JP3499446B2 - Substrate processing equipment - Google Patents

Substrate processing equipment

Info

Publication number
JP3499446B2
JP3499446B2 JP23093398A JP23093398A JP3499446B2 JP 3499446 B2 JP3499446 B2 JP 3499446B2 JP 23093398 A JP23093398 A JP 23093398A JP 23093398 A JP23093398 A JP 23093398A JP 3499446 B2 JP3499446 B2 JP 3499446B2
Authority
JP
Japan
Prior art keywords
substrate
bearing
rotating member
holding
outer peripheral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP23093398A
Other languages
Japanese (ja)
Other versions
JP2000058428A (en
Inventor
学 矢部
靖 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Screen Holdings Co Ltd, Dainippon Screen Manufacturing Co Ltd filed Critical Screen Holdings Co Ltd
Priority to JP23093398A priority Critical patent/JP3499446B2/en
Publication of JP2000058428A publication Critical patent/JP2000058428A/en
Application granted granted Critical
Publication of JP3499446B2 publication Critical patent/JP3499446B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、処理液を基板上に
供給して基板に所定の処理を行う基板処理装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate processing apparatus for supplying a processing liquid onto a substrate to perform a predetermined processing on the substrate.

【0002】[0002]

【従来の技術】半導体ウエハ、液晶表示装置用ガラス基
板、フォトマスク用ガラス基板、光ディスク用ガラス基
板などの基板に種々の処理を行うために基板処理装置が
用いられている。たとえば、基板の表面に形成された感
光性膜の現像処理には、回転式の現像装置が用いられて
いる。
2. Description of the Related Art A substrate processing apparatus is used to perform various kinds of processing on a semiconductor wafer, a glass substrate for a liquid crystal display device, a glass substrate for a photomask, a glass substrate for an optical disk and the like. For example, a rotary developing device is used for developing the photosensitive film formed on the surface of the substrate.

【0003】図9は従来の現像装置の概略断面図であ
る。図9において、基板保持部31は、円形板状のスピ
ンベース32を備える。スピンベース32はモータ3の
回転軸2の先端部に水平に固定され、鉛直方向の軸の周
りで回転駆動される。
FIG. 9 is a schematic sectional view of a conventional developing device. In FIG. 9, the substrate holding unit 31 includes a circular plate-shaped spin base 32. The spin base 32 is horizontally fixed to the tip of the rotary shaft 2 of the motor 3, and is rotationally driven around a vertical axis.

【0004】スピンベース32の上面には環状支持部3
3が固定され、この環状支持部33に基板Wの裏面を支
持する複数の基板支持ピン34が設けられている。ま
た、スピンベース32には、基板Wの水平位置を規制す
る複数の基板保持ピン37が軸受38により鉛直方向の
軸の周りで回動可能に取り付けられている。各基板保持
ピン37の下部には棒状の永久磁石39が取り付けられ
ている。
On the upper surface of the spin base 32, an annular support portion 3 is provided.
3 is fixed, and a plurality of substrate support pins 34 that support the back surface of the substrate W are provided on the annular support portion 33. A plurality of substrate holding pins 37 that regulate the horizontal position of the substrate W are attached to the spin base 32 by bearings 38 so as to be rotatable around an axis in the vertical direction. A rod-shaped permanent magnet 39 is attached to the bottom of each substrate holding pin 37.

【0005】スピンベース32の下方には環状磁石41
が配設されている。この環状磁石41は、駆動装置(図
示せず)により上下動自在に設けられた磁石支持部材4
2に固定されている。
An annular magnet 41 is provided below the spin base 32.
Is provided. This annular magnet 41 is provided with a magnet support member 4 which is vertically movable by a drive device (not shown).
It is fixed at 2.

【0006】基板保持部31の上方には、現像液を吐出
する現像ノズル43が上下方向および水平方向に移動可
能に設けられている。この現像ノズル43は、現像処理
前および現像処理後に基板Wの上方から外れた位置に待
機し、現像処理時に基板Wの中心部の上方に移動する。
A developing nozzle 43 for ejecting a developing solution is provided above the substrate holding portion 31 so as to be movable in the vertical and horizontal directions. The developing nozzle 43 stands by at a position separated from above the substrate W before and after the developing process, and moves above the central portion of the substrate W during the developing process.

【0007】上記の現像装置における現像処理時の動作
を以下に説明する。この現像装置を用いた基板の現像処
理は、現像液供給、現像液保持、純水洗浄および乾燥の
各工程からなる。
The operation during the developing process in the above developing device will be described below. The development processing of the substrate using this developing device includes the steps of supplying a developing solution, retaining the developing solution, washing with pure water, and drying.

【0008】まず、現像液供給工程では、環状磁石41
が上昇して複数の基板保持ピン37により基板Wが水平
方向に保持される。その後、モータ3により基板保持部
31が回転駆動され、基板Wが鉛直方向の軸の周りで低
速回転する。この状態で、現像ノズル43から基板W上
に現像液が吐出される。基板Wの回転により現像液は基
板Wの表面の全体に均一に塗り広げられる。
First, in the developing solution supplying step, the annular magnet 41 is used.
And the substrate W is held in the horizontal direction by the plurality of substrate holding pins 37. After that, the substrate holding unit 31 is rotationally driven by the motor 3, and the substrate W rotates at a low speed around the axis in the vertical direction. In this state, the developing solution is discharged onto the substrate W from the developing nozzle 43. By the rotation of the substrate W, the developing solution is uniformly spread on the entire surface of the substrate W.

【0009】現像液保持工程では、基板保持部31の回
転が停止される。基板Wの回転が停止すると、環状磁石
41が下降して基板保持ピン37が開放状態となる。こ
れにより、基板W上に現像液が液盛りされ、一定時間静
止される。この間に、基板Wの感光性膜の現像が進行す
る。
In the developing solution holding step, the rotation of the substrate holding section 31 is stopped. When the rotation of the substrate W is stopped, the annular magnet 41 descends and the substrate holding pins 37 are opened. As a result, the developing solution is piled up on the substrate W and is left stationary for a certain period of time. During this time, the development of the photosensitive film on the substrate W proceeds.

【0010】純水洗浄工程では、基板保持部31が再び
回転駆動され、基板Wの表面に純水供給ノズル(図示せ
ず)から純水が供給され、基板Wの表面の純水洗浄が行
われる。
In the pure water cleaning step, the substrate holder 31 is driven to rotate again, pure water is supplied to the surface of the substrate W from a pure water supply nozzle (not shown), and the surface of the substrate W is cleaned with pure water. Be seen.

【0011】乾燥工程では、純水の供給が停止された
後、基板保持部31が高速で回転駆動され、回転に伴う
遠心力により基板Wの表面から純水が振り切られる。こ
れにより、基板Wが乾燥する。その後、基板保持部31
の回転が停止し、基板Wの現像処理が終了する。
In the drying step, after the supply of pure water is stopped, the substrate holder 31 is rotationally driven at a high speed, and the pure water is shaken off from the surface of the substrate W by the centrifugal force accompanying the rotation. As a result, the substrate W is dried. Then, the substrate holder 31
Is stopped, and the developing process of the substrate W is completed.

【0012】[0012]

【発明が解決しようとする課題】上記の現像液供給工程
では、基板保持部31に保持された基板Wが低速で回転
駆動された状態で現像ノズル43から現像液45が基板
Wの表面に吐出される。現像液45が基板Wの全面に均
一に行き渡るように多量に吐出されると、現像液45は
基板Wの外周部から基板保持ピン37の上面やスピンベ
ース32の上面外周部に流れ落ち、さらにスピンベース
32の外周部から下方に流れ落ちる。その後、基板Wの
回転が停止すると、一部の現像液はスピンベース32の
外周部から裏面を伝って構成部品間に徐々に浸透する。
In the developing solution supplying step described above, the developing solution 43 is discharged from the developing nozzle 43 onto the surface of the substrate W while the substrate W held by the substrate holding section 31 is rotationally driven at a low speed. To be done. When a large amount of the developing solution 45 is ejected so as to uniformly spread over the entire surface of the substrate W, the developing solution 45 flows down from the outer peripheral portion of the substrate W onto the upper surface of the substrate holding pin 37 and the upper peripheral portion of the upper surface of the spin base 32, and further spins. It flows down from the outer peripheral portion of the base 32. After that, when the rotation of the substrate W is stopped, a part of the developing solution propagates from the outer peripheral portion of the spin base 32 to the back surface and gradually permeates between the components.

【0013】特に、処理液が基板保持ピン37の軸受3
8内に浸入すると、基板保持ピン37の滑らかな動きが
損なわれる。また、構成部品間に浸透した現像液が固化
すると、乾燥工程で基板保持部31が高速回転したとき
に、固化した現像液がパーティクル(固体粒子)となっ
てカップ40内を浮遊し、基板Wの表面に再付着して基
板Wを汚染する。
In particular, the processing liquid is the bearing 3 of the substrate holding pin 37.
If it penetrates into the inside 8, smooth movement of the substrate holding pin 37 is impaired. Further, when the developing solution that has permeated between the components solidifies, the solidified developing solution becomes particles (solid particles) and floats in the cup 40 when the substrate holding unit 31 rotates at high speed in the drying process, and the substrate W It reattaches to the surface of the substrate and contaminates the substrate W.

【0014】本発明の目的は、基板に供給される処理液
が基板を保持する保持部材の回動部分に浸入することが
防止された基板処理装置を提供することである。
An object of the present invention is to provide a substrate processing apparatus in which the processing liquid supplied to the substrate is prevented from entering the rotating portion of the holding member holding the substrate.

【0015】[0015]

【課題を解決するための手段および発明の効果】第1の
発明に係る基板処理装置は、基板上に処理液を供給して
基板に所定の処理を行う基板処理装置であって、基板の
外径よりも大きな径を有する回転部材と、回転部材を回
転駆動する駆動手段と、基板の外周部に沿うように回転
部材に設けられ、基板の外周端部に当接して基板を保持
する複数の保持部材と、複数の保持部材により保持され
た基板上に処理液を供給する処理液供給手段とを備え、
複数の保持部材のうち少なくとも1つの保持部材は、回
転部材を上下に貫通するように設けられた軸受と、軸受
により回転部材上に回動自在に設けられた支持部と、支
持部の回動に伴って基板の外周端部に当接するように支
持部に設けられた保持部とを備え、回転部材は、回転部
材の外周部から下方に延びる周壁部を備えたものであ
る。
A substrate processing apparatus according to a first aspect of the present invention is a substrate processing apparatus for supplying a processing liquid onto a substrate to perform a predetermined process on the substrate. A rotating member having a diameter larger than the diameter, a driving unit that rotationally drives the rotating member, and a plurality of members that are provided on the rotating member along the outer peripheral portion of the substrate and contact the outer peripheral end portion of the substrate to hold the substrate. A holding member; and a processing liquid supply means for supplying the processing liquid onto the substrate held by the plurality of holding members,
At least one holding member of the plurality of holding members includes a bearing provided so as to vertically penetrate the rotary member, a support portion rotatably provided on the rotary member by the bearing, and a rotation of the support portion. Accordingly, the rotating member includes a holding portion provided on the supporting portion so as to come into contact with the outer peripheral end portion of the substrate, and the rotating member includes a peripheral wall portion extending downward from the outer peripheral portion of the rotating member.

【0016】第1の発明に係る基板処理装置において
は、複数の保持部材により基板が回転部材上に保持され
る。この場合、少なくとも1つの保持部材の保持部が軸
受による支持部の回動に伴って基板の外周端部に当接す
る。この状態で、回転部材が駆動手段により回転駆動さ
れ、処理液供給手段から基板上に処理液が供給される。
In the substrate processing apparatus according to the first aspect of the invention, the substrate is held on the rotating member by the plurality of holding members. In this case, the holding portion of the at least one holding member comes into contact with the outer peripheral end portion of the substrate as the support portion is rotated by the bearing. In this state, the rotating member is rotationally driven by the driving unit, and the processing liquid is supplied from the processing liquid supply unit onto the substrate.

【0017】基板上に供給された処理液の一部は基板の
外周部から回転部材上に流れ落ち、さらに回転部材の外
周部を伝って下面側に回り込もうとする。回転部材の外
周部には下方に延びる周壁部が形成されているため、そ
の周壁部により処理液が回転部材の下面側に回り込むこ
とが阻止される。それにより、保持部材の軸受に処理液
が浸入せず、処理液の浸入による軸受の動作不良が防止
される。また、軸受に浸入した処理液が固化することに
よるパーティクルの発生が防止される。
A part of the processing liquid supplied onto the substrate flows down from the outer peripheral portion of the substrate onto the rotating member, and further tries to go around to the lower surface side along the outer peripheral portion of the rotating member. Since the peripheral wall portion that extends downward is formed on the outer peripheral portion of the rotary member, the peripheral wall portion prevents the processing liquid from flowing around to the lower surface side of the rotary member. As a result, the treatment liquid does not enter the bearing of the holding member, and malfunction of the bearing due to the entry of the treatment liquid is prevented. Further, generation of particles due to solidification of the treatment liquid that has entered the bearing is prevented.

【0018】第2の発明に係る基板処理装置は、第1の
発明に係る基板処理装置の構成において、少なくとも1
つの保持部材は、回転部材の上面側に突出する環状壁部
を有しかつ軸受を収納する軸受収納部をさらに備え、支
持部は、軸受収納部の環状壁部の上部から外側を一定の
隙間を介して取り囲む蓋状部を有するものである。
A substrate processing apparatus according to a second aspect of the present invention has at least one of the substrate processing apparatus according to the first aspect of the present invention.
Each of the holding members further includes a bearing accommodating portion having an annular wall portion projecting to the upper surface side of the rotating member and accommodating the bearing, and the support portion has a constant gap outside the upper portion of the annular wall portion of the bearing accommodating portion. It has a lid-like portion surrounding it.

【0019】この場合、軸受が軸受収納部に収納される
とともに、回転部材の上面側に突出する軸受収納部の環
状壁部の上部から外側が支持部の蓋状部により一定の隙
間を介して覆われているので、基板上から保持部材の支
持部上に流れ落ちた処理液は支持部の蓋状部の外面に沿
って回転部材上に流れ落ちる。そのため、処理液が回転
部材の上面側から軸受収納部内の軸受に浸入しない。ま
た、軸受収納部の内部は環状壁部と支持部の蓋状部との
間の屈曲した隙間を通して外部に連通しているので、処
理液が環状壁部と支持部の蓋状部との間の隙間を通して
軸受収納部内の軸受に浸入することは困難となる。した
がって、処理液が保持部材の軸受内に浸入することが確
実に防止される。
In this case, the bearing is accommodated in the bearing accommodating portion, and the outer side from the upper portion of the annular wall portion of the bearing accommodating portion protruding to the upper surface side of the rotating member is separated by the lid-like portion of the supporting portion with a certain gap. Since it is covered, the processing liquid that has flowed down from the substrate onto the supporting portion of the holding member flows down onto the rotating member along the outer surface of the lid-shaped portion of the supporting portion. Therefore, the treatment liquid does not enter the bearing in the bearing housing from the upper surface side of the rotating member. Further, since the inside of the bearing housing communicates with the outside through the curved gap between the annular wall and the lid of the support, the treatment liquid is not allowed to flow between the annular wall and the lid of the support. It becomes difficult to penetrate into the bearing in the bearing housing through the gap. Therefore, the treatment liquid is reliably prevented from entering the bearing of the holding member.

【0020】第3の発明に係る基板処理装置は、基板上
に処理液を供給して基板に所定の処理を行う基板処理装
置であって、基板の外径よりも大きな径を有する回転部
材と、回転部材を回転駆動する駆動手段と、基板の外周
部に沿うように回転部材に設けられ、基板の外周端部に
当接して基板を保持する複数の保持部材と、複数の保持
部材により保持された基板上に処理液を供給する処理液
供給手段とを備え、複数の保持部材のうち少なくとも1
つの保持部材は、回転部材を上下に貫通するように設け
られた軸受と、軸受により回転部材上に回動自在に設け
られた支持部と、支持部の回動に伴って基板の外周端部
に当接するように支持部に設けられた保持部と、回転部
材の下面側かつ外周部側で軸受の外側を遮蔽する遮蔽部
とを備えたものである。
A substrate processing apparatus according to a third aspect of the present invention is a substrate processing apparatus that supplies a processing liquid onto a substrate to perform a predetermined process on the substrate, and includes a rotating member having a diameter larger than an outer diameter of the substrate. A driving means for rotationally driving the rotating member, a plurality of holding members provided on the rotating member along the outer peripheral portion of the substrate and holding the substrate by contacting the outer peripheral end portion of the substrate, and held by the plurality of holding members A treatment liquid supply means for supplying a treatment liquid onto the formed substrate, and at least one of the plurality of holding members is provided.
The two holding members are a bearing provided so as to vertically penetrate the rotating member, a support portion rotatably provided on the rotating member by the bearing, and an outer peripheral end portion of the substrate along with the rotation of the supporting portion. And a shielding portion that shields the outside of the bearing on the lower surface side and the outer peripheral side of the rotating member so as to abut on the supporting member.

【0021】第3の発明に係る基板処理装置において
は、複数の保持部材により基板が回転部材上に保持され
る。この場合、少なくとも1つの保持部材の保持部が軸
受による支持部の回動に伴って基板の外周端部に当接す
る。この状態で、回転部材が駆動手段により回転駆動さ
れ、処理液供給手段から基板上に処理液が供給される。
In the substrate processing apparatus according to the third aspect of the invention, the substrate is held on the rotating member by the plurality of holding members. In this case, the holding portion of the at least one holding member comes into contact with the outer peripheral end portion of the substrate as the support portion is rotated by the bearing. In this state, the rotating member is rotationally driven by the driving unit, and the processing liquid is supplied from the processing liquid supply unit onto the substrate.

【0022】基板上に供給された処理液の一部は基板の
外周部から回転部材上に流れ落ち、さらに回転部材の外
周部を伝って下面側に回り込もうとする。回転部材の下
面側かつ外周部側で軸受の外側を遮蔽する遮蔽部が設け
られているため、その遮蔽部により処理液が保持部材の
下面側に回り込むことが阻止される。それにより、保持
部材の軸受に処理液が浸入せず、処理液の浸入による軸
受の動作不良が防止される。また、軸受に浸入した処理
液が固化することによるパーティクルの発生が防止され
る。
A part of the processing liquid supplied onto the substrate flows down from the outer peripheral portion of the substrate onto the rotating member, and further tries to go around to the lower surface side along the outer peripheral portion of the rotating member. Since the shielding portion that shields the outside of the bearing is provided on the lower surface side and the outer peripheral portion side of the rotating member, the shielding solution prevents the processing liquid from flowing around to the lower surface side of the holding member. As a result, the treatment liquid does not enter the bearing of the holding member, and malfunction of the bearing due to the entry of the treatment liquid is prevented. Further, generation of particles due to solidification of the treatment liquid that has entered the bearing is prevented.

【0023】第4の発明に係る基板処理装置は、第3の
発明に係る基板処理装置の構成において、少なくとも1
つの保持部材は、回転部材の上面側に突出する環状壁部
を有しかつ軸受を収納する軸受収納部をさらに備え、支
持部は、軸受収納部の環状壁部の上部から外側を一定の
隙間を介して取り囲む蓋状部を有するものである。
A substrate processing apparatus according to a fourth aspect of the present invention has at least one of the substrate processing apparatus according to the third aspect of the invention.
Each of the holding members further includes a bearing accommodating portion having an annular wall portion projecting to the upper surface side of the rotating member and accommodating the bearing, and the support portion has a constant gap outside the upper portion of the annular wall portion of the bearing accommodating portion. It has a lid-like portion surrounding it.

【0024】この場合、軸受が軸受収納部に収納される
とともに、回転部材の上面側に突出する軸受収納部の環
状壁部の上部から外側が支持部の蓋状部により一定の隙
間を介して覆われているので、基板上から保持部材の支
持部上に流れ落ちた処理液は支持部の蓋状部の外面に沿
って回転部材上に流れ落ちる。そのため、処理液が回転
部材の上面側から軸受収納部内の軸受に浸入しない。ま
た、軸受収納部の内部は環状壁部と支持部の蓋状部との
間の屈曲した隙間を通して外部に連通しているので、処
理液が環状壁部と支持部の蓋状部との間の隙間を通して
軸受収納部内の軸受に浸入することは困難となる。した
がって、処理液が保持部材の軸受内に浸入することが確
実に防止される。
In this case, the bearing is accommodated in the bearing accommodating portion, and the outer side from the upper portion of the annular wall portion of the bearing accommodating portion protruding to the upper surface side of the rotating member is separated by the lid-shaped portion of the supporting portion with a certain gap. Since it is covered, the processing liquid that has flowed down from the substrate onto the supporting portion of the holding member flows down onto the rotating member along the outer surface of the lid-shaped portion of the supporting portion. Therefore, the treatment liquid does not enter the bearing in the bearing housing from the upper surface side of the rotating member. Further, since the inside of the bearing housing communicates with the outside through the curved gap between the annular wall and the lid of the support, the treatment liquid is not allowed to flow between the annular wall and the lid of the support. It becomes difficult to penetrate into the bearing in the bearing housing through the gap. Therefore, the treatment liquid is reliably prevented from entering the bearing of the holding member.

【0025】[0025]

【発明の実施の形態】以下、本発明に係る基板処理装置
の一例として回転式の現像装置について説明する。
DETAILED DESCRIPTION OF THE INVENTION A rotary developing device will be described below as an example of a substrate processing apparatus according to the present invention.

【0026】図1は本発明の第1の実施例による回転式
の現像装置の断面図であり、図2は図1の現像装置の平
面図である。
FIG. 1 is a sectional view of a rotary developing device according to the first embodiment of the present invention, and FIG. 2 is a plan view of the developing device of FIG.

【0027】図1および図2において、基板保持部1は
円形板状のスピンベース11を備える。スピンベース1
1は、アルミニウムを母材に使用し、上面にニッケル−
ポリテトラフルオロエチレンめっきが施されている。ニ
ッケル−ポリテトラフルオロエチレンめっきの水に対す
る接触角は約100°と大きく、現像液を弾くことがで
きる。また、スピンベース11の他の例としては、アル
マイトに撥水性の樹脂を含浸処理したもの、あるいはチ
タン合金などの金属材料の表面にフッ素系樹脂をコーテ
ィング(被膜処理)したものを用いてもよい。
In FIG. 1 and FIG. 2, the substrate holder 1 is provided with a circular plate-shaped spin base 11. Spin base 1
No. 1 uses aluminum as a base material and nickel on the upper surface.
It is polytetrafluoroethylene plated. The contact angle of nickel-polytetrafluoroethylene plating with water is as large as about 100 ° and the developer can be repelled. Further, as another example of the spin base 11, it is possible to use an alumite impregnated with a water-repellent resin, or a metal material such as a titanium alloy coated with a fluorine-based resin (coating treatment). .

【0028】スピンベース11はモータ3の回転軸2の
先端にベース取り付け部材12を介して水平に固定さ
れ、鉛直方向の軸の周りで回転駆動される。
The spin base 11 is horizontally fixed to the tip of the rotary shaft 2 of the motor 3 via a base mounting member 12, and is rotationally driven about a vertical axis.

【0029】スピンベース11の上面には、撥水性を有
する樹脂からなる環状支持部13が設けられており、こ
の環状支持部13の上面には、基板Wの下面を支持する
複数の支持ピン14が設けられている。
On the upper surface of the spin base 11, an annular supporting portion 13 made of a water-repellent resin is provided, and on the upper surface of the annular supporting portion 13, a plurality of support pins 14 for supporting the lower surface of the substrate W are provided. Is provided.

【0030】図2に示すように、環状支持部13の外周
部には複数の切欠部13bが設けられている。環状支持
部13の各切欠部13bには基板Wの水平位置を規制す
る回転式保持ピン15が配設されている。回転式保持ピ
ン15はスピンベース11に鉛直方向の軸の周りで回動
可能に取り付けられている。この回転式保持ピン15の
構造については後述する。
As shown in FIG. 2, a plurality of cutout portions 13b are provided on the outer peripheral portion of the annular support portion 13. A rotary holding pin 15 that restricts the horizontal position of the substrate W is provided in each notch 13 b of the annular support 13. The rotary holding pin 15 is attached to the spin base 11 so as to be rotatable around a vertical axis. The structure of the rotary holding pin 15 will be described later.

【0031】図1に示すように、スピンベース11の下
方には環状磁石6が配設されている。この環状磁石6
は、駆動装置(図示せず)により上下動自在に設けられ
た磁石支持部材7に固定されている。
As shown in FIG. 1, an annular magnet 6 is arranged below the spin base 11. This ring magnet 6
Is fixed to a magnet supporting member 7 provided so as to be vertically movable by a driving device (not shown).

【0032】モータ3の回転軸2は中空軸により構成さ
れ、その内部に基板Wの裏面洗浄用のバックリンスノズ
ル9(図2参照)が挿入されている。このバックリンス
ノズル9は、ベース取り付け部材12を貫通して基板W
の裏面側に突出している。バックリンスノズル9の先端
には、円錐台状のキャップ8が取り付けられている。キ
ャップ8はバックリンスノズル9から吐出される純水等
のリンス液が回転軸2の内部に浸入することを防止する
ために設けられている。
The rotating shaft 2 of the motor 3 is a hollow shaft, and a back rinse nozzle 9 (see FIG. 2) for cleaning the back surface of the substrate W is inserted therein. The back rinse nozzle 9 penetrates the base mounting member 12 and the substrate W
Projecting to the back side of. A frustoconical cap 8 is attached to the tip of the back rinse nozzle 9. The cap 8 is provided to prevent a rinse liquid such as pure water discharged from the back rinse nozzle 9 from entering the inside of the rotating shaft 2.

【0033】基板保持部1の上方には、現像液を吐出す
る現像ノズル10が上下方向および水平方向に移動可能
に設けられている。この現像ノズル10は、現像処理前
および現像処理後に基板Wの上方から外れた位置に待機
し、現像処理時に基板Wの中心部の上方に移動する。
Above the substrate holder 1, a developing nozzle 10 for ejecting a developing solution is provided so as to be movable in the vertical and horizontal directions. The developing nozzle 10 stands by at a position separated from above the substrate W before and after the developing process, and moves above the central portion of the substrate W during the developing process.

【0034】さらに、基板保持部1の周囲を取り囲むよ
うに中空のカップ4が配設されている。カップ4は上下
方向に移動可能な上カップ4aと、上カップ4aの下方
に固定された下カップ4bとを備える。下カップ4bの
下部には現像装置の上方からカップ4内に下降される清
浄な空気の下降流(ダウンフロー)を排気するための排
気口4cが設けられている。
Further, a hollow cup 4 is arranged so as to surround the substrate holding portion 1. The cup 4 includes an upper cup 4a that is vertically movable, and a lower cup 4b fixed below the upper cup 4a. An exhaust port 4c for exhausting a downward flow (downflow) of clean air that is descended from above the developing device into the cup 4 is provided below the lower cup 4b.

【0035】図3は図2中のX−X線断面図であり、図
4は図1の現像装置の回転式保持ピンの分解斜視図であ
る。
FIG. 3 is a sectional view taken along line XX in FIG. 2, and FIG. 4 is an exploded perspective view of the rotary holding pin of the developing device of FIG.

【0036】図3および図4において、回転式保持ピン
15は、棒状のピン部材16、ほぼ円柱状のピン支持部
17、取り付け部材18および磁石収納部21を備え
る。ピン部材16は、ピン支持部17の上面にピン支持
部17の中心に対して偏心して設けられている。
In FIGS. 3 and 4, the rotary holding pin 15 includes a rod-shaped pin member 16, a substantially columnar pin support portion 17, a mounting member 18, and a magnet housing portion 21. The pin member 16 is provided on the upper surface of the pin support portion 17 so as to be eccentric with respect to the center of the pin support portion 17.

【0037】ピン支持部17は、蓋状部17aと、後述
する取り付け部材18のベアリング20内に挿入される
挿入部17bと、磁石収納部21に連結される連結部1
7cとを備える。
The pin support portion 17 has a lid portion 17a, an insertion portion 17b which is inserted into a bearing 20 of a mounting member 18 which will be described later, and a connecting portion 1 which is connected to the magnet accommodating portion 21.
7c and.

【0038】磁石収納部21は、棒状の永久磁石22を
収納する収納部21aと、ピン支持部17の連結部17
cに図3のねじ25によって固定される連結部21bと
を備える。
The magnet housing portion 21 is a housing portion 21a for housing a rod-shaped permanent magnet 22 and a connecting portion 17 of the pin support portion 17.
c is provided with a connecting portion 21b fixed by the screw 25 of FIG.

【0039】取り付け部材18は、スピンベース11に
固定される固定部18aと、スピンベース11の取り付
け孔に挿入される円筒状の挿入部18bと、スピンベー
ス11の上方に突出する円筒状の突出部18cとを有す
る。挿入部18bおよび突出部18cの内側には、ベア
リング20が収納されており、また、そのベアリング2
0の脱落を防止するベアリング支持部材24が挿入され
ている(図3参照)。
The mounting member 18 includes a fixing portion 18a fixed to the spin base 11, a cylindrical insertion portion 18b inserted into a mounting hole of the spin base 11, and a cylindrical protrusion protruding above the spin base 11. And a portion 18c. A bearing 20 is housed inside the insertion portion 18b and the protruding portion 18c.
A bearing support member 24 for preventing the falling of 0 is inserted (see FIG. 3).

【0040】取り付け部材18の固定部18aには、一
対の取り付け孔19が形成されており、ねじ(図示せ
ず)を取り付け孔19に挿入することにより固定部18
aがスピンベース11に固定される。取り付け部材18
の突出部18cはスピンベース11の上面から上方に突
出する。取り付け部材18の突出部18cの内側に挿入
されたベアリング20内にはピン支持部17の挿入部1
7bが挿入される。また、ベアリング20内には取り付
け部材18の下端側から磁石収納部21の連結部21b
が挿入され、図3のねじ25によりピン支持部17と磁
石収納部21とが連結される。これにより、ピン支持部
17および磁石収納部21が一体化され、ベアリング2
0により回動可能にスピンベース11に支持される。
A pair of mounting holes 19 are formed in the fixing portion 18a of the mounting member 18, and the fixing portion 18a is formed by inserting a screw (not shown) into the mounting hole 19.
a is fixed to the spin base 11. Mounting member 18
The projecting portion 18c of the above project from the upper surface of the spin base 11 upward. In the bearing 20 inserted inside the protruding portion 18c of the mounting member 18, the insertion portion 1 of the pin support portion 17 is inserted.
7b is inserted. In addition, in the bearing 20, from the lower end side of the mounting member 18 to the connecting portion 21b of the magnet housing portion 21.
Is inserted, and the pin support portion 17 and the magnet storage portion 21 are connected by the screw 25 of FIG. As a result, the pin support portion 17 and the magnet housing portion 21 are integrated, and the bearing 2
It is rotatably supported by the spin base 11 by 0.

【0041】回転式保持ピン15がスピンベース11に
取り付けられた状態では、ピン支持部17の蓋状部17
aが取り付け部材18の突出部18cの上端面および外
周面を一定の隙間を介して覆っている。これにより、ピ
ン支持部17の外部から取り付け部材18内のベアリン
グ20に達する隙間が上下方向に蛇行し、外部からベア
リング20内に現像液が浸入することが困難となる。
When the rotary holding pin 15 is attached to the spin base 11, the lid-shaped portion 17 of the pin support 17 is provided.
a covers the upper end surface and the outer peripheral surface of the protruding portion 18c of the attachment member 18 with a certain gap. As a result, the gap reaching the bearing 20 in the mounting member 18 from the outside of the pin support 17 meanders in the vertical direction, and it becomes difficult for the developer to enter the bearing 20 from the outside.

【0042】また、図3に示すように、取り付け部材1
8の下面と磁石収納部21の収納部21aおよび連結部
21bの表面との間には、その構造上、隙間Aが生じ
る。このため、基板Wからスピンベース11上に流下し
た現像液の一部が磁石収納部21に流れ落ちると、隙間
Aを通ってベアリング20に浸入するおそれがある。
Further, as shown in FIG. 3, the mounting member 1
Due to its structure, a gap A is formed between the lower surface of 8 and the surfaces of the storage portion 21a and the connecting portion 21b of the magnet storage portion 21. For this reason, if a part of the developer flowing down from the substrate W onto the spin base 11 flows down into the magnet housing portion 21, there is a possibility that it will enter the bearing 20 through the gap A.

【0043】そこで、スピンベース11の外周部には円
環状の外周カバー部材26が設けられている。外周カバ
ー部材26は、スピンベース11の外周部から下方に延
びており、複数の回転式保持ピン15の外方を取り囲ん
でいる。
Therefore, an annular outer peripheral cover member 26 is provided on the outer peripheral portion of the spin base 11. The outer peripheral cover member 26 extends downward from the outer peripheral portion of the spin base 11 and surrounds the outer sides of the plurality of rotary holding pins 15.

【0044】スピンベース11に流下した現像液は、外
周カバー部材26の外表面を伝って下方に流れ落ちる。
したがって、ベアリング20に現像液が浸入することが
防止される。
The developing solution that has flowed down to the spin base 11 flows down along the outer surface of the outer peripheral cover member 26.
Therefore, the developer is prevented from entering the bearing 20.

【0045】本実施例においては、スピンベース11が
回転部材に相当し、モータ3が駆動手段に相当し、回転
式保持ピン15が保持部材に相当し、現像ノズル10が
処理液供給手段に相当する。また、回転式保持ピン15
におけるベアリング20が軸受に相当し、ピン支持部1
7が支持部に相当し、ピン部材16が保持部に相当し、
外周カバー部材26が周壁部に相当する。さらに、取り
付け部材18が軸受収納部に相当し、突出部18cが環
状壁部に相当し、蓋状部17aが蓋状部に相当する。
In this embodiment, the spin base 11 corresponds to the rotating member, the motor 3 corresponds to the driving means, the rotary holding pin 15 corresponds to the holding member, and the developing nozzle 10 corresponds to the processing liquid supply means. To do. In addition, the rotary holding pin 15
The bearing 20 in FIG.
7 corresponds to the support portion, the pin member 16 corresponds to the holding portion,
The outer peripheral cover member 26 corresponds to the peripheral wall portion. Further, the mounting member 18 corresponds to the bearing accommodating portion, the protruding portion 18c corresponds to the annular wall portion, and the lid-shaped portion 17a corresponds to the lid-shaped portion.

【0046】次に、上記構造を有する現像装置における
現像処理時の動作について説明する。この現像装置にお
いては、上方から清浄なダウンフローがカップ4の内外
に供給されつつ現像処理が行われる。現像処理では、現
像液供給、現像液保持、純水洗浄および乾燥の各工程が
順に行われる。
Next, the operation of the developing device having the above structure during the developing process will be described. In this developing device, the developing process is performed while a clean downflow is supplied to the inside and the outside of the cup 4 from above. In the developing process, the steps of supplying a developing solution, holding a developing solution, washing with pure water, and drying are sequentially performed.

【0047】まず、基板Wが基板保持部1の支持ピン1
4上に載置される。次に、環状磁石6が上昇して複数の
回転式保持ピン15が基板Wを水平方向に保持する。
First, the substrate W is the support pin 1 of the substrate holder 1.
4. Next, the annular magnet 6 rises and the plurality of rotary holding pins 15 hold the substrate W in the horizontal direction.

【0048】現像液供給工程では、モータ3により基板
保持部1が低速で回転駆動された状態で、現像ノズル1
0から基板W上に現像液が吐出される。吐出された現像
液は基板Wの全面に均一に塗り広げられる。
In the developing solution supplying step, the developing nozzle 1 is operated while the substrate holding portion 1 is rotationally driven at a low speed by the motor 3.
The developing solution is discharged onto the substrate W from 0. The discharged developing solution is uniformly spread on the entire surface of the substrate W.

【0049】現像ノズル10からは比較的多量の現像液
が吐出される。このため、現像液の一部は回転式保持ピ
ン15を伝わり、あるいは直接環状支持部13の上面外
周部に流れ落ちる。さらに、現像液は、環状支持部13
の上面外周部から外周カバー部材26の外表面を伝って
カップ4内の下方に流れ落ちる。
A relatively large amount of developing solution is discharged from the developing nozzle 10. Therefore, a part of the developer is transmitted to the rotary holding pin 15 or directly flows down to the outer peripheral portion of the upper surface of the annular support portion 13. Further, the developing solution is applied to the annular supporting portion 13.
From the outer peripheral portion of the upper surface along the outer surface of the outer peripheral cover member 26 to flow downward in the cup 4.

【0050】また、回転式保持ピン15のピン支持部1
7の上面に流れ落ちた現像液は、ピン支持部17の蓋状
部17aに沿って切欠部13b内のスピンベース11表
面に流れ落ち、さらに外周カバー部材26の外表面を伝
って下方へ流れ落ちる。
Further, the pin support portion 1 of the rotary holding pin 15
The developer that has flowed down to the upper surface of 7 flows down to the surface of the spin base 11 in the notch 13b along the lid-shaped portion 17a of the pin supporting portion 17, and further flows down along the outer surface of the outer peripheral cover member 26.

【0051】これにより、現像液が取り付け部材18内
のベアリング20に浸入することが防止される。
This prevents the developer from entering the bearing 20 in the mounting member 18.

【0052】現像液保持工程では、基板保持部1の回転
が停止されるとともに、環状磁石6が下降して回転式保
持ピン15が開放状態となる。この状態で、現像液が基
板W上に一定時間静止保持される。これにより、基板W
上の感光性膜の現像が進行する。この場合にも、基板W
の外周部から現像液が流れ落ちると、その現像液は外周
カバー部材26の外表面に沿ってカップ4の下方に流し
去られる。
In the developing solution holding step, the rotation of the substrate holding section 1 is stopped, the annular magnet 6 is lowered, and the rotary holding pin 15 is opened. In this state, the developing solution is held stationary on the substrate W for a certain period of time. As a result, the substrate W
Development of the upper photosensitive film proceeds. Also in this case, the substrate W
When the developer flows down from the outer peripheral portion of the, the developer is flushed off below the cup 4 along the outer surface of the outer peripheral cover member 26.

【0053】洗浄工程では、環状磁石6が再び上昇して
回転式保持ピン15が基板Wを水平方向に保持する。そ
して、モータ3により基板保持部1が回転駆動され、基
板Wが所定の速度で回転する。この洗浄工程では、純水
供給ノズル(図示せず)から基板W上に純水が吐出され
て基板Wの表面が洗浄されるとともにバックリンスノズ
ル9(図2参照)からリンス液(純水)が吐出されて基
板Wの裏面が洗浄される。
In the cleaning step, the annular magnet 6 moves up again and the rotary holding pin 15 holds the substrate W in the horizontal direction. Then, the substrate holding unit 1 is rotationally driven by the motor 3, and the substrate W is rotated at a predetermined speed. In this cleaning process, pure water is discharged from the pure water supply nozzle (not shown) onto the substrate W to clean the surface of the substrate W, and the rinse liquid (pure water) is rinsed from the back rinse nozzle 9 (see FIG. 2). Are discharged to clean the back surface of the substrate W.

【0054】基板Wの表面および裏面の洗浄処理が終了
すると、乾燥工程に移行する。乾燥工程では、モータ3
の回転数が高められ、基板Wが高速で回転する。これに
より、基板Wの表面に供給された純水が外方に振り切ら
れ、基板Wの表面が乾燥する。
When the cleaning process for the front surface and the back surface of the substrate W is completed, the process proceeds to the drying step. In the drying process, the motor 3
The number of rotations is increased, and the substrate W rotates at high speed. As a result, the pure water supplied to the surface of the substrate W is shaken off to the outside, and the surface of the substrate W is dried.

【0055】このように、本実施例の現像装置では、ス
ピンベース11の外周部の下面側に外周カバー部材26
が設けられているので、スピンベース11の下面側に現
像液が回り込むことが阻止される。それにより、ベアリ
ング20に現像液が浸入して回転式保持ピン15の動き
が損なわれることが防止される。また、ベアリング20
に浸入した現像液が固化することによるパーティクルの
発生が防止される。
As described above, in the developing device of this embodiment, the outer peripheral cover member 26 is provided on the lower surface side of the outer peripheral portion of the spin base 11.
Is provided, the developer is prevented from flowing around the lower surface side of the spin base 11. This prevents the developer from penetrating into the bearing 20 and impairing the movement of the rotary holding pin 15. Also, the bearing 20
The generation of particles due to the solidification of the developing solution that has penetrated into is prevented.

【0056】図5は本発明の第2の実施例による回転式
の現像装置の断面図であり、図6は図5の現像装置の平
面図である。また、図7は図6中のY−Y線断面図であ
り、図8は図5の現像装置の回転式保持ピンの分解斜視
図である。
FIG. 5 is a sectional view of a rotary developing device according to the second embodiment of the present invention, and FIG. 6 is a plan view of the developing device of FIG. 7 is a sectional view taken along the line YY in FIG. 6, and FIG. 8 is an exploded perspective view of the rotary holding pin of the developing device of FIG.

【0057】図5の現像装置においては、図1の現像装
置の外周カバー部材26の代わりに各取り付け部材18
に軸受カバー部18dが設けられている。図5の現像装
置の他の部分の構成は、図1の現像装置の構成と同様で
ある。本実施例においては、取り付け部材18の軸受カ
バー部18dが遮蔽部に相当する。
In the developing device of FIG. 5, each mounting member 18 is used instead of the outer peripheral cover member 26 of the developing device of FIG.
The bearing cover portion 18d is provided in the. The configuration of the other parts of the developing device in FIG. 5 is the same as the configuration of the developing device in FIG. In this embodiment, the bearing cover portion 18d of the mounting member 18 corresponds to the shielding portion.

【0058】図7および図8において、取り付け部材1
8の下面には、軸受カバー部18dが設けられている。
軸受カバー部18dは取り付け部材18の固定部18a
の下面から下方に延び、磁石収納部21の外側のほぼ半
分を覆う半円筒状に形成されている。
7 and 8, the mounting member 1
The lower surface of 8 is provided with a bearing cover portion 18d.
The bearing cover portion 18d is the fixed portion 18a of the mounting member 18.
Is formed in a semi-cylindrical shape extending downward from the lower surface of the magnet and covering almost half of the outside of the magnet housing portion 21.

【0059】基板Wからスピンベース11に流下した現
像液は、さらに取り付け部材18の軸受カバー部18d
の外表面を伝ってカップ4の下方に流れ落ちる。それに
より、現像液が取り付け部材18の下面と磁石収納部2
1の表面との間の隙間Aを通ってベアリング20に浸入
することが防止される。
The developer flowing down from the substrate W onto the spin base 11 is further subjected to the bearing cover portion 18d of the mounting member 18.
Flows down the cup 4 along the outer surface of the cup. As a result, the developing solution is applied to the lower surface of the mounting member 18 and the magnet housing 2
It is prevented that the bearing 20 is penetrated through the gap A between the bearing 20 and the surface of the bearing 1.

【0060】したがって、ベアリング20への現像液の
浸入により回転式保持ピン15の動きが損なわれること
が防止される。また、ベアリング20に浸入した現像液
が固化することによるパーティクルの発生が防止され
る。
Therefore, it is possible to prevent the movement of the rotary holding pin 15 from being impaired by the infiltration of the developing solution into the bearing 20. Further, the generation of particles due to the solidification of the developer that has entered the bearing 20 is prevented.

【0061】なお、軸受カバー部18dは、磁石収納部
21を駆動する環状磁石6が磁石収納部21内の永久磁
石22に近接できるように、半円筒状に形成することが
好ましい。しかし、環状磁石6が磁石収納部21内の永
久磁石22に十分に磁力を及ぼすことができる場合に
は、軸受カバー部18dを磁石収納部21の周囲を取り
囲む円筒状に形成してもよい。
The bearing cover portion 18d is preferably formed in a semi-cylindrical shape so that the annular magnet 6 that drives the magnet housing portion 21 can come close to the permanent magnet 22 inside the magnet housing portion 21. However, if the annular magnet 6 can exert a sufficient magnetic force on the permanent magnet 22 in the magnet housing portion 21, the bearing cover portion 18d may be formed in a cylindrical shape surrounding the magnet housing portion 21.

【0062】なお、上記実施例の現像装置では、複数の
保持部材として回転式保持ピン15を用いているが、複
数の保持部材の少なくとも1つとして回転式保持ピン1
5を用い、残りの保持部材として固定式保持ピンを用い
てもよい。
In the developing device of the above embodiment, the rotary holding pins 15 are used as the plurality of holding members, but the rotary holding pin 1 is used as at least one of the plurality of holding members.
5 may be used, and a fixed holding pin may be used as the remaining holding member.

【0063】なお、本発明は、上記実施例のように現像
液を供給する現像装置のみならず、他の処理液を基板に
供給する他の基板処理装置に適用することもできる。
The present invention can be applied not only to the developing device that supplies the developing solution as in the above-described embodiment but also to another substrate processing apparatus that supplies another processing liquid to the substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例による回転式の現像装置
の断面図である。
FIG. 1 is a sectional view of a rotary type developing device according to a first embodiment of the present invention.

【図2】図1の現像装置の平面図である。FIG. 2 is a plan view of the developing device of FIG.

【図3】図2中のX−X線断面図である。FIG. 3 is a sectional view taken along line XX in FIG.

【図4】図1の現像装置の回転式保持ピンの分解斜視図
である。
FIG. 4 is an exploded perspective view of a rotary holding pin of the developing device of FIG.

【図5】本発明の第2の実施例による回転式の現像装置
の断面図である。
FIG. 5 is a sectional view of a rotary developing device according to a second embodiment of the present invention.

【図6】図5の現像装置の平面図である。FIG. 6 is a plan view of the developing device of FIG.

【図7】図6中のY−Y線断面図である。7 is a cross-sectional view taken along the line YY in FIG.

【図8】図5の現像装置の回転式保持ピンの分解斜視図
である。
FIG. 8 is an exploded perspective view of a rotary holding pin of the developing device of FIG.

【図9】従来の現像装置の断面図である。FIG. 9 is a sectional view of a conventional developing device.

【符号の説明】[Explanation of symbols]

1 基板保持部 11 スピンベース 12 取り付け部材 13 環状支持部 15 回転式保持ピン 16 ピン部材 17 ピン支持部 17a 蓋状部 17b 挿入部 17c 連結部 18 取り付け部材 18a 固定部 18b 挿入部 18c 突出部 18d 軸受カバー部 20 ベアリング 21 磁石収納部 21a 収納部 21b 連結部 22 永久磁石 26 外周カバー部材 1 Substrate holder 11 spin base 12 Mounting member 13 Annular support 15 Rotary holding pin 16 pin member 17 pin support 17a lid part 17b insertion part 17c connection part 18 Mounting member 18a fixed part 18b insertion part 18c protrusion 18d bearing cover 20 bearings 21 Magnet storage 21a Storage section 21b Connection part 22 Permanent magnet 26 Peripheral cover member

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平8−323274(JP,A) 特開 平8−222512(JP,A) 特開 平8−141478(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/027 G03F 7/30 501 ─────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-8-323274 (JP, A) JP-A-8-222512 (JP, A) JP-A-8-141478 (JP, A) (58) Field (Int.Cl. 7 , DB name) H01L 21/027 G03F 7/30 501

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 基板上に処理液を供給して基板に所定の
処理を行う基板処理装置であって、 基板の外径よりも大きな径を有する回転部材と、 前記回転部材を回転駆動する駆動手段と、 基板の外周部に沿うように前記回転部材に設けられ、基
板の外周端部に当接して基板を保持する複数の保持部材
と、 前記複数の保持部材により保持された基板上に処理液を
供給する処理液供給手段とを備え、 前記複数の保持部材のうち少なくとも1つの保持部材
は、 前記回転部材を上下に貫通するように設けられた軸受
と、 前記軸受により前記回転部材上に回動自在に設けられた
支持部と、 前記支持部の回動に伴って基板の外周端部に当接するよ
うに前記支持部に設けられた保持部とを備え、 前記回転部材は、前記回転部材の外周部から下方に延び
る周壁部を備えたことを特徴とする基板処理装置。
1. A substrate processing apparatus for supplying a processing liquid onto a substrate to perform a predetermined process on the substrate, comprising: a rotating member having a diameter larger than an outer diameter of the substrate; and a drive for rotationally driving the rotating member. Means, a plurality of holding members provided on the rotating member along the outer peripheral portion of the substrate, for holding the substrate by contacting the outer peripheral end portion of the substrate, and processing on the substrate held by the plurality of holding members. A treatment liquid supply means for supplying a liquid, wherein at least one holding member of the plurality of holding members is a bearing provided so as to vertically penetrate the rotating member, and the bearing is provided on the rotating member. The rotating member includes a supporting portion that is rotatably provided, and a holding portion that is provided on the supporting portion so as to come into contact with an outer peripheral end of the substrate as the supporting portion rotates. A peripheral wall extending downward from the outer peripheral portion of the member A substrate processing apparatus having a section.
【請求項2】 前記少なくとも1つの保持部材は、前記
回転部材の上面側に突出する環状壁部を有しかつ前記軸
受を収納する軸受収納部をさらに備え、 前記支持部は、前記軸受収納部の前記環状周壁の上部か
ら外側を一定の隙間を介して取り囲む蓋状部を有するこ
とを特徴とする請求項1記載の基板処理装置。
2. The at least one holding member further includes a bearing accommodating portion having an annular wall portion projecting to an upper surface side of the rotating member and accommodating the bearing, and the supporting portion is the bearing accommodating portion. 2. The substrate processing apparatus according to claim 1, further comprising a lid-shaped portion that surrounds an outer side of the annular peripheral wall from an upper portion of the annular peripheral wall with a constant gap.
【請求項3】 基板上に処理液を供給して基板に所定の
処理を行う基板処理装置であって、 基板の外径よりも大きな径を有する回転部材と、 前記回転部材を回転駆動する駆動手段と、 基板の外周部に沿うように前記回転部材に設けられ、基
板の外周端部に当接して基板を保持する複数の保持部材
と、 前記複数の保持部材により保持された基板上に処理液を
供給する処理液供給手段とを備え、 前記複数の保持部材のうち少なくとも1つの保持部材
は、 前記回転部材を上下に貫通するように設けられた軸受
と、 前記軸受により前記回転部材上に回動自在に設けられた
支持部と、 前記支持部の回動に伴って基板の外周端部に当接するよ
うに前記支持部に設けられた保持部と、 前記回転部材の下面側かつ外周部側で前記軸受の外側を
遮蔽する遮蔽部とを備えたことを特徴とする基板処理装
置。
3. A substrate processing apparatus for supplying a processing liquid onto a substrate to perform a predetermined process on the substrate, the rotating member having a diameter larger than the outer diameter of the substrate, and a drive for rotationally driving the rotating member. Means, a plurality of holding members provided on the rotating member along the outer peripheral portion of the substrate, for holding the substrate by contacting the outer peripheral end portion of the substrate, and processing on the substrate held by the plurality of holding members. A treatment liquid supply means for supplying a liquid, wherein at least one holding member of the plurality of holding members is a bearing provided so as to vertically penetrate the rotating member, and the bearing is provided on the rotating member. A supporting portion that is rotatably provided, a holding portion that is provided on the supporting portion so as to come into contact with an outer peripheral end portion of the substrate as the supporting portion rotates, a lower surface side and an outer peripheral portion of the rotating member. Shield that shields the outside of the bearing on the side And a substrate processing apparatus.
【請求項4】 前記少なくとも1つの保持部材は、前記
回転部材の上面側に突出する環状壁部を有しかつ前記軸
受を収納する軸受収納部をさらに備え、 前記支持部は、前記軸受収納部の前記環状壁部の上部か
ら外側を一定の隙間を介して取り囲む蓋状部を有するこ
とを特徴とする請求項3記載の基板処理装置。
4. The at least one holding member further includes a bearing accommodating portion having an annular wall portion protruding toward an upper surface side of the rotating member and accommodating the bearing, and the supporting portion is the bearing accommodating portion. 4. The substrate processing apparatus according to claim 3, further comprising a lid-shaped portion that surrounds an outer side of the annular wall portion from above with a constant gap.
JP23093398A 1998-08-17 1998-08-17 Substrate processing equipment Expired - Lifetime JP3499446B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23093398A JP3499446B2 (en) 1998-08-17 1998-08-17 Substrate processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23093398A JP3499446B2 (en) 1998-08-17 1998-08-17 Substrate processing equipment

Publications (2)

Publication Number Publication Date
JP2000058428A JP2000058428A (en) 2000-02-25
JP3499446B2 true JP3499446B2 (en) 2004-02-23

Family

ID=16915577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23093398A Expired - Lifetime JP3499446B2 (en) 1998-08-17 1998-08-17 Substrate processing equipment

Country Status (1)

Country Link
JP (1) JP3499446B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3395696B2 (en) 1999-03-15 2003-04-14 日本電気株式会社 Wafer processing apparatus and wafer processing method

Also Published As

Publication number Publication date
JP2000058428A (en) 2000-02-25

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