JPH1040277A - Cad device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve the pattern wiring efficiency in a layout design mode by exchanging the component elements between the mounting parts of different library names if the component elements have identifiers when it's decided via the layout evaluation that the exchange of those component elements is needed between both mounting parts. SOLUTION: If it's decided via the layout evaluation that the exchange of component elements is needed between the mounting parts of different library names 21, a change means 3 reads the data on the mounting parts to be exchanged out of a storage means 2 and confirms whether the component elements of each mounting parts have identifiers 24. If the data on every component element include an identifier 24, these component elements are exchanged with each other. The identifiers 24 are given to the component elements which have the same function names and can be exchanged with each other between the mounting parts of different names 21. Therefore, the component elements having the same function names are exchanged with each other between both mounting parts of different names 21.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a C for reading data of a mounted component from a database and designing a layout (mounting) of a mounted board based on the read information.
It relates to an AD (Computer Aided Design) device.

[0002]

2. Description of the Related Art As a conventional CAD apparatus, for example, a CAD apparatus for designing a printed circuit board for performing circuit design and layout design of a printed circuit board is known. This CAD apparatus has a database (storage means) composed of a hard disk device or the like, and designs a printed circuit board based on data on mounted components stored in the storage means.

In a normal semiconductor device manufacturing process, after mounting components on a printed circuit board,
A product test is performed on the printed circuit board to determine whether there is an electrical defect or the like. One of the product tests is a boundary scan test. In order to perform the boundary scan test, it is necessary that the mounted components mounted on the printed circuit board have components necessary for performing the boundary scan test. In designing a printed circuit board on which such a mounting component (hereinafter, referred to as a boundary scan test-compatible component) is mounted by using the CAD apparatus, the design must be performed in accordance with the IEEE1149.1 standard. .

For example, a component corresponding to the boundary scan test has an input terminal (TDI terminal) and an output terminal (TDO terminal) for test data. Then, in a circuit design of a printed circuit board on which a plurality of components corresponding to the boundary scan test are mounted, as shown in FIG.
The terminal and the external terminal 51 of the printed circuit board must be connected in series (hereinafter, such a serial connection is referred to as a boundary scan chain). In the circuit connection of the boundary scan chain, the connection order of each component corresponding to the boundary scan is arbitrary. For example, when there are three components corresponding to the boundary scan test, A, B, and C, there are six combinations of connection orders including the connection order shown in FIG. 6, but any connection order may be selected.

[0005] As described above, in the circuit design, the circuit connection of the boundary scan chain is performed by selecting one of several combinations in the connection order. Also,
In a layout design of a printed circuit board using a CAD device performed after circuit design, pattern wiring in a boundary scan chain portion is performed as specified in the circuit design.

[0006]

However, the conventional CA
The D device has a disadvantage that the circuit connection of the boundary scan chain cannot be changed during layout design. This is because if a circuit connection other than that specified in the circuit design is made in the layout design, it will be violated when the layout design is verified later. Exceptionally, when the configuration of data stored in the storage unit of the CAD apparatus meets the following conditions, circuit connection may be changed in layout design. However, the data configuration of the conventional component for the boundary scan test does not satisfy this condition.

That is, the conditions under which the circuit connection can be changed in the layout design are such that in a CAD apparatus for performing circuit design and layout design, the data structure of mounted components stored in the storage means has a pin exchange rule and a slot exchange rule.
In addition, the exchangeable identification is defined. Here, the components of the data of the mounted component include a name “library name” indicating a type of the mounted component, a “function name” indicating a function, and the like. For example, in the component SO4 in which four 2NAND gates are mounted as shown in FIG. 7, SO4 is a library name and 2NAND is a function name. In addition, among the data of the mounted components, 2NAN including information of the pin number is included.
The D gate itself is called a "slot".

The above-mentioned pin replacement rule is, for example, 1-2, 4-5, 9-10, 12- in the case of the component SO4 shown in FIG.
It is assumed that the 13 pins are interchangeable with each other. The slot exchange rule is 2N composed of 1, 2, 3 pins.
AND gates (slots), 4, 5, and 6 pins, 9, 10, and 8 pins, and 12, 13, and 11 pins are interchangeable, and components of the same type (same library name) If they are the same, the slot can be exchanged between different parts. Logically, the input pins of the two NAND gates are interchangeable, and each of the two NAND gates is interchangeable on a gate-by-gate basis.

In the data structure in the storage means of the CAD apparatus, the identification that the slot can be replaced is obvious for the slot having the same function name, or an identifier is separately provided for the data of the slot having the same function name. Defined by In some cases, an identifier indicating whether or not a slot can be exchanged with a mounted component having the same library name is provided. However, this identifier is not a necessary condition due to the existence of the above-described slot exchange rule. The identification that the pin can be exchanged is defined by providing an identifier to the data of the pins constituting the slot.

Although it is logically possible to change the circuit connection of the boundary scan chain, that is, to change the connection order, as described above, the change of the circuit connection has the same library name that the slot is interchangeable. Limited to between mounted components. Many of the plurality of components corresponding to the boundary scan test mounted on the printed circuit board have different library names. Therefore, in the conventional CAD apparatus, the data configuration of the component corresponding to the boundary scan test does not satisfy the condition for slot replacement. For this reason, the connection order of the boundary scan chains cannot be changed at the time of layout design, and as a result, pattern wiring cannot be efficiently performed at the time of layout design.

[0011]

A CAD apparatus according to the present invention includes, as data relating to a mounted component mounted on a mounting substrate, a library name indicating a type of the mounted component and a function of a component configuring the mounted component. Storage means for storing a function name to be represented, and an identifier representing the component when the component is interchangeable with a component having the same function name between mounting parts having different library names, and storage means. When the layout of the mounted parts is designed based on the data stored in step (1) and this layout is evaluated, and it is determined that the components need to be exchanged between the mounted parts with different library names by this evaluation. The data of the mounted components that need to be replaced is read from the storage unit, and it is checked whether or not each component of the mounted component has an identifier. Characterized in that it comprises a changing means for exchanging these components when there is a child.

According to the present invention, when it is determined in the layout evaluation that components to be mounted need to be exchanged between the mounted components having different library names, the changing means uses the data of the mounted components requiring the replacement. Is read from the storage means,
It is checked whether or not each component of each mounted component has an identifier. If the data of each component has an identifier, these components are exchanged. This identifier is provided for a component having the same function name with a component having a different library name and a component which can be exchanged, and therefore has the same function name with a component having a different library name. The components are exchanged.

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of a CAD apparatus according to the present invention will be described below with reference to the drawings. FIG. 1A is a block diagram illustrating a schematic configuration of a CAD apparatus according to an embodiment, and FIG. 1B is a conceptual diagram illustrating a configuration of data stored in a storage unit of FIG. This CAD device 1
The mounted substrate on which the mounted components are mounted is a printed circuit board,
The layout of the mounting form of the mounted components on a printed circuit board is designed based on the data on the mounted components. As shown in FIG.
And is provided.

The storage means 2 stores data relating to the mounted components, and the stored data is read out and used not only in the layout design but also in the circuit design. Also, as data on mounted components,
As shown in FIG. 1B, a library name 21 representing a type of a mounted component, a function name representing a function of a component (hereinafter, referred to as a slot) constituting the mounted component, and its configuration content 2
2. The pin number group 23 constituting the slot, and the slot is
An identifier representing an element that can be exchanged for a slot having the same function name between mounted components having different library names 21, that is, an inter-library slot exchange flag 24.
And so on.

For example, if the mounted component is a component corresponding to a product test performed by arranging the mounted components such that their components are connected in series, that is, a component compatible with a boundary scan test, the storage means 2
Is the library name 2 of the component supporting the boundary scan test
1 is stored. Further, the logical function of this part is stored in advance in the storage means 2 as "a circuit block of the part itself (hereinafter, referred to as a non-boundary scan circuit block)".
It is divided into two slots, “Boundary Scan Circuit Block” and registered. The storage unit 2 stores the function name and configuration content 22 and the pin number group 23 of each slot. Further, in this case, the storage unit 2 stores the function name and the configuration content 2 of the boundary scan circuit block.
As 2, the same name and the same configuration content are registered even if the type of the component corresponding to the boundary scan test is different, that is, even if the component has a different library name, and the storage unit 2 stores these as data. For example, a name “BS” is stored, and the same symbol, for example, a symbol as shown in FIG. 2 is stored as data for a circuit symbol used in circuit design. Further, the storage means 2 stores a slot exchange flag between different libraries 24 as data relating to the boundary scan circuit block.

The conceptual diagram of the data structure shown in FIG. 1B illustrates a case where there are a plurality of slots having a slot exchange flag 24 between different libraries for one function name. In the data configuration of the components corresponding to the boundary scan test, the “boundary scan circuit block” sets one slot having the slot exchange flag 24 between different libraries for any component.
Have only one.

The above-mentioned changing means 3, when it is determined in the layout evaluation performed after the layout design that the mounting components having different library names need to be replaced with each other, these mounting components need to be replaced. The data is read from the storage means 2 and it is confirmed whether or not the slot of each mounting component has the slot exchange flag 24 between different libraries. If the slot exchange flag 24 between different libraries exists in each slot, these slots are replaced. Is to replace.

For example, the mounted component is a component corresponding to the boundary scan test, and the layout order is changed by exchanging the boundary scan circuit blocks (slots) between the components corresponding to the boundary scan test having different library names. Is determined to be necessary, the changing means 3 checks the different library slot exchange flag 24 and exchanges these boundary scan circuit blocks. Thus, the connection order of the boundary scan circuit blocks (the connection order of the boundary scan chains) is changed.

Next, a case in which a layout design of a mounting component including a boundary scan compatible component on a printed circuit board is performed using the CAD apparatus 1 will be described with reference to FIG. First, as shown in step 1 (hereinafter, referred to as step and ST), components used in a circuit from circuit diagram data obtained by circuit design, that is, components mounted on a printed board, Output data (netlist) expressing connection (connection),
The data is input to the CAD device 1 that performs the layout design.

Next, using the CAD apparatus 1, the mounted components are arranged (laid out) on a printed circuit board based on the obtained net list and the data of the mounted components stored in the storage means 2 (ST2). Thereafter, the layout is evaluated (ST3), and according to the evaluation, slot exchange, pin exchange, and the like are performed (ST4). At the time of the slot exchange, the connection order of the boundary scan chains is changed by the changing means 3.

For example, three components corresponding to the boundary scan test, IC5, IC18, and IC7, which have different types of components and thus different library names, are designed by circuit design as shown in FIG.
In the case where the boundary scan chains are connected as shown in (1), if it is determined in the layout evaluation that it is necessary to change the connection order of the boundary scan chains by exchanging the boundary scan circuit blocks of the IC7 and IC5. The changing means 3 reads data relating to the ICs 7 and 5 from the storage means 2. And IC7, I
It is checked whether or not there is a slot exchange flag 24 between different libraries in the boundary scan circuit block of C5. In the data in the storage means 2, the different library slot exchange flag 24 and the same function name are given to the boundary scan circuit blocks of IC7 and IC5. Therefore, the changing means 3 confirms that each of the boundary scan circuit blocks has the different library slot exchange flag 24, and exchanges the boundary scan circuit blocks of these ICs 7 and 5 as shown in FIG. Change order. At this time, there is no change in the non-boundary scan circuit block.

FIG. 4 is a circuit diagram immediately after circuit design, and FIG. 5 is a circuit diagram after the connection order of the boundary scan chains has been changed. In the storage unit 2, since the data configuration of the component corresponding to the boundary scan test is divided into the non-boundary scan circuit block and the boundary scan circuit block, the boundary scan chain portion in the circuit diagram is shown in FIGS. 4 and 5. Thus, the display is performed separately from the non-boundary scan circuit portion.

After the slot exchange, the pin exchange and the like are performed, the pattern wiring between the mounted components is performed (ST).
5). Thereafter, the CAD device 1 outputs the changed data to the circuit diagram input CAD device so that the changed data such as the slot exchange and the pin exchange is back-annotated in the circuit diagram (ST6). Through the above steps, the layout design is completed.

As described above, the CAD apparatus 1 according to the embodiment
According to the definition, it is defined that the boundary scan circuit block can be exchanged between the components corresponding to the boundary scan test having different library names, and the exchange is treated as a slot exchange. In this case, the connection order of the boundary scan chains can be changed. Therefore, it is possible to improve the pattern wiring efficiency at the time of layout design. This is more effective as the number of components for the boundary scan test mounted on the printed circuit board is larger. In the above embodiment, the layout design of the printed circuit board on which the components corresponding to the boundary scan test are mounted
Although the case where the AD device is used has been described, it is needless to say that the present invention is not limited to the embodiment.

[0025]

As described above, the CA according to the present invention is
According to the D device, as the data in the storage means, an identifier indicating that the component of the mounted component can be exchanged with a component having the same function name between mounted components having different library names. When it is determined in the layout design that components to be replaced need to be exchanged between the mounted components having different library names, the changing unit transmits an identifier to the data of the component that needs to be exchanged. Since these components are exchanged in a certain case, it is possible to exchange components having the same function name between mounted components having different library names in layout design. Therefore, it is possible to improve the pattern wiring efficiency at the time of layout design.

[Brief description of the drawings]

FIGS. 1A and 1B are explanatory diagrams of a CAD apparatus according to an embodiment of the present invention, in which FIG. 1A is a block diagram illustrating a schematic configuration of the CAD apparatus, and FIG. 1B is a data configuration stored in a storage unit of FIG. FIG.

FIG. 2 is a diagram showing an example of a circuit symbol diagram of a boundary scan circuit block.

FIG. 3 is a process chart showing an example of a procedure of a layout design using the CAD apparatus according to the embodiment.

FIG. 4 is a circuit diagram of a boundary scan chain portion designed by circuit design.

FIG. 5 is a circuit diagram of a boundary scan chain after a connection order is changed.

FIG. 6 is a diagram illustrating a boundary scan chain.

FIG. 7 is a diagram for explaining pin exchange and slot exchange.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 CAD apparatus 2 Storage means 3 Changing means 21 Library name 22 Function name and configuration contents 24 Slot exchange flag between different libraries

Claims (2)

[Claims] 1. A CAD apparatus for designing a layout of a mounting form of a mounted component on a mounting board based on data on the mounted component, wherein a library representing a type of the mounted component as the data on the mounted component. Name, a function name representing the function of a component constituting the mounted component, and a component that is interchangeable with a component having the same function name between mounted components having different library names. Storage means for storing an identifier indicating this; and a layout design of the mounted component is performed based on the data stored in the storage means, and the layout is evaluated.
If it is determined that the components need to be exchanged between mounted components with different library names based on this evaluation,
The data of the mounted components that need to be replaced is read from the storage unit, and it is checked whether or not each component of the mounted component has an identifier. If each component has an identifier, these components are replaced. A CAD apparatus comprising: a change unit. 2. The component is used for a product test performed by arranging the mounted components such that the components are connected in series with each other. The mounting substrate of the mounted component is used for a product test. Layout design to
The product test can be performed, and the changing unit determines that it is necessary to change the connection order of the components between the mounted components having different library names by evaluating the layout. If it is determined, the data of the mounted parts whose connection order needs to be changed is read from the storage unit, and it is checked whether or not each component of each mounted component has an identifier. 2. The CAD apparatus according to claim 1, wherein in some cases, these components are exchanged to change the connection order of the components.