JPH04278476A - Adapter for printed board test - Google Patents

Abstract

PURPOSE:To develop an adapter capable of using a conventional universal head as it is, so as to cope with fine wiring structure of a printed board. CONSTITUTION:A plurality of conductive test pins all capable of bending in a direction are held between a pattern board and pattern guide board, and a conversion board for converting the intervals of lands of a printed board into the intervals of probe pins of a universal head is provided on the pattern guide board side. A very accurate test can be made by using a conventional universal head, even if the printed board has such a very fine configuration that the intervals between lands are 0.6mm.

Description

[Detailed description of the invention] [Purpose of the invention]

0001

[Industrial Field of Application] The present invention relates to an adapter used for conducting continuity tests of printed circuit boards, and in particular, to ensure that the pin head of the adapter comes into contact with the printed circuit board when the printed circuit board is pressed into contact with the adapter. The present invention relates to a pressure contact structure of a pin head in an adapter.

0002

BACKGROUND OF THE INVENTION When conducting a continuity test on a printed circuit board on which electronic components such as ICs are mounted, an adapter A is connected to a universal head U having a large number of contact terminals called probes, as shown in FIG. Connect this adapter A
The pin head H of the plurality of test pins T provided in
The test is carried out by contacting the printed circuit board N for testing. In such a continuity test, the pin head H must be brought into secure contact with the test area such as the land of the printed circuit board N, so generally the pin head H must be elastically connected to the pattern board B facing the printed circuit board. It is necessary to have a structure that allows the probe pin P of the universal head U to move in and out at will, and such a countermeasure has already been taken by utilizing the action of the coil spring C built into the probe pin P of the universal head U.

However, in recent years, as electronic products have become smaller and more highly integrated, electronic components have also become smaller, and printed circuit boards have also become smaller, with distances between lands ranging from 0.6 to 0.6 mm.
The distance between the probe pins P in the universal head U is 8 mm, which is much finer than the 2.54 mm distance between the probe pins P in the universal head U. However, in response to such miniaturization, the receiving terminal J of the probe pin P in the universal head U is
However, with this method, the test pins T may come into contact with each other and cause an electrical short, or the test pins T may contact each other and cause an electrical short circuit. The movement of the test pins may deteriorate due to friction, the height positions of the pin heads H may become uneven and some pin heads H may not come into contact with the printed circuit board N, and furthermore, depending on the degree of inclination of the test pins T, the test pins may not move properly during operation. There were problems such as the test pin T coming off the receiving terminal J of the probe pin P.

By the way, since the spacing between the probe pins P in the universal head U is fixed, in order to make the pin head H correspond to the land R having a narrower spacing, in addition to the above method, a conversion plate for changing the spacing midway is necessary. One possible method is to provide However, in this method, the test pin T cannot directly utilize the spring action of the probe pin P due to the presence of the conversion plate.

Therefore, as a completely new idea, it has been considered to stop using the elastic force of the probe pin P and use the elasticity of the test pin T, and an embodiment of this idea is shown in FIG.
As shown in (b), a device in which a bending regulating plate S for holding a test pin T is further provided between two holding plates D has been developed. In this test pin T, which is normally straight, is elastically deformed by pulling the bending regulating plate S in the lateral direction, and the pin head H is pressed into contact with the printed circuit board N by the restoring force. However, even in this method, there are problems such as not only does it take time and effort to hold the test pin between the bending regulating plate S and the test pin T, but also the structure itself becomes complicated.

[0006]

[Technical matters attempted to be developed] The present invention was made in view of this background, and based on the technical idea of utilizing the elastic restoring force of the test pin, separate members such as a bending regulating plate are used. This is an attempt to develop a new adapter for printed circuit board testing in which the test pins are elastically deformed without contacting each other by changing the form or holding state of the test pins without using them.

[0007]

[Structure of the invention]

[Means for achieving the object] That is, the printed circuit board testing adapter, which is the first invention according to the present application, has electrical conductivity and elasticity between a pattern board and a pattern guide board that are arranged in parallel at a constant interval. A plurality of test pins are held, and the pattern guide board side is equipped with a conversion board that converts the land spacing on the test printed circuit board to the probe pin spacing on the universal head, and the test pins are all constant. It is characterized by having a deflection in the direction.

[0008] A second invention of the present application is a printed circuit board testing adapter, characterized in that the holding portions of the test pin on the pattern board and the pattern guide board are offset from each other in a certain direction. .

[0009] Furthermore, a third invention, a printed circuit board testing adapter, is characterized in that a notch is formed in the holding portion.

Furthermore, a fourth aspect of the present invention is a printed circuit board testing adapter, in which the holding portion is formed obliquely with respect to the pattern board or the pattern guide board. These inventions attempt to achieve the above object.

[0011]

Effect of the Invention In the present invention, since the plurality of test pins held between the pattern board and the pattern guide board have a bending pattern in a certain direction, when a load is applied to the tips of the test pins, all the test pins are bent. The pins flex in a fixed direction without contacting each other, and their restoring action causes the tips of the pins to come into pressure contact with the printed circuit board.

Furthermore, if the holding portions of the test pins on the pattern board and the pattern guide board are shifted from each other in a fixed direction, the test pins will have a deflection pattern in a fixed direction in accordance with the displacement of the holding portions. Furthermore, if a notch is formed in the holding portion, the bending of the test pin will be further promoted. Furthermore, if the holding portion is formed obliquely to the pattern board or pattern guide board,
The test pin now has a deflection pattern in a certain direction.

[0013]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be explained below based on the illustrated embodiments. FIG. 1 shows a system for conducting a continuity test of wiring printed on a printed circuit board using a board tester 1 to which a printed circuit board testing adapter according to the present invention is applied. In FIG. 1, reference numeral 2 denotes a printed circuit board testing adapter, which is installed above a universal head 4 built into the upper surface of the tester main body 3 via an interposer 5. In addition, an operation panel 3a is provided in front of the tester main body 3, a display panel 3b is provided in the rear right hand corner, and a printer 3c is provided in the front right hand corner.
A pressurizing device 6 is provided above the tester main body 3 and supported by four support rods 7.

[0014] A pressing plate 9 is provided on the lower surface side of the pressurizing device 6 in relation to a rod 8 of a cylinder provided within the pressurizing device 6. Incidentally, such a board tester 1 is
By pressing the printed circuit board N set on the printed circuit board test adapter 2 using the pressing plate 9,
This is to electrically inspect the wiring condition of the printed circuit board N. In addition, when printed wiring is made on both sides of the printed circuit board N, a printed circuit board test adapter 2 or the like may be provided on the pressing plate 9 side so that both sides of the printed circuit board N can be inspected at the same time. .

The printed circuit board test adapter 2 and its peripheral members to which the present invention is applied will be explained in detail below. As shown in FIGS. 2 to 5, the printed circuit board test adapter 2 has a plurality of test pins 12 held between a pattern board 10 provided on the printed circuit board side to be tested and a pattern guide board 11 provided parallel to the pattern board 10. Furthermore, a conversion board 13 is provided overlappingly on the universal head 4 side of the pattern guide board 11.

Both the pattern board 10 and the pattern guide board 11 are formed by forming a plurality of holding holes 14 in an acrylic plate corresponding to the positions of the lands R on the printed circuit board N for testing. The holding hole 14 is for holding the end of the test pin 12, and the holding hole 14 is designed to hold the end of the test pin 12 in a manner corresponding to each board.
They are defined as 0a and 11a.

Further, the positional relationship between the pattern board 10 and the pattern guide board 11 is such that, as shown in FIG. By holding both ends of the test pins 12 against the deviated holding parts 10a and 11a, all the test pins 12 are held in a state deformed in a certain direction as exaggeratedly shown in FIGS. 2 to 5. .

Now, the test pin 12 will be explained. This pin has a thicker held portion 16 formed at both ends that are held in the holding hole 14, and a flexible portion 17 formed between them. Further, a pin head 18 is formed at the tip of each held portion 16 . The printed circuit board testing adapter of the present invention utilizes the elastic restoring force of the test pin 12 when the pin head is elastically pressed against the printed circuit board N.

Incidentally, holding the test pin 12 in the above-described state is one of the characteristic features of the present invention, and this prevents a load from being applied to the test pin 12 in a direction perpendicular to the pattern board 10. In this case, all the test pins 12 can be bent in a certain direction without coming into contact with each other. In order to hold the test pins 12 as described above, first set the pattern board 10 and pattern guide board 11 so that the positions of the respective holding holes 14 match, and in this state, the test pins 12 are inserted into the respective holding holes 14. After passing the pattern board 10 and pattern guide board 11 through the pattern guide board 11, the pattern board 10 and the pattern guide board 11 may be slid in opposite directions.

Next, in order to ensure that the test pin 12 is deflected in a certain direction, the form of the holding parts 10a and 11a may be changed. That is, in the example shown in FIG. 6A, by forming a notch 10b in the holding part 10a on the lower surface side of the pattern board 10, the flexible part 17 or the boundary between the flexible part 17 and the held part 16 is cut out. The area around the part is made more flexible. Further, in the case shown in FIG. 6(b), the holding hole 14 on the pattern guide board 11 side is formed obliquely, and the held portion 16 of the test pin 12 is held obliquely therein. The bent portion of the flexible portion 17 in the test pin 12 is set at one location, so that the deflection state of the test pin 12 becomes more constant.

In each of the above embodiments, the holding parts 10a and 11a of the pattern board 10 and pattern guide board 11 are shifted in a certain direction. It is possible to hold the test pin 12 with one or both of the holding holes 14 formed diagonally without shifting the position, or to hold the test pin 12 with one or both of the holding holes 14 formed diagonally.
, for example, test pin 12 without shifting the position of 11a.
It is also possible to make a notch or the like in a part of the plate to create a bend.

Next, a structure for regulating the deflection of the test pin 12 beyond a certain level will be explained. An edge frame 19 of a constant height is provided around the pattern guide board 11, and a coil spring 20 is provided between the pattern board 10 and the upper end surface of this edge frame 19, so that its elastic stretching action Normally, the pattern board 10 is in a state that it is somewhat floating above the upper end surface of the edge frame 19. In this state, the pin head 18 at the top of the test pin 12 is below the top surface of the pattern board 10, and the pattern board 10 is pushed downward against the elasticity of the coil spring 20, so that the pin head 18 at the top of the test pin 12 is relatively The pin head 18 comes to protrude upward from the holding hole 14.

Therefore, with the printed circuit board N for testing placed on the pattern board 10, the printed circuit board N is placed from above.
If you press , the protrusion of the pin head 18 from the holding hole 14 is restricted by the presence of the printed circuit board N, so the test pin 1 is pressed with the pin head 18 in pressure contact with the printed circuit board N.
2 will be transformed. Note that such deformation of the test pins 12 is regulated by the contact between the pattern board 10 and the upper end surface of the edge frame 19, so the presence of the edge frame 19 prevents the test pins 12 from deforming more than necessary. This also serves to protect the test pin 12. Further, on the upper surface of the pattern board 10, projections 21 for positioning the printed circuit board N are formed at four locations, for example.

Next, the conversion board 13, which is another characteristic configuration of the present invention, will be explained. This conversion board 13 has land R on the printed circuit board N in order to apply the conventional almost standardized universal head 4 as it is.
This is for converting the distance between the probe pins into the distance between the probe pins in the universal head 4. This is attached to the lower surface side of the pattern guide board 11, and the holding holes 14 in the pattern guide board 11 are attached to this attachment surface side.
A pattern side land 22 is provided correspondingly to the pattern side land 22, and the lower pin head 18 of the test pin 12 comes into contact with the pattern side land 22.

On the other hand, a plurality of conversion-side lands 23 are provided on the interposer 5 side surface in correspondence with the spacing between the probe pins in the universal head 4. Then, for each pattern-side land 22, one of the conversion-side lands 23 is selected and connected to each other using the wiring structure 24 in the conversion board 13, but which conversion-side land 23 is to be associated with is determined by As shown in FIG. 7(a), the pattern side land 2
If there is a conversion-side land 23 immediately below the conversion-side land 2, this is made to correspond, and in other cases, as a general rule, the closest conversion-side land 23 is made to correspond. Note that, as shown in FIG. 7(c), if two pin heads 18 are relatively close to each other and one pin head 18 is made to correspond to the nearest conversion side land 23, it becomes impossible to make the other pin head 18 correspond. If the wiring structure 2 is connected to the conversion side land 23 which is a little away
4 may be extended to correspond to this.

The printed circuit board test adapter 2 has the above-described structure, and the structure of the interposer 5 and universal head 4 to which it is connected, and the connection state thereof will be explained below. First, the interbozer 5 is a communication board 25 installed on the adapter side.
A contact pin 27 is held between the contact guide board 26 and the contact guide board 26 provided on the universal head 4 side.

Unlike the test pin 12, this contact pin 27 is designed to not be elastically deformed, and has a pin head 28 formed on one end.
8 in contact with the conversion-side lands 23 of the conversion board 13, and are held perpendicularly in the holding holes 29 formed in the communication board 25 and the communication guide board 26, respectively. Note that, like the printed circuit board test adapter 2, this interposer 5 also has a frame 30 on the communication guide board 26 side.
is provided, and also due to the spring action, the communication board 25 sinks only when the printed circuit board test adapter 2 is placed on it, and the pin head 28 of the communication pin 27 touches the conversion board 1.
It has a structure that makes contact with the third side.

Next, the universal head 4 will be briefly explained. This head 4 is made up of a support board 33 provided on the top of a head body 32 in which probe pins 31 are basically arranged at grid intervals of 2.54 mm. In addition, the probe pin 31
A pin receiving portion 34 for receiving the lower end of the connecting pin 27 is elastically expandable and contractible by the action of a coil spring 35, and the support board 33 functions to support the pin receiving portion 34. In addition, the support board 33 has a spring 36
Normally, the supporting board 33 is pushed up to cover the pin receiving part 34, but by placing the interposer 5 on it, the support board 33 sinks, and the pin receiving part 34 becomes operable. And this kind of universal head 4
From there, the wiring 37 from each probe pin 31 is bundled and connected to an appropriate detection member in the tester main body 3.

The board tester 1 to which the present invention is applied has the structure as described above, and the state in which the continuity test of the printed circuit board N is performed using this tester will be described below. First, the board tester 1 is put into operation, and in this state, the printed circuit board N is set on the pattern board 10 of the printed circuit board testing adapter 2, aligned by the projections 21. Next, when the operation panel 3a is operated to drive the pressurizing device 6, the press plate 9 descends and presses the printed circuit board N. As a result, all the test pins 12 are deflected in a certain direction, and the pin heads 18 on both sides are pressed against each land R of the printed circuit board N and each pattern side land 22 of the conversion board 13 due to the restoring action. Also, at this time, the contact pin 2 is pressed by the pressing action from above.
The pin head 28 and the other end side of No. 7 reliably contact the conversion land 23 on the conversion board 13 and the pin receiving portion 34 of the probe pin 31, respectively. As a result, a circuit from the printed circuit board N to the wiring 37 is formed, and a continuity test of the printed circuit board N can be performed by passing a current through this circuit. The test results, such as voltage values, are displayed on the display panel 3b, and can be recorded on the printer 3c if necessary.

[0030]

Effects of the Invention In the printed circuit board testing adapter 2 of the present invention, the test pin 12 is held with a deflection in a certain direction between the pattern board 10 and the pattern guide board 11, and the pattern guide board 11
Since the conversion board 13 is provided on the side, even if the distance between the lands R on the printed circuit board N is 0.6 mm, which is extremely smaller than 2.54 mm, which is the distance between the probe pins 31 on the universal head 4. too,
Highly accurate tests can be performed by applying the conventional universal head 4 as is.

[Brief explanation of the drawing]

FIG. 1 is a partially exploded perspective view showing a board tester to which a printed circuit board testing adapter of the present invention is applied.

FIG. 2 is an enlarged perspective view showing the vicinity of the attachment part of the printed circuit board testing adapter of the present invention.

FIG. 3 is a longitudinal cross-sectional view showing a connection structure of various parts of the same as above.

FIG. 4 is an enlarged perspective view of a part of the printed circuit board testing adapter of the present invention.

FIG. 5 is a vertical cross-sectional view of the same as above.

FIG. 6 is a longitudinal sectional view showing another embodiment in which the structure of holding holes in a pattern board and a pattern guide board is different.

FIG. 7 is a longitudinal sectional view showing various conversion modes by the conversion board.

FIG. 8 is a plan view showing a comparison between the distances between patterns and lands of electronic components on a printed circuit board and the distance between pins on a universal head.

FIG. 9 is an enlarged vertical cross-sectional view showing the basic structure of a conventional board tester and the vicinity of probe pins.

FIG. 10 is a skeletal vertical cross-sectional view showing two embodiments of a conventional printed circuit board testing adapter.

[Explanation of symbols]

1 Board tester 2 Printed board test adapter 3
Tester main body 3a Operation panel 3b Display panel 3e Printer 4 Universal head 5 Interbozer 6 Pressure device 7 Support rod 8 Rod 9 Pressure plate 10 Pattern board 10a Holding section 10b Notch section 11 Pattern guide board 11a Holding section 12 Test pin 13 Conversion board 14 Holding hole 16 Part to be held 17 Flexible part 18 Pin head 19 Edge frame 20 Coil spring 21 Projection 22 Pattern side land 23 Conversion side land 24 Wiring structure 25 Communication board 26 Communication guide board 27 Communication pin 28 Pin head 29 Holding hole 30 Edge Frame 31 Probe pin 32 Head body 33 Support board 34 Pin receiver 35 Coil spring 36 Spring 37 Wiring G Dimension N Printed circuit board R Land

Claims (4)

[Claims] Claim 1: A plurality of test pins having conductivity and elasticity are held between a pattern board and a pattern guide board that are arranged in parallel at a constant interval, and a plurality of test pins are held on the pattern guide board side. For printed circuit board testing, comprising a conversion board that converts the spacing between lands on a test printed circuit board to the spacing between probe pins on a universal head, and wherein all of the test pins have a deflection pattern in a certain direction. adapter. 2. The printed circuit board testing adapter according to claim 1, wherein the test pin holding portions on the pattern board and the pattern guide board are offset from each other in a fixed direction. 3. The printed circuit board testing adapter according to claim 1, wherein the holding portion has a cutout portion formed therein. 4. The printed circuit board testing adapter according to claim 1, wherein the holding portion is formed obliquely with respect to a pattern board or a pattern guide board.