取り付け部材22は1対の取り付け孔22aを有
し、回転部材11(図1参照)の下面外周にねじ止め固
定される。取り付け部材22はベアリング収納部21を
有し、ベアリング収納部21内に収納されたベアリング
23の軸孔内に回転式保持ピン15の連結軸18が挿通
される。これにより、図4に示すように、回転式保持ピ
ン15のピン部材16およびピン固定部17が回転部材
11の上面側に突出し、回転式保持ピン15の磁石収納
部19が回転部材11の下面側に突出する。
The rotating holding pin 15 is attached to the rotating member 11 by an attaching member 22. 3B, the mounting member 22 has a pair of mounting holes 22a, and is fixed to the outer periphery of the lower surface of the rotating member 11 (see FIG. 1) by screwing. The mounting member 22 has a bearing housing 21, and the connecting shaft 18 of the rotary holding pin 15 is inserted into a shaft hole of a bearing 23 housed in the bearing housing 21. Thereby, as shown in FIG. 4, the pin member 16 and the pin fixing portion 17 of the rotary holding pin 15 protrude toward the upper surface side of the rotating member 11, and the magnet housing portion 19 of the rotary holding pin 15 moves to the lower surface of the rotating member 11. Project to the side.

【0029】回転式保持ピン15において、ピン部材1
6、ピン固定部17、取り付け部材22および磁石収納
部19は撥水性を有するポロプロピレン、あるいはポリ
テトラフルオロエチレン等の樹脂から形成されている。
ポリプロピレンの水に対する接触角は約80°、ポリテ
トラフルオロエチレンの接触角は90〜100°であ
り、共に高い撥水性を有している。このため、被着した
現像液を弾き、流下させることができる。なお、これら
の部材は上記の撥水性を有する樹脂材料で形成するのみ
ならず、金属材料の表面にポリテトラフルオロエチレン
等の撥水性材料をコーティングしたもの、あるいはフッ
化グラファイト等の表面処理を施したものを用いてもよ
い。フッ化グラファイトの水に対する接触角は140〜
180°である。
In the rotary holding pin 15, the pin member 1
6, the pin fixing portion 17, the mounting member 22, and the magnet housing portion 19 are made of water-repellent resin such as polypropylene or polytetrafluoroethylene.
The contact angle of polypropylene to water is about 80 °, and the contact angle of polytetrafluoroethylene is 90 to 100 °, both of which have high water repellency. Therefore, the applied developer can be repelled and flow down. These members are not only formed of the above-mentioned water-repellent resin material, but are also made of a metal material having a surface coated with a water-repellent material such as polytetrafluoroethylene, or subjected to a surface treatment such as graphite fluoride. You may use what was done. The contact angle of graphite fluoride to water is 140 ~
180 °.

【0030】また、図4において、ピン固定部17と取
り付け部材21との間に形成される隙間Aおよび取り付
け部材22と磁石収納部19との間に形成される隙間B
の間隔d1,d2は0.5mm以上1mm以下に調整さ
れる。各隙間A,Bにおけるピン固定部17、取り付け
部材22および磁石収納部19の表面は撥水性を有して
いる。このため、各隙間の間隔d1,d2を1mm以下
に調整することにより、隙間A,Bを介して対向する各
部材の表面の撥水性により現像液が弾かれ、隙間A,B
を通過することが妨げられる。これにより、ベアリング
保持部21内に現像液が侵入して滞留したり、非撥水性
のベアリング23に現像液が被着することが防止され
る。また、各隙間の間隔d1,d2が0.5mmより小
さくなると、隙間の調整に高い精度が要求され、組み立
て作業が困難となる。
In FIG. 4, a gap A formed between the pin fixing portion 17 and the mounting member 21 and a gap B formed between the mounting member 22 and the magnet housing portion 19.
Are adjusted to 0.5 mm or more and 1 mm or less. The surfaces of the pin fixing portion 17, the mounting member 22, and the magnet housing portion 19 in each of the gaps A and B have water repellency. Therefore, by adjusting the gaps d1 and d2 between the gaps to 1 mm or less, the developer is repelled by the water repellency of the surfaces of the members facing each other via the gaps A and B, and the gaps A and B are adjusted.
Is prevented from passing through. This prevents the developer from entering and staying in the bearing holding portion 21 and preventing the developer from adhering to the non-water-repellent bearing 23. If the distances d1 and d2 between the gaps are smaller than 0.5 mm, high precision is required for adjusting the gaps, and the assembling work becomes difficult.

【0031】回転部材11の下方には環状磁石6が配設
されている。この環状磁石6は、駆動装置(図示せず)
により上下動自在に設けられた磁石支持部材7に固定さ
れている。
An annular magnet 6 is provided below the rotating member 11. This annular magnet 6 is driven by a driving device (not shown).
Are fixed to a magnet support member 7 provided to be vertically movable.

【0032】磁石支持部材7が上昇すると、環状磁石6
と回転式保持ピン15の永久磁石20とが引き合い、回
転式保持ピン15が回転してピン部材16が基板Wの外
周端部に当接して基板Wの水平方向の位置を保持する。
また、磁石支持部材7が下降すると、回転式保持ピン1
5が逆方向に回動し、ピン部材16が基板Wの外周端部
から離間する。このような動作により、基板Wの外周端
部が回転式保持ピン15により保持され、あるいは開放
される。
When the magnet support member 7 rises, the annular magnet 6
And the permanent magnet 20 of the rotary holding pin 15 attracts, the rotary holding pin 15 rotates, and the pin member 16 abuts on the outer peripheral end of the substrate W to hold the horizontal position of the substrate W.
When the magnet supporting member 7 is lowered, the rotary holding pin 1 is moved.
5 rotates in the opposite direction, and the pin member 16 separates from the outer peripheral end of the substrate W. By such an operation, the outer peripheral end of the substrate W is held or opened by the rotary holding pins 15.

【0033】モータ3の回転軸2は中空軸により構成さ
れ、その内部に基板の裏面洗浄用のバックリンスノズル
9(図2参照)が挿入されている。このバックリンスノ
ズル9は取り付け部材12を貫通して基板Wの裏面側に
突出している。バックリンスノズル9の先端には、円錐
台状のキャップ8が取り付けられている。キャップ8
は、バックリンスノズル9から吐出されるリンス液(純
水)が回転軸2の内部に侵入することを防止するために
取り付けられている。
The rotating shaft 2 of the motor 3 is constituted by a hollow shaft, and a back rinse nozzle 9 (see FIG. 2) for cleaning the back surface of the substrate is inserted therein. The back rinse nozzle 9 penetrates through the mounting member 12 and protrudes to the back side of the substrate W. At the tip of the back rinse nozzle 9, a truncated conical cap 8 is attached. Cap 8
Is mounted to prevent the rinsing liquid (pure water) discharged from the back rinsing nozzle 9 from entering the inside of the rotating shaft 2.

【0034】また、基板保持部1の上方には、現像液を
吐出する現像ノズル10が上下方向および水平方向に移
動可能に設けられている。この現像ノズル10は、現像
処理前および現像処理後に基板Wの上方から外れた位置
に待機し、現像処理時に基板Wの中心部の上方に移動す
る。
Above the substrate holder 1, a developing nozzle 10 for discharging a developing solution is provided so as to be movable in the vertical and horizontal directions. The developing nozzle 10 waits at a position deviated from above the substrate W before the developing process and after the developing process, and moves above the central portion of the substrate W during the developing process.

【0035】さらに、基板保持部1の周囲を取り囲むよ
うに中空のカップ4が配設されている。カップ4は上下
方向に移動可能な上カップ4aと、上カップ4aの下方
に固定された下カップ4bとからなる。下カップ4bの
下部には現像装置の上方からカップ4内に下降される清
浄な空気の下降流(ダウンフロー)を排気するための排
気口4cが設けられている。
Further, a hollow cup 4 is provided so as to surround the periphery of the substrate holding section 1. The cup 4 includes an upper cup 4a that can move in the vertical direction, and a lower cup 4b fixed below the upper cup 4a. An exhaust port 4c is provided below the lower cup 4b for exhausting a downward flow (downflow) of clean air descending into the cup 4 from above the developing device.

【0036】本実施例において、回転式保持ピン15が
本発明の保持部材に相当し、モータ3が駆動手段に相当
し、現像ノズル10が処理液供給手段に相当する。ま
た、回転式保持ピン15のピン部材16が本発明の保持
部に相当し、ピン固定部17が支持部に相当し、連結軸
18が回転軸に相当し、磁石収納部19が磁石収納部に
相当し、取り付け部材22が取り付け部に相当する。
In this embodiment, the rotary holding pin 15 corresponds to the holding member of the present invention, the motor 3 corresponds to the driving means, and the developing nozzle 10 corresponds to the processing liquid supply means. Further, the pin member 16 of the rotary holding pin 15 corresponds to the holding portion of the present invention, the pin fixing portion 17 corresponds to the supporting portion, the connecting shaft 18 corresponds to the rotating shaft, and the magnet housing portion 19 corresponds to the magnet housing portion. , And the mounting member 22 corresponds to a mounting portion.

【0037】次に、図1の現像装置における現像処理時
の動作について説明する。この現像装置においては、上
方から清浄なダウンフローがカップ4の内外に供給され
つつ現像処理が行われる。現像処理では、現像液供給、
現像液保持、純水洗浄および乾燥の各工程が順に行われ
る。
Next, the operation of the developing device of FIG. 1 during the developing process will be described. In this developing device, the developing process is performed while a clean downflow is supplied into and out of the cup 4 from above. In the development process, the developer supply,
The steps of holding the developing solution, washing with pure water, and drying are sequentially performed.

【0038】まず、基板Wが基板保持部1の支持ピン1
4上に載置される。次に、環状磁石6が上昇して複数の
回転式保持ピン15が基板Wを水平方向に保持する。
First, the substrate W is supported by the support pins 1 of the substrate holder 1.
4. Next, the annular magnet 6 is raised, and the plurality of rotary holding pins 15 hold the substrate W in the horizontal direction.

【0039】現像液供給工程では、モータ3により基板
保持部1が低速で回転駆動された状態で、現像ノズル1
0から基板W上に現像液が吐出される。吐出された現像
液は基板Wの全面に均一に塗り広げられる。
In the developing solution supply step, the developing nozzle 1 is rotated while the substrate holder 1 is rotated at a low speed by the motor 3.
From 0, the developer is discharged onto the substrate W. The discharged developer is uniformly spread over the entire surface of the substrate W.

【0040】現像ノズル10からは比較的多量の現像液
が吐出される。このため、現像液の一部は回転式保持ピ
ン15を伝わり回転部材11に流れ落ちる。回転式保持
ピン15および回転部材11の表面は撥水性を有してい
る。このため、基板Wから流れ落ちた現像液は回転式保
持ピン15および回転部材11の表面に付着することな
く基板保持部1の回転により外方に飛散される。
A relatively large amount of developing solution is discharged from the developing nozzle 10. For this reason, a part of the developer flows down the rotary holding pin 15 and flows down to the rotating member 11. The surfaces of the rotary holding pin 15 and the rotary member 11 have water repellency. For this reason, the developer flowing down from the substrate W is scattered outward by the rotation of the substrate holding unit 1 without adhering to the surfaces of the rotary holding pins 15 and the rotating member 11.

【0041】さらに、現像液保持工程では、基板保持部
1の回転が停止される。基板保持部1が停止されると、
環状磁石6が下降して回転式保持ピン15が開放状態と
なる。この状態で、現像液が基板W上に一定時間静止保
持される。これにより、基板W上の感光性膜の現像が進
行する。この場合には、現像液は回転式保持ピン15お
よび回転部材11の表面に付着することなくはじかれた
状態で回転部材11の表面に載っており、回転部材11
の回転により遠心力が働けば、速やかに流れ落ちる。
Further, in the developing solution holding step, the rotation of the substrate holding unit 1 is stopped. When the substrate holding unit 1 is stopped,
The annular magnet 6 descends, and the rotary holding pin 15 is opened. In this state, the developer is kept stationary on the substrate W for a certain period of time. Thereby, development of the photosensitive film on the substrate W proceeds. In this case, the developer is placed on the surface of the rotating member 11 in a state where the developer is repelled without adhering to the surfaces of the rotating holding pin 15 and the rotating member 11.
If centrifugal force acts due to the rotation of, it flows down quickly.

【0042】次に、洗浄工程では、環状磁石6が再び上
昇して回転式保持ピン15により基板Wが水平方向に保
持される。そして、モータ3により基板保持部1が回転
駆動され、基板Wが所定の速度で回転する。この洗浄工
程では純水供給ノズル(図示せず)から基板W上に純水
が吐出されて基板Wの表面が洗浄されるとともに、バッ
クリンスノズル9(図2参照)からリンス液(純水)が
吐出されて基板Wの裏面が洗浄される。
Next, in the cleaning step, the annular magnet 6 is raised again and the substrate W is held in the horizontal direction by the rotary holding pins 15. Then, the substrate holding unit 1 is rotationally driven by the motor 3, and the substrate W rotates at a predetermined speed. In this cleaning step, pure water is discharged from the pure water supply nozzle (not shown) onto the substrate W to clean the surface of the substrate W, and the rinse liquid (pure water) is supplied from the back rinse nozzle 9 (see FIG. 2). Is discharged to clean the back surface of the substrate W.

【0043】基板Wの表面および裏面の洗浄処理が終了
すると、乾燥工程に移行する。乾燥工程では、モータ3
の回転数が高められ、基板Wが高速で回転される。これ
により、基板Wの表面に供給された純水が外方に振り切
られ、基板Wの表面が乾燥される。
Upon completion of the cleaning process for the front and back surfaces of the substrate W, the process proceeds to a drying step. In the drying process, the motor 3
Is increased, and the substrate W is rotated at a high speed. Thereby, the pure water supplied to the surface of the substrate W is shaken outward, and the surface of the substrate W is dried.

【0044】このように、回転部材11の表面あるいは
回転式保持ピン15の表面を撥水性に形成したことによ
り、現像液が付着し、後工程においてミストとなって基
板Wの表面を汚染することが防止される。また、回転式
保持ピン15のピン固定部17および磁石保持部19と
取り付け部材22との隙間に現像液が侵入して固化し、
回転式保持ピン15の回動動作を妨げることを防止する
ことができる。
As described above, since the surface of the rotating member 11 or the surface of the rotary holding pin 15 is formed to be water-repellent, the developing solution adheres and becomes a mist in a later step to contaminate the surface of the substrate W. Is prevented. Further, the developer enters the gap between the pin fixing portion 17 and the magnet holding portion 19 of the rotary holding pin 15 and the mounting member 22 and solidifies,
It is possible to prevent the rotation operation of the rotary holding pin 15 from being hindered.

【0045】さらに、基板保持部1に現像液が付着しに
くくなり、基板保持部1が清浄な状態に維持されること
により基板保持部1の洗浄等の保守作業の周期を長くす
ることができる。
Furthermore, the developer is less likely to adhere to the substrate holder 1, and the substrate holder 1 is maintained in a clean state, so that the period of maintenance work such as cleaning of the substrate holder 1 can be lengthened. .

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例における回転式の現像装置の
断面図である。
FIG. 1 is a sectional view of a rotary developing device according to an embodiment of the present invention.

【図2】図1の現像装置の平面図である。FIG. 2 is a plan view of the developing device of FIG.

【図3】回転式保持ピンおよび取り付け部材の斜視図で
ある。
FIG. 3 is a perspective view of a rotary holding pin and a mounting member.

【図4】現像装置における回転式保持ピン近傍の拡大断
面図である。
FIG. 4 is an enlarged sectional view of the vicinity of a rotary holding pin in the developing device.

【図5】従来の現像装置の断面模式図である。FIG. 5 is a schematic sectional view of a conventional developing device.

【符号の説明】[Explanation of symbols]

1 基板保持部 11 回転部材 14 支持ピン 15 回転式保持ピン 16 ピン部材 17 ピン固定部 18 連結軸 19 磁石収納部 21 ベアリング収納部 22 取り付け部材 23 ベアリング DESCRIPTION OF SYMBOLS 1 Substrate holding part 11 Rotating member 14 Support pin 15 Rotating holding pin 16 Pin member 17 Pin fixing part 18 Connecting shaft 19 Magnet storing part 21 Bearing storing part 22 Mounting member 23 Bearing

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 基板を回転させつつ基板に所定の処理を
行う基板処理装置であって、 回転自在な回転部材と、 基板の外周部に沿うように前記回転部材上に設けられ、
基板の外周端部に当接して基板を保持する複数の保持部
材と、 前記回転部材を回転駆動する駆動手段と、 前記複数の保持部材により保持された基板に処理液を供
給する処理液供給手段とを備え、 前記複数の保持部材により保持された基板の表面に対向
する前記回転部材の表面が撥水性を有することを特徴と
する基板処理装置。
1. A substrate processing apparatus for performing a predetermined process on a substrate while rotating the substrate, comprising: a rotatable rotary member; and a rotatable rotary member provided on the rotary member along an outer peripheral portion of the substrate.
A plurality of holding members that abut against an outer peripheral end of the substrate and hold the substrate; a driving unit that rotationally drives the rotating member; and a processing liquid supply unit that supplies a processing liquid to the substrate held by the plurality of holding members. Wherein the surface of the rotating member facing the surface of the substrate held by the plurality of holding members has water repellency.
【請求項2】 前記各保持部材は、 前記回転部材を貫通して鉛直方向に延びる回転軸と、 前記回転部材に固定され、前記回転軸を回転自在に支持
する取り付け部と、 前記回転軸の上端に取り付けられた支持部と、 前記支持部の回動に伴って基板の外周端部に当接するよ
うに前記回転軸に対して偏心して前記支持部上に設けら
れた保持部と、 前記回転軸の下端に取り付けられ、前記支持部の回動の
ための磁力を発生する磁石を収納する磁石収納部とを備
え、 少なくとも前記取り付け部と前記支持部との間の隙間に
おける前記取り付け部および前記支持部の表面と、前記
取り付け部と前記磁石収納部との間の隙間における前記
取り付け部および前記磁石収納部の表面とが撥水性を有
することを特徴とする請求項1記載の基板処理装置。
2. Each of the holding members includes: a rotating shaft extending vertically through the rotating member; a mounting portion fixed to the rotating member and rotatably supporting the rotating shaft; A support portion attached to an upper end, a holding portion provided on the support portion eccentrically with respect to the rotation axis so as to contact an outer peripheral end portion of the substrate with the rotation of the support portion, and the rotation A magnet accommodating portion attached to a lower end of a shaft and accommodating a magnet that generates a magnetic force for rotating the support portion, wherein the attaching portion and the attaching portion at least in a gap between the attaching portion and the supporting portion. 2. The substrate processing apparatus according to claim 1, wherein a surface of the support part and a surface of the mounting part and the magnet storage part in a gap between the mounting part and the magnet storage part have water repellency. 3.
【請求項3】 前記取り付け部と前記支持部との間の隙
間および前記取り付け部と前記磁石保持部との隙間が
0.5mm以上1.0mm以下であることを特徴とする
請求項2記載の基板処理装置。
3. The gap according to claim 2, wherein a gap between the mounting portion and the support portion and a gap between the mounting portion and the magnet holding portion are 0.5 mm or more and 1.0 mm or less. Substrate processing equipment.
【請求項4】 前記回転部材の表面における水に対する
接触角が70°以上180°以下であることを特徴とす
る請求項1〜3のいずれかに記載の基板処理装置。
4. The substrate processing apparatus according to claim 1, wherein a contact angle of the surface of the rotating member with water is 70 ° or more and 180 ° or less.
JP10044893A 1998-02-26 1998-02-26 Substrate treatment apparatus Pending JPH11239758A (en)

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Application Number Priority Date Filing Date Title
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