JPH1083948A - Rotary developing device - Google Patents

Rotary developing device

Info

Publication number
JPH1083948A
JPH1083948A JP23766096A JP23766096A JPH1083948A JP H1083948 A JPH1083948 A JP H1083948A JP 23766096 A JP23766096 A JP 23766096A JP 23766096 A JP23766096 A JP 23766096A JP H1083948 A JPH1083948 A JP H1083948A
Authority
JP
Japan
Prior art keywords
substrate
holding
rotation
outer peripheral
developing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23766096A
Other languages
Japanese (ja)
Other versions
JP3492107B2 (en
Inventor
Masao Tsuji
雅夫 辻
Masafumi Tagaya
雅史 多賀谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP23766096A priority Critical patent/JP3492107B2/en
Publication of JPH1083948A publication Critical patent/JPH1083948A/en
Application granted granted Critical
Publication of JP3492107B2 publication Critical patent/JP3492107B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces

Abstract

PROBLEM TO BE SOLVED: To provide a rotary developing device, which can rotate a substrate in a state that the center of the substrate is made to coincide with the center of rotation of a ratating, stage and can hold cleanly the rear of the substrate. SOLUTION: A plurality of substrate support pins 6 for supporting the rear of a substrate 100 are provided on the annular support part 5 of a rotating stage 2. Moreover, a plurality of substrate holding pins 7 for controlling the horizontal position of the substrate 100 are rotatably mounted to the stage 2 by bearings 8 around the axis in the vertical direction of the stage 8. The plurality of the substrate holding pins 7 are arranged equally at the same distance from the center P of rotation of the stage 2 and are driven by the magnetic forces of a permanent magnet a and an annular magnet and 11. At the time of the delivery of the substrate 100 and after a developing solution is applied on the substrate 100, the outer peripheral surfaces of the pin members of the pins 7 are separated from the outer peripheral end surface of the substrate 100. At the time of the rotation of the substrate 100, the outer peripheral surfaces of the pin members of the pins 7 are made contact with the outer peripheral end surface of the substrate 100 and the substrate 100 is held in the horizontal direction.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、基板に現像処理を
行うための回転式現像装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a rotary developing apparatus for performing a developing process on a substrate.

【0002】[0002]

【従来の技術】半導体ウエハ、液晶表示装置用ガラス基
板、フォトマスク用ガラス基板、光ディスク用ガラス基
板等の基板に現像処理を行うために回転式現像装置が用
いられている。
2. Description of the Related Art A rotary developing apparatus is used for developing a substrate such as a semiconductor wafer, a glass substrate for a liquid crystal display, a glass substrate for a photomask, and a glass substrate for an optical disk.

【0003】この回転式現像装置では、真空配管ライン
に接続された吸引式スピンチャック上に基板を水平に吸
着保持し、現像ノズルを基板の上方に移動させ、基板上
に現像液を吐出する。このとき、基板の表面は現像液を
はじきやすい状態である場合が多いため、スピンチャッ
クに吸着された基板を水平姿勢で低速回転させながら基
板上の感光性膜に現像液を供給する。
In this rotary developing device, a substrate is horizontally held by suction on a suction type spin chuck connected to a vacuum piping line, a developing nozzle is moved above the substrate, and a developing solution is discharged onto the substrate. At this time, since the surface of the substrate is often in a state in which the developing solution is easily repelled, the developing solution is supplied to the photosensitive film on the substrate while the substrate held by the spin chuck is rotated at a low speed in a horizontal posture.

【0004】供給された現像液は、基板の回転によって
基板の全面に均一に塗り広げられ、感光性膜と接触す
る。表面張力により基板上に現像液を保持した状態で一
定時間基板を静止させること(液盛り)により感光性膜
の現像が行われる。
The supplied developer is uniformly spread over the entire surface of the substrate by the rotation of the substrate, and comes into contact with the photosensitive film. The development of the photosensitive film is performed by keeping the substrate stationary for a certain period of time while holding the developing solution on the substrate by the surface tension (liquid level).

【0005】その後、基板を所定の速度で回転させなが
ら基板の表面に純水リンス液を供給するとともに基板の
裏面をバックリンス液で洗浄する。基板の回転により純
水リンス液およびバックリンス液を振り切った後、処理
を終了する。
Thereafter, a pure water rinsing liquid is supplied to the front surface of the substrate while rotating the substrate at a predetermined speed, and the back surface of the substrate is washed with a back rinsing liquid. After the pure water rinse solution and the back rinse solution are shaken off by the rotation of the substrate, the process is terminated.

【0006】このような吸引式スピンチャックを用いた
回転式現像装置では、基板を回転時に確実に吸着保持す
るために強力な吸引を行っているので、基板の裏面に吸
着跡が残る。また、基板の裏面に付着したパーティクル
(粒子)等の異物をバックリンス液で洗浄する際に、ス
ピンチャックによる吸着部分およびその周囲を十分に洗
浄しきれず、基板の裏面がパーティクルで汚染される。
In a rotary developing device using such a suction-type spin chuck, strong suction is performed to surely hold and hold a substrate during rotation, so that a suction mark is left on the back surface of the substrate. Further, when cleaning foreign matter such as particles (particles) adhered to the back surface of the substrate with the back rinse liquid, the suction portion and its surroundings cannot be sufficiently cleaned by the spin chuck, and the back surface of the substrate is contaminated with particles.

【0007】基板の裏面に吸着跡や異物の付着がある
と、基板をキャリア内に多段に配置した場合に、上の基
板の裏面の付着物が下方に落下し、下の基板の表面を汚
染することがある。また、現像処理の後の工程で基板表
面への感光性膜の塗布処理および露光処理を繰り返す場
合、基板裏面に付着物があると、露光処理時にフォーカ
ス異常を引き起こすおそれがある。
[0007] If there are adsorption traces or foreign matter adhered to the back surface of the substrate, when the substrates are arranged in multiple stages in the carrier, the adhered material on the back surface of the upper substrate falls downward and contaminates the surface of the lower substrate. May be. In addition, in a case where the coating process of the photosensitive film on the substrate surface and the exposure process are repeated in a process after the development process, if there is a deposit on the back surface of the substrate, a focus abnormality may be caused during the exposure process.

【0008】そこで、基板の裏面を支持するとともに基
板の外周端面を保持しつつ基板に回転力を伝達するメカ
式スピンチャックが提案されている。メカ式スピンチャ
ックは、水平姿勢で回転駆動される回転ステージ上に、
基板の裏面を垂直に支持する複数の支持ピンと、基板の
外周端面に当接して基板の水平位置を規制しかつ基板に
回転力を伝達する複数の保持ピンとが設けられてなる。
Therefore, there has been proposed a mechanical spin chuck which supports a back surface of a substrate and transmits a rotational force to the substrate while holding an outer peripheral end surface of the substrate. The mechanical spin chuck is mounted on a rotating stage that is driven to rotate in a horizontal position.
A plurality of support pins for vertically supporting the back surface of the substrate, and a plurality of holding pins for contacting an outer peripheral end surface of the substrate to regulate a horizontal position of the substrate and transmit a rotational force to the substrate are provided.

【0009】各保持ピンと基板の外周端面との間には、
基板の搬入および搬出を容易にするために僅かな隙間が
設けられている。スピンチャックが鉛直方向の軸の周り
で回転駆動されると、複数の保持ピンのいくつかが基板
の外周端面に圧接され、基板の中心が回転中心からやや
偏心した状態で基板がスピンチャックとともに回転す
る。
[0009] Between each holding pin and the outer peripheral end face of the substrate,
A slight gap is provided to facilitate loading and unloading of the substrate. When the spin chuck is rotated around a vertical axis, some of the holding pins are pressed against the outer peripheral end surface of the substrate, and the substrate rotates together with the spin chuck with the center of the substrate slightly eccentric from the center of rotation. I do.

【0010】このメカ式スピンチャックでは、基板が複
数の支持ピンにより回転ステージ上の所定の高さに支持
されているので、基板と回転ステージとの間にギャップ
が存在する。したがって、基板の裏面の全体をバックリ
ンス液で洗浄することができ、基板裏面の汚染が生じな
い。
In this mechanical spin chuck, since the substrate is supported at a predetermined height on the rotary stage by a plurality of support pins, a gap exists between the substrate and the rotary stage. Therefore, the entire back surface of the substrate can be cleaned with the back rinse solution, and no contamination of the back surface of the substrate occurs.

【0011】[0011]

【発明が解決しようとする課題】しかしながら、上記の
メカ式スピンチャックでは、基板上に液盛りされた現像
液が基板の外周端面に当接している保持ピンを伝ってこ
ぼれ落ちやすい。これにより、基板上の現像液にむらが
生じ、現像処理が不均一になる。また、こぼれ落ちた現
像液を補うために追加の現像液を供給する必要が生じ、
現像液の消費量が増加することになる。
However, in the above-mentioned mechanical spin chuck, the developing solution laid on the substrate is easily spilled down along the holding pins in contact with the outer peripheral end surface of the substrate. As a result, the developer on the substrate becomes uneven, and the developing process becomes non-uniform. Also, it becomes necessary to supply additional developer to make up for the spilled developer,
The consumption of the developer will increase.

【0012】さらに、基板の中心が回転中心からやや偏
心した状態で基板が回転するので、負荷の不平衡による
振動が発生し、その振動が他の基板処理ユニットに影響
を与える可能性がある。また、複数の保持ピンのうちい
くつかが基板の外周端面に接しているため、基板の取り
出し時に基板の端面と保持ピンとが擦れてパーティクル
が発生しやすい。特に、基板の回転により、基板の端面
が保持ピンに強く喰い込んだ場合には、基板の搬送不良
や基板の破損が発生するおそれがある。
Furthermore, since the substrate is rotated with the center of the substrate slightly eccentric from the center of rotation, vibration due to imbalance of the load may occur, and the vibration may affect other substrate processing units. In addition, since some of the plurality of holding pins are in contact with the outer peripheral end face of the substrate, the end faces of the substrate and the holding pins are rubbed when the substrate is taken out, so that particles are easily generated. In particular, in the case where the end face of the substrate bites into the holding pin due to the rotation of the substrate, there is a possibility that the substrate may be transported poorly or the substrate may be damaged.

【0013】本発明の目的は、基板の中心を回転中心と
一致させた状態で基板を回転させることができ、かつ基
板の裏面を清浄に保つことができる回転式現像装置を提
供することである。
An object of the present invention is to provide a rotary developing device that can rotate a substrate while keeping the center of the substrate coincident with the center of rotation, and can keep the back surface of the substrate clean. .

【0014】本発明の他の目的は、パーティクルを発生
することなく基板を円滑に取り出すことができ、かつ基
板の裏面を清浄に保つことができる回転式現像装置を提
供することである。
Another object of the present invention is to provide a rotary developing device capable of taking out a substrate smoothly without generating particles and keeping the back surface of the substrate clean.

【0015】[0015]

【課題を解決するための手段および発明の効果】第1の
発明に係る回転式現像装置は、基板を水平姿勢で保持す
る基板保持手段と、基板保持手段を鉛直方向の軸の周り
で回転駆動する回転駆動手段と、基板保持手段に保持さ
れた基板上に現像液を供給する現像液供給手段とを備え
る。基板保持手段は、回転駆動手段により水平姿勢で回
転駆動される回転部材と、回転部材の回転中心から等距
離の位置に分散配置され、基板の外周端面に当接して基
板を水平方向に保持する基板保持位置と基板の外周端面
から離間する基板開放位置との間で移動可能な複数の保
持部材と、回転駆動手段による回転部材の回転駆動時に
複数の保持部材を基板保持位置に駆動し、現像液供給手
段による基板上への現像液の供給後で回転部材の停止時
に複数の保持部材を基板開放位置に駆動する駆動手段と
を含む。
According to the first aspect of the present invention, there is provided a rotary developing device for holding a substrate in a horizontal posture, and for rotating the substrate holding means about a vertical axis. And a developer supply means for supplying a developer onto the substrate held by the substrate holding means. The substrate holding means is distributed and arranged at a position equidistant from the rotation center of the rotation member and a rotating member which is rotated and driven in a horizontal posture by the rotation driving means, and abuts on the outer peripheral end surface of the substrate to hold the substrate in the horizontal direction. A plurality of holding members movable between a substrate holding position and a substrate open position separated from an outer peripheral end surface of the substrate; and a plurality of holding members driven to the substrate holding position when the rotation member is rotationally driven by the rotation driving means, and developed. Driving means for driving the plurality of holding members to the substrate open position when the rotation member is stopped after the supply of the developing solution onto the substrate by the liquid supply means.

【0016】第1の発明に係る回転式現像装置において
は、回転駆動手段により基板保持手段の回転部材が鉛直
方向の軸の周りで回転駆動され、基板保持手段に保持さ
れた基板上に現像液供給手段により現像液が供給され
る。回転駆動手段による回転部材の回転駆動時には駆動
手段により複数の保持部材が基板保持位置に駆動され
る。それにより、複数の保持部材が基板の外周端面に当
接して基板を水平方向に保持する。この場合、複数の保
持部材が回転部材の回転中心から等距離の位置に配置さ
れているので、基板の中心が回転中心に正確に一致す
る。それにより、基板の中心が回転中心から偏心するこ
とによる振動の発生が防止される。
In the rotary developing device according to the first aspect of the present invention, the rotary member of the substrate holding means is driven to rotate about the axis in the vertical direction by the rotary driving means, and the developing solution is placed on the substrate held by the substrate holding means. The developer is supplied by the supply unit. The plurality of holding members are driven to the substrate holding position by the driving means when the rotation member is rotationally driven by the rotation driving means. Thereby, the plurality of holding members contact the outer peripheral end surface of the substrate to hold the substrate in the horizontal direction. In this case, since the plurality of holding members are arranged at positions equidistant from the rotation center of the rotating member, the center of the substrate exactly matches the rotation center. This prevents generation of vibration due to the eccentricity of the center of the substrate from the center of rotation.

【0017】現像液供給手段により基板上へ現像液が供
給された後に回転部材が停止すると、駆動手段により複
数の保持部材が基板開放位置に駆動される。それによ
り、複数の保持部材が基板の外周端面から離間する。こ
の状態で一定時間基板を静止させることにより現像処理
が行われる。このとき、複数の保持部材が基板の外周端
面から離間しているので、基板上に供給された現像液が
複数の保持部材を伝ってこぼれ落ちることがない。した
がって、基板上に現像液が均一に保持され、均一な現像
処理が可能となる。また、現像液の消費量が低減され
る。
When the rotating member stops after the developing solution is supplied onto the substrate by the developing solution supply means, the plurality of holding members are driven to the substrate open position by the driving means. Thereby, the plurality of holding members are separated from the outer peripheral end surface of the substrate. In this state, the developing process is performed by keeping the substrate stationary for a certain period of time. At this time, since the plurality of holding members are separated from the outer peripheral end surface of the substrate, the developer supplied onto the substrate does not spill down along the plurality of holding members. Therefore, the developer is uniformly held on the substrate, and uniform development can be performed. Further, the consumption of the developer is reduced.

【0018】第2の発明に係る回転式現像装置は、第1
の発明に係る回転式現像装置の構成において、駆動手段
が、基板保持手段への基板の搬入時および搬出時に複数
の保持部材を基板開放位置に駆動するものである。
A rotary developing device according to a second aspect of the present invention comprises:
In the configuration of the rotary developing device according to the present invention, the driving means drives the plurality of holding members to the substrate open position when loading and unloading the substrate into and from the substrate holding means.

【0019】この場合、基板の搬入時および搬出時に複
数の保持部材が基板の外周端面から離間するので、基板
の外周端面が複数の保持部材に擦れてパーティクルが発
生することが防止される。また、基板の外周端面が複数
の保持部材に喰い込むこともないので、基板の搬送不良
や基板の破損が防止される。
In this case, since the plurality of holding members are separated from the outer peripheral end surface of the substrate when the substrate is loaded and unloaded, it is possible to prevent the outer peripheral end surface of the substrate from rubbing against the plurality of holding members to generate particles. In addition, since the outer peripheral end surface of the substrate does not bite into the plurality of holding members, defective transport of the substrate and breakage of the substrate are prevented.

【0020】第3の発明に係る回転式現像装置は、第1
または第2の発明に係る回転式現像装置の構成におい
て、駆動手段が、複数の保持部材を磁力により駆動する
ものである。この場合、部材間の摩擦によるパーティク
ルが発生しない。
According to a third aspect of the present invention, there is provided a rotary developing device comprising:
Alternatively, in the configuration of the rotary developing device according to the second invention, the driving means drives the plurality of holding members by magnetic force. In this case, particles are not generated due to friction between members.

【0021】第4の発明に係る回転式現像装置は、第
1、第2または第3の発明に係る回転式現像装置の構成
において、複数の保持部材の各々が、鉛直方向の回転軸
の周りで回動可能に回転部材に取り付けられた支持部
と、支持部の回動に伴って基板の外周端面に当接するよ
うに支持部の回転軸に対して偏心して設けられた保持部
とを含むものである。
A rotary developing device according to a fourth aspect of the present invention is the rotary developing device according to the first, second, or third aspect, wherein each of the plurality of holding members is arranged around a vertical rotation axis. A supporting portion rotatably attached to the rotating member, and a holding portion provided eccentrically with respect to a rotation axis of the supporting portion so as to abut on an outer peripheral end surface of the substrate as the supporting portion rotates. It is a thing.

【0022】この場合、支持部を回動させることにより
保持部を基板保持位置と基板開放位置との間で容易に移
動させることができる。第5の発明に係る回転式現像装
置は、第1〜第4のいずれかの発明に係る回転式現像装
置の構成において、基板保持手段が回転部材上に配設さ
れて基板の裏面を支持する複数の支持部材をさらに含
み、基板保持手段の回転部材のほぼ中心部に配置された
吐出口を有しかつ基板の裏面に洗浄液を吐出する洗浄液
吐出手段をさらに備えたものである。
In this case, the holding portion can be easily moved between the substrate holding position and the substrate releasing position by rotating the support portion. A rotary developing device according to a fifth aspect of the present invention is the rotary developing device according to any one of the first to fourth aspects, wherein the substrate holding means is disposed on the rotating member to support the back surface of the substrate. The cleaning apparatus further includes a plurality of support members, further includes a cleaning liquid discharge unit that has a discharge port disposed substantially at the center of the rotating member of the substrate holding unit and discharges the cleaning liquid to the back surface of the substrate.

【0023】この場合、基板が複数の支持部材により回
転部材上の所定の高さに支持されるので、基板と回転部
材との間にギャップが存在する。したがって、洗浄液吐
出手段の吐出口から吐出される洗浄液により基板の裏面
の全体を十分に洗浄することができる。
In this case, since the substrate is supported at a predetermined height on the rotating member by the plurality of supporting members, there is a gap between the substrate and the rotating member. Therefore, the entire back surface of the substrate can be sufficiently cleaned by the cleaning liquid discharged from the discharge port of the cleaning liquid discharging means.

【0024】[0024]

【発明の実施の形態】図1は本発明の一実施例における
回転式現像装置の断面図である。また、図2は図1の回
転式現像装置の主要部の平面図である。
FIG. 1 is a sectional view of a rotary developing device according to an embodiment of the present invention. FIG. 2 is a plan view of a main part of the rotary developing device of FIG.

【0025】図1において、回転保持部1は円形板状の
回転ステージ2を備える。回転ステージ2は、モータ3
のシャフト4の先端部に水平に固定され、鉛直方向の軸
の周りで回転駆動される。
In FIG. 1, the rotation holding unit 1 includes a circular plate-shaped rotation stage 2. The rotating stage 2 includes a motor 3
Is horizontally fixed to the tip of the shaft 4 and is driven to rotate around a vertical axis.

【0026】回転ステージ2の上面には環状支持部5が
固定され、この環状支持部5に基板100の裏面を支持
する複数の基板支持ピン6が設けられている。また、回
転ステージ2には、基板100の水平位置を規制する複
数の基板保持ピン7が軸受け8により鉛直方向の軸の周
りで回動可能に取り付けられている。図2に示すよう
に、複数の基板保持ピン7は、図1の回転保持部1の回
転中心Pから等距離に等分配置されている。各基板保持
ピン7の下部には後述する棒状の永久磁石9が取り付け
られている。回転ステージ2の周縁部には環状壁部10
が設けられている。
An annular support 5 is fixed to the upper surface of the rotary stage 2, and a plurality of substrate support pins 6 for supporting the back surface of the substrate 100 are provided on the annular support 5. A plurality of substrate holding pins 7 for regulating the horizontal position of the substrate 100 are attached to the rotary stage 2 by bearings 8 so as to be rotatable about a vertical axis. As shown in FIG. 2, the plurality of substrate holding pins 7 are equally spaced from the rotation center P of the rotation holding unit 1 in FIG. A rod-shaped permanent magnet 9 described below is attached to a lower portion of each substrate holding pin 7. An annular wall 10 is provided around the periphery of the rotary stage 2.
Is provided.

【0027】回転ステージ2の下方には環状磁石11が
配設されている。この環状磁石11は、駆動装置(図示
せず)により上下動自在に設けられた磁石支持部材12
に固定されている。
An annular magnet 11 is provided below the rotary stage 2. The annular magnet 11 is provided with a magnet support member 12 provided to be vertically movable by a driving device (not shown).
It is fixed to.

【0028】また、回転ステージ2には複数の貫通孔1
3が形成されている。これらの貫通孔13の下方には昇
降ピン14がエアシリンダ(図示せず)により昇降自在
に配設されている。これらの昇降ピン14は、基板搬送
装置(図示せず)との基板100の受渡し時に、回転ス
テージ2の貫通孔13を貫通して上昇し、基板100の
裏面に当接して基板100を上方に押し上げる。
The rotary stage 2 has a plurality of through holes 1.
3 are formed. An elevating pin 14 is disposed below these through holes 13 so as to be able to move up and down by an air cylinder (not shown). When the substrate 100 is transferred to and from a substrate transfer device (not shown), the lifting pins 14 rise through the through-holes 13 of the rotary stage 2 and contact the back surface of the substrate 100 to move the substrate 100 upward. Push up.

【0029】モータ3のシャフト4は中空体により構成
され、その内部に裏面洗浄用のバックリンスノズル15
が挿入されている。このバックリンスノズル15は、回
転ステージ2を貫通して基板100の裏面側に突出して
いる。回転保持部1の周囲には、カップ16が上下動自
在に配設されている。
The shaft 4 of the motor 3 is formed of a hollow body, and has a back rinse nozzle 15 for back surface cleaning inside.
Is inserted. The back rinse nozzle 15 penetrates the rotary stage 2 and protrudes to the back surface side of the substrate 100. A cup 16 is arranged around the rotation holding unit 1 so as to be vertically movable.

【0030】また、回転保持部1の上方には、現像液を
吐出する現像ノズル17が上下方向および水平方向に移
動可能に設けられている。この現像ノズル17は、現像
処理前および現像処理後に基板100の上方から外れた
位置に待機し、現像処理時に基板100の中心部の上方
に移動する。
A developing nozzle 17 for discharging a developing solution is provided above the rotation holding unit 1 so as to be movable in the vertical and horizontal directions. The developing nozzle 17 stands by at a position deviated from above the substrate 100 before and after the developing process, and moves above the central portion of the substrate 100 during the developing process.

【0031】モータ3の回転および停止、磁石支持部材
12の上昇および下降、現像ノズル17からの現像液の
吐出、バックリンスノズル15からのバックリンス液の
吐出等の一連の動作は制御部18により制御される。
A series of operations such as rotation and stop of the motor 3, raising and lowering of the magnet support member 12, discharging of the developing solution from the developing nozzle 17, and discharging of the back rinsing solution from the back rinsing nozzle 15 are performed by the control unit 18. Controlled.

【0032】本実施例では、回転保持部1が基板保持手
段に相当し、モータ3が回転駆動手段に相当し、現像ノ
ズル17が現像液供給手段に相当する。また、回転ステ
ージ2が回転部材に相当し、基板保持ピン7が保持部材
に相当する。さらに、永久磁石9、環状磁石11および
制御部18が駆動手段を構成する。また、基板支持ピン
6が支持部材に相当し、バックリンスノズル15が洗浄
液吐出手段に相当する。
In this embodiment, the rotation holding section 1 corresponds to the substrate holding means, the motor 3 corresponds to the rotation driving means, and the developing nozzle 17 corresponds to the developing solution supply means. The rotary stage 2 corresponds to a rotating member, and the substrate holding pins 7 correspond to a holding member. Further, the permanent magnet 9, the annular magnet 11, and the control unit 18 constitute a driving unit. Further, the substrate support pins 6 correspond to a support member, and the back rinse nozzle 15 corresponds to a cleaning liquid discharging unit.

【0033】図3は基板保持ピン7の斜視図である。図
3に示すように、基板保持ピン7は、円柱状の支持部2
1、円柱状(棒状)のピン部材22、連結シャフト部2
3および磁石収納部24からなる。ピン部材22は、支
持部21の上面に支持部21の中心に対して偏心して設
けられている。磁石収納部24は、支持部21の下部に
連結シャフト部23を介して固定されている。磁石収納
部24内には棒状の永久磁石9が収納されている。
FIG. 3 is a perspective view of the board holding pin 7. As shown in FIG. 3, the substrate holding pin 7 is
1. cylindrical (rod-shaped) pin member 22, connecting shaft 2
3 and the magnet storage section 24. The pin member 22 is provided eccentrically with respect to the center of the support 21 on the upper surface of the support 21. The magnet housing part 24 is fixed to a lower part of the support part 21 via a connecting shaft part 23. The rod-shaped permanent magnet 9 is housed in the magnet housing 24.

【0034】図4および図5は基板保持ピン7の動作を
説明するための図であり、(a)は基板保持ピン7およ
びその周辺部の部分断面図、(b)は基板保持ピン7の
平面図である。
FIGS. 4 and 5 are views for explaining the operation of the substrate holding pins 7, wherein FIG. 4A is a partial cross-sectional view of the substrate holding pins 7 and the periphery thereof, and FIG. It is a top view.

【0035】基板100の受渡し時および現像液の液盛
り後には、図4(a)に示すように、環状磁石11が回
転ステージ2の下方に離れて位置する。このとき、環状
磁石11が形成する磁力線Bは、永久磁石9が設置され
る高さにおいて、回転ステージ2の外側から中心部に向
かう方向に向いている。したがって、永久磁石9のN極
が回転ステージ2の中心部に向かう方向に吸引される。
それにより、図4(b)に示すように、基板保持ピン7
が矢印Xの方向に回動し、ピン部材22の外周面が基板
100の外周端面から離れる。
At the time of delivery of the substrate 100 and after the filling of the developing solution, as shown in FIG. 4A, the annular magnet 11 is positioned below the rotary stage 2 at a distance. At this time, the line of magnetic force B formed by the annular magnet 11 is directed from the outside of the rotary stage 2 toward the center at the height where the permanent magnet 9 is installed. Therefore, the N pole of the permanent magnet 9 is attracted in a direction toward the center of the rotary stage 2.
As a result, as shown in FIG.
Is rotated in the direction of arrow X, and the outer peripheral surface of the pin member 22 is separated from the outer peripheral end surface of the substrate 100.

【0036】基板100の回転時には、図5(a)に示
すように、環状磁石11が上昇して回転ステージ2に接
近する。したがって、永久磁石9のS極が環状磁石11
のN極に吸引される。それにより、図5(b)に示すよ
うに、基板保持ピン7が矢印Yの方向に回動し、ピン部
材22の外周面が基板100の外周端面に当接し、基板
100が水平方向に保持される。
When the substrate 100 rotates, the annular magnet 11 rises and approaches the rotary stage 2 as shown in FIG. Therefore, the S pole of the permanent magnet 9 is
Is attracted to the N pole. Thereby, as shown in FIG. 5B, the substrate holding pin 7 rotates in the direction of arrow Y, the outer peripheral surface of the pin member 22 contacts the outer peripheral end surface of the substrate 100, and the substrate 100 is held in the horizontal direction. Is done.

【0037】次に、図6のフローチャートを参照しなが
ら図1の回転式現像装置における現像処理時の動作を説
明する。まず、図5に示すように、環状磁石11が上昇
して複数の基板保持ピン7により基板100が水平方向
に保持される(ステップS1)。このとき、複数の基板
保持ピン7が回転ステージ2の回転中心から等距離に配
置されているので、基板100の中心が回転ステージ2
の回転中心(基板100の回転中心)と正確に一致す
る。
Next, the operation of the rotary developing device of FIG. 1 during the developing process will be described with reference to the flowchart of FIG. First, as shown in FIG. 5, the annular magnet 11 is raised and the substrate 100 is horizontally held by the plurality of substrate holding pins 7 (Step S1). At this time, since the plurality of substrate holding pins 7 are arranged at the same distance from the rotation center of the rotary stage 2, the center of the substrate 100 is
(The rotation center of the substrate 100).

【0038】その後、モータ3により回転保持部1が回
転駆動され、基板100が鉛直方向の軸の周りで低速回
転する(ステップS2)。この状態で、現像ノズル17
から基板100上に現像液が吐出される(ステップS
3)。基板100の回転により現像液は基板100の表
面の全体に均一に塗り広げられる。
Thereafter, the rotation holding unit 1 is driven to rotate by the motor 3, and the substrate 100 rotates at a low speed around the vertical axis (step S2). In this state, the developing nozzle 17
Is discharged onto the substrate 100 from the substrate (step S
3). By the rotation of the substrate 100, the developer is uniformly spread over the entire surface of the substrate 100.

【0039】その後、回転保持部1の回転が停止される
(ステップS4)。基板100の回転が停止すると、図
4に示すように、環状磁石11が下降して基板保持ピン
7が開放状態となる(ステップS5)。この場合、基板
保持ピン7のピン部材22が基板100の外周端面から
離間するため、基板100上に液盛りされた現像液がピ
ン部材22を伝ってこぼれ落ちることがない。この状態
で、現像液が一定時間静止される(ステップS6)。こ
れにより、基板100上の感光性膜の現像が進行する。
Thereafter, the rotation of the rotation holding unit 1 is stopped (step S4). When the rotation of the substrate 100 is stopped, as shown in FIG. 4, the annular magnet 11 descends, and the substrate holding pins 7 are opened (Step S5). In this case, the pin member 22 of the substrate holding pin 7 is separated from the outer peripheral end surface of the substrate 100, so that the developing solution laid on the substrate 100 does not fall down along the pin member 22. In this state, the developer is stopped for a certain time (step S6). Thus, development of the photosensitive film on the substrate 100 proceeds.

【0040】次に、図5に示すように、環状磁石11が
上昇して基板保持ピン7により基板100が水平方向に
保持される(ステップS7)。そして、モータ3により
回転保持部1が回転駆動され、基板100が所定の速度
で回転する(ステップS8)。純水供給ノズル(図示せ
ず)から基板100上に純水リンス液が供給されて基板
100の表面に純水リンスが行われるとともにバックリ
ンスノズル15からバックリンス液が吐出されて基板1
00の裏面が洗浄される(ステップS9)。
Next, as shown in FIG. 5, the ring magnet 11 is raised, and the substrate 100 is held in the horizontal direction by the substrate holding pins 7 (step S7). Then, the rotation holding unit 1 is driven to rotate by the motor 3, and the substrate 100 rotates at a predetermined speed (step S8). A pure water rinsing liquid is supplied onto the substrate 100 from a pure water supply nozzle (not shown), and the surface of the substrate 100 is rinsed with pure water.
00 is cleaned (step S9).

【0041】基板100の回転により純水リンス液およ
びバックリンス液が振り切られた後、基板100の回転
が停止する(ステップS10)。現像処理の終了後、図
4に示すように、環状磁石11が下降して基板保持ピン
7が開放状態となる(ステップS11)。昇降ピン14
が回転ステージ2の貫通孔13を貫通して上昇し、基板
100の裏面に当接し、さらに基板100を上方に押し
上げる。その状態で、基板搬送装置(図示せず)に対し
て基板100の受渡しが行われる。
After the pure water rinse solution and the back rinse solution are shaken off by the rotation of the substrate 100, the rotation of the substrate 100 is stopped (step S10). After the end of the developing process, as shown in FIG. 4, the annular magnet 11 descends, and the substrate holding pins 7 are opened (step S11). Lifting pin 14
Rises through the through hole 13 of the rotary stage 2, contacts the back surface of the substrate 100, and further pushes the substrate 100 upward. In this state, the transfer of the substrate 100 to a substrate transfer device (not shown) is performed.

【0042】上記のように、本実施例の回転式現像処理
装置においては、基板100の裏面および外周端面が点
接触状態または線接触状態で保持されているので、基板
100の裏面の全体を洗浄することが可能となる。その
結果、基板100の裏面のパーティクルが格段に減少す
る。
As described above, in the rotary developing apparatus of this embodiment, since the back surface and the outer peripheral end surface of the substrate 100 are held in a point contact state or a line contact state, the entire back surface of the substrate 100 is cleaned. It is possible to do. As a result, particles on the back surface of the substrate 100 are significantly reduced.

【0043】また、現像液の液盛り時に基板保持ピン7
のピン部材22が基板100の外周端面から離間するの
で、ピン部材22を伝って現像液がこぼれ落ちることが
ない。その結果、基板100の表面に現像液が均一に保
持され、均一な現像処理が行われるとともに、現像液の
消費量が低減される。
When the developing solution is filled, the substrate holding pins 7
Since the pin member 22 is separated from the outer peripheral end surface of the substrate 100, the developer does not spill down along the pin member 22. As a result, the developer is uniformly held on the surface of the substrate 100, a uniform development process is performed, and the consumption of the developer is reduced.

【0044】さらに、基板100の回転時に基板100
の中心と回転中心とが正確に一致するので、負荷の不平
衡による振動が発生しない。したがって、安定した回転
処理が行われる。
Further, when the substrate 100 rotates,
And the center of rotation exactly coincide with each other, so that vibration due to imbalance of the load does not occur. Therefore, stable rotation processing is performed.

【0045】また、基板100の搬入および搬出時に基
板保持ピン7のピン部材22が基板100の外周端面か
ら離間するので、基板100の外周端面が基板保持ピン
7のピン部材22と擦れてパーティクルが発生すること
が防止されるとともに、基板100が基板保持ピン7の
ピン部材22に喰い込むことによる基板100の搬送不
良や基板100の破損が防止される。
When the substrate 100 is carried in and carried out, the pin member 22 of the substrate holding pin 7 is separated from the outer peripheral end surface of the substrate 100. Therefore, the outer peripheral end surface of the substrate 100 rubs against the pin member 22 of the substrate holding pin 7 to generate particles. In addition to preventing the occurrence of the occurrence, the substrate 100 is prevented from being erroneously transported and the substrate 100 from being damaged by the pin members 22 of the substrate holding pins 7.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例における回転式現像装置の断
面図である。
FIG. 1 is a sectional view of a rotary developing device according to an embodiment of the present invention.

【図2】図1の回転式現像装置の主要部の平面図であ
る。
FIG. 2 is a plan view of a main part of the rotary developing device of FIG.

【図3】図1の回転式現像装置における基板保持ピンの
斜視図である。
FIG. 3 is a perspective view of a substrate holding pin in the rotary developing device of FIG.

【図4】基板保持ピンのピン部材が基板の外周端面から
離れた状態を示す部分断面図および平面図である。
4A and 4B are a partial sectional view and a plan view showing a state where a pin member of a substrate holding pin is separated from an outer peripheral end surface of the substrate.

【図5】基板保持ピンのピン部材が基板の外周端面に当
接した状態を示す部分断面図および平面図である。
5A and 5B are a partial cross-sectional view and a plan view showing a state where a pin member of a substrate holding pin is in contact with an outer peripheral end surface of the substrate.

【図6】図1の回転式現像装置における現像処理時の動
作を示すフローチャートである。
FIG. 6 is a flowchart showing an operation during a developing process in the rotary developing device of FIG. 1;

【符号の説明】[Explanation of symbols]

1 回転保持部 2 回転ステージ 3 モータ 4 シャフト 6 基板支持ピン 7 基板保持ピン 9 永久磁石 11 環状磁石 15 バックリンスノズル 17 現像ノズル 21 支持部 22 ピン部材 DESCRIPTION OF SYMBOLS 1 Rotation holding part 2 Rotation stage 3 Motor 4 Shaft 6 Substrate support pin 7 Substrate holding pin 9 Permanent magnet 11 Ring magnet 15 Back rinse nozzle 17 Developing nozzle 21 Support part 22 Pin member

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 基板を水平姿勢で保持する基板保持手段
と、 前記基板保持手段を鉛直方向の軸の周りで回転駆動する
回転駆動手段と、 前記基板保持手段に保持された基板上に現像液を供給す
る現像液供給手段とを備え、 前記基板保持手段は、 前記回転駆動手段により水平姿勢で回転駆動される回転
部材と、 前記回転部材の回転中心から等距離の位置に分散配置さ
れ、前記基板の外周端面に当接して前記基板を水平方向
に保持する基板保持位置と前記基板の外周端面から離間
する基板開放位置との間で移動可能な複数の保持部材
と、 前記回転駆動手段による前記回転部材の回転駆動時に前
記複数の保持部材を前記基板保持位置に駆動し、前記現
像液供給手段による前記基板上への現像液の供給後で前
記回転部材の停止時に前記複数の保持部材を前記基板開
放位置に駆動する駆動手段とを含むことを特徴とする回
転式現像装置。
1. A substrate holding means for holding a substrate in a horizontal posture; a rotation driving means for driving the substrate holding means to rotate around a vertical axis; and a developer on a substrate held by the substrate holding means. And a developing solution supply unit that supplies the developer, wherein the substrate holding unit is a rotation member that is driven to rotate in a horizontal posture by the rotation drive unit, and is distributed and arranged at a position equidistant from a rotation center of the rotation member. A plurality of holding members movable between a substrate holding position for holding the substrate in the horizontal direction by contacting the outer peripheral end surface of the substrate and a substrate opening position separated from the outer peripheral end surface of the substrate; and The plurality of holding members are driven to the substrate holding position when the rotation member is rotationally driven, and the plurality of holding members are stopped when the rotation member is stopped after supply of the developing solution onto the substrate by the developing solution supply unit. And a driving unit for driving the substrate to the substrate open position.
【請求項2】 前記駆動手段は、前記基板保持手段への
基板の搬入時および搬出時に前記複数の保持部材を前記
基板開放位置に駆動することを特徴とする請求項1記載
の回転式現像装置。
2. The rotary developing device according to claim 1, wherein said driving means drives said plurality of holding members to said substrate open position when loading and unloading a substrate to and from said substrate holding means. .
【請求項3】 前記駆動手段は、前記複数の保持部材を
磁力により駆動することを特徴とする請求項1または2
記載の回転式現像装置。
3. The driving device according to claim 1, wherein the driving unit drives the plurality of holding members by magnetic force.
The rotary developing device as described in the above.
【請求項4】 前記複数の保持部材の各々は、 鉛直方向の回転軸の周りで回動可能に前記回転部材に取
り付けられた支持部と、 前記支持部の回動に伴って前記基板の外周端面に当接す
るように前記支持部の前記回転軸に対して偏心して設け
られた保持部とを含むことを特徴とする請求項1〜3の
いずれかに記載の回転式現像装置。
4. Each of the plurality of holding members includes: a support portion attached to the rotation member so as to be rotatable around a vertical rotation axis; and an outer periphery of the substrate with the rotation of the support portion. The rotary developing device according to any one of claims 1 to 3, further comprising: a holding portion provided eccentrically with respect to the rotation axis of the support portion so as to contact an end surface.
【請求項5】 前記基板保持手段は前記回転部材上に配
設されて前記基板の裏面を支持する複数の支持部材をさ
らに含み、 前記基板保持手段の前記回転部材のほぼ中心部に配置さ
れた吐出口を有しかつ前記基板の裏面に洗浄液を吐出す
る洗浄液吐出手段をさらに備えたことを特徴とする請求
項1〜4のいずれかに記載の回転式現像装置。
5. The substrate holding means further includes a plurality of support members disposed on the rotating member to support a back surface of the substrate, and the substrate holding means is disposed substantially at the center of the rotating member of the substrate holding means. The rotary developing device according to any one of claims 1 to 4, further comprising a cleaning liquid discharging unit having a discharge port and discharging a cleaning liquid onto the back surface of the substrate.
JP23766096A 1996-09-09 1996-09-09 Rotary developing device Expired - Fee Related JP3492107B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23766096A JP3492107B2 (en) 1996-09-09 1996-09-09 Rotary developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23766096A JP3492107B2 (en) 1996-09-09 1996-09-09 Rotary developing device

Publications (2)

Publication Number Publication Date
JPH1083948A true JPH1083948A (en) 1998-03-31
JP3492107B2 JP3492107B2 (en) 2004-02-03

Family

ID=17018626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23766096A Expired - Fee Related JP3492107B2 (en) 1996-09-09 1996-09-09 Rotary developing device

Country Status (1)

Country Link
JP (1) JP3492107B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6964724B2 (en) * 1999-03-15 2005-11-15 Nec Corporation Etching and cleaning methods and etching and cleaning apparatuses used therefor
KR100816742B1 (en) * 2006-09-11 2008-03-25 세메스 주식회사 Apparatus for treating substrates
KR100872889B1 (en) 2007-04-18 2008-12-10 세메스 주식회사 Wafer Spin Chuck
US8166985B2 (en) 2007-11-13 2012-05-01 Sokudo Co., Ltd. Substrate cleaning and processing apparatus with magnetically controlled spin chuck holding pins
CN106449500A (en) * 2016-09-27 2017-02-22 天津华海清科机电科技有限公司 Positioning assembly

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6964724B2 (en) * 1999-03-15 2005-11-15 Nec Corporation Etching and cleaning methods and etching and cleaning apparatuses used therefor
US8420549B2 (en) 1999-03-15 2013-04-16 Renesas Electronics Corporation Etching and cleaning methods and etching and cleaning apparatuses used therefor
KR100816742B1 (en) * 2006-09-11 2008-03-25 세메스 주식회사 Apparatus for treating substrates
KR100872889B1 (en) 2007-04-18 2008-12-10 세메스 주식회사 Wafer Spin Chuck
US8166985B2 (en) 2007-11-13 2012-05-01 Sokudo Co., Ltd. Substrate cleaning and processing apparatus with magnetically controlled spin chuck holding pins
CN106449500A (en) * 2016-09-27 2017-02-22 天津华海清科机电科技有限公司 Positioning assembly
WO2018059166A1 (en) * 2016-09-27 2018-04-05 清华大学 Positioning assembly

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