JPH1123614A - Contact probe - Google Patents

Abstract

PROBLEM TO BE SOLVED: To obtain a contact probe in which fixtures, conventionally manufactured for each inspection board or inspection board assembly, can be used commonly. SOLUTION: The contact probe 1, 2 comprises a rod-like contact pin 4 having a forward end part being pressed against an inspection board 3, a tubular contact pin receiver 7 being inserted with the contact pin 4, and a spring 6 interposed between the contact pin 4 and the contact pin receiver 7 and urging the forward end part of the contact pin 4 in the direction of the inspection board 3. The contact probe 1, 2 further comprises means for securing the contact pin 4 while pushing downward oppositely to the inspection board 3. The securing means comprises an opening made in the contact pin receiver 7, and a first hook 9 provided on the contact pin 4 to project through the opening when it is located thereat.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a contact probe, and more particularly to a contact probe used in a fixture such as an in-circuit tester or a function tester for inspecting a printed circuit board or a printed circuit board assembly.

[0002]

2. Description of the Related Art One method of inspecting a printed circuit board or a printed circuit board assembly is to use an in-circuit tester or a function tester. The in-circuit tester and the function tester include a pinboard type and a pinboardless type. In the pinboard type, a fixture having a structure having contact probes at all locations required for inspection is used. In the pin board type, a fixture in which a contact probe is driven into a required portion is required for each inspection printed circuit board or printed circuit board assembly.

[0003]

However, the fixture having a structure having a conventional contact probe has the following problems to be solved. First, it is assumed that a missing contact probe is newly used so that the inspection board B can be inspected with the fixture used for the conventional inspection board A. When the fixture is used again on the test board A, the contact probe added for the test board B may short-circuit lands of unnecessary test portions of the test board A, and the test boards A,
Alternatively, there is a problem that an in-circuit tester or a function tester may be electrically destroyed.

Second, it takes a considerable amount of time to remove unnecessary contact probes from the fixture in order to prevent electrical destruction when a product is changed, and other production processes during production. Had a problem of having a great effect on Unnecessary contact probes must be removed even when the arrangement on the board changes slightly, such as when the arrangement of connectors on the inspection board changes due to a model change, etc. I was

Therefore, an object of the present invention is to be able to use the test board in common even when the product to be manufactured is changed and the type of the test board is changed, and to prevent electrical destruction of the test board, the in-circuit tester, the function tester, and the like. An object of the present invention is to provide a contact probe that can reduce the time required to switch between models when changing a product.

[0006]

In order to solve the above-mentioned problems, the present invention employs the following new characteristic constitution means. That is, the contact probe of the present invention is provided with a rod-shaped contact pin whose tip is pressed against an inspection board, a cylindrical contact pin receiver into which the contact pin is inserted, and a contact pin provided between the contact pin and the contact pin receiver. A spring for urging a tip portion of the contact pin in the direction of the test board, further comprising fixing means for fixing the contact pin in a state of being pressed down in a direction opposite to the test board. It is characterized by that. Preferably, the fixing means includes an opening provided in the contact pin receiver, and a hook provided in the contact pin and projecting from the opening when located in the opening. I have. Preferably, the fixing means includes a key-shaped groove provided in the contact pin receiver, and a hook provided in the contact pin and guided to the key-shaped groove.

[0007]

Next, an embodiment of the present invention will be described in detail with reference to the drawings. FIG. 1 is a cross-sectional view for explaining a fixture using the contact probe according to the first embodiment of the present invention. FIG. 2 shows FIG.
3 is a partially enlarged sectional view of the contact probe of FIG.

[0008] The fixture using the contact probe of the present embodiment is mainly composed of a first contact probe 1, a second contact probe 2 and an acrylic plate 5. Here, a plurality of openings are formed in the acrylic plate 5 corresponding to the positions of the test points on the printed circuit board to be inspected. A contact probe is inserted and fixed in each opening of the acrylic plate 5. FIG. 1 shows a case where the first contact probe 1 and the second contact probe 2 are inserted and fixed in one acrylic plate 1.

Next, the configuration of the first and second contact probes 1 and 2 of this embodiment will be described.
The contact probes 1 and 2 of the present embodiment include a rod-shaped contact pin 4 whose tip is pressed against an inspection board 3, a cylindrical contact pin receiver 7 into which the contact pin 4 is inserted, and a contact pin 4. A contact spring provided between the contact board and the contact pin receiver for biasing the tip of the contact pin in the direction of the inspection board. It is characterized by further comprising a fixing means for fixing in a state of being pushed down in a direction opposite to the above. In this embodiment, the contact pin receiver 7 has a hollow portion into which the contact pin 4 is inserted, and the spring 6 is disposed in the hollow portion of the contact pin receiver 7 and
Is configured to urge the front end portion in the direction of the inspection board 3. The contact pin 4 can move up and down along the hollow portion of the contact pin receiver 7. Further, in the present embodiment, the fixing means includes an opening provided in the contact pin receiver 7 and a first hook 9 provided in the contact pin 4 and projecting from the opening when located in the opening. It is comprised including.

[0010] More specifically, in the present embodiment, the contact pin receiver 7 has a cylindrical shape, a flange portion 7a having a larger diameter than other portions, and a width detail having a smaller diameter than other portions. 7b and a socket connecting portion 7c into which a measuring socket having a small width is inserted.
Since the flange portion 7a is larger in diameter than other portions of the contact pin receiver 7, the contact pin receiver 7 is
When it is inserted into the opening, it is fixed here. Width detail 7b
Defines a range in which the contact pin 4 can be moved in a contact pin receiver 7 described later. The distal end opposite to the side on which the inspection board to be inspected is disposed is thinned to form a socket connection portion 7c, to which a signal line to which a voltage or a test signal to be supplied at the time of inspection is supplied is attached. Can be Further, as shown in FIG.
The wide portion 4 a at the lower end of the contact pin 4 is formed with a first hook 9 and a spring 8 for urging the first hook 9 in a direction perpendicular to the moving direction of the contact pin 4. The position of the opening on the side surface of the contact pin receiver 7 is provided at a position that does not hinder the vertical movement of the contact pin 4. As shown in the first contact probe 1 of FIG. 1 and FIG. 2, the contact pins 4 are held until the first hook 9 of the contact pin receiver 7 comes to this opening.
Is pressed down in a direction opposite to the inspection board 3, the first hook 9 slightly jumps out of the opening due to the elasticity of the spring 8, and the contact pin 4 may rise even when the elasticity of the spring 6 is working. The contact pin 4 is fixed in a lowered state. The non-depressed second contact probe 2 in FIG. 1 can be used as it is for measurement, pressed against the land on the back surface of the test board 3 and used for testing.

Next, a method of using the contact probe according to the present embodiment will be described. For the contact probe not used for inspection, for example, as shown in the first contact probe 1 on the left side of FIG. 1, the contact pin 4 is lowered to compress the spring 6, and the first hook 9 is formed on the contact pin receiver 7. So that it protrudes from the opening. By the action of the spring 6, the first hook 9 is maintained in a state of protruding from an opening formed in the contact pin receiver 7, and the contact pin 4 is locked at the lowered position. As for the contact probe used for the inspection, for example, as shown in the second contact probe 2 on the right side of the paper surface of FIG. Next, the distance between the acrylic plate 5 and the inspection substrate 3 is reduced,
The contact probe fixed to the acrylic plate 5 is pressed against the land of the inspection substrate, and a voltage and a test signal required for the inspection are given from the contact probe to perform the inspection.

According to the contact probe of the present embodiment, since the fixing means for fixing the contact pins 4 in a state where the contact pins 4 are pressed down in the opposite direction to the test board 3 is provided, the contact probe is conventionally produced for each test board or test board assembly. Since the fixtures that have been used can be used in common, costs can be reduced. Furthermore, since the contact probe not used for the inspection can be fixed at a position not in contact with the inspection substrate 3, it is possible to prevent unnecessary short-circuit between lands when using a fixture in common. Therefore, it is possible to prevent the electrical inspection substrate from being destroyed. Furthermore, fixing the contact probe so as not to come into contact with the inspection board 3 does not require a great deal of time, such as removing and inserting the contact probe itself, as in the related art. Shortening can be achieved.

Next, a second embodiment of the present invention will be described in detail with reference to the drawings. FIG. 3 is a cross-sectional view illustrating a contact probe according to a second embodiment of the present invention. The third and fourth contact probes 21 and 22 of the present embodiment include a rod-shaped contact pin 4 whose tip is pressed against the inspection board 3 and a cylindrical contact pin receiver 7 into which the contact pin 4 is inserted. And a spring (6) provided between the contact pin (4) and the contact pin receiver (7) for urging the tip of the contact pin (4) in the direction of the test board (3). 4
Is further provided with fixing means for fixing the inspection board 3 in a state where it is pressed down in the opposite direction to the inspection board 3. Also in the present embodiment, the contact pin receiver 7 has a hollow portion into which the contact pin 4 is inserted, and the spring 6 is disposed in the hollow portion of the contact pin receiver 7 so that the tip of the contact pin 4 is connected to the inspection board 3. In the direction of the arrow. The contact pin 4 can move up and down along the hollow portion of the contact pin receiver 7. Further, in this embodiment, a fixing means different from that of the first embodiment is provided. That is, in the present embodiment, the fixing means includes the key-shaped groove 10 provided in the contact pin receiver 7 and the second hook 11 provided in the contact pin 4 and guided to the key-shaped groove 10. It is provided with.

More specifically, in this embodiment,
The contact pin receiver 7 has a cylindrical shape, a flange portion 7a having a larger diameter than other portions, a width detail 7b having a smaller diameter than other portions, and a socket connecting portion into which a measuring socket having a small width is inserted. 7c and the like. In this embodiment, a key-shaped groove 10 is provided as a fixing means in the contact pin receiver 7, and the contact pin 4 is provided with the key-shaped groove 10.
Is formed. Here, the key-shaped groove 10 has a J-shape as shown in FIG. The key-shaped groove 10 has a fixing portion 12 at a position slightly returned from a state where the contact pin 4 is pressed down most. For a contact probe not used for inspection, after the contact pin 4 is pressed down, the spring 6 Using the elastic force, the second hook 11 of the contact pin 4 is fixed to the fixing portion 1.
2 and can be fixed in a state where the contact pin 4 is pushed down. The third contact probe 21 in FIG. 3 which is not pushed down can be used as it is for measurement, pressed against a land on the back surface of the inspection board (not shown) and used for testing.

Next, a method of using the contact probe according to the present embodiment will be described. For the contact probe not used for the inspection, for example, as shown in the fourth contact probe 22 on the right side of the paper of FIG.
Is engaged with the second hook 11. By the action of the spring 6, the hook 12 is maintained in a state of being fixed to the fixing portion 12 of the key-shaped groove 10 formed in the contact pin receiver 7, and the contact pin 12 is locked at the lowered position. As for the contact probe used for the inspection, for example, the contact pin 4 is not lowered as shown in the contact probe 21 on the left side of the drawing of FIG. Next, the distance between the acrylic board fixed to the measuring device (not shown) and the test board is reduced, and the contact probe fixed to the acrylic board is pressed against the land of the test board to apply the voltage and test signals required for the test. Inspection is performed by giving from a contact probe.

According to the contact probe of the present embodiment, since the fixing means for fixing the contact pins 4 in a state of being pushed down in the opposite direction to the inspection board 3 is provided, the same effect as in the first embodiment can be obtained. Brought. Further, as compared with the first embodiment, the fixing means has no movable parts such as springs and hooks moved by the springs, and the number of parts constituting the fixing means is small. It is possible to reduce the cost and the switching time.

Although the preferred embodiments of the present invention have been described above, the present invention is not limited to the above-described embodiments, but can be applied to contact probes having various shapes. In the first and second embodiments, the contact pin receiver 7 has a hollow portion into which the contact pin 4 is inserted, and the spring 6 is disposed in this hollow portion of the contact pin receiver 7 and Although the description has been given of the case where the present invention is applied to a contact probe having a structure in which the tip portion is biased in the direction of the inspection substrate 3, the present invention is also applicable to a contact probe having another structure.

FIG. 4 is a side view of a contact probe according to a third embodiment in which the present invention is applied to a contact probe having a different structure from the contact probes of the first and second embodiments. Here, the technique used in the above-described second embodiment is adopted as the fixing means. The contact probes 31 and 32 according to the present embodiment include a rod-shaped contact pin 35 whose tip is pressed against an inspection board, a cylindrical contact pin receiver 33 into which the contact pin 35 is inserted, and a contact pin 35. A contact probe provided between the contact pin receiver 33 and a spring 34 for urging a tip portion of the contact pin 35 toward the test board, wherein the contact pin 35 is opposite to the test board. It is characterized by further comprising fixing means for fixing in a state of being pushed down in the direction. The contact pin 35 penetrates the cylindrical contact pin receiver 33 and the spring 34 continuously connected to one end of the contact pin receiver 33. It is configured to urge in the direction of the inspection board. In the present embodiment, as the fixing means, the contact pin receiver 33 is used.
And a second hook 11 provided in the contact pin 35 and guided to the key-shaped groove 10.

More specifically, in the present embodiment,
The contact pin receiver 33 has a flange portion 33a having a cylindrical shape and a diameter larger than the other portions. When the contact probe is inserted into the opening formed in the acrylic plate, the wide flange portion 33a engages with the opening and the contact probe is fixed to the acrylic plate. The contact pin receiver 35 has a rod shape, and has a tip portion 35a pressed against the land of the inspection board and a socket connection portion 35b provided at the other end and into which a socket for measurement is inserted. The spring 34 is disposed in the hollow portion inside the contact pin receiver in the contact probes of the first and second embodiments, but is provided outside the contact pin receiver 33 in the contact probe of the present embodiment. .

Also in this embodiment, a key-shaped groove 10 is provided on the contact pin receiver 7 as a fixing means, and the contact pin 4 is formed with a second hook 11 guided to the key-shaped groove 10. . Here, the key-shaped groove 10 has a J-shape as shown in FIG. The key-shaped groove 10 has the fixing portion 12 at a position slightly returned from a state where the contact pin 35 is pressed down most. For a contact probe not used for inspection, after the contact pin 35 is pressed down, the spring 34 Using the elastic force, the second hook 11 of the contact pin 35 can be engaged with the fixing portion 12 so that the contact pin 35 can be fixed in a depressed state. The sixth contact probe 31 in FIG. 4 that is not pushed down can be used as it is for measurement, pressed against a land on the back surface of the inspection board (not shown), and used for testing. The method of using the contact probe of the third embodiment is almost the same as that of the contact probe of the second embodiment. According to the contact probe of this embodiment, since the fixing means for fixing the contact pin 35 in a state of being pushed down in the opposite direction to the inspection board is provided, the same effect as in the first and second embodiments is provided. It is. Further, as compared with the first embodiment, the fixing means has no movable parts such as springs and hooks moved by the springs, and the number of parts constituting the fixing means is small. It is possible to reduce the cost and the switching time.

Further, the fixing means of the present invention has been described with the method as in the first, second and third embodiments, but it can also be realized by a knock type used for a ballpoint pen or the like. It is possible. In other words, when the contact pin is pushed in the opposite direction to the test board, it is fixed at the pushed down position, and when pushed in the opposite direction to the test board again, the pushed-in state is released and the structure returns to the high position. Could be possible.

[0022]

As described above, according to the contact probe of the present invention, the contact pin is further provided with a fixing means for fixing the contact pin while being pressed down in the opposite direction to the test board. The fixtures produced for each test board or test board assembly can be used in common, so that costs can be reduced.

Second, when a fixture is commonly used, unnecessary short-circuiting between lands, which has been a conventional problem, can be prevented, so that the electrical inspection substrate can be prevented from being destroyed. .

Third, fixing the contact probe does not require a great deal of time, such as removing and inserting the conventional contact probe itself.
It is possible to reduce the time required to switch models when changing production products.

[Brief description of the drawings]

FIG. 1 is a cross-sectional view illustrating a contact probe according to a first embodiment of the present invention.

FIG. 2 is a partially enlarged cross-sectional view of the contact probe of FIG.

FIG. 3 is a cross-sectional view illustrating a contact probe according to a second embodiment of the present invention.

FIG. 4 is a side view of a contact probe according to a third embodiment when applied to a contact probe having a shape different from those of FIGS. 1 and 2;

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 1st contact probe 2 2nd contact probe 3 Inspection board 4, 35 Contact pin 4a Wide part 5 Acrylic plate 6, 34 Spring 7, 33 Contact pin receiver 7a, 33a Flange part 7b Detailed width 7c, 35b Socket connection part Reference Signs List 8 spring 9 first hook 10 key-shaped groove 11 second hook 12 fixing part 21 third contact probe 22 fourth contact probe 31 fifth contact probe 32 sixth contact probe 35a tip

Claims (5)

[Claims] A contact pin having a tip portion pressed against an inspection board; a cylindrical contact pin receiver into which the contact pin is inserted; and the contact pin provided between the contact pin and the contact pin receiver. A spring for urging a tip portion of the probe in the direction of the test board, further comprising a fixing means for fixing the contact pin in a state of being pressed down in a direction opposite to the test board. And contact probe. 2. The contact pin receiver has a hollow portion into which the contact pin is inserted, and the spring is disposed in the hollow portion of the contact pin receiver so that a tip portion of the contact pin faces the test board. The contact probe according to claim 1, wherein the contact probe is biased. 3. The fixing device according to claim 2, wherein the fixing means includes an opening provided in the contact pin receiver, and a hook provided in the contact pin and projecting from the opening when located in the opening. The contact probe according to claim 1 or 2, wherein 4. The contact pin passes through the cylindrical contact pin receiver and the spring continuously connected to one end of the contact pin receiver, and the spring inspects a tip portion of the contact pin. The contact probe according to claim 1, wherein the contact probe is biased in a direction of the substrate. 5. The fixing device according to claim 1, wherein the fixing means includes a key-shaped groove provided in the contact pin receiver, and a hook provided in the contact pin and guided to the key-shaped groove. The contact probe according to claim 1, 2, or 5.