JPH11118777A - Sector scanning ultrasonic inspecting apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a sector scanning ultrasonic inspecting apparatus, for identifying not only a flow but also type of a fault and quantitatively evaluating a fault size. SOLUTION: The sector scanning ultrasonic inspecting apparatus for generating an image gradated in color or dark or light responsive to an amplitude level of an echo signal from the signal from a specimen 1 to be detected, detected by an array probe 2 to display it on an image display unit 13, comprises a receiving circuit 5B having a fault pattern memory 15 for storing pattern information regarding various model faults, a discriminating and evaluating processor 16 inputting required detecting echo image stored in a frame memory provided in a coordinate transforming circuit 12 and pattern information stored in the memory 15 to automatically discriminate or evaluating the type and size of the fault existing in the specimen 1 to be detected, and a controller 17 for the processor 16.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an array probe in which a large number of array transducers are arranged, scans ultrasonic waves in a fan shape, detects an echo signal from the subject, and controls the situation inside the subject. The present invention relates to a sector scanning ultrasonic inspection apparatus for inspecting by destruction, and more particularly to a sector scanning ultrasonic inspection apparatus suitable for evaluating the type and size of a defect existing inside a subject.

[0002]

2. Description of the Related Art Conventionally, for example, Japanese Patent Laid-Open Publication No.
As described in Japanese Unexamined Patent Application Publication No. Hei. 3-12 and Japanese Unexamined Patent Application Publication No. HEI 4-12269, the array probe in which a large number of array transducers are arranged in a fan shape is moved along the surface of the subject while the respective array transducers are moved. The transducer is electronically scanned at a required timing to generate a fan-shaped ultrasonic beam from the array probe, an echo signal returned from the subject is detected by the array probe, and the inside of the subject is detected. 2. Description of the Related Art A fan-type scanning ultrasonic inspection apparatus for non-destructively inspecting a situation is known.

FIG. 6 shows an example of a conventionally known fan-type scanning ultrasonic inspection apparatus. As is clear from this figure, the sector scanning ultrasonic inspection apparatus of the present example supports an array probe 2 in which a large number of array transducers are arranged in a sector shape, and supports the array probe 2. A mechanical scanner 3 that moves in one direction along the surface of the subject 1 and an angle detection encoder 3 attached to each joint of the mechanical scanner 3
a, 3b, 3c, a magnet stand 4 supporting the mechanical scanner 3, a transmitting circuit 5A, and a receiving circuit 5B.
And an image display unit 13.

The transmitting circuit section 5A includes n array transducers constituting the array probe 2, each of which is individually connected to n array transducers.
A transmission driving circuit 5 which includes a number of pulsers 5P ₁ ~5P _n,
Consist transmission delay control circuit 6 for delaying the excitation signal array transducer output from sequentially selected to the pulser groups a predetermined number of pulsers from among the pulser 5P ₁ ~5P _n by a predetermined time, the pulser groups By adjusting the number of pulsars and the delay amount of the excitation signal for each pulsar group, the array probe 2 scans the ultrasonic beam in a fan shape.

[0005] The receiving circuit unit 5B includes n array vibrators constituting the array probe 2, each of which is individually connected to n array vibrators.
Pieces of a receiving circuit 7 which includes a receiver 7R ₁ ~7R _n, reception delay circuit delays the echo signals from the subject 1 received by each receiver 7R ₁ ~7R _n by a predetermined time 8
A reception delay control circuit 9 for controlling a delay amount of the reception delay circuit 8, and an adder 10 for adding each delayed echo signal
A / which converts the added echo signal into a digital value
A coordinate signal generating circuit for calculating the coordinate position of the array probe 2 based on signals from the D converter 11 and encoders 3a, 3b, 3c provided in the mechanical scanner 3, and outputting the coordinate position signal 12 and a coordinate conversion circuit 14. The coordinate conversion circuit 14 includes: a frame memory having an address corresponding to a display position of the image display unit 13;
A line memory for storing data of the echo signal input from the / D converter 11; a coordinate conversion operation unit for performing a required operation to be described later; and a coordinate position output from the coordinate signal generation circuit 12. In accordance with the signal, an image (detected echo image) is provided at each address of the frame memory, in which the color or gradation corresponding to the amplitude level of the echo signal is grayed.
Is stored. This detected echo image is displayed on the image display unit 13 in real time.

[0006] The control part of the ultrasonic inspection apparatus is as follows.
It operates by a clock signal output from a reference pulse generator (not shown).

The inspection of the subject 1 is performed by bending the joints of the mechanical scanner 3 and moving the array probe 2 linearly in the direction of arrow A along the surface of the subject 1 while transmitting the transmission drive circuit 5.
And the array probe 2 by driving the transmission delay control circuit 6
This is performed by scanning the ultrasonic beam in a fan shape. The reflected beam from the subject 1 is detected by each of the array transducers constituting the array probe 2 and received by the receiving circuit 7 to become an echo signal. Each echo signal output from the reception circuit 7 is delayed by the reception delay circuit 8 by a predetermined time set by the reception delay control circuit 9, and after the echo signals for each beam are added by the adder 10. , A / D
The data is converted into a digital value by the converter 11. The digitally converted echo signal is converted into a coordinate conversion circuit based on a coordinate signal output from a coordinate signal generation circuit 12 based on position signals from encoders 3a, 3b, 3c attached to each joint of the mechanical scanner 3. 14 is input.

That is, the digitally converted echo signal is temporarily stored in a line memory provided in the coordinate conversion circuit 14 for each beam, and time information (distance information) of the beam data stored in the line memory is represented by: The coordinates are converted into X-axis and Y-axis coordinate information in accordance with the radiation angle of the beam by the coordinate conversion operation unit, and are stored in an address corresponding to the coordinates in the frame memory. As a result, the detected echo image is stored in the frame memory in such a manner that the detected echo image is converted into a color or shade corresponding to the amplitude level of each echo signal.

Incidentally, since the operation for the conversion by the coordinate conversion operation section provided in the coordinate conversion circuit 14 takes a considerable time, other coordinate conversion means are usually employed instead of the operation. Often done. FIG. 7 shows an example of another conventionally known coordinate conversion means. FIG.
(A) shows each ultrasonic beam emitted from the array probe 2 to the subject 1, and each beam is given a number in advance. This number is indicated by B ₁ .about.B _n in FIG. FIG. 7B shows a line memory M provided in the coordinate conversion circuit 14.
Indicates _L, I to viii indicates the address of the line memory M _L. FIG. 7C shows the coordinate conversion circuit 14.
Shows the frame memory M _F provided in the sign X _1,
X _2, X ₃ the address of the X-axis of the frame memory M _F corresponding to each coordinate ............ is outputted from the coordinate signal generation circuit 12, reference numeral Y _1, Y _2, Y ₃ ............ is Y Indicates the address of the axis.

[0010] Now, when the echo signal beams B ₁ is converted into digital data by the A / D converter 11, these data are temporarily stored in the line memory M _L. Each of the stored data is indicated by reference numerals a to h in FIG. Individual, advance to create an address of the frame memory M _F specified by the address of the beam number and the line memory M _L advance in the data table, the frame memory M which was stored in the line memory M _L data are respectively identified Means of storing at the address of _F is adopted. The data table T _D shown in (d) of FIG. For example, as shown in the figure, the frame memory M _F corresponding to the address I of the beam number B ₁
The addresses are specified such as "X _10, Y _1", the address of the frame memory M _F corresponding to the address II the beam number B ₁ represents "X _9, Y _2". Therefore, the data is stored in the line memory M _L, the data table T _D is referred to, the data of the line memory M _L will be immediately stored in a corresponding address of the frame memory M _F. Storage state of each data a~h of beams B ₁ is shown in (c) of FIG. In this manner, the calculation for the above-mentioned conversion by the coordinate conversion calculation unit can be omitted, and high-speed data processing can be performed.

The above data processing is performed for each beam scanning for each movement of the array probe 1. Therefore, the address in the frame memory M _F is occurs when the data by the movement of the array probe 2 overlap,
In such a case, for example, a means is used in which the already stored data is compared with the data to be stored this time, and the larger data is stored at the address.

[0012] Thus, the data of the echo signals of each beam are sequentially stored in the frame memory M _F, the stored data is immediately image display are transmitted to the image display unit 13. In the apparatus of the above example, the detected echo image corresponding to the amplitude level of each echo signal is displayed on the image display unit 13 in color or shade. Thus, the inspector can observe the ultrasonic echo image at the position while moving the array probe 2.

[0013]

In the conventional ultrasonic inspection apparatus described above, the image display unit 13 displays a cross-sectional image (B
By displaying the scope image, it is possible to relatively easily detect a defect and specify the location of the defect. However, since only an image gray-scaled according to the amplitude level of each echo signal is displayed on the image display unit 13, it is difficult to determine the type of defect and to evaluate the size of the defect.

SUMMARY OF THE INVENTION The present invention has been made in order to solve the above-mentioned deficiencies of the prior art, and an object thereof is to provide a sector scanning type which can also determine the type of a defect and evaluate the size of the defect. An ultrasonic inspection apparatus is provided.

[0015]

In order to achieve the above object, the present invention firstly provides an array probe composed of a large number of array transducers, and a method for detecting an object from the array probe. A transmission circuit unit that scans the ultrasonic beam in a fan shape, and a detection that is grayed to a color or shade corresponding to the amplitude level of the echo signal from the echo signal from the subject detected by the array probe. In a fan-type scanning ultrasonic inspection apparatus including a receiving circuit unit that generates an echo image and stores the detected echo image in a frame memory, and an image display unit that displays the detected echo image generated by the receiving circuit unit, In the circuit section,
A defect pattern memory in which pattern information related to various model defects is stored, and a required detected echo image stored in the frame memory are fetched, and pattern information of the detected echo image corresponding to the pattern information related to the model defect is processed by image processing. The pattern information of the detected echo image is extracted, and the pattern information on the model defect is collated with the pattern information on the model defect to determine the type of the defect present in the subject.

Second, in the fan-type scanning ultrasonic inspection apparatus similar to the above, the pattern information relating to various model defects, the calculation formula of the defect size, and each model defect to be substituted into the calculation formula are stored in the receiving circuit unit. A defect pattern memory in which constants and proportional coefficients according to the type of memory are stored, and a pattern information of a detected echo image corresponding to the pattern information relating to the model defect by capturing a required detected echo image stored in the frame memory. Extracted by the processing, the pattern information of the detected echo image and the pattern information relating to the model defect are collated to automatically determine the type of the defect present in the subject, and the defect size calculation formula and the determined A constant and a proportional coefficient corresponding to the type of the detected defect are fetched from the defect pattern memory, and the defect And the configuration of providing the determination and evaluation unit for automatically evaluating's.

The defect pattern memory can store, as the pattern information, arbitrary parameters applied to pattern recognition by digital image processing, but the data amount is small and is included in the subject relatively easily. Since the type of defect can be determined, echo images of various model defects, an approximate expression of a line segment obtained by performing image processing on the echo image, and a ratio between the X-axis length and the Y-axis length of the line segment are stored. Is preferred.

When the ultrasonic probe is scanned in a fan shape from the array probe while moving the array probe in one direction along the surface of the object, if there is any defect inside or on the surface of the object, The ultrasonic beam emitted from the array probe is reflected by the defect and generates an echo signal having a specific pattern corresponding to the type of the defect. This echo signal is detected by the array probe in a range where the beam direction of the array probe and the direction of the echo signal coincide with each other, so that the detected echo signal is subjected to coordinate conversion according to the beam direction. It is possible to store the detected echo image obtained by the coordinate conversion in a frame memory having an address configuration corresponding to the display position of the image display unit. This detected echo image also has a unique pattern corresponding to the type of defect.

Therefore, ultrasonic flaw detection is performed on test pieces having model defects of various shapes in advance, and the echo images and necessary pattern information obtained by image processing from the echo images (for example, the above-described approximate expression of the line segment) And the ratio of the X-axis length to the Y-axis length of the line segment) stored in the defect pattern memory, the echo image of the model defect and the detected echo image are superimposed and displayed on the image display unit.
The type of defect can be immediately known by image processing or visual observation. In addition, if the corresponding defect pattern information is extracted from the detected echo image by image processing, and the extracted defect pattern information is compared with the pattern information stored in the defect pattern memory, the type of the defect included in the subject can be determined. Can be automatically obtained by calculation.

Further, as a result of performing ultrasonic inspection on a large number of test pieces having model defects of various shapes, the size of the defect can be calculated by a relatively simple calculation formula using a constant and a proportional coefficient corresponding to the shape of the model defect. Since it is known that it can be obtained by substituting the length of the line segment obtained by performing image processing on the detected echo image, these calculation formulas, constants, and proportional coefficients should be stored in advance in the defect pattern memory. For example, each time the type of defect is determined in the determination processing unit, a constant and a proportional coefficient corresponding to the type of the defect determined as the above-described calculation formula are taken into the determination / evaluation processing unit from the defect pattern memory, and the above calculation is performed. By executing this, it is possible to automatically determine the size of the defect whose type has been determined.

[0021]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing an example of a fan-type scanning ultrasonic inspection apparatus according to the present invention. FIG. 1 is a configuration diagram of a sector scanning ultrasonic inspection apparatus according to an embodiment, FIG. 2 is a schematic diagram showing the relationship between the type of defect and the beam directivity of an echo signal, and FIG. 3 is detected by ultrasonic flaw detection. FIG. 4 is a table showing various types of defect images, and FIG. 4 is a table illustrating pattern information stored in a defect pattern memory.

As is apparent from FIG. 1, the ultrasonic inspection apparatus according to the present embodiment has a defect inspection system in which pattern information relating to various model defects is stored in the receiving circuit unit 5B of the conventional ultrasonic inspection apparatus shown in FIG. Pattern memory 15 and coordinate conversion circuit 1
2. By taking in the required detected echo image stored in the frame memory provided in 2 and the pattern information stored in the defect pattern memory 15, the type and size of the defect existing in the subject 1 are automatically determined. Or, a discrimination / evaluation processing unit 16 to be evaluated, and a control unit 17 of the discrimination / evaluation processing unit 16
Has been added.

As shown in FIG. 4, the defect pattern memory 15 obtains, as pattern information relating to the shape of various model defects, echo images of various model defects (see FIG. 3) and image processing of the echo images. The approximate expression of the line segment and the ratio of the X-axis length to the Y-axis length of the line segment are stored. Among these pieces of pattern information, the echo images of various model defects are:
Ultrasonic flaw detection can be performed on a model defect whose type (shape) is known, and the approximate expression of the line segment and the ratio of the X-axis length to the Y-axis length of the line segment can be obtained. It can be obtained by performing image processing such as binarization and thinning on the echo image.

That is, as shown in FIG.
When the ultrasonic beam B is scanned in a fan shape at the radiation angle α from the above, the directivity direction of the echo signal generated from the defect and the angle β at which the echo signal is generated have a specific value according to the type of the defect. The echo image generated by the coordinate conversion also has a unique pattern according to the type of defect.

For example, as shown in FIG. 2A, when the defect existing in the subject 1 is a circular defect such as a void or a blow hole, the reflection directivity of the echo signal is in principle zero. Although the echo signal is obtained in a wide angle range in which the ultrasonic beam B is emitted, the level of the echo signal depends on the oblique incidence efficiency between the array probe 2 and the subject 1 and the path length of the beam. differ, in general, the signal level increases in an angular range beta ₁ to the position of the array probe 2 and the defect as shown in FIG. 2 (a) around the longitudinal waves facing, FIGS. 3 (a) As a result, an arc-shaped echo image is obtained. Further, as shown in FIG. 2B, when the defect existing in the subject 1 is a horizontal defect such as a lamination or an unwelded portion of a joining surface in a lap welding portion, the reflection directivity of the echo signal is determined. Is limited to a narrow range β ₂ orthogonal to the inclination of the defect, and a horizontal linear echo image as shown in FIG. 3B is obtained. Further, as shown in FIG. 2C, when the defect existing in the subject 1 is a vertical defect such as a vertical crack or an unwelded portion of a joint surface at a butt weld, the reflection directivity of the echo signal is determined. Is a relatively wide angle range β ₃ , and when the ultrasonic beam B is incident on the defect from one side, an oblique echo image as shown in FIG. 3C is obtained. When the beam B is incident, a cross-shaped echo image as shown in FIG. 3D is obtained.

The echo images shown in FIGS.
After the binarization, image processing such as thinning is performed to obtain the shape of each echo image, the length of a line segment, the position of the center of gravity, and the length of the image passing through the position of the center of gravity in the X-axis direction and the Y-axis direction. Can be obtained from these data, and the approximate expression of the line segment representing the shape of each echo image and the ratio of the X-axis length to the Y-axis length of the line segment can be obtained. Therefore, the echo image itself and the above parameters can be stored in the defect pattern memory 15 as pattern information on various model defects.

On the other hand, the pattern information necessary for evaluating the defect size includes a calculation formula for calculating the defect size from the length of the line segment obtained by performing image processing on the detected echo image, ｛defect size = (line segment) Length + constant) / proportional coefficient
And various constants and proportional coefficients according to the type of model defect are stored in the defect pattern memory 15. These calculation formulas, constants and proportional coefficients are obtained in advance by performing ultrasonic flaw detection on a large number of model defects.

The defect discrimination / evaluation processing unit 16 includes the control unit 1
In response to a command from the controller 7, a required detected echo image stored in the frame memory of the coordinate conversion circuit 12 is fetched and image-processed, and defect pattern information corresponding to the pattern information stored in the defect pattern memory 15 is extracted. The defect pattern information and the defect pattern memory 1
5, a discrimination processing unit 16 for automatically discriminating the type of a defect existing in the object 1 by comparing the pattern information stored in the object 5 with the pattern information.
a and a constant and a proportional coefficient corresponding to the defect type calculation formula and the determined defect type from the defect pattern memory 15 when the type of the defect is determined by the determination processing unit 16a. A defect size evaluation control unit 16b for calculating the size of a defect by substituting the length of a line segment obtained by performing image processing on a required detected echo image fetched from the frame memory and each constant and proportionality coefficient; .

The defect pattern memory 15, the defect determination / evaluation processing section 16 and the control section 17 can be constituted by a personal computer.

The other parts have the same configuration as the conventional ultrasonic inspection apparatus shown in FIG. 6, and therefore, in order to avoid duplication, corresponding parts are denoted by the same reference numerals, and description thereof is omitted.

Hereinafter, the procedure of the defect inspection by the fan-type scanning ultrasonic inspection apparatus configured as described above will be described with reference to FIG. FIG. 5 is a flowchart showing a defect determination / evaluation flow of the ultrasonic inspection apparatus.

First, the presence or absence of a defect in the subject 1 is inspected by the same procedure as the defect inspection in the conventional apparatus. That is, the ultrasonic inspection apparatus is switched to the flaw detection mode (step S- 1), and the ultrasonic beam is scanned in a fan shape from the array probe 2 positioned at a required position with respect to the subject 1. Is detected by the array probe 2 to check for the presence or absence of a defect (step S-2). If no defect is detected, the array probe 2 is moved by a predetermined amount along the surface of the subject 1 in the direction of arrow A by operating the mechanical scanner 3, and the procedures S-1 and S- are repeated. Repeat 2. If no defect is detected over the entire movable range of the mechanical scanner 3, the system ends.

In the flaw detection mode, when one screen of flaw detection image display is completed and a defect is found in the detected echo image,
The ultrasonic inspection apparatus is switched to the defect determination / evaluation mode by performing an interruption process (step S-11). In the defect determination / evaluation mode, the detected echo image and the defect pattern memory 15 are stored in accordance with a control program installed in the control unit 17.
Are loaded into the discrimination / evaluation processing unit 16 (procedure S-12), the echo images are superimposed (procedure S-13), and the superimposed images are displayed on the image display unit. 13 (procedure S-14). Thus, the inspector determines the type of the approximate defect by image processing or visual observation (step S-15).

In order to evaluate not only the type of the defect but also the size of the defect, the inspector operates an input device (not shown) to instruct the control unit 17 to evaluate the defect size (step S-21). ). The control unit 17 displays a determination / evaluation window on the image display unit 13 according to the installed control program (step S-22), and sets a determination range in accordance with the detected echo image for the window frame (step S-22). Procedure S-23). Next, the echo image in the window frame is binarized and its area is calculated (step S-24), and the ratio between the X-axis length and the Y-axis length of the obtained area is calculated (step S-2).
5). Further, the detected echo image is thinned, and an approximate expression representing the shape of the obtained thin line and the length of the line segment are calculated (step S-26). Then, the ratio between the X-axis length and the Y-axis length obtained in step S-25 and the approximate expression obtained in step S-26 are used as the X-axis length in the pattern information stored in the defect pattern memory 15 in advance. The type of the defect is specified by collating with the ratio of the Y-axis length and the approximate expression (step S-27).

Next, the defect size is evaluated using the defect determination result obtained by the above procedure. First,
The calculation formula from the defect pattern memory 15 and the constant and proportional coefficient corresponding to the defect determination result obtained in step S-27 are taken into the determination / evaluation processing unit 16 (step S-31), and obtained in step S-26. The defect size is determined by substituting the length of the line segment and the constant and the proportionality coefficient taken into the discrimination / evaluation processing unit 16 from the defect pattern memory 15 in step S-31 into the above-mentioned formula (step S-32). Finally, the type and size of the defect obtained by the above procedure are displayed on the image display unit 1.
3 (step S-33), and the system is terminated.

When an imaging experiment according to the above embodiment was conducted using a model defect test piece having a circular defect, a horizontal defect and a vertical defect, a special case where the depth of the defect was extremely deep was found. Excluding that, it was confirmed that the type and size of each defect could be determined and evaluated with high accuracy.

It should be noted that in the above embodiment, the discrimination /
Although the type and size of the defect are obtained in the evaluation processing unit 16, it is a matter of course that only the type of the defect is determined by repeating the steps S-1 to S-15. Further, in this embodiment, the procedures S-1 to S-15 are performed.
Shows an example in which the type of defect is determined by superimposing the detected echo image and the echo image of the model defect.However, read the echo images of various model defects on the display screen of the detected echo image and compare them with the detected echo image. It is also clear that only the type of the defect can be determined.

Further, in the above-described embodiment, the case where the coordinate position of the array probe 2 is given using the angle detection encoders 3a, 3b, 3c attached to each joint of the mechanical scanner 3 will be described as an example. However, the gist of the present invention is not limited to this, and can be applied to an ultrasonic inspection apparatus that displays a moving image on the image display unit 13.

[0039]

As described above, according to the first aspect of the present invention, the receiving circuit section of the sector scanning ultrasonic inspection apparatus has a defect pattern memory in which pattern information relating to various model defects is stored; A required detected echo image stored in a frame memory is taken in, pattern information of the detected echo image corresponding to the pattern information on the model defect is extracted by image processing, and the pattern information on the detected echo image and the pattern information on the model defect are extracted. Is provided so as to determine the type of the defect existing in the subject by comparing with the above. Therefore, it is possible to easily and accurately determine the type of the defect, which has been difficult in the past.

According to the second aspect of the present invention, the pattern information relating to various model defects and the calculation formula of the defect size and each model to be substituted into the calculation formula are stored in the receiving circuit section of the sector scanning ultrasonic inspection apparatus. A defect pattern memory in which a constant and a proportional coefficient corresponding to the type of defect are stored, and a required detected echo image stored in a frame memory are fetched, and pattern information of the detected echo image corresponding to the pattern information relating to the model defect is imaged. Extracted by the processing, the pattern information of the detected echo image and the pattern information relating to the model defect are collated to automatically determine the type of the defect present in the subject, and the defect size calculation formula and the determined The size of the determined defect by fetching a constant and a proportional coefficient according to the type of the detected defect from the defect pattern memory. Is provided with the identification and evaluation unit which automatically assessed, it is possible to perform the evaluation of the type of determination and the defect size conventionally difficult a defect easily and accurately.

According to the third aspect of the present invention,
Since an approximate expression of a line segment obtained by performing image processing on echo images of various model defects and a ratio of the X-axis length to the Y-axis length of the line segment are stored as the pattern information in the defect pattern memory, the defect pattern The amount of data to be stored in the memory is small, and the type of a defect included in the subject can be determined at high speed.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of a sector scanning ultrasonic inspection apparatus according to an embodiment.

FIG. 2 is a schematic diagram showing the relationship between the type of defect and the beam directivity of an echo signal.

FIG. 3 is a diagram showing various defect images detected by ultrasonic flaw detection.

FIG. 4 is a table illustrating pattern information stored in a defect pattern memory;

FIG. 5 is a diagram illustrating a defect determination and an ultrasonic inspection apparatus according to the embodiment.
It is a flowchart which shows an evaluation flow.

FIG. 6 is a configuration diagram of a fan-shaped scanning ultrasonic inspection apparatus according to a conventional example.

FIG. 7 is an explanatory diagram showing an example of a conventionally known coordinate conversion means.

[Explanation of symbols]

1 subject 2 array probe 3 mechanical scanners 3a, 3b, 3c encoder 4 Magnetic Stand 5A transmitting circuit section 5B receiver circuit 5P ₁ ~5P _n pulser 6 transmission delay control circuit 7 receiving circuit 7R ₁ ~7R _n receiver 8 Reception delay circuit 9 Reception delay control circuit 10 Adder 11 A / D converter 12 Coordinate signal generation circuit 13 Image display unit 15 Defect pattern memory 16 Defect discrimination / evaluation processing unit 17 Control unit

Continued on the front page (72) Inventor Shoji Yamaguchi 650 Kandamachi, Tsuchiura-shi, Ibaraki Pref.

Claims (3)

[Claims] 1. An array probe comprising a large number of array transducers, a transmission circuit section for scanning an ultrasonic beam from the array probe to a subject in a fan shape, and detecting by the array probe. A receiving circuit unit that generates a detected echo image grayed to a color or shade corresponding to the amplitude level of the echo signal from the echo signal from the subject and stores the detected echo image in a frame memory; A fan pattern scanning type ultrasonic inspection apparatus having an image display unit for displaying the detected echo image generated by the method, wherein the receiving circuit unit has a defect pattern memory in which pattern information on various model defects is stored; and The required detected echo image stored in the frame memory is taken in, and the pattern information of the detected echo image corresponding to the pattern information on the model defect is extracted by image processing. A fan-type scanning ultrasonic inspection apparatus, further comprising: a discriminating processing unit that discriminates a type of a defect existing in the subject by comparing pattern information of an output echo image with pattern information on the model defect. 2. An array probe comprising a large number of array transducers, a transmission circuit for scanning an ultrasonic beam from the array probe to a subject in a fan shape, and detecting by the array probe. A receiving circuit unit that generates a detected echo image grayed to a color or shade corresponding to the amplitude level of the echo signal from the echo signal from the subject and stores the detected echo image in a frame memory; And an image display unit that displays the detected echo image generated by the fan scanning ultrasonic inspection apparatus. A defect pattern memory in which constants and proportional coefficients corresponding to the types of model defects to be substituted into the memory are stored, and a required detected echo image stored in the frame memory is fetched. The pattern information of the detected echo image corresponding to the pattern information on the defect is extracted by image processing, and the pattern information on the detected echo image is compared with the pattern information on the model defect to determine the type of the defect present in the subject. A discrimination / evaluation in which the discrimination is automatically performed, and a defect size calculation formula and a constant and a proportional coefficient corresponding to the type of the determined defect are taken from the defect pattern memory to automatically evaluate the size of the determined defect. A fan-shaped scanning ultrasonic inspection apparatus, comprising a processing unit. 3. The sector scanning ultrasonic inspection apparatus according to claim 1 or 2, the defect pattern memory, as the pattern information, and the echo image of the various models defects, those
A fan-type scanning ultrasonic inspection apparatus, wherein an approximate expression of a line segment obtained by image processing the echo image and a ratio of the X-axis length to the Y-axis length of the line segment are stored.