JPH10150248A - Wiring board and its manufacture - Google Patents

Wiring board and its manufacture

Info

Publication number
JPH10150248A
JPH10150248A JP30815896A JP30815896A JPH10150248A JP H10150248 A JPH10150248 A JP H10150248A JP 30815896 A JP30815896 A JP 30815896A JP 30815896 A JP30815896 A JP 30815896A JP H10150248 A JPH10150248 A JP H10150248A
Authority
JP
Japan
Prior art keywords
thermosetting resin
resin
wiring
wiring conductor
insulating base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP30815896A
Other languages
Japanese (ja)
Other versions
JP3393769B2 (en
Inventor
Hidenori Shikada
英典 鹿田
Shunichi Fujii
俊一 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP30815896A priority Critical patent/JP3393769B2/en
Publication of JPH10150248A publication Critical patent/JPH10150248A/en
Application granted granted Critical
Publication of JP3393769B2 publication Critical patent/JP3393769B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4673Application methods or materials of intermediate insulating layers not specially adapted to any one of the previous methods of adding a circuit layer
    • H05K3/4676Single layer compositions

Abstract

PROBLEM TO BE SOLVED: To strengthen the bonding strength of wiring conductors to an insulating base body by a method wherein an intermediate layer consisting of a thermosetting resin is made to interpose between the insulating base body and the wiring conductors and at the same time, the thermosetting resin of the intermediate layer is bonded to the thermosetting resin of each of the insulating base body and the wiring conductors by a crosslinking reaction. SOLUTION: An intermediate layer is made to interpose between wiring conductors 2 and the upper surface of an insulating substrate 1b constituting an insulating base body 1. The thermosetting resin of the intermediate layer causes a crosslinking reaction with the thermosetting resin of each of the substrate 1b and the wiring conductors 2, whereby the wiring conductors 2 are firmly bonded to the substrate 1b. Thereby, when electrodes on a semiconductor element 3 are connected with the conductors 2 via bonding wires 4 or at other times, the conductors 2 are never separated from the base body 1 (the surface of the substrate 1b) by an external force even if the large external force is applied to the conductors 2. Thereby, it becomes possible to connect electrically each electrode on the element 3 with each wiring conductor 2 reliably and firmly.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、配線基板に関し、
より詳細には半導体素子を収容するための半導体素子収
納用パッケージや混成集積回路装置等に用いられる配線
基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board,
More specifically, the present invention relates to a semiconductor element housing package for housing a semiconductor element, and a wiring board used for a hybrid integrated circuit device or the like.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに該半導体素子
の各電極を、例えばボンディングワイヤ等の電気的接続
手段を介して配線導体に電気的に接続し、しかる後、前
記絶縁基体の上面に、金属やセラミックス等から成る蓋
体を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロ
ウ材等の封止部材を介して接合させ、絶縁基体の凹部内
に半導体素子を気密に収容することによって製品として
の半導体装置となる。
2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element is made of ceramics such as an aluminum oxide sintered body, and a semiconductor element is housed in a central portion of an upper surface thereof. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum which is led out from the periphery of the concave portion to the lower surface of the insulating substrate, and a semiconductor element is formed on the bottom surface of the concave portion of the insulating substrate. Glass, resin, and adhesively fixed via an adhesive such as a brazing material, and each electrode of the semiconductor element is electrically connected to a wiring conductor through an electrical connection means such as a bonding wire. A sealing member made of glass, resin, brazing material, or the like, with a cover made of metal, ceramics, or the like on the upper surface of the insulating base so as to cover the concave portion of the insulating base. Through by joining a semiconductor device as a product by housing airtightly semiconductor element in the recess of the insulating substrate.

【0003】なお、この従来の配線基板は一般に、セラ
ミックグリーンシート積層法によって製作されており、
具体的には酸化アルミニウム、酸化珪素、酸化マグネシ
ウム、酸化カルシウム等のセラミック原料粉末に適当な
有機バインダー、溶剤等を添加混合して泥漿状となすと
ともにこれを従来周知のドクターブレード法を採用し、
シート状にすることによって複数枚のセラミックグリー
ンシートを得、しかる後、前記セラミックグリーンシー
トに適当な打ち抜き加工を施すとともに配線導体となる
金属ペーストを所定パターンに印刷塗布し、最後に前記
セラミックグリーンシートを所定の順に上下に積層して
生セラミック成形体となすとともに該生セラミック成形
体を還元雰囲気中、約1600℃の高温で焼成すること
によって製作される。
Incidentally, this conventional wiring board is generally manufactured by a ceramic green sheet laminating method.
Specifically, an appropriate organic binder, a solvent, etc. are added to a ceramic raw material powder such as aluminum oxide, silicon oxide, magnesium oxide, and calcium oxide to form a slurry, which is formed by a conventionally known doctor blade method.
A plurality of ceramic green sheets are obtained by forming the sheet into a sheet shape. Thereafter, the ceramic green sheet is subjected to an appropriate punching process, and a metal paste serving as a wiring conductor is printed and applied in a predetermined pattern. Are laminated one above the other in a predetermined order to form a green ceramic molded body, and the green ceramic molded body is fired at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】しかしながら、この従来の配線基板は、絶
縁基体を構成する酸化アルミニウム質焼結体等のセラミ
ックスが硬くて脆い性質を有するため、搬送工程や半導
体装置製作の自動ライン等において配線基板同士が、あ
るいは配線基板と半導体装置製作自動ラインの一部とが
激しく衝突すると絶縁基体に欠けや割れ、クラック等が
発生し、その結果、半導体素子を気密に収容することが
できず、半導体素子を長期間にわたり正常、かつ安定に
作動させることができなくなるという欠点を有してい
た。
However, in the conventional wiring board, since ceramics such as an aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the wiring boards are not connected to each other in a transfer process or an automatic line for manufacturing semiconductor devices. If the wiring board and a part of the automatic semiconductor device manufacturing line collide violently, the insulating substrate may be chipped, cracked, cracked, etc., and as a result, the semiconductor element cannot be housed in an airtight manner, and the semiconductor element may not be long. There was a drawback that normal and stable operation could not be achieved over a period of time.

【0005】また、前記配線基板の製造方法によれば、
生セラミック成形体を焼成する際、生セラミック成形体
に不均一な焼成収縮が生じ、得られる配線基板に反り等
の変形や寸法のばらつきが発生して半導体素子の各電極
を所定の配線導体に、あるいは配線導体を所定の外部電
気回路に正確、かつ確実に電気的接続することができな
いという欠点を有していた。
According to the method of manufacturing a wiring board,
When firing the green ceramic molded body, uneven firing shrinkage occurs in the green ceramic molded body, and deformation and dimensional variation such as warpage occur in the obtained wiring board, so that each electrode of the semiconductor element is connected to a predetermined wiring conductor. Alternatively, the wiring conductor cannot be accurately and reliably electrically connected to a predetermined external electric circuit.

【0006】そこで、配線基板の絶縁基体を従来のセラ
ミックスに代えて無機絶縁物粉末を熱硬化性樹脂で結合
したものに、配線導体を従来の高融点金属粉末に代えて
金属粉末を熱硬化性樹脂で結合したものにした配線基板
が提案されている。この無機絶縁物粉末を熱硬化性樹脂
で結合して成る絶縁基体と金属粉末を熱硬化性樹脂で結
合して成る配線導体とから成る配線基板は、熱硬化性樹
脂と無機絶縁物粉末とを混合して成る半硬化状態の前駆
体シートを準備するとともに該前駆体シートに適当な打
ち抜き加工を施し、次にこれに熱硬化性樹脂と金属粉末
とを混合して成る金属ペーストを所定パターンに印刷塗
布し、最後に前記金属ペーストが印刷塗布された前駆体
シートを必要に応じて積層するとともにこれを約100
〜300℃の温度で熱硬化させることによって製作され
る。
Therefore, the insulating base of the wiring board is replaced with conventional ceramics and the inorganic insulating powder is bonded with a thermosetting resin, and the wiring conductor is replaced with the conventional high melting point metal powder and the metal powder is replaced with the thermosetting resin. There has been proposed a wiring board joined by a resin. A wiring board composed of an insulating base formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with a thermosetting resin, comprises a thermosetting resin and an inorganic insulating powder. A precursor sheet in a semi-cured state is prepared by mixing, and the precursor sheet is subjected to appropriate punching, and then a metal paste formed by mixing a thermosetting resin and metal powder is formed into a predetermined pattern. The precursor sheet on which the metal paste is printed and applied is laminated as required, and this is applied for about 100 hours.
Manufactured by thermosetting at a temperature of 300300 ° C.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、この無
機絶縁物粉末を熱硬化性樹脂で結合して成る絶縁基体と
金属粉末を熱硬化性樹脂で結合して成る配線導体とから
成る配線基板は、絶縁基体に対する配線導体の接合強度
が若干弱く、配線導体に半導体素子の電極を接続する際
等において配線導体に大きな外力が印加されると該外力
によって配線導体が絶縁基体より剥離し、半導体素子等
の電極と配線導体との電気的接続の信頼性が若干劣ると
いう解決すべき課題を有していた。
However, a wiring board comprising an insulating base formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with a thermosetting resin, The bonding strength of the wiring conductor to the insulating base is slightly weak, and when a large external force is applied to the wiring conductor, for example, when connecting an electrode of a semiconductor element to the wiring conductor, the wiring force peels off from the insulating base due to the external force, and the semiconductor element, etc. There is a problem to be solved that the reliability of the electrical connection between the electrode and the wiring conductor is slightly inferior.

【0008】本発明は上記欠点に鑑み案出されたもの
で、その目的は絶縁基体と配線導体との接合を強固と
し、配線導体に半導体素子の電極等を強固に電気的接続
することができる配線基板を提供することにある。
The present invention has been made in view of the above-mentioned drawbacks, and has as its object to strengthen the bonding between an insulating base and a wiring conductor and to firmly electrically connect an electrode of a semiconductor element to the wiring conductor. It is to provide a wiring board.

【0009】[0009]

【課題を解決するための手段】本発明は、60重量%乃
至95重量%の無機絶縁物粉末と5重量%乃至40重量
%の熱硬化性樹脂とからなり、前記無機絶縁物粉末を前
記熱硬化性樹脂により結合した少なくとも一枚の絶縁基
板から成る絶縁基体に、金属粉末を熱硬化性樹脂により
結合した配線導体を被着させて成る配線基板であって、
前記絶縁基体と配線導体との間に、熱硬化性樹脂からな
る中間層を介在させるとともに、該中間層の熱硬化性樹
脂を絶縁基体及び配線導体の各々の熱硬化性樹脂に架橋
反応により接合させたことを特徴とするものである。
The present invention comprises 60 to 95% by weight of an inorganic insulating powder and 5 to 40% by weight of a thermosetting resin. A wiring board comprising: an insulating base made of at least one insulating substrate bonded by a curable resin; and a wiring conductor bonded to a metal powder by a thermosetting resin.
An intermediate layer made of a thermosetting resin is interposed between the insulating base and the wiring conductor, and the thermosetting resin of the intermediate layer is joined to each thermosetting resin of the insulating base and the wiring conductor by a crosslinking reaction. It is characterized by having made it.

【0010】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合してなる前駆
体シートを準備する工程と、前記前駆体シートの一面に
熱硬化性樹脂前駆体から成る樹脂ペーストを塗布する工
程と、前記塗布された樹脂ペースト上に熱硬化性樹脂前
駆体と金属粉末とを混合してなる金属ペーストを所定パ
ターンに塗布する工程と、前記前駆体シート、樹脂ペー
スト及び金属ペーストに圧力を印加しながら加熱処理
し、熱樹脂ペーストの熱硬化性樹脂と前駆体シート及び
金属ペーストの熱硬化性樹脂との間に架橋反応をおこさ
せつつ熱硬化させる工程と、から成ることを特徴とする
ものである。
The method of manufacturing a wiring board according to the present invention further comprises a step of preparing a precursor sheet obtained by mixing a thermosetting resin precursor and an inorganic insulating powder; A step of applying a resin paste composed of a resin precursor, a step of applying a metal paste obtained by mixing a thermosetting resin precursor and a metal powder on the applied resin paste in a predetermined pattern, The sheet, the resin paste, and the metal paste are subjected to heat treatment while applying pressure, and are thermoset while causing a crosslinking reaction between the thermosetting resin of the thermoresin paste and the thermosetting resin of the precursor sheet and the metal paste. And a process.

【0011】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作ラインの一部とが激しく衝
突したとしても絶縁基体に欠けや割れ、クラック等を発
生することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are connected to each other or between the wiring board and the semiconductor device manufacturing line. Even if it violently collides with a part, the insulating substrate will not be chipped, cracked, cracked or the like.

【0012】また本発明の配線基板によれば、絶縁基体
と配線導体との間に熱硬化性樹脂から成る中間層を介在
させるとともに該中間層の熱硬化性樹脂を絶縁基体及び
配線導体の各々の熱硬化性樹脂に架橋反応により接合さ
せたことから絶縁基体に対する配線導体の接合強度が極
めて強いものとなり、その結果、配線導体に半導体素子
の電極を接続する際等において配線導体に大きな外力が
印加されても配線導体が絶縁基体より剥離することはな
く、半導体素子等の電極を配線導体に確実、強固に電気
的接続することが可能となる。
Further, according to the wiring board of the present invention, an intermediate layer made of a thermosetting resin is interposed between the insulating base and the wiring conductor, and the thermosetting resin of the intermediate layer is applied to each of the insulating base and the wiring conductor. The bonding strength of the wiring conductor to the insulating base becomes extremely strong due to the bonding to the thermosetting resin of the above by a crosslinking reaction. As a result, when the electrode of the semiconductor element is connected to the wiring conductor, a large external force is applied to the wiring conductor. Even when the voltage is applied, the wiring conductor does not peel off from the insulating base, and the electrodes of the semiconductor element and the like can be reliably and firmly electrically connected to the wiring conductor.

【0013】更に本発明の配線基板は、熱硬化性樹脂前
駆体と無機絶縁物粉末とを混合してなる前駆体シートを
準備する工程と、前記前駆体シートの一面に熱硬化性樹
脂前駆体から成る樹脂ペーストを塗布する工程と、前記
塗布された樹脂ペースト上に熱硬化性樹脂前駆体と金属
粉末とを混合してなる金属ペーストを所定パターンに塗
布する工程と、前記前駆体シート、樹脂ペースト及び金
属ペーストに圧力を印加しながら加熱処理し、熱樹脂ペ
ーストの熱硬化性樹脂と前駆体シート及び金属ペースト
の熱硬化性樹脂との間に架橋反応をおこさせつつ熱硬化
させる工程とで製作され、前駆体シート、樹脂ペース
ト、金属ペーストの熱硬化性樹脂前駆体は熱硬化時に殆
ど収縮しないことから不均一な収縮による変形や寸法の
ばらつきが発生することもない。
Further, the wiring board of the present invention comprises a step of preparing a precursor sheet obtained by mixing a thermosetting resin precursor and an inorganic insulating powder; and a step of forming a thermosetting resin precursor on one surface of the precursor sheet. A step of applying a resin paste comprising: a step of applying a metal paste obtained by mixing a thermosetting resin precursor and a metal powder on the applied resin paste in a predetermined pattern; and Heat-treating while applying pressure to the paste and the metal paste, and performing a thermosetting while causing a cross-linking reaction between the thermosetting resin of the thermo-resin paste and the thermosetting resin of the precursor sheet and the metal paste. Manufactured, thermosetting resin precursors of precursor sheets, resin pastes, and metal pastes hardly shrink during thermosetting, causing deformation and dimensional variations due to uneven shrinkage. And no.

【0014】[0014]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。図1及び図2は、本発明の配線基板を
半導体素子を収容する半導体素子収納用パッケージに適
用した場合の一実施医を示し、1は絶縁基体、2は配線
導体である。
Next, the present invention will be described in detail with reference to the accompanying drawings. 1 and 2 show one embodiment of a case where the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating base, and 2 is a wiring conductor.

【0015】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
材を介して接着固定される。
The insulating substrate 1 comprises three insulating substrates 1a, 1
The semiconductor element 3 is formed by laminating b and 1c, and has a concave portion 1d for accommodating the semiconductor element at the center of the upper surface thereof, and the semiconductor element 3 is provided on the bottom surface of the concave portion 1d via an adhesive such as resin. Adhesively fixed.

【0016】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは、例えば酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
ゼオライト等の無機絶縁物粉末をエポキシ樹脂、ポリイ
ミド樹脂等の熱硬化性樹脂で結合することによって形成
されており、絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cはその各々が無機絶縁物粉末を靱性に優
れる熱硬化性樹脂で接合することによって形成されてい
ることから絶縁基体1に外力が印加されても、該外力に
よって絶縁基体1に欠けや割れ、クラック等が発生する
ことはない。
The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are made of, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding an inorganic insulating powder such as zeolite with a thermosetting resin such as an epoxy resin or a polyimide resin.
a, 1b, and 1c are each formed by bonding an inorganic insulating powder with a thermosetting resin having excellent toughness. Therefore, even if an external force is applied to the insulating base 1, the insulating base 1 is applied to the insulating base 1 by the external force. No chips, cracks, cracks, etc., occur.

【0017】なお、前記無機絶縁物粉末を熱硬化性樹脂
で結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に熱膨張係数の相違に起因する大
きな熱応力が発生し、この大きな熱応力によって半導体
素子3が絶縁基体1より剥離したり、半導体素子3に割
れや欠け等が発生してしまう。また95重量%を越える
と無機絶縁物粉末を熱硬化性樹脂で完全に結合させるこ
とができず、所定の絶縁基板1a、1b、1cを得るこ
とができなくなる。従って、前記絶縁基体1を構成する
絶縁基板1a、1b、1cはその各々の内部に含有され
る無機絶縁物粉末の量が60重量%乃至95重量%の範
囲に特定される。
The three insulating substrates 1 constituting the insulating base 1 formed by bonding the inorganic insulating powder with a thermosetting resin.
a, 1b, and 1c each have a content of the inorganic insulating powder of 60% by weight.
If it is less than 1, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, and the semiconductor element 3 generates heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. Then, a large thermal stress is generated between the two due to a difference in thermal expansion coefficient, and the large thermal stress causes the semiconductor element 3 to be separated from the insulating base 1 or the semiconductor element 3 to be cracked or chipped. I will. If it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, and 1c cannot be obtained. Therefore, the amount of the inorganic insulating powder contained in each of the insulating substrates 1a, 1b, and 1c constituting the insulating base 1 is specified in the range of 60% by weight to 95% by weight.

【0018】また前記絶縁基体1はその凹部1dの周辺
から下面にかけて例えば、銅、銀、金等の金属粉末をエ
ポキシ樹脂等の熱硬化性樹脂より結合した配線導体2が
形成されている。
The insulating substrate 1 has a wiring conductor 2 formed by bonding metal powders such as copper, silver and gold from a thermosetting resin such as an epoxy resin from the periphery to the lower surface of the concave portion 1d.

【0019】前記配線導体2は、内部に収容する半導体
素子3を外部電気回路に電気的に接続する作用をなし、
凹部1dの周辺部位には半導体素子3の各電極がボンデ
ィングワイヤ4を介して電気的に接続され、また絶縁基
体1の下面に導出する部位は外部電気回路基板に電気的
に接続される。
The wiring conductor 2 functions to electrically connect the semiconductor element 3 housed therein to an external electric circuit,
Each electrode of the semiconductor element 3 is electrically connected to a peripheral portion of the concave portion 1d via a bonding wire 4, and a portion extending to the lower surface of the insulating base 1 is electrically connected to an external electric circuit board.

【0020】前記配線導体2はそれに含有される金属粉
末の量が70重量%未満では配線導体2の導電性が悪く
なる傾向にあり、また95重量%を越えると金属粉末を
熱硬化性樹脂で強固に結合することが困難となる傾向に
ある。従って、前記金属粉末を熱硬化性樹脂で結合して
成る配線導体2は金属粉末の含有量を70重量%乃至9
5重量%の範囲としておくことが好ましい。
When the amount of the metal powder contained in the wiring conductor 2 is less than 70% by weight, the conductivity of the wiring conductor 2 tends to deteriorate, and when the amount exceeds 95% by weight, the metal powder is converted to a thermosetting resin. It tends to be difficult to bond firmly. Therefore, the wiring conductor 2 formed by bonding the metal powder with a thermosetting resin has a metal powder content of 70% by weight to 9% by weight.
It is preferable to set the range to 5% by weight.

【0021】また前記配線導体2は、その露出する表面
にニッケル、金等の耐蝕性に優れ、かつ良導電性の金属
をめっき法により1μm乃至20μmの厚みに被着させ
ておくと、配線導体2の酸化腐食を有効に防止すること
ができるとともに配線導体2とボンディングワイヤ4と
を強固に電気的接続させることができる。従って、前記
配線導体2はその露出する表面にニッケルや金等の耐蝕
性に優れ、かつ良導電性である金属をめっき法により1
μm乃至20μm厚みに被着させておくことが好まし
い。
If the wiring conductor 2 is coated with a metal having excellent corrosion resistance and good conductivity such as nickel or gold to a thickness of 1 μm to 20 μm by a plating method on the exposed surface thereof, 2 can be effectively prevented, and the wiring conductor 2 and the bonding wire 4 can be firmly electrically connected. Therefore, the wiring conductor 2 is formed by plating a metal having excellent corrosion resistance and good conductivity, such as nickel or gold, on the exposed surface by plating.
It is preferable that it is applied to a thickness of from 20 μm to 20 μm.

【0022】前記配線導体2はまた絶縁基体1の下面に
導出する部位に、外部電気回路と電気的に接続されるバ
ンプ電極2aが形成されており、該バンプ電極2aを外
部電気回路基板の配線導体に半田等の導電性接着剤を介
して接合することにより内部に収容する半導体素子3は
外部電気回路に電気的に接続されることとなる。
In the wiring conductor 2, a bump electrode 2a electrically connected to an external electric circuit is formed at a portion extending to the lower surface of the insulating base 1, and the bump electrode 2a is connected to a wiring of the external electric circuit board. The semiconductor element 3 housed inside by joining the conductor to the conductor via a conductive adhesive such as solder is electrically connected to an external electric circuit.

【0023】更に前記配線導体2と絶縁基体1を構成す
る絶縁基板1bの上面との間に図2に示すように、中間
層5が介在されており、該中間層5によって配線導体2
と絶縁基板1bとが強固に接合し、配線導体2に半導体
素子3の電極をボンディングワイヤ4を介して接続させ
る際等において、配線導体2に大きな外力が印加された
としても該外力によって配線導体2が絶縁基体1(絶縁
基板1bの上面)より剥離することはなく、これによっ
て半導体素子3の各電極を配線導体2に確実、強固に電
気的接続することが可能となる。
As shown in FIG. 2, an intermediate layer 5 is interposed between the wiring conductor 2 and the upper surface of the insulating substrate 1b constituting the insulating base 1.
When the electrode of the semiconductor element 3 is connected to the wiring conductor 2 via the bonding wire 4 when the external conductor is strongly bonded to the wiring substrate 2, even if a large external force is applied to the wiring conductor 2, the wiring force is applied by the external force. 2 does not peel off from the insulating base 1 (the upper surface of the insulating substrate 1b), whereby each electrode of the semiconductor element 3 can be securely and firmly electrically connected to the wiring conductor 2.

【0024】前記中間層5はビスマレイミド−トリアジ
ン樹脂、エポキシ樹脂、ポリイミド樹脂等の熱硬化性樹
脂から成り、絶縁基板1bの熱硬化性樹脂と配線導体2
の熱硬化性樹脂とに架橋反応、具体的には中間層5の熱
硬化性樹脂がビスマレイミド−トリアジン樹脂、絶縁基
板1b及び配線導体2の熱硬化性樹脂がエポキシ樹脂の
場合、中間層5のビスマレイミド−トリアジン樹脂の主
成分であるシアネート基に存在する第3級アミンが、絶
縁基板1b及び配線導体2のエポキシ樹脂のエポキシ基
の開環重合として働いて架橋反応を起こしたり、ビスマ
レイミド樹脂に存在する−C=Oと、エボキシ基が架橋
反応を起こすことによって配線導体2を絶縁基板1bに
強固に接合させる。
The intermediate layer 5 is made of a thermosetting resin such as a bismaleimide-triazine resin, an epoxy resin, or a polyimide resin.
Crosslinking reaction, specifically, when the thermosetting resin of the intermediate layer 5 is a bismaleimide-triazine resin and the thermosetting resin of the insulating substrate 1b and the wiring conductor 2 is an epoxy resin, The tertiary amine present in the cyanate group, which is the main component of the bismaleimide-triazine resin, acts as ring-opening polymerization of the epoxy group of the epoxy resin of the insulating substrate 1b and the wiring conductor 2 to cause a crosslinking reaction, The wiring conductor 2 is firmly joined to the insulating substrate 1b by causing a crosslinking reaction between -C = O present in the resin and the ethoxy group.

【0025】なお、前記中間層5はその厚みが10μm
未満となると配線導体2を絶縁基板1b上に強固に接合
するのが困難となり、また70μmを越えると中間層5
と配線導体2及び絶縁基板1bとの間に熱膨張係数の相
違に伴う熱応力によって剥離が発生してしまう危険性が
ある。従って、前記中間層5はその厚みを10μm乃至
70μmの範囲としておくことが好ましい。
The intermediate layer 5 has a thickness of 10 μm.
If it is less than 70 mm, it will be difficult to firmly join the wiring conductor 2 on the insulating substrate 1b.
There is a risk that separation may occur due to thermal stress due to the difference in thermal expansion coefficient between the wiring conductor 2 and the insulating substrate 1b. Therefore, it is preferable that the thickness of the intermediate layer 5 be in the range of 10 μm to 70 μm.

【0026】また、前記中間層5はその内部に酸化珪
素、酸化アルミニウム、窒化アルミニウム、炭化珪素、
チタン酸バリウム、チタン酸ストロンチウム、酸化チタ
ン等のフィラーを含有させておいてもよい。但し、その
含有量は50重量%を越えると配線導体2中の熱硬化性
樹脂及び絶縁基板1b中の熱硬化性樹脂との架橋反応性
が悪くなってしまうので50重量%以下とすることが好
ましい。
The intermediate layer 5 has silicon oxide, aluminum oxide, aluminum nitride, silicon carbide,
A filler such as barium titanate, strontium titanate, or titanium oxide may be contained. However, if the content exceeds 50% by weight, the crosslinking reactivity with the thermosetting resin in the wiring conductor 2 and the thermosetting resin in the insulating substrate 1b deteriorates. preferable.

【0027】かくして上述の配線基板よれば、絶縁基体
1の凹部1d底面に半導体素子3を接着剤を介して接着
固定するとともに半導体素子3の各電極をボンディング
ワイヤ4を介して配線導体2に電気的に接続し、しかる
後、前記絶縁基体1の上面に蓋体6を封止剤を介して接
合させ、絶縁基体11と蓋体6とから成る容器内部に半
導体素子3を気密に収容することによって製品としての
半導体装置となる。
Thus, according to the above-described wiring board, the semiconductor element 3 is bonded and fixed to the bottom surface of the concave portion 1d of the insulating base 1 with an adhesive, and each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 through the bonding wire 4. After that, the lid 6 is bonded to the upper surface of the insulating base 1 via a sealing agent, and the semiconductor element 3 is hermetically accommodated in a container including the insulating base 11 and the lid 6. Thus, a semiconductor device as a product is obtained.

【0028】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図3に基づき説明
する。まず図3(a)に示すように、3枚の前駆体シー
ト11a、11b、11cを準備する。
Next, a method of manufacturing a wiring board used in the package for housing a semiconductor element will be described with reference to FIG. First, as shown in FIG. 3A, three precursor sheets 11a, 11b, and 11c are prepared.

【0029】前記3枚の前駆体シート11a、11b、
11cは酸化珪素、酸化アルミニウム、窒化アルミニウ
ム、炭化珪素、チタン酸バリウム、チタン酸ストロンチ
ウム、酸化チタン等の無機絶縁物粉末をエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体で結合することによって形成されてお
り、例えば粒径が0.1〜100μmの酸化珪素粉末
に、ビスフェノールA型エポキシ樹脂、ノボラック型エ
ポキシ樹脂、グリシジルエステル型エポキシ樹脂等のエ
ポキシ樹脂、及びアミン系硬化剤、イミダゾール系硬化
剤、酸無水物系硬化剤等の硬化剤を添加混合してペース
ト状となし、しかる後、このペーストをシート状になす
とともに約25〜100℃の温度で1〜60分間加熱
し、半硬化させことによって製作される。
The three precursor sheets 11a, 11b,
11c is an epoxy resin made of an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, and titanium oxide;
Polyimide resin, formed by bonding with a thermosetting resin precursor such as polyphenylene ether resin, for example, a silicon oxide powder having a particle size of 0.1 to 100 μm, bisphenol A type epoxy resin, novolak type epoxy resin, An epoxy resin such as a glycidyl ester type epoxy resin and a curing agent such as an amine curing agent, an imidazole curing agent, and an acid anhydride curing agent are added and mixed to form a paste, and then the paste is formed into a sheet. It is manufactured by heating and semi-curing at a temperature of about 25 to 100 ° C. for 1 to 60 minutes.

【0030】次に図3(b)に示すように、前記前駆体
シート11bの上面に中間層となる樹脂ペースト膜15
を形成する。
Next, as shown in FIG. 3B, a resin paste film 15 serving as an intermediate layer is formed on the upper surface of the precursor sheet 11b.
To form

【0031】前記樹脂ペースト膜15はエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体から成り、前記前駆体シート11bの上
面に10μm〜70μmの厚みに被着させることよって
前駆体シート11bの上面に形成される。
The resin paste film 15 is made of epoxy resin,
It is formed of a thermosetting resin precursor such as a polyimide resin and a polyphenylene ether resin, and is formed on the upper surface of the precursor sheet 11b by being applied to the upper surface of the precursor sheet 11b to a thickness of 10 μm to 70 μm.

【0032】前記樹脂ペースト膜15の前駆体シート1
1bの上面への形成は前駆体シート11bの上面に熱硬
化性樹脂前駆体から成る樹脂ペーストを塗布するととも
にこれを約25〜100℃の温度で1〜60分間熱処理
し、樹脂ペースト中の熱硬化性樹脂を半硬化させること
によって行われる。
The precursor sheet 1 for the resin paste film 15
1b is formed on the upper surface of the precursor sheet 11b by applying a resin paste composed of a thermosetting resin precursor and heat-treating the resin paste at a temperature of about 25 to 100 ° C. for 1 to 60 minutes. This is performed by semi-curing the curable resin.

【0033】次に図3(c)に示すように、前記3枚の
前駆体シート11a、11b、11cのうち2枚の前駆
体シート11a、11bに半導体素子3を収容する凹部
1dとなる開口A、A’を、2枚の前駆体シート11
b、11cに配線導体2を引き回すための貫通孔B、
B’を各々形成する。
Next, as shown in FIG. 3 (c), two precursor sheets 11a, 11b among the three precursor sheets 11a, 11b, 11c form openings 1d for accommodating the semiconductor elements 3 therein. A, A 'are replaced with two precursor sheets 11
b, a through hole B for routing the wiring conductor 2 to 11c,
B ′ are formed.

【0034】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。
The openings A, A 'and the through holes B, B' are formed by subjecting the precursor sheets 11a, 11b, 11c to a conventionally well-known punching method to form the precursor sheets 11a, 11b, 11c.
c is formed by piercing a hole of a predetermined shape in each of c.

【0035】次に図3(d)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布するとともに
これを約25〜100℃の温度で1〜60分間加熱し、
半硬化させる。
Next, as shown in FIG. 3D, a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B 'by a conventionally known screen printing method. Print and apply in a predetermined pattern and heat it at a temperature of about 25-100 ° C for 1-60 minutes,
Semi-cured.

【0036】前記金属ペースト12としては、例えば、
粒径が0.1〜20μm程度の銅等の粉末にビスフェノ
ールA型エポキシ樹脂、ノボラック型エポキシ樹脂、グ
リシジルエステル型エポキシ樹脂等のエポキシ樹脂、及
びアミン系硬化剤、イミダゾール系硬化剤、酸無水物系
硬化剤等の硬化剤を添加混合しペースト状となしたもの
が使用される。
As the metal paste 12, for example,
An epoxy resin such as a bisphenol A type epoxy resin, a novolak type epoxy resin, a glycidyl ester type epoxy resin, and an amine-based curing agent, an imidazole-based curing agent, and an acid anhydride are added to a powder of copper or the like having a particle size of about 0.1 to 20 μm. A paste obtained by adding and mixing a curing agent such as a system curing agent is used.

【0037】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層し、上下より一定の圧
力(5〜50Kgf/cm2 )で押圧しつつ約80〜3
00℃の温度を10秒〜24時間印加し、前記樹脂ペー
スト膜15の熱硬化性樹脂と前記前駆体シート11bの
熱硬化性樹脂及び金属ペースト12の熱硬化性樹脂を架
橋反応させるとともに前記前駆体シート11a、11
b、11c、樹脂ペースト膜15及び所定パターンに印
刷塗布された金属ペースト12を完全に熱硬化させるこ
とによって図1に示すような絶縁基体1に配線導体2を
被着させた配線基板が完成する。この場合、前記前駆体
シート11a、11b、11c、樹脂ペースト膜15及
び金属ペースト12は熱硬化時に収縮することは殆どな
く、従って、得られる配線基板に変形や寸法のばらつき
が発生することはなく、これによって半導体素子と配線
導体とを正確に接続することが可能となる。
Finally, the three precursor sheets 11
a, 11b, and 11c are vertically laminated and pressed at a constant pressure (5 to 50 Kgf / cm 2 ) from the upper and lower sides to about 80 to 3
A temperature of 00 ° C. is applied for 10 seconds to 24 hours to cause a crosslinking reaction between the thermosetting resin of the resin paste film 15, the thermosetting resin of the precursor sheet 11 b and the thermosetting resin of the metal paste 12, and Body sheets 11a, 11
By completely thermosetting the b, 11c, the resin paste film 15, and the metal paste 12 printed and applied in a predetermined pattern, a wiring board in which the wiring conductor 2 is adhered to the insulating base 1 as shown in FIG. 1 is completed. . In this case, the precursor sheets 11a, 11b, 11c, the resin paste film 15, and the metal paste 12 hardly shrink during thermosetting, and therefore, there is no deformation or dimensional variation in the obtained wiring board. Thus, the semiconductor element and the wiring conductor can be accurately connected.

【0038】また前記3枚の前駆体シート11a、11
b、11cを上下より5〜50Kgf/cm2 で押圧す
るのは樹脂ペースト膜15の熱硬化性樹脂と金属ペース
ト12及び前駆体シート11bの熱硬化性樹脂との架橋
反応を促進するとともに各々の密着性を高めるためであ
り、押圧力が5Kgf/cm2 未満ではその目的が充分
に達成されず、また50Kgf/cm2 を越えると得ら
れる絶縁基体が大きく変形し寸法精度が低下することか
ら5〜50Kgf/cm2 の範囲としておくことが好ま
しい。
The three precursor sheets 11a, 11
The pressing of b and 11c from above and below at 5 to 50 kgf / cm 2 promotes the crosslinking reaction between the thermosetting resin of the resin paste film 15 and the thermosetting resin of the metal paste 12 and the precursor sheet 11b, and at the same time, When the pressing force is less than 5 kgf / cm 2 , the purpose is not sufficiently achieved. When the pressing force exceeds 50 kgf / cm 2 , the obtained insulating substrate is greatly deformed and the dimensional accuracy is reduced. It is preferable to set the range to 50 kgf / cm 2 .

【0039】なお、本発明は上述の実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲であれば
種々の変更は可能であり、例えば上述の実施例では、本
発明の配線基板を半導体素子を収容する半導体素子収納
用パッケージに適用した場合を例に採って説明したが、
これを構成集積回路等に用いられる配線基板としても適
用できることはいうまでもない。
It should be noted that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the spirit of the present invention. Although the case where the substrate is applied to a semiconductor element housing package for housing a semiconductor element has been described as an example,
Needless to say, this can be applied to a wiring board used for a constituent integrated circuit or the like.

【0040】更に上述の実施例では、3枚の前駆体シー
トを積層することによって配線基板を製作したが、一枚
や二枚、或いは四枚以上の絶縁基板を積層することによ
って形成してもよい。
Further, in the above embodiment, the wiring substrate is manufactured by laminating three precursor sheets. However, the wiring substrate may be formed by laminating one, two, or four or more insulating substrates. Good.

【0041】[0041]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作ラインの一部とが激しく
衝突したとしても絶縁基体に欠けや割れ、クラック等を
発生することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device are manufactured. Even if a part of the line collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0042】また本発明の配線基板によれば、絶縁基体
と配線導体との間に熱硬化性樹脂から成る中間層を介在
させるととも該中間層の熱硬化性樹脂を絶縁基体及び配
線導体の各々の熱硬化性樹脂に架橋反応により接合させ
たことから絶縁基体に対する配線導体の接合強度が極め
て強いものとなり、その結果、配線導体に半導体素子の
電極を接続する際等において配線導体に大きな外力が印
加されても配線導体が絶縁基体より剥離することはな
く、半導体素子等の電極を配線導体に確実、強固に電気
的接続することが可能となる。
Further, according to the wiring board of the present invention, an intermediate layer made of a thermosetting resin is interposed between the insulating base and the wiring conductor, and the thermosetting resin of the intermediate layer is formed on the insulating base and the wiring conductor. The bonding strength of the wiring conductor to the insulating substrate becomes extremely strong because the thermosetting resin is bonded to each thermosetting resin by a cross-linking reaction. As a result, a large external force is applied to the wiring conductor when the electrode of the semiconductor element is connected to the wiring conductor. Is applied, the wiring conductor does not peel off from the insulating base, and the electrodes of the semiconductor element and the like can be securely and firmly electrically connected to the wiring conductor.

【0043】更に本発明の配線基板は、熱硬化性樹脂前
駆体と無機絶縁物粉末とを混合してなる前駆体シートを
準備する工程と、前記前駆体シートの一面に熱硬化性樹
脂前駆体から成る樹脂ペーストを塗布する工程と、前記
塗布された樹脂ペースト上に熱硬化性樹脂前駆体と金属
粉末とを混合してなる金属ペーストを所定パターンに塗
布する工程と、前記前駆体シート、樹脂ペースト及び金
属ペーストに圧力を印加しながら加熱処理し、熱樹脂ペ
ーストの熱硬化性樹脂と前駆体シート及び金属ペースト
の熱硬化性樹脂との間に架橋反応をおこさせつつ熱硬化
させる工程とで製作され、前駆体シート、樹脂ペース
ト、金属ペーストの熱硬化性樹脂前駆体は熱硬化時に殆
ど収縮しないことから不均一な収縮による変形や寸法の
ばらつきが発生することもない。
Further, the wiring board of the present invention comprises a step of preparing a precursor sheet obtained by mixing a thermosetting resin precursor and an inorganic insulating powder; and a step of forming a thermosetting resin precursor on one surface of the precursor sheet. A step of applying a resin paste comprising: a step of applying a metal paste obtained by mixing a thermosetting resin precursor and a metal powder on the applied resin paste in a predetermined pattern; and Heat-treating while applying pressure to the paste and the metal paste, and performing a thermosetting while causing a cross-linking reaction between the thermosetting resin of the thermo-resin paste and the thermosetting resin of the precursor sheet and the metal paste. Manufactured, thermosetting resin precursors of precursor sheets, resin pastes, and metal pastes hardly shrink during thermosetting, causing deformation and dimensional variations due to uneven shrinkage. And no.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a sectional view showing an embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.

【図2】図1に示す配線基板の要部拡大断面図である。FIG. 2 is an enlarged sectional view of a main part of the wiring board shown in FIG.

【図3】(a)乃至(d)は本発明の配線基板の製造方
法を説明するための工程毎の断面図である。
FIGS. 3A to 3D are cross-sectional views for explaining steps of a method for manufacturing a wiring board according to the present invention.

【符号の説明】 1・・・・・・・・・・絶縁基体 1a、1b、1c・・・絶縁基板 2・・・・・・・・・・配線導体 5・・・・・・・・・・中間層 11a、11b、11c・・前駆体シート 12・・・・・・・・・・・金属ペースト 15・・・・・・・・・・・樹脂ペースト膜[Description of Signs] 1 ... Insulating substrate 1a, 1b, 1c ... Insulating substrate 2 ... Wiring conductor 5 ... ..Intermediate layers 11a, 11b, 11c..Precursor sheet 12 ... Metal paste 15 ... Resin paste film

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】60重量%乃至95重量%の無機絶縁物粉
末と5重量%乃至40重量%の熱硬化性樹脂とからな
り、前記無機絶縁物粉末を前記熱硬化性樹脂により結合
した少なくとも一枚の絶縁基板から成る絶縁基体に、金
属粉末を熱硬化性樹脂により結合した配線導体を被着さ
せて成る配線基板であって、前記絶縁基体と配線導体と
の間に、熱硬化性樹脂からなる中間層を介在させるとと
もに、該中間層の熱硬化性樹脂を絶縁基体及び配線導体
の各々の熱硬化性樹脂に架橋反応により接合させたこと
を特徴とする配線基板。
At least one of an inorganic insulating powder of 60% by weight to 95% by weight and a thermosetting resin of 5% to 40% by weight, wherein the inorganic insulating powder is bonded by the thermosetting resin. A wiring substrate, comprising a wiring conductor obtained by bonding metal powder with a thermosetting resin to an insulating base made of a plurality of insulating substrates, wherein a thermosetting resin is provided between the insulating base and the wiring conductor. A wiring substrate, wherein an intermediate layer is interposed and the thermosetting resin of the intermediate layer is joined to each thermosetting resin of the insulating base and the wiring conductor by a crosslinking reaction.
【請求項2】前記中間層の厚みが10μm乃至70μm
であることを特徴とする請求項1に記載の配線基板。
2. The intermediate layer has a thickness of 10 μm to 70 μm.
The wiring board according to claim 1, wherein
【請求項3】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合してなる前駆体シートを準備する工程と、前記前駆
体シートの一面に熱硬化性樹脂前駆体から成る樹脂ペー
ストを塗布する工程と、前記塗布された樹脂ペースト上
に熱硬化性樹脂前駆体と金属粉末とを混合してなる金属
ペーストを所定パターンに塗布する工程と、前記前駆体
シート、樹脂ペースト及び金属ペーストに圧力を印加し
ながら加熱処理し、熱樹脂ペーストの熱硬化性樹脂と前
駆体シート及び金属ペーストの熱硬化性樹脂との間に架
橋反応をおこさせつつ熱硬化させる工程と、から成る配
線基板の製造方法。
3. A step of preparing a precursor sheet obtained by mixing a thermosetting resin precursor and an inorganic insulating powder, and applying a resin paste made of a thermosetting resin precursor to one surface of the precursor sheet. And applying a metal paste formed by mixing a thermosetting resin precursor and a metal powder on the applied resin paste in a predetermined pattern, and applying a pressure to the precursor sheet, the resin paste and the metal paste. Heat-treating while applying a thermosetting resin, and thermosetting while causing a crosslinking reaction between the thermosetting resin of the thermo-resin paste and the thermosetting resin of the precursor sheet and the metal paste. Method.
JP30815896A 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same Expired - Fee Related JP3393769B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30815896A JP3393769B2 (en) 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30815896A JP3393769B2 (en) 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same

Publications (2)

Publication Number Publication Date
JPH10150248A true JPH10150248A (en) 1998-06-02
JP3393769B2 JP3393769B2 (en) 2003-04-07

Family

ID=17977604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30815896A Expired - Fee Related JP3393769B2 (en) 1996-11-19 1996-11-19 Wiring board and method of manufacturing the same

Country Status (1)

Country Link
JP (1) JP3393769B2 (en)

Also Published As

Publication number Publication date
JP3393769B2 (en) 2003-04-07

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