JPH1116701A - Multiple chip resistor - Google Patents

Multiple chip resistor

Info

Publication number
JPH1116701A
JPH1116701A JP16548697A JP16548697A JPH1116701A JP H1116701 A JPH1116701 A JP H1116701A JP 16548697 A JP16548697 A JP 16548697A JP 16548697 A JP16548697 A JP 16548697A JP H1116701 A JPH1116701 A JP H1116701A
Authority
JP
Japan
Prior art keywords
layer
multiple chip
chip resistor
layers
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16548697A
Other languages
Japanese (ja)
Inventor
Hideo Kobayashi
英雄 小林
Hiroyuki Yamada
博之 山田
Seiji Tsuda
清二 津田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16548697A priority Critical patent/JPH1116701A/en
Publication of JPH1116701A publication Critical patent/JPH1116701A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To decide the inside and outside of a resistor without fail by a method, wherein a multiple chip resistor is composed of a black color base inside and outside deciding insulating layer provided between a plurality of resistance layers, as well as a transmittable protective layer provided covering at least the resistance layers and the inside and outside deciding insulating layer. SOLUTION: A recess 12 and a projection 13 are provided on the opposite sides of a white color base insulating substrate 11 so as to form electrode layers 14. These electrode layers 14 are composed of three layers, i.e., an upper side electrode layer made of a mixed material, e.g. silver and glass, a nickel-plating layer 14b covering the upper side electrode layers 14a and a solder-plated layer 14c covering the nickel-plated layer 14b. A black color base resistance layers 15 partly and convolutionally connected to the upper side electrode layer 14a are formed, so as to form the other black color base inside and outside deciding insulating layer 16 between the resistance layers 15. Finally, a transmittable protective layer 17 covering the resistance layers 15 and the inside and outside deciding insulating layer 16 is formed, and then side electrodes 18 are formed on the sides of the insulating substrate 11.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、高密度配線回路に
用いられ、回路に実装後、抵抗値をレーザートリミング
により修正することにより回路動作を修正する、機能修
正等に用いられる多連チップ抵抗器に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multiple chip resistor used for a high-density wiring circuit, for correcting a circuit operation by correcting a resistance value by laser trimming after mounting on the circuit, and for correcting a function. It is about a vessel.

【0002】[0002]

【従来の技術】以下、従来の多連チップ抵抗器について
図面を参照しながら説明する。
2. Description of the Related Art A conventional multiple chip resistor will be described below with reference to the drawings.

【0003】図6は従来による多連チップ抵抗器を上面
から透視した図であり、図7は同X−X断面図である。
FIG. 6 is a perspective view of a conventional multiple chip resistor seen from above, and FIG. 7 is a sectional view taken along line XX of FIG.

【0004】図において、1は96%アルミナ等からな
る絶縁基板である。2は絶縁基板1の対向する側部に設
けられた凹部である。3は絶縁基板1の対向する側部に
設けられた凸部である。4は凸部3に設けられた電極層
である。なお、電極層4は3層(図示せず)から構成さ
れており、最下層は銀とガラスとの混合材料からなる電
極層、中間層はニッケルめっき層、最上層は半田めっき
層である。5は対向する電極層4と導通するように設け
られた酸化ルテニウムとガラスとの混合材料等からなる
抵抗層である。6は少なくとも抵抗層5を覆うように設
けられたホウケイ酸鉛系ガラス等からなる透過可能な保
護層である。
In FIG. 1, reference numeral 1 denotes an insulating substrate made of 96% alumina or the like. Reference numeral 2 denotes a concave portion provided on the opposite side of the insulating substrate 1. Reference numeral 3 denotes a protrusion provided on the opposite side of the insulating substrate 1. Reference numeral 4 denotes an electrode layer provided on the projection 3. The electrode layer 4 is composed of three layers (not shown). The lowermost layer is an electrode layer made of a mixed material of silver and glass, the intermediate layer is a nickel plating layer, and the uppermost layer is a solder plating layer. Reference numeral 5 denotes a resistance layer formed of a mixed material of ruthenium oxide and glass or the like provided so as to be electrically connected to the opposing electrode layer 4. Reference numeral 6 denotes a permeable protective layer made of lead borosilicate glass or the like provided so as to cover at least the resistance layer 5.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、多連チ
ップ抵抗器をテーピングする場合、表裏センサによって
表面と裏面を判定して包装するにもかかわらず、従来の
多連チップ抵抗器の構成では、2個の抵抗層5間に透過
可能な保護層6しか形成されておらず、外観上その部分
は絶縁基板の色(白色系)に見えるので、この多連チッ
プ抵抗器をテーピングする場合、表裏センサが表裏を誤
認するという課題を有していた。
However, in the case of taping a multiple chip resistor, the conventional multiple chip resistor has a structure of two in spite of the fact that the front and back sensors are used to determine the front surface and the back surface and the package is used. Since only the transparent protective layer 6 is formed between the resistive layers 5 and that portion looks like the color (white) of the insulating substrate in appearance, when taping this multiple chip resistor, the front and back sensors are used. Had the problem of misidentifying the front and back.

【0006】また、従来の多連チップ抵抗器の構成で
は、図6に示す断面図のように2個の抵抗層5間に保護
層6しか形成されていないため、その部分と抵抗層5の
上に保護層6を形成した部分では凹凸が生じ、多連チッ
プ抵抗器の実装時に吸着エラーが発生するという課題を
有していた。
In the structure of the conventional multiple chip resistor, only the protective layer 6 is formed between the two resistive layers 5 as shown in the sectional view of FIG. There is a problem that unevenness occurs in a portion where the protective layer 6 is formed thereon, and an adsorption error occurs when mounting a multiple chip resistor.

【0007】本発明は、上記従来の課題を解決するもの
で、抵抗器の表裏面を表裏センサによって確実に判定で
きる上、実装時の吸着エラーが発生しにくい多連チップ
抵抗器を提供することを目的とするものである。
An object of the present invention is to solve the above-mentioned conventional problems by providing a multiple chip resistor in which the front and back surfaces of a resistor can be reliably determined by a front and back sensor and suction errors during mounting are less likely to occur. It is intended for.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するため
に本発明は、複数の抵抗層間に設けられた黒色系の表裏
判定用絶縁層と、少なくとも前記抵抗層と表裏判定用絶
縁層とを覆うように設けられた透過可能な保護層とから
構成されるものである。
In order to achieve the above object, the present invention provides a black-based front / back determination insulating layer provided between a plurality of resistance layers, and at least the resistance layer and the front / back determination insulating layer. And a transmissive protective layer provided so as to cover it.

【0009】[0009]

【発明の実施の形態】本発明の請求項1に記載の発明
は、絶縁基板の対向するように側部に設けられた複数の
電極層と、前記複数の電極層と導通するように設けられ
た複数の抵抗層と、前記複数の抵抗層間に設けられた黒
色系の表裏判定用絶縁層と、少なくとも前記抵抗層と表
裏判定用絶縁層とを覆うように設けられた透過可能な保
護層とからなるものである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The invention according to claim 1 of the present invention is provided with a plurality of electrode layers provided on a side portion of an insulating substrate so as to face each other, and provided so as to be electrically connected to the plurality of electrode layers. A plurality of resistance layers, a black-based front / back determination insulating layer provided between the plurality of resistance layers, and a transmissive protective layer provided so as to cover at least the resistance layer and the front / back determination insulating layer. It consists of

【0010】また、請求項2に記載の発明は、請求項1
記載の抵抗層と表裏判定用絶縁層とで、抵抗器の表裏面
を判定するものである。
[0010] The invention described in claim 2 is the same as the claim 1.
The resistance layer described above and the insulating layer for front and back determination determine the front and back surfaces of the resistor.

【0011】また、請求項3に記載の発明は、請求項1
記載の抵抗層と表裏判定用絶縁層とは、同色系からなる
ものである。
[0011] The invention according to claim 3 is based on claim 1.
The described resistance layer and the insulating layer for front / back determination are of the same color system.

【0012】また、請求項4に記載の発明は、請求項1
記載の抵抗層と表裏判定用絶縁層とは、同膜厚からなる
ものである。
The invention described in claim 4 is the first invention.
The described resistance layer and the insulating layer for front / back determination have the same thickness.

【0013】この構成により、抵抗器の表裏面を表裏セ
ンサによって確実に判定でき、かつ、実装時の吸着エラ
ーがなくなるという作用を有するものである。
According to this configuration, the front and back sensors of the resistor can be reliably determined by the front and back sensors, and the suction error at the time of mounting is eliminated.

【0014】(実施の形態1)以下、本発明の実施の形
態による多連チップ抵抗器について、図面を参照しなが
ら説明する。
(Embodiment 1) Hereinafter, a multiple chip resistor according to an embodiment of the present invention will be described with reference to the drawings.

【0015】図1は本発明の実施の形態1における多連
チップ抵抗器を上面から透視した図で、図2は同X−X
断面図、図3は同Y−Y断面図である。
FIG. 1 is a perspective view of a multiple chip resistor according to a first embodiment of the present invention viewed from above, and FIG.
FIG. 3 is a cross-sectional view of FIG.

【0016】図において、11は96%アルミナ、ガラ
スセラミック等からなる白色系の絶縁基板である。12
は絶縁基板11の対向する側部に設けられた凹部であ
る。13は絶縁基板11の対向する側部に設けられた凸
部である。14は凸部13に設けられた電極層である。
なお、電極層14は3層から構成されており、14aは
銀とガラスとの混合材料等からなる上面電極層、14b
は上面電極層14aを覆うよう設けられたニッケルめっ
き層、14cはニッケルめっき層14bを覆うように設
けられた半田めっき層である。15は上面電極層14a
に一部が重畳して電気的に接続するように設けられた酸
化ルテニウムとガラスとの混合材料等からなる黒色系の
抵抗層である。16は抵抗層15間に設けられたホウケ
イ酸鉛系ガラス等からなる黒色系の表裏判定用絶縁層で
ある。17は少なくとも抵抗層15と表裏判定用絶縁層
16を覆うように設けられたホウケイ酸鉛系ガラス等か
らなる透過可能な保護層である。18は絶縁基板11の
側面に少なくとも上面電極層14aと電気的接続するよ
うに設けられた銀とガラスとの混合材料等からなる側面
電極層である。
In FIG. 1, reference numeral 11 denotes a white insulating substrate made of 96% alumina, glass ceramic or the like. 12
Is a concave portion provided on the opposite side of the insulating substrate 11. Reference numeral 13 denotes a protrusion provided on the opposite side of the insulating substrate 11. Reference numeral 14 denotes an electrode layer provided on the projection 13.
The electrode layer 14 is composed of three layers, 14a is an upper electrode layer made of a mixed material of silver and glass or the like, 14b
Is a nickel plating layer provided to cover the upper electrode layer 14a, and 14c is a solder plating layer provided to cover the nickel plating layer 14b. 15 is an upper electrode layer 14a
And a black-based resistance layer made of a mixed material of ruthenium oxide and glass, which is provided so as to be partially overlapped with and electrically connected thereto. Reference numeral 16 denotes a black type front-back determination insulating layer made of a lead borosilicate glass or the like provided between the resistance layers 15. Reference numeral 17 denotes a permeable protection layer made of a lead borosilicate glass or the like provided so as to cover at least the resistance layer 15 and the insulating layer 16 for front / back determination. Reference numeral 18 denotes a side electrode layer made of a mixed material of silver and glass or the like provided on the side surface of the insulating substrate 11 so as to be electrically connected to at least the upper electrode layer 14a.

【0017】以上のように構成された多連チップ抵抗器
について、以下にその製造方法を図面を参照しながら説
明する。
A method of manufacturing the multiple chip resistor having the above-described configuration will be described below with reference to the drawings.

【0018】図4、図5は本発明の実施の形態1におけ
る多連チップ抵抗器の製造方法を示す工程図である。
FIGS. 4 and 5 are process diagrams showing a method for manufacturing a multiple chip resistor according to the first embodiment of the present invention.

【0019】まず、図4(a)に示すように、スルーホ
ール21と縦横の分割溝22を有する96%アルミナ、
ガラスセラミック等からなる白色系のシート状基板23
の分割溝22を跨ぐように銀とガラスとの混合ペースト
材料をスクリーン印刷・乾燥して、ベルト式連続焼成炉
によって約850℃の温度で、約45分のプロファイル
によって焼成し、上面電極層24を形成する。
First, as shown in FIG. 4A, 96% alumina having through holes 21 and vertical and horizontal dividing grooves 22 is formed.
White sheet-like substrate 23 made of glass ceramic or the like
Screen-printed and dried a mixed paste material of silver and glass so as to straddle the dividing groove 22 of the above, and fired at a temperature of about 850 ° C. in a belt-type continuous firing furnace at a temperature of about 850 ° C. for a profile of about 45 minutes. To form

【0020】次に、図4(b)に示すように、上面電極
層24間を電気的に接続するように、酸化ルテニウムと
ガラスとの混合ペースト材料を上面電極層24の一部に
重畳するようにシート状基板23の上面にスクリーン印
刷・乾燥し、ベルト式連続焼成炉によって約850℃の
温度で、約45分のプロファイルによって焼成し、約1
0μmの黒色系の抵抗層25を形成する。
Next, as shown in FIG. 4B, a mixed paste material of ruthenium oxide and glass is superposed on a part of the upper electrode layer 24 so as to electrically connect the upper electrode layers 24. Screen-printed and dried on the upper surface of the sheet-like substrate 23, and fired at a temperature of about 850 ° C. in a belt-type continuous firing furnace at a temperature of about 850 ° C. with a profile of about 45 minutes, and dried for about 1 hour.
A black resistive layer 25 having a thickness of 0 μm is formed.

【0021】次に、図4(c)に示すように、抵抗層2
5間の白色部をなくし、かつ、表面をフラットにするた
めに、酸化マンガン等の黒色系顔料を含有するホウケイ
酸鉛系ガラスペーストをスクリーン印刷・乾燥し、ベル
ト式連続焼成炉によって約600℃の温度で、約45分
のプロファイルによって焼成し、約10μmで抵抗層2
5と同色系である黒色系の表裏判定用絶縁層26を形成
する。
Next, as shown in FIG.
In order to eliminate the white portion between 5 and to make the surface flat, a lead borosilicate glass paste containing a black pigment such as manganese oxide is screen-printed and dried, and is heated to about 600 ° C. by a belt-type continuous firing furnace. At a temperature of about 45 minutes with a profile of about 45 minutes,
A black-based front / back determination insulating layer 26 of the same color as 5 is formed.

【0022】次に、図5(a)に示すように、少なくと
も抵抗層25と表裏判定用絶縁層26の上面を覆うよう
にホウケイ酸鉛系ガラスペーストをスクリーン印刷・乾
燥し、ベルト式連続焼成炉によって約600℃の温度
で、約45分のプロファイルによって焼成し、透過可能
な保護層27を形成する。ここで、抵抗層25と表裏判
定用絶縁層26は同じ膜厚であることから、保護層27
の表面は凹凸がないフラットな状態となる。
Next, as shown in FIG. 5A, a lead borosilicate glass paste is screen-printed and dried so as to cover at least the upper surfaces of the resistance layer 25 and the insulating layer 26 for determining the front and back sides, and is subjected to belt-type continuous firing. Firing in a furnace at a temperature of about 600 ° C. with a profile of about 45 minutes to form a permeable protective layer 27. Here, since the resistance layer 25 and the front / back determination insulating layer 26 have the same thickness, the protective layer 27
Has a flat state without irregularities.

【0023】次に、図5(b)に示すように、側面から
上面電極層24が露出するようにシート状基板(本図で
は、図示せず)の分割溝(本図では、図示せず)に沿っ
て分割して、短冊状の基板28を形成する。
Next, as shown in FIG. 5B, division grooves (not shown in FIG. 5) of the sheet-like substrate (not shown in FIG. 5) so that the upper electrode layer 24 is exposed from the side surfaces. ) To form a strip-shaped substrate 28.

【0024】次に、図5(c)に示すように、上面電極
層24と電気的に接続するように、銀とガラスとの混合
ペースト材料をローラー転写印刷・乾燥し、ベルト式連
続焼成炉によって約600℃の温度で、約45分のプロ
ファイルによって焼成し、側面電極層29を形成する。
Next, as shown in FIG. 5C, a mixed paste material of silver and glass is roller-transfer-printed and dried so as to be electrically connected to the upper electrode layer 24, and the belt-type continuous firing furnace is used. At a temperature of about 600 ° C. with a profile of about 45 minutes to form the side electrode layer 29.

【0025】次に、図5(d)に示すように、短冊状の
基板28を分割溝22に沿って分割して、個片状の基板
30を形成する。
Next, as shown in FIG. 5D, the strip-shaped substrate 28 is divided along the division grooves 22 to form individual substrates 30.

【0026】最後に、上面電極層24と側面電極層29
を覆うようにニッケルめっき等からなる第1のめっき層
(図示せず)を形成するとともに、この第1のめっき層
を覆うように錫と鉛との合金めっき等からなる第2のめ
っき層(図示せず)を形成して、多連チップ抵抗器を製
造するものである。
Finally, the upper electrode layer 24 and the side electrode layer 29
A first plating layer (not shown) made of nickel plating or the like is formed so as to cover the first plating layer, and a second plating layer made of an alloy plating of tin and lead or the like is formed so as to cover the first plating layer. (Not shown)) to manufacture a multiple chip resistor.

【0027】以上のように構成・製造された多連チップ
抵抗器について、以下にその特性を従来の多連チップ抵
抗器と比較したものを説明する。
The characteristics of the multiple chip resistor constructed and manufactured as described above will be described below in comparison with those of a conventional multiple chip resistor.

【0028】(実験方法1)自動テーピング機の表裏セ
ンサで多連チップ抵抗器、本実施の形態の多連チップ抵
抗器と従来の多連チップ抵抗器それぞれ10000個の
表裏を判定させて包装する。
(Experimental Method 1) The front and back sensors of the automatic taping machine are used to judge the front and back of each of the multiple chip resistors, the multiple chip resistors of the present embodiment, and the conventional multiple chip resistors, and package them. .

【0029】(良否判定1)多連チップ抵抗器が裏向き
に包装されたものを不良とする。
(Pass / Fail Judgment 1) A multiple chip resistor packaged upside down is regarded as defective.

【0030】(実験結果1)(表1)に従来と本実施の
形態による多連チップ抵抗器の包装不良数の実験結果を
示す。
(Experimental Results 1) (Table 1) shows experimental results of the number of defective packaging of the multiple chip resistor according to the conventional and the present embodiment.

【0031】[0031]

【表1】 [Table 1]

【0032】(表1)より明らかなように、本発明の多
連チップ抵抗器は抵抗層間に表裏判定用絶縁層を設けて
いるため、多連チップ抵抗器の表裏面を表裏センサによ
って確実に判定できていることが確認できる。
As is clear from Table 1, since the multiple chip resistor of the present invention is provided with an insulating layer for determining the front and back sides between the resistance layers, the front and back surfaces of the multiple chip resistor are surely detected by the front and back sensors. It can be confirmed that the judgment has been made.

【0033】(実験方法2)自動実装機で多連チップ抵
抗器、本実施の形態の多連チップ抵抗器と従来の多連チ
ップ抵抗器それぞれ10000個の表面を吸着させる。
(Experimental Method 2) The surface of each of the multiple chip resistors, the multiple chip resistors of the present embodiment, and the conventional multiple chip resistors of 10,000 is adsorbed by an automatic mounting machine.

【0034】(実装不良2)多連チップ抵抗器の吸着エ
ラーが発生したものを不良とする。
(Mounting failure 2) A chip in which a suction error has occurred in a multiple chip resistor is determined to be defective.

【0035】(実験結果2)(表2)に従来と本発明に
よる多連チップ抵抗器の実装不良数の実験結果を示す。
(Experimental Results 2) Table 2 shows the experimental results of the number of defective mountings of the multiple chip resistor according to the prior art and the present invention.

【0036】[0036]

【表2】 [Table 2]

【0037】(表2)より明らかなように、本発明の多
連チップ抵抗器は抵抗層間に表裏判定用絶縁層を設けて
いるため、表面がフラットになり実装時の吸着エラーが
発生しないことが確認できる。
As is clear from Table 2, since the multiple chip resistor of the present invention is provided with an insulating layer for determining the front and back sides between the resistance layers, the surface is flat and no suction error occurs during mounting. Can be confirmed.

【0038】なお、上記実施の形態1では凸電極タイプ
を用いたが、これは電極形状を制限するものではなく、
凹電極タイプを用いることでも同様の効果が得られる。
Although the convex electrode type is used in the first embodiment, this does not limit the shape of the electrode.
The same effect can be obtained by using the concave electrode type.

【0039】また、上記実施の形態1では2素子タイプ
を用いたが、これは素子数を制限するものではなく、3
素子タイプ以上を用いることでも同様の効果が得られ
る。
Further, in the first embodiment, the two-element type is used, but this does not limit the number of elements.
Similar effects can be obtained by using an element type or more.

【0040】[0040]

【発明の効果】以上のように本発明は、抵抗層間に黒色
系の表裏判定用絶縁層を設けているため、多連チップ抵
抗器の表裏面を表裏センサによって確実に判定できる
上、抵抗層と表裏判定用絶縁層の膜厚を同じにしている
ため、保護層の表面がフラットになることで実装性にも
優れた多連チップ抵抗器を提供できるものである。
As described above, according to the present invention, since the black-type front / back determination insulating layer is provided between the resistance layers, the front / back sensor of the multiple chip resistor can be reliably determined by the front / back sensor. Since the thickness of the insulating layer for determining the front and back sides is the same, the surface of the protective layer becomes flat, so that a multiple chip resistor excellent in mountability can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態1における多連チップ抵抗
器の上面から透視した図
FIG. 1 is a perspective view of a multiple chip resistor according to a first embodiment of the present invention as seen from above.

【図2】同X−X断面図FIG. 2 is a sectional view taken along line XX of FIG.

【図3】同Y−Y断面図FIG. 3 is a sectional view taken along the line YY of FIG.

【図4】同製造方法を示す工程図FIG. 4 is a process chart showing the manufacturing method.

【図5】同製造方法を示す工程図FIG. 5 is a process chart showing the manufacturing method.

【図6】従来の多連チップ抵抗器の上面から透視した図FIG. 6 is a perspective view of the conventional multiple chip resistor seen from above.

【図7】同X−X断面図FIG. 7 is a sectional view taken along line XX of FIG.

【符号の説明】[Explanation of symbols]

11 絶縁基板 14 電極層 15 抵抗層 16 表裏判定用絶縁層 17 保護層 DESCRIPTION OF SYMBOLS 11 Insulating substrate 14 Electrode layer 15 Resistance layer 16 Insulating layer for front / back determination 17 Protective layer

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 絶縁基板の対向するように側部に設けら
れた複数の電極層と、前記複数の電極層と導通するよう
に設けられた複数の抵抗層と、前記複数の抵抗層間に設
けられた黒色系の表裏判定用絶縁層と、少なくとも前記
抵抗層と表裏判定用絶縁層とを覆うように設けられた透
過可能な保護層とからなる多連チップ抵抗器。
A plurality of electrode layers provided on a side of the insulating substrate so as to face each other; a plurality of resistance layers provided so as to be electrically connected to the plurality of electrode layers; and a plurality of resistance layers provided between the plurality of resistance layers. A multi-chip resistor comprising: a black-based front / back determination insulating layer; and a transparent protective layer provided so as to cover at least the resistance layer and the front / back determination insulating layer.
【請求項2】 抵抗層と表裏判定用絶縁層とで、多連チ
ップ抵抗器の表裏面を判定する請求項1記載の多連チッ
プ抵抗器。
2. The multiple chip resistor according to claim 1, wherein the front and back surfaces of the multiple chip resistor are determined by the resistance layer and the front / back determination insulating layer.
【請求項3】 抵抗層と表裏判定用絶縁層とは、同色系
からなる請求項1記載の多連チップ抵抗器。
3. The multiple chip resistor according to claim 1, wherein the resistance layer and the front / back determination insulating layer are of the same color system.
【請求項4】 抵抗層と表裏判定用絶縁層とは、同膜厚
からなる請求項1記載の多連チップ抵抗器。
4. The multiple chip resistor according to claim 1, wherein the resistance layer and the front / back determination insulating layer have the same thickness.
JP16548697A 1997-06-23 1997-06-23 Multiple chip resistor Pending JPH1116701A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16548697A JPH1116701A (en) 1997-06-23 1997-06-23 Multiple chip resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16548697A JPH1116701A (en) 1997-06-23 1997-06-23 Multiple chip resistor

Publications (1)

Publication Number Publication Date
JPH1116701A true JPH1116701A (en) 1999-01-22

Family

ID=15813325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16548697A Pending JPH1116701A (en) 1997-06-23 1997-06-23 Multiple chip resistor

Country Status (1)

Country Link
JP (1) JPH1116701A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001176708A (en) * 1999-12-15 2001-06-29 Matsushita Electric Ind Co Ltd Resistor
JPWO2007060774A1 (en) * 2005-11-28 2009-05-07 株式会社村田製作所 Ceramic electronic components
CN110580991A (en) * 2019-09-30 2019-12-17 深圳市禹龙通电子有限公司 Resistance card

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001176708A (en) * 1999-12-15 2001-06-29 Matsushita Electric Ind Co Ltd Resistor
JPWO2007060774A1 (en) * 2005-11-28 2009-05-07 株式会社村田製作所 Ceramic electronic components
JP4697231B2 (en) * 2005-11-28 2011-06-08 株式会社村田製作所 Ceramic electronic components
CN110580991A (en) * 2019-09-30 2019-12-17 深圳市禹龙通电子有限公司 Resistance card

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