JPH10274667A - Automatic temperature characteristic testing device for electronic parts - Google Patents

Abstract

PROBLEM TO BE SOLVED: To continuously and adequately test the temperature characteristics of electronic parts in a short time by transporting measuring parts between a plurality of temperature characteristics testing tanks set at different temperatures. SOLUTION: In a temperature characteristics testing part 5, a plurality of temperature chambers (temperature characteristics testing tanks) 3a to 3n capable of setting at different desired temperatures are placed and a specific amount of liquid is injected inside them and the liquid temperatures are freely set within -30 deg.C to 85 deg.C. For example, in the case of testing quartz vibrators having a testing temperature range of -30 deg.C to 70 deg.C, 5 temperature chambers are arranged and their liquid temperatures are set at 70 deg.C, 50 deg.C, 25 deg.C (ambient temperature), -10 deg.C and -30 deg.C. Then, after correcting the bend and the like of lead legs of quartz vibrators supplied from a supplier part 1 are corrected at a lead correction part 2, they are carried in turn in the temperature chambers 3a to 3n, the quartz vibrators are warmed or cooled to the specific temperatures by the liquid temperatures, the vibration frequencies and impedances at the specific temperatures are measured and the temperature characteristics are tested.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic temperature characteristic test apparatus for electronic parts using a temperature characteristic test tank.

[0002]

2. Description of the Related Art Conventionally, in the manufacturing process of various electronic components, an electrical performance test and a temperature performance test of generally manufactured electronic components have been performed. In particular, in quartz resonators widely used as frequency control elements for various electronic devices,
The change rate of the electrical impedance with respect to the change in temperature is relatively large, and changes, for example, so as to draw a cubic curve. For this reason, in a temperature characteristic test of a quartz oscillator, measurement of an oscillation frequency or the like is performed at a plurality of temperature points, and classification is appropriately performed based on the measurement result.

[0003] An automatic temperature characteristic test apparatus for performing a temperature characteristic test of a quartz oscillator generally sets an atmosphere in a chamber to a predetermined temperature regardless of an external temperature as a temperature characteristic test tank, and maintains the set temperature. If you are using a thermostat that can perform automatic temperature characteristic testing of the crystal unit,
After setting a plurality of quartz oscillators in such a temperature characteristic test chamber, the oscillation frequency and impedance are automatically measured at multiple temperature points by continuously changing the temperature of the gas atmosphere in the chamber. I have to.

[0004]

When a temperature characteristic test of a quartz oscillator is performed by the above-mentioned conventional automatic temperature characteristic testing apparatus, first, a temperature characteristic test tank in which a quartz oscillator is set is placed. The gas atmosphere reaches a predetermined temperature, and then the set crystal oscillator reaches the predetermined temperature depending on the atmosphere in the bath.

[0005] However, since the quartz oscillator has a slow response to a change in the temperature of the gas atmosphere, and the time required for the quartz oscillator to reach a predetermined temperature is long (for example, about 15 minutes to 20), the atmosphere of the gas atmosphere in the bath is not affected. A long time was required for a temperature characteristic test of a crystal unit in which various measurements were performed at a plurality of temperature points while continuously changing the temperature. for that reason,
There was a problem that the process of the temperature characteristic test could not be incorporated into the production line of the crystal unit, resulting in poor productivity.

Further, the temperature characteristic test tank used in the conventional automatic temperature characteristic test apparatus has a large variation in the temperature of the body atmosphere in the tank due to the influence of the flow of the atmosphere.
There was also a problem that an accurate temperature characteristic test could not be performed.

SUMMARY OF THE INVENTION The present invention has been made to solve such a problem, and an object of the present invention is to provide an automatic temperature characteristic test apparatus capable of accurately performing a temperature characteristic test of an electronic component in a relatively short time. And

[0008]

In order to achieve the above object, a constant temperature liquid tank capable of setting a liquid supplied to a predetermined liquid level to a desired temperature, and a plurality of parts to be measured. A holding unit that can be rotated and held in a state of contact (immersion) with the liquid in the constant temperature liquid tank, and a measuring unit that measures the characteristics of the component to be measured transferred to a predetermined position by the holding unit. A plurality of temperature characteristic test tanks, and a transfer means for transferring the component to be measured between the plurality of temperature characteristic test tanks, and by setting the plurality of temperature characteristic test tanks to different predetermined measurement temperatures, respectively, continuously. The temperature characteristics of the component to be measured were measured.

Further, the space portion of the constant temperature liquid tank is filled with dry gas, and this gas is supplied through a pipe immersed in the constant temperature liquid tank. Also,
The electronic component was a quartz oscillator.

According to the present invention, the plurality of constant temperature liquid tanks, which are temperature characteristic test tanks, are set to different predetermined measurement temperatures, respectively, and the component to be measured is transferred between the plurality of constant temperature liquid tanks by the transfer means. Therefore, the temperature characteristic test of the component to be measured can be continuously performed.

[0011]

FIG. 1 is a block diagram showing an outline of an apparatus for testing the temperature characteristics of an electronic component according to the present invention. In the present embodiment, the component to be measured is a quartz oscillator, and the shape of the quartz oscillator is such that a quartz piece is hermetically sealed by a metal container and electrodes are drawn out by lead legs.

In this figure, a supply unit 1 is arranged so that the directions of a large number of quartz oscillators to be measured are aligned and continuously supplied by a conveyor belt or the like. The lead correcting section 2 corrects the bending and the pulling-out direction of the lead foot of the crystal oscillator supplied from the supply section 1 via a conveyor belt or the like.

The temperature characteristic test section 5 is provided with a plurality of temperature chambers (temperature characteristic test tanks) 3a to 3n each capable of setting a desired temperature.
Are sequentially carried into the temperature chambers 3a to 3n of the temperature characteristic test section 5, whereby a temperature characteristic test of the crystal resonator at a predetermined temperature is performed.

The structure of the temperature chambers provided in the temperature characteristic test section 5 will be described later. Each of the temperature chambers 3a to 3n has a predetermined amount of liquid injected therein, and the temperature of the liquid For example, -30 ° C to 85
A temperature setting function that can be set freely within the range of ° C. is provided.

For example, when performing a temperature characteristic test of a quartz oscillator having a test temperature range of −30 ° C. to 70 ° C., five sets of temperature chambers are arranged in the temperature characteristic test tank 5 and the liquid temperature of each temperature chamber is set. Is set to, for example, 70 ° C., 50 ° C., 25 ° C. (normal temperature), −10 ° C., and −30 ° C. to perform a temperature characteristic test of the crystal unit.

In this case, the crystal oscillator whose lead foot has been corrected by the lead correction section 2 is first carried into a first temperature chamber, and its surface is immersed or contacted with a liquid (70 ° C.) in this temperature chamber. So that it is kept. As a result, the quartz oscillator quickly reaches a predetermined temperature (70 ° C.), and various measurements such as the oscillation frequency and the impedance at this temperature are performed by a measuring unit provided in the bath.

Thereafter, the quartz oscillator is taken out of the first temperature chamber, and is sequentially transferred into the second temperature chamber, and its surface is immersed or brought into contact with the liquid (50 ° C.) in the second temperature chamber. So that it is kept. As a result, the quartz oscillator quickly reaches a predetermined temperature (50 ° C.), and various measurements such as the oscillation frequency and the internal impedance at that temperature are performed in the measuring section in the bath.

The crystal oscillator supplied from the lead correction unit 2 is sequentially transferred to each of the subsequent temperature chambers, carried into the last temperature chamber, and subjected to the liquid (-30 ° C.) in the temperature chamber. When various measurements such as the oscillation frequency and the internal impedance are performed as the temperature, a series of temperature characteristic tests is completed. The liquid drainers 4a to 4n provided in the temperature chambers 3a to 3n return liquid adhering to the quartz oscillator to the respective tanks.
It is provided on the side to be transferred from each temperature chamber to the next temperature chamber.

In this way, various measurement data for each temperature measured by the temperature characteristic test section 5 is input to the computer device 8 and managed for each crystal resonator.

The printing unit 6 prints a model number, a serial number, a manufacturing date, a manufacturer name, and the like on the surface of the metal container of the crystal unit based on the data stored in the computer device 8.
The oscillation frequency characteristic measured by the temperature characteristic test unit 5 and the impedance characteristic of the crystal unit are displayed and printed with characters, numerals, and bar codes, or the oscillation frequency measured by the temperature characteristic test unit 5 is changed to a predetermined frequency. They are classified into ranges, and the classifications are printed in color.

The classifying and storing section 7 classifies and stores the crystal oscillator conveyed from the printing section 6 based on the oscillation frequency characteristics measured by the temperature characteristic testing section 5,
The rejected quartz resonators are classified and stored.

As described above, in the automatic temperature characteristic testing apparatus for a quartz oscillator according to the present embodiment, the temperature characteristic testing unit 5
Are provided with a plurality of temperature chambers 3a to 3n which are set to different temperatures, respectively, and by sequentially transporting the crystal units to be measured to the temperature chambers 3a to 3n,
Since the temperature characteristic test can be performed continuously in a very short time, the temperature characteristic test can be incorporated into a series of processes such as printing, sorting, and storing.

Next, the internal structure of the temperature chamber 3 used in the above-mentioned automatic temperature characteristic test apparatus is shown in FIGS.
This will be specifically described with reference to FIG. FIG. 2A is a cross-sectional view illustrating the internal structure of the temperature chamber 3, and FIG. 2B is a top view illustrating the internal structure of the temperature chamber 3. As shown in FIG. 2A, the temperature chamber 3 has openings 11a.
It is formed by a container 11 having 11b. The opening 11a is provided to carry the crystal unit into the container 11, and the opening 11b is provided to take out the crystal unit from the container 11.

Covers 12 and 13 are provided above the openings 11a and 11b, respectively.
a and 11b are closed by lids 12 and 13, and the inside of the container 11 is kept substantially sealed. Also,
The container 11 is filled with a liquid (fluorinate) 14 so as to have a predetermined liquid level, and the liquid is supplied by a temperature setting device (not shown) capable of heating and reducing temperature, which is disposed on the lower surface of the container 11, for example. For example, if the temperature of 14 is -35 ° C.
It can be set freely within the range of 85 ° C.

The liquid 14 contained in the container 11 is, for example, Fluorinert (trade name).
The temperature is set to a predetermined temperature by the temperature setting device of the container 11. When the temperature of the liquid 14 is set by the temperature setting device of the container 11 as described above, the temperature of the liquid 14 can be set with high accuracy (± 0.01 ° C.). The liquid 14 is not limited to Fluorinert, and may be another liquid as long as it does not vaporize or solidify at least within a range that can be set by the temperature setting device of the container 11.

A rotary plate 16 supported by a rotary shaft 15 is provided at a position in contact with the liquid surface of the liquid 14 in the container 11. The rotating plate 16 is rotatable in at least one direction (clockwise or counterclockwise). Further, as shown in FIG. 2B, a number of notches 21 are formed on the circumference.

The notch 21 has a size such as to hold a crystal oscillator carried into the container 11 through the opening 11a by a transfer arm, for example. As a result, the crystal oscillator carried into the temperature chamber 3 is held in the liquid 14 by the notch 21 with most of its surface immersed or in surface contact.

The measuring section 17 is brought into the opening 11a, and the quartz oscillator held by the rotating plate 16 is rotated by approximately 180 degrees by the rotation of the rotating plate 16, and when the quartz oscillator is moved to a predetermined position, the lead of the quartz oscillator is moved. A connector for contacting the foot is provided, and various measurements are performed by measuring a voltage or a current supplied through the connector.

An inert gas, for example, a dry gas such as nitrogen (N ₂ ) is sent from outside via a pipe 19 into a space 18 in the container 11 in which the liquid 14 is not contained. As a result, the space 18 in the container 11 is filled with the dried gas. The temperature of the dried gas is substantially the same as that of the liquid 14 because the pipe 19 passes through the liquid 14 in the container 11.

When the dried gas is fed into the space 18 in the container 11, the space 18 in the container 11
Is removed, for example, when the temperature of the liquid 14 in the container 11 is set to a low temperature (for example, −30 ° C.), the rotating shaft 15 in which the water contained in the space 18 has a low temperature is used.
And dew condensation caused by contact with the rotating plate 16 can be prevented. Therefore, it is possible to prevent frost generated on the rotating shaft 15 and the rotating plate 16 which is particularly likely to occur in the low-temperature temperature chamber 3, thereby preventing an electrical failure and a mechanical failure. In this example, nitrogen (N
_{Although 2} ) is used, any inert gas may be used, and it is not particularly limited to nitrogen.

Next, the operation of the temperature chamber 3 as described above will be described with reference to FIGS. Note that FIG.
In FIG. 4, the nitrogen gas (N ₂ ) filled in the space 18 of the container 11 and the pipe 19 for feeding the nitrogen gas are omitted. First, the crystal unit 30 supplied from the supply unit 1 shown in FIG. 1 and whose lead foot is corrected by the lead correction unit 2 is:
For example, it is carried into the inside of the temperature chamber 3 through the opening 11a of the container 11 by the transfer arm 31 as shown in FIG.

The quartz oscillator loaded by the transfer arm 31 is rotated by the rotary plate 16 located just below the opening 11a.
3b (see FIG. 3B). As a result, the surface of the crystal unit 30 is immersed or in contact with the liquid 14 while being held by the rotating plate 16.

The rotating plate 16 has the next notch 21b in the opening 11 until the next crystal unit is carried into the container 11.
Rotation movement is performed so as to be located directly below the hole a, and the crystal oscillator 30 newly carried in by the transfer arm 31 is held in the notch 21b. The lid 12 of the opening 11a of the container 11 is controlled to open and close according to the transfer operation of the transfer arm 31.

By repeating such an operation, the quartz oscillator 30 is sequentially placed in the notch 21 of the rotating plate 16.
Is held, and the held quartz oscillator 30 moves on the circumference of the rotating plate 16. And FIG.
As shown in (a), when the quartz oscillator 30 first carried in and held in the notch 21 moves half a circle on the circumference of the rotary plate 16, the oscillation frequency and impedance ( L, C) and the like will be measured.

When the crystal unit 30 thus carried in is immersed in or brought into contact with the liquid 14 set at a predetermined temperature, the temperature of the crystal unit 30 until the temperature of the crystal unit 30 coincides with the temperature in the conventional atmosphere. Since the temperature of the liquid 14 coincides with the temperature of the liquid 14 in an extremely short time (about several tens of seconds to one minute) as compared with the time, the temperature characteristic test of the crystal unit 30 in the temperature chamber 3 can be performed in an extremely short time.

After the measurement, the quartz oscillator 30 is moved by the transfer arm 32 to the container 11 as shown in FIG.
Is taken out of the opening 11b, and is carried into the next temperature chamber 3, and a similar temperature characteristic test is performed.
The lid 13 of the opening 11b is also controlled to open and close according to the operation of the transfer arm 32.

Since the liquid 14 in the container 11 is slightly reduced by adhering to the quartz oscillator,
A replenishing function for replenishing the liquid 14 is provided.

As described above, in the temperature chamber 3, the crystal oscillator 30 is set to a predetermined temperature by the liquid 14, so that the temperature of the crystal oscillator is set by the temperature of the conventional gas atmosphere. This makes it possible to perform a highly accurate temperature characteristic test in a very short time.

While the quartz oscillator 30 is held by the rotating plate 16 while the quartz oscillator is immersed or in contact with the liquid 14, for example, 50 notches are formed in the rotating plate 16. If the part 21 is formed, several seconds to
The quartz oscillator 30 is continuously inserted into the temperature chamber 3 at intervals of several tens of seconds.
Can be transported.

Further, since the dried gas is fed into the space 18 in the temperature chamber 3, the rotating shaft 15 and the rotating plate 16 in the container 11 are free from frost and dew condensation, and there is no electrical trouble or mechanical trouble. It is also possible to prevent a mechanical failure.

In this embodiment, only the case where a temperature characteristic test is performed for a crystal unit having lead legs has been described. However, the present invention is not limited to this case. Testing can also be performed. For example, when performing a temperature characteristic test of a surface-mount type crystal unit, the shape of the notch 21 of the rotating plate 16 may be a shape that can hold the surface-mount type crystal unit. Further, in the present embodiment, a case where a quartz oscillator is used as an electronic component has been described. However, the present invention is not limited to this, and it is of course possible to perform a similar temperature characteristic test on other electronic components. .

[0042]

As described above, the automatic temperature characteristic test apparatus for electronic parts of the present invention sets a plurality of constant temperature liquid tanks, which are temperature characteristic test tanks, to different predetermined measurement temperatures, respectively, and transfers means. The component to be measured is transferred between the plurality of constant temperature liquid tanks, so that the temperature characteristic test of the component to be measured can be continuously performed. This makes it possible to incorporate a series of manufacturing processes into a line for a temperature characteristic test of an electronic component.

Further, if the space of the constant temperature liquid tank is filled with dry gas, there is an effect that no electric trouble or mechanical trouble occurs.

[Brief description of the drawings]

FIG. 1 is a block diagram showing an outline of an automatic temperature characteristic test apparatus for electronic components of the present invention.

FIG. 2 is a side view and a top view showing an internal structure of a temperature chamber which is a temperature chamber according to the present invention.

FIG. 3 is a diagram illustrating the operation of the temperature chamber of the present invention.

FIG. 4 is a diagram illustrating the operation of the temperature chamber of the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Supply part 2 Lead straightening part 3a-3n Temperature chamber 4a-4n Liquid drain part 5 Temperature characteristic test part 6 Printing part 7 Classification / storage part 8 Computer device 11 Container 11a, 11b Opening 12,13 Lid 14 Liquid 15 Rotation axis DESCRIPTION OF SYMBOLS 16 Rotating plate 17 Measuring part 18 Space 19 Tube 21 Notch part 30 Quartz oscillator 31, 32 Transfer arm

Claims (4)

[Claims] 1. A constant-temperature liquid tank capable of setting a liquid supplied to a predetermined liquid level to a desired temperature, and a plurality of components to be measured are brought into contact with the liquid in the constant-temperature liquid tank. A plurality of temperature characteristic test tanks each including a holding unit that can be rotated and held in a state, and a measuring unit that measures characteristics of the component to be measured transferred to a predetermined position by the holding unit; A transfer means for transferring the component to be measured between the characteristic test tanks, and the temperature characteristics of the component to be measured are continuously measured by setting the plurality of temperature characteristic test tanks to different predetermined measurement temperatures. An automatic temperature characteristic testing device for electronic components, characterized in that the temperature of the electronic component is automatically measured. 2. The automatic temperature characteristic testing apparatus for electronic parts according to claim 1, wherein a space portion of said constant temperature liquid tank is filled with a dry gas. 3. The apparatus according to claim 2, wherein the gas is supplied via a pipe immersed in the thermostatic liquid bath. 4. The apparatus according to claim 1, wherein the electronic component is a quartz oscillator.