JPH10142401A - Low-reflectivity transparent conductive film as well as its production and display device - Google Patents

Low-reflectivity transparent conductive film as well as its production and display device

Info

Publication number
JPH10142401A
JPH10142401A JP8295514A JP29551496A JPH10142401A JP H10142401 A JPH10142401 A JP H10142401A JP 8295514 A JP8295514 A JP 8295514A JP 29551496 A JP29551496 A JP 29551496A JP H10142401 A JPH10142401 A JP H10142401A
Authority
JP
Japan
Prior art keywords
conductive film
transparent conductive
film
low
reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8295514A
Other languages
Japanese (ja)
Inventor
Naoki Takamiya
直樹 高宮
Kazumichi Mori
一倫 森
Masumi Ishizuka
ます美 石塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Osaka Cement Co Ltd
Original Assignee
Sumitomo Osaka Cement Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Osaka Cement Co Ltd filed Critical Sumitomo Osaka Cement Co Ltd
Priority to JP8295514A priority Critical patent/JPH10142401A/en
Publication of JPH10142401A publication Critical patent/JPH10142401A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To obtain a low-reflectivity transparent conductive film which has extremely light transparency, is lessened in reflection, has the lessened color irregularity of reflected light and has excellent antistatic electromagnetic shielding properties by adopting the two-layered constitution composed of a transparent conductive film having a specific film thickness and a transparent thin film having the refractive index different from the refractive index of this conductive film. SOLUTION: This low-reflectivity transparent conductive film 4 is formed on the surface of the face panel 3 of a cathode ray tube 5. The low-reflectivity transparent conductive film 4 is constituted by forming the transparent thin film 2 having the refractive index different from the refractive index of the transparent conductive film 1, which contains silver as metal and is specified in its film thickness (h) to a range within >=5 to <50nm, on the upper layer of the transparent conductive film 1. The film thickness H of the lowreflectivity transparent conductive film 4 made of such two-layered constitution is specified to <100nm. The low-reflectivity transparent conductive film 4 is produced by applying a conductive coating liquid contg. silver particulates and ethylene glycol monobutylether on the face panel 3 and drying the coating to form the transparent conductive film 1, then forming the transparent thin film 2 thereon.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、光透過性に優れ、
反射が軽減され、反射光の色むらが少なく、しかも優れ
た帯電防止性・電磁波遮蔽性を有する低反射透明導電膜
とその製造方法、およびこの低反射透明導電膜がフェー
スパネルの前面に形成された表示装置に関する。
TECHNICAL FIELD The present invention is excellent in light transmittance,
A low-reflection transparent conductive film having reduced reflection, less color unevenness of reflected light, and excellent antistatic properties and electromagnetic wave shielding properties, a method of manufacturing the same, and the low-reflection transparent conductive film are formed on the front surface of the face panel. Display device.

【0002】[0002]

【従来の技術】プラズマディスプレイ、液晶表示装置、
陰極線管などの表示装置、特にTVブラウン管やコンピ
ュータのディスプレイなどとして用いられている陰極線
管にあっては、フェースパネル面に発生する静電気によ
り埃が付着して視認性が低下する他、電磁波を輻射して
周囲の機器などに影響を及ぼす惧れがある。
2. Description of the Related Art Plasma displays, liquid crystal displays,
In a display device such as a cathode ray tube, particularly a cathode ray tube used as a TV cathode ray tube or a display of a computer, dust adheres to the face panel surface due to static electricity, which reduces visibility and radiates electromagnetic waves. It may affect surrounding devices.

【0003】そこで最近、帯電防止、電磁波遮蔽および
反射防止を目的として、平均粒径2〜200nmの金属
微粒子からなる透明導電性微粒子層と、この微粒子層の
上層に形成されかつこの微粒子層より屈折率が低い透明
被膜とから構成された透明導電性被膜を陰極線管のフェ
ースパネル上に成膜することが提案されている(特開平
8−77832号公報)。この提案によれば、透明導電
性被膜が優れた反射防止効果を発揮するためには、導電
性微粒子層の膜厚を50nm〜200nmの範囲内とす
ることが推奨されている。
Recently, for the purpose of preventing static electricity, shielding electromagnetic waves, and preventing reflection, a transparent conductive fine particle layer made of metal fine particles having an average particle size of 2 to 200 nm, and a layer formed on the fine particle layer and refracted by the fine particle layer. It has been proposed to form a transparent conductive film composed of a transparent film having a low rate on a face panel of a cathode ray tube (Japanese Patent Application Laid-Open No. 8-77832). According to this proposal, it is recommended that the thickness of the conductive fine particle layer be in the range of 50 nm to 200 nm in order for the transparent conductive film to exhibit an excellent antireflection effect.

【0004】[0004]

【発明が解決しようとする課題】しかし、前記の提案に
従う透明導電性被膜は透明性(光透過性)が悪く、例え
ば陰極線管のフェースパネルなどに施すと、透過画像が
極端に暗くなって実用に耐えないことがわかった。ま
た、透明性を改善するためには膜厚を薄くすることが考
えられるので、導電性微粒子層を膜厚が50nm未満と
なるように成膜しようとすると、均一な厚みの成膜がで
きず膜厚むらを生じ、この膜厚むらに起因して反射光の
色むらが発生し、透過画像の視認性が低下すると共に、
外観も悪化するという問題があった。
However, the transparent conductive film according to the above proposal has poor transparency (light transmission). For example, when applied to a face panel of a cathode ray tube, a transmitted image becomes extremely dark, so that it is not practical. Turned out to be unbearable. Further, since it is conceivable to reduce the film thickness in order to improve the transparency, if the conductive fine particle layer is formed to have a film thickness of less than 50 nm, a film having a uniform thickness cannot be formed. The thickness unevenness occurs, and the unevenness of the thickness of the reflected light occurs due to the unevenness of the thickness, and the visibility of the transmitted image is reduced.
There was a problem that the appearance also deteriorated.

【0005】本発明は、上記の課題を解決するためにな
されたものであって、従ってその目的は、光透過性に優
れ、反射が軽減され、反射光の色むらが少なく、しかも
優れた帯電防止性・電磁波遮蔽性を有する低反射透明導
電膜とその製造方法、およびこの低反射透明導電膜がフ
ェースパネルの前面に形成された表示装置を提供するこ
とにある。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and has as its object to provide excellent light transmission, reduced reflection, less color unevenness of reflected light, and excellent charging. It is an object of the present invention to provide a low-reflection transparent conductive film having an anti-electromagnetic wave shielding property and a method of manufacturing the same, and a display device in which the low-reflection transparent conductive film is formed on the front surface of a face panel.

【0006】[0006]

【課題を解決するための手段】上記の課題を解決するた
めに本発明は、金属を含み膜厚が5nm以上50nm未
満の範囲内である透明導電膜の上層および/または下層
に、この透明導電膜の屈折率とは異なる屈折率を有する
透明薄膜が1層以上形成されてなる低反射透明導電膜を
提供する。前記金属の少なくとも1種は銀であることが
好ましい。また前記の低反射透明導電膜は、透明導電膜
とその上層に形成された透明薄膜との2層構成とされ、
この低反射透明導電膜の膜厚が100nm未満とされて
なるものであることが好ましい。
In order to solve the above-mentioned problems, the present invention relates to a method of forming a transparent conductive film on an upper layer and / or a lower layer of a transparent conductive film containing a metal and having a thickness in a range of 5 nm or more and less than 50 nm. Provided is a low-reflection transparent conductive film in which one or more transparent thin films having a refractive index different from the refractive index of the film are formed. Preferably, at least one of the metals is silver. The low-reflection transparent conductive film has a two-layer structure of a transparent conductive film and a transparent thin film formed thereon.
It is preferable that the film thickness of the low reflection transparent conductive film is less than 100 nm.

【0007】本発明はまた、前記の低反射透明導電膜を
製造するに際して、少なくとも金属微粒子とグリコール
エーテルとを含む導電性塗布液を用いて前記の透明導電
膜を形成する低反射透明導電膜の製造方法を提供する。
更に本発明は、前記のいずれかに記載の低反射透明導電
膜がフェースパネルの前面に形成されてなる表示装置を
提供する。
[0007] The present invention also provides a low-reflection transparent conductive film, which is formed by using a conductive coating solution containing at least metal fine particles and glycol ether when producing the low-reflection transparent conductive film. A manufacturing method is provided.
Further, the present invention provides a display device in which the low-reflection transparent conductive film according to any of the above is formed on the front surface of a face panel.

【0008】[0008]

【発明の実施の形態】以下、本発明の実施の形態を詳し
く説明する。図1に、本発明の低反射透明導電膜および
陰極線管の一実施形態を示す。図1において、この低反
射透明導電膜4は、陰極線管5のフェースパネル3の表
面に形成されている。この低反射透明導電膜4は、金属
として銀を含み、かつ膜厚hが5nm以上50nm未満
の範囲内とされた透明導電膜1の上層に、この透明導電
膜1の屈折率とは異なる屈折率を有する透明薄膜2が形
成され、この透明導電膜1と透明薄膜2との2層構成と
された低反射透明導電膜4の膜厚Hが100nm未満と
されている。ここで一般に、2層またはそれ以上に積層
された膜のフェースパネル3に近い側の層を相対的に下
層、遠い側の層を上層と称する。
Embodiments of the present invention will be described below in detail. FIG. 1 shows an embodiment of the low reflection transparent conductive film and the cathode ray tube of the present invention. 1, the low-reflection transparent conductive film 4 is formed on the surface of the face panel 3 of the cathode ray tube 5. The low-reflection transparent conductive film 4 contains silver as a metal and has a refractive index different from the refractive index of the transparent conductive film 1 on an upper layer of the transparent conductive film 1 having a thickness h in a range of 5 nm or more and less than 50 nm. The transparent thin film 2 having a low refractive index is formed, and the film thickness H of the low-reflection transparent conductive film 4 having a two-layer structure of the transparent conductive film 1 and the transparent thin film 2 is less than 100 nm. Here, in general, a layer closer to the face panel 3 of the two or more laminated films is referred to as a relatively lower layer, and a layer farther away is referred to as an upper layer.

【0009】この低反射透明導電膜4は、透明導電膜1
が金属(銀)を含んでいるので、その膜厚hが5nm以
上50nm未満の範囲内であっても十分な帯電防止性
能、電磁波遮蔽性能を発揮するに十分な導電性を有して
おり、かつ透明性が高く、フェースパネル3からの透過
画像が明るく、実用的に十分な視認性を有している。ま
た、この低反射透明導電膜4は、透明導電膜1の屈折率
とは異なる屈折率を有する透明薄膜2が上層に形成され
ているので、外光反射が防止されている。
The low-reflection transparent conductive film 4 is
Contains metal (silver), so that even if the film thickness h is in the range of 5 nm or more and less than 50 nm, it has sufficient antistatic performance and sufficient conductivity to exhibit electromagnetic wave shielding performance, In addition, the transparency is high, the transmitted image from the face panel 3 is bright, and it has practically sufficient visibility. Further, in the low-reflection transparent conductive film 4, reflection of external light is prevented because the transparent thin film 2 having a refractive index different from that of the transparent conductive film 1 is formed in an upper layer.

【0010】この低反射透明導電膜4は、銀微粒子とグ
リコールエーテルの1種であるエチレングリコールモノ
ブチルエーテル(ブチルセロソルブ)とを含む導電性塗
布液をフェースパネル3上に塗布し乾燥して、膜厚が5
nm以上50nm未満の範囲内である透明導電膜1を形
成し、次いでこの上に透明薄膜2を形成する方法により
製造されている。この製造方法を用いて製造された低反
射透明導電膜4は、透明導電膜1の膜厚が50nm未満
の薄さであっても均一であり、従って膜厚むらに起因す
る反射光の色むらが防止され、透過画像の視認性が更に
改善されると共に、フェースパネルの外観が良好な陰極
線管5が得られる。
The low-reflection transparent conductive film 4 is coated with a conductive coating solution containing silver fine particles and ethylene glycol monobutyl ether (butyl cellosolve), which is a kind of glycol ether, on the face panel 3 and dried to form a film. Is 5
The transparent conductive film 1 having a thickness of not less than 50 nm and less than 50 nm is formed, and then a transparent thin film 2 is formed thereon. The low-reflection transparent conductive film 4 manufactured using this manufacturing method is uniform even if the film thickness of the transparent conductive film 1 is less than 50 nm, and therefore, the color unevenness of the reflected light due to the uneven film thickness. Is prevented, the visibility of the transmitted image is further improved, and the cathode ray tube 5 with a good appearance of the face panel is obtained.

【0011】以下、本発明を構成する各要素について詳
しく説明する。前記の透明導電膜1は基本成分として金
属を含んでいる。この透明導電膜1における金属の存在
形態は、それぞれが独立した金属微粒子の形態であって
もよく、一様に連続した金属薄膜の形態であってもよ
く、金属微粒子が互いに融着して連結した薄膜の形態で
あってもよく、更にこれらの金属薄膜と金属微粒子とが
混在した形態であってもよい。
Hereinafter, each element constituting the present invention will be described in detail. The transparent conductive film 1 contains a metal as a basic component. The metal present in the transparent conductive film 1 may be in the form of independent metal fine particles, or may be in the form of a uniformly continuous metal thin film. It may be in the form of a thin film formed, or in a form in which these metal thin films and metal fine particles are mixed.

【0012】この透明導電膜1の膜厚は5nm以上50
nm未満の範囲内とされる。本発明者らは、金属を含む
透明導電膜1の膜厚hを5nm以上50nm未満の範囲
内とすることによって、低反射透明導電膜4が実用的に
十分な帯電防止性能、電磁波遮蔽性能を備えながら、し
かも良好な透明性を獲得し得ることを見いだし本発明に
到達した。膜厚hが5nm未満では十分な電磁波遮蔽性
能が得難くなる他、そもそも均一な膜形成が困難とな
り、一方、膜厚hが50nm以上では、導電性は問題な
いが透明性が低下し、透過画像の視認性が悪化する。す
なわち、金属を含む透明導電膜1の膜厚hを5nm以上
50nm未満の範囲内とするとき、電磁波遮蔽性能と透
明性との最適なバランスが得られる。特に、この範囲内
で膜厚が均一に調整されていれば、反射光の相互干渉に
よる色むらが解消され、視認性と外観が更に改善される
ことがわかった。
The thickness of the transparent conductive film 1 is 5 nm or more and 50
within the range of less than nm. The present inventors have proposed that the low-reflection transparent conductive film 4 has practically sufficient antistatic performance and electromagnetic wave shielding performance by setting the thickness h of the transparent conductive film 1 containing a metal to a range of 5 nm or more and less than 50 nm. The present inventors have found that it is possible to obtain good transparency while preparing, and arrived at the present invention. If the thickness h is less than 5 nm, it is difficult to obtain a sufficient electromagnetic wave shielding performance, and it is difficult to form a uniform film in the first place. The visibility of the image deteriorates. That is, when the thickness h of the metal-containing transparent conductive film 1 is in the range of 5 nm or more and less than 50 nm, an optimal balance between electromagnetic wave shielding performance and transparency can be obtained. In particular, it was found that if the film thickness was adjusted uniformly within this range, color unevenness due to mutual interference of reflected light was eliminated, and visibility and appearance were further improved.

【0013】透明導電膜1の形成に用いることができる
金属は、特に限定されるものではないが、透明性を保持
しながら良好な導電性を有する好ましい金属の例として
は、銀、金、銅、白金、パラジウム、ルテニウム、ロジ
ウム、ニッケル、またはこれらの任意の2種以上を組み
合わせた混合物を挙げることができる。
The metal that can be used for forming the transparent conductive film 1 is not particularly limited. Examples of preferable metal having good conductivity while maintaining transparency include silver, gold, and copper. , Platinum, palladium, ruthenium, rhodium, nickel, or a mixture of any two or more thereof.

【0014】用いる金属の内の少なくとも1種または全
部が銀であることが好ましい。銀はコロイド状分散液と
して比較的容易かつ安価に入手可能であり、導電性が高
く帯電防止性・電磁波遮蔽性に優れ、しかも透明性の高
い導電膜が形成できるからである。また銀と組み合わせ
て例えば金を用いることも好ましい。銀は、可視光帯域
の短波長側に特有の吸収を有し、透過画像が黄色味に着
色して見える傾向があるが、これに金を比較的少量配合
することによって、可視光帯域における透過スペクトル
の波形を平坦化し、透過画像の色相を補正する効果があ
る。
Preferably, at least one or all of the metals used are silver. This is because silver is relatively easily and inexpensively available as a colloidal dispersion liquid, and a conductive film having high conductivity, excellent antistatic properties and electromagnetic wave shielding properties, and having high transparency can be formed. It is also preferable to use, for example, gold in combination with silver. Silver has a characteristic absorption on the short wavelength side of the visible light band, and the transmission image tends to appear yellowish. This has the effect of flattening the spectrum waveform and correcting the hue of the transmitted image.

【0015】透明導電膜1は、前記の金属を10重量%
以上含有していることが好ましい。透明導電膜1は、帯
電防止効果ばかりでなく電磁波遮蔽効果も求められてい
るので、遮蔽すべき電磁波の周波数に対応した膜特性の
設計が必要となる。一般に、電磁波遮蔽効果は、下記の
式1によって表される。
The transparent conductive film 1 contains 10% by weight of the above metal.
It is preferable to contain the above. Since the transparent conductive film 1 is required to have not only an antistatic effect but also an electromagnetic wave shielding effect, it is necessary to design a film characteristic corresponding to the frequency of the electromagnetic wave to be shielded. Generally, the electromagnetic wave shielding effect is represented by the following Equation 1.

【0016】式1: S(dB)=50+10log(1/ρf)+1.7t
√(f/ρ) 式中、S(dB)は電磁波遮蔽効果、ρ(Ω・cm)は
導電膜の体積固有抵抗、f(MHz)は電磁波周波数、
t(cm)は導電膜の膜厚を表す。
Equation 1: S (dB) = 50 + 10log (1 / ρf) + 1.7t
√ (f / ρ) where S (dB) is an electromagnetic wave shielding effect, ρ (Ω · cm) is the volume resistivity of the conductive film, f (MHz) is the electromagnetic wave frequency,
t (cm) represents the thickness of the conductive film.

【0017】透明導電膜1の膜厚tは、前記のように5
nm以上50nm未満とされ、きわめて薄いのでtを含
む項を無視すれば、式1は近似的に下記の式2で表すこ
とができる。式2: S(dB)=50+10log(1/ρf)
The thickness t of the transparent conductive film 1 is 5 as described above.
Equation 1 can be approximately expressed by Equation 2 below, ignoring the term including t since it is set to be not less than 50 nm and less than 50 nm. Formula 2: S (dB) = 50 + 10log (1 / ρf)

【0018】すなわち、透明導電膜1の体積固有抵抗値
(ρ)は、できるだけ小さいほうが広範な周波数の電磁
波に対してより大きい遮蔽効果を現すことがわかる。一
般に、電磁波遮蔽効果は、S>30dBであれば有効、
更にS>60dBであれば優良とみなされる。規制対象
となる電磁波の周波数は一般に10kHz〜1000M
Hzの範囲とされるので、50nm未満の膜厚で良好な
電磁波遮蔽効果を得るには、透明導電膜1の体積固有抵
抗値(ρ)を103 Ω・cm以下とすることが望まし
い。この値は、透明導電膜1中の金属含有量を10重量
%以上とすることによって達成することができる。
That is, it can be seen that the smaller the volume specific resistance value (ρ) of the transparent conductive film 1 is, the larger the shielding effect against electromagnetic waves of a wide range of frequencies is. Generally, the electromagnetic wave shielding effect is effective if S> 30 dB,
Further, if S> 60 dB, it is regarded as excellent. The frequency of electromagnetic waves to be regulated is generally 10 kHz to 1000 M
In order to obtain a good electromagnetic wave shielding effect with a film thickness of less than 50 nm, it is desirable that the volume resistivity (ρ) of the transparent conductive film 1 be 10 3 Ω · cm or less. This value can be achieved by setting the metal content in the transparent conductive film 1 to 10% by weight or more.

【0019】この透明導電膜1は、前記の金属の他に、
透明性を更に向上させるなどのために、ケイ素、アルミ
ニウム、ジルコニウム、セリウム、チタン、イットリウ
ム、亜鉛、マグネシウム、インジウム、錫、アンチモ
ン、ガリウムなどの酸化物、複合酸化物、または窒化
物、特にインジウムや錫の酸化物、複合酸化物または窒
化物を主成分とする無機微粒子を含んでいてもよい。こ
れらの無機微粒子の粒径は、透明導電膜1の膜厚を50
nm未満とする必要から50nm未満とするべきであ
る。
This transparent conductive film 1 is made of, in addition to the above metals,
For further improving the transparency, such as silicon, aluminum, zirconium, cerium, titanium, yttrium, zinc, magnesium, indium, tin, antimony, oxides such as gallium, composite oxides, or nitrides, especially indium and It may contain inorganic fine particles containing tin oxide, composite oxide or nitride as a main component. The particle size of these inorganic fine particles is determined by setting the thickness of the transparent conductive film 1 to 50.
It should be less than 50 nm because it is necessary to be less than 50 nm.

【0020】透明導電膜1はまた、前記の金属の他に、
膜強度を向上させるためにバインダー成分を含んでいて
もよい。用いることができるバインダー成分の例として
は、例えばポリエステル樹脂、アクリル樹脂、エポキシ
樹脂、メラミン樹脂、ウレタン樹脂、ブチラール樹脂、
紫外線硬化樹脂などの有機系合成樹脂、ケイ素、チタ
ン、ジルコニウムなどの金属アルコキシドの加水分解
物、またはシリコーンモノマー、シリコーンオリゴマー
などの有機・無機系バインダー成分などを挙げることが
できる。特に式、 M(OR)mn において、MがSi、TiまたはZrであり、RがC1
〜C4 のアルキル基であり、mが1〜4の整数であり、
nが1〜3の整数であり、かつm+nが4である化合
物、またはその部分加水分解物の1種またはそれ以上の
混合物をバインダーとして用いることが好ましい。
The transparent conductive film 1 also includes, in addition to the above metals,
A binder component may be included to improve the film strength. Examples of the binder component that can be used include, for example, polyester resin, acrylic resin, epoxy resin, melamine resin, urethane resin, butyral resin,
Examples include organic synthetic resins such as ultraviolet curable resins, hydrolysates of metal alkoxides such as silicon, titanium and zirconium, and organic / inorganic binder components such as silicone monomers and silicone oligomers. Particularly where in M (OR) m R n, is M is Si, Ti or Zr, R is C 1
A C 4 alkyl group, m is an integer of 1 to 4,
It is preferable to use a compound in which n is an integer of 1 to 3 and m + n is 4, or a mixture of one or more partial hydrolysates thereof as a binder.

【0021】前記バインダー成分と金属との親和性を高
めるために、金属の表面は、シリコーンカップリング
剤、チタネートカップリング剤などのカップリング剤
や、カルボン酸塩、ポリカルボン酸塩、リン酸エステル
塩、スルホン酸塩、ポリスルホン酸塩などの親油化表面
処理剤で処理されていてもよい。
In order to increase the affinity between the binder component and the metal, the surface of the metal may be coated with a coupling agent such as a silicone coupling agent or a titanate coupling agent, a carboxylate, a polycarboxylate, or a phosphate. It may be treated with a lipophilic surface treatment agent such as a salt, a sulfonate, and a polysulfonate.

【0022】透明導電膜1を、例えば陰極線管のフェー
スパネル3などの表面に形成する方法としては、真空蒸
着やスパッタなどの方法を用いることもできるが、前記
金属の微粒子をコロイド状に分散させて得られた塗布液
を、透明導電膜1の膜厚hが5nm以上50nm未満の
範囲内となるように均一に塗布して成膜することによっ
て形成することが好ましい。このとき用いる塗布液は、
例えば金属を粒径が50nm未満のコロイド状微粒子と
し、水および/または有機溶剤からなる媒体中に均一に
分散させることによって調製することができる。
As a method for forming the transparent conductive film 1 on the surface of the face panel 3 of a cathode ray tube, for example, a method such as vacuum evaporation or sputtering can be used. However, the metal fine particles are dispersed in a colloidal form. It is preferable to form the film by applying the obtained coating solution uniformly so that the thickness h of the transparent conductive film 1 is in the range of 5 nm or more and less than 50 nm. The coating solution used at this time is
For example, it can be prepared by making a metal into colloidal fine particles having a particle size of less than 50 nm and uniformly dispersing the same in a medium comprising water and / or an organic solvent.

【0023】この塗布液の配合や塗布条件は、得られた
低反射透明導電膜4に求められる導電性や透明性を考慮
して設計することが好ましい。特に本発明の低反射透明
導電膜においては、透明導電膜1の膜厚hが5nm以上
50nm未満の範囲内ときわめて薄くされるので、塗布
に際して膜厚むらを起こし易く、膜厚むらが起こると反
射光に色むらが生じて視認性を低下させ、また外観を悪
くするので、膜厚むらが起こらないように、塗布液の濡
れ性やレベリング性に特別な配慮が求められる。
It is preferable to design the composition of the coating solution and the coating conditions in consideration of the conductivity and transparency required for the obtained low-reflection transparent conductive film 4. In particular, in the low-reflection transparent conductive film of the present invention, the thickness h of the transparent conductive film 1 is extremely thin within a range of 5 nm or more and less than 50 nm. Since unevenness in the color of the reflected light reduces visibility and deteriorates the appearance, special consideration is required for the wettability and leveling property of the coating solution so as to prevent unevenness in film thickness.

【0024】この塗布液にグリコールエーテル類を添加
すると、濡れ性やレベリング性が改善され、膜厚hが5
nm以上50nm未満の範囲内ときわめて薄いにも関わ
らず、膜強度の劣化を招くことなく均一な厚みに塗布す
ることができ、厚みむらに起因する反射光の色むらが効
果的に防止できることがわかった。
When a glycol ether is added to this coating solution, wettability and leveling property are improved, and
In spite of being extremely thin, in the range of not less than 50 nm and less than 50 nm, it is possible to apply a uniform thickness without deteriorating the film strength, and it is possible to effectively prevent color unevenness of reflected light due to uneven thickness. all right.

【0025】用い得るグリコールエーテルの例として
は、エチレングリコールモノメチルエーテル、エチレン
グリコールモノエチルエーテル、エチレングリコールモ
ノプロピルエーテル、エチレングリコールモノブチルエ
ーテル、エチレングリコールジメチルエーテル、エチレ
ングリコールジエチルエーテル、ジエチレングリコール
モノメチルエーテル、ジエチレングリコールモノエチル
エーテル、ジエチレングリコールモノブチルエーテル、
ジエチレングリコールジメチルエーテル、ジエチレング
リコールジエチルエーテル、プロピレングリコールモノ
メチルエーテル、プロピレングリコールモノエチルエー
テル、プロピレングリコールモノプロピルエーテル、ジ
プロピレングリコールモノメチルエーテル、ジプロピレ
ングリコールモノエチルエーテル、およびこれらのアセ
タート類などを挙げることができる。特に濡れ性の観点
から、エチレングリコールモノブチルエーテル(ブチル
セロソルブ)が好ましい。これらのグリコールエーテル
は、塗布液中に1重量%〜80重量%の範囲内で添加す
ることが好ましい。
Examples of glycol ethers which can be used include ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether. Ether, diethylene glycol monobutyl ether,
Examples thereof include diethylene glycol dimethyl ether, diethylene glycol diethyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether, and acetates thereof. Particularly, from the viewpoint of wettability, ethylene glycol monobutyl ether (butyl cellosolve) is preferable. These glycol ethers are preferably added to the coating solution in the range of 1% by weight to 80% by weight.

【0026】前記塗布液の塗布は、一般には、スピンコ
ート、ロールコート、ナイフコート、バーコート、スプ
レーコート、メニスカスコート、ディップコートなど、
公知の任意の薄膜塗布技術を用いて行うことができる。
この内、スピンコートは、短時間で均一な厚みの薄膜を
形成することができるので特に好ましい塗布法である。
塗布後、塗膜を乾燥すれば、フェースパネル3などの表
面に透明導電膜1が形成される。
In general, the coating solution is applied by spin coating, roll coating, knife coating, bar coating, spray coating, meniscus coating, dip coating, or the like.
It can be performed using any known thin film coating technique.
Of these, spin coating is a particularly preferred coating method because a thin film having a uniform thickness can be formed in a short time.
After coating, if the coating film is dried, the transparent conductive film 1 is formed on the surface of the face panel 3 or the like.

【0027】本発明の低反射透明導電膜にあっては、前
記の透明導電膜1の上層および/または下層に、この透
明導電膜1の屈折率とは異なる屈折率を有する透明薄膜
2が1層以上形成される。この透明薄膜2は、膜の界面
における外光反射を干渉効果によって除去または軽減す
るために用いられる。
In the low-reflection transparent conductive film of the present invention, a transparent thin film 2 having a refractive index different from that of the transparent conductive film 1 is provided on the upper and / or lower layer of the transparent conductive film 1. More than layers are formed. This transparent thin film 2 is used to remove or reduce external light reflection at the interface of the film by an interference effect.

【0028】この目的に用いられる透明薄膜は、図1に
示す実施形態においては透明導電膜1の上層に透明薄膜
2として1層形成されているが、本発明の低反射透明導
電膜における透明薄膜の構成はこれに限定されるもので
はない。透明薄膜は、透明導電膜1の下層(フェースパ
ネル3と透明導電膜1との間)に形成されていてもよ
く、また上層と下層の双方に形成されていてもよい。
In the embodiment shown in FIG. 1, one transparent thin film is formed as a transparent thin film 2 on the transparent conductive film 1 in the embodiment shown in FIG. Is not limited to this. The transparent thin film may be formed below the transparent conductive film 1 (between the face panel 3 and the transparent conductive film 1), or may be formed on both the upper layer and the lower layer.

【0029】一般に、透明導電膜1の上層に形成される
透明薄膜は、その屈折率を透明導電膜1の屈折率より小
さくし、透明導電膜1の下層に形成される透明薄膜は、
その屈折率を透明導電膜1のそれより大きくすることに
よって有効な反射防止が達成される。またこの透明薄膜
は、必ずしも1層に限定されるものではなく、多層に形
成されていてもよく、例えば透明導電膜1も含めて最下
層から最上層に向けて屈折率が順次に低下する複数の薄
膜層が形成されるように構成してもよい。
Generally, the transparent thin film formed on the transparent conductive film 1 has a refractive index smaller than that of the transparent conductive film 1, and the transparent thin film formed on the lower layer of the transparent conductive film 1
By making the refractive index larger than that of the transparent conductive film 1, effective antireflection is achieved. The transparent thin film is not necessarily limited to a single layer, and may be formed in multiple layers. For example, a plurality of transparent thin films including the transparent conductive film 1 whose refractive index sequentially decreases from the lowermost layer to the uppermost layer. May be configured to form the thin film layer.

【0030】一般に、多層薄膜における界面反射防止能
は、薄膜の屈折率と膜厚、および積層薄膜数により決定
されるため、本発明の低反射透明導電膜においても、積
層膜数を考慮して透明導電膜、透明薄膜の厚みを適宜設
計することにより、効果的な反射防止効果を得ることが
できる。
In general, the antireflection ability at the interface in a multilayer thin film is determined by the refractive index and thickness of the thin film and the number of laminated thin films. Therefore, even in the low reflection transparent conductive film of the present invention, the number of laminated films is taken into consideration. By appropriately designing the thicknesses of the transparent conductive film and the transparent thin film, an effective anti-reflection effect can be obtained.

【0031】この透明薄膜2は、例えばケイ素、アルミ
ニウム、ジルコニウム、セリウム、チタン、イットリウ
ム、亜鉛、マグネシウム、インジウム、錫、アンチモ
ン、ガリウムなどの酸化物、複合酸化物、または窒化物
など、または焼付けによってこれらを生成することがで
きる前駆体を主成分として含む塗布液(反射防止塗料)
を用いて膜厚が均一な膜を形成し、透明導電膜1と同時
にまたは別途に焼付けることによって形成することがで
きる。
The transparent thin film 2 is made of, for example, an oxide, a complex oxide, or a nitride of silicon, aluminum, zirconium, cerium, titanium, yttrium, zinc, magnesium, indium, tin, antimony, gallium, or the like, or by baking. Coating solution containing a precursor capable of producing these as a main component (anti-reflective coating)
Can be formed by baking simultaneously with the transparent conductive film 1 or separately.

【0032】この透明薄膜2はまた、透明導電膜1の反
射防止と保護とを兼ねて、表面硬度が高く、屈折率が比
較的低いSiO2 膜からなるハードコート層として形成
することもできる。この反射防止性ハードコート層を形
成することができる物質の例として、例えば下式 M(OR)m n において、MがSi、TiまたはZrであり、RがC1
〜C4 のアルキル基であり、mが1〜4の整数であり、
nが1〜3の整数であり、かつm+nが4である化合
物、またはその部分加水分解物の1種またはそれ以上の
混合物を挙げることができる。この化合物の例として
は、例えばテトラエトキシシラン(Si(OC
254 )が被膜形成性、透明性、膜強度および反射防
止性能の点から好適に用いられる。
The transparent thin film 2 also has a thickness opposite to that of the transparent conductive film 1.
High surface hardness and high refractive index
Relatively low SiOTwoFormed as a hard coat layer consisting of a film
You can also. This anti-reflective hard coat layer is shaped
As an example of a substance that can be formed, for example, the following formula M (OR)mRn In the above, M is Si, Ti or Zr, and R is C1
~ CFourM is an integer of 1 to 4,
a compound wherein n is an integer of 1 to 3 and m + n is 4
Product, or one or more of its partial hydrolysates
Mixtures can be mentioned. As an example of this compound
Is, for example, tetraethoxysilane (Si (OC
TwoHFive)Four) Is film-forming, transparent, film-strength and anti-reflective
It is preferably used in terms of stopping performance.

【0033】このハードコート層は、前記の透明導電膜
1と異なる屈折率に設定できるのであれば、前記の透明
薄膜2を形成する金属酸化物、複合酸化物、または窒化
物など、または焼付けによってこれらを生成することが
できる前駆体などを含んでいてもよい。
If the hard coat layer can be set to a refractive index different from that of the transparent conductive film 1, a metal oxide, a composite oxide, a nitride, or the like for forming the transparent thin film 2, or baking is used. It may contain a precursor or the like capable of producing these.

【0034】透明薄膜の形成は、透明導電膜1の形成に
用いた方法と同様に、前記の成分を含む塗布液(反射防
止塗料)を所定の面に均一に塗布して成膜する方法によ
って行うことができる。塗布は、スピンコート、ロール
コート、ナイフコート、バーコート、スプレーコート、
メニスカスコート、ディップコートなどによることがで
きるが、特にスピンコートが好ましい。塗布後は塗膜を
乾燥し、好ましくは焼き付けることによって強固な膜が
形成される。
The transparent thin film is formed by a method similar to the method used for forming the transparent conductive film 1 in which a coating solution (antireflection paint) containing the above-mentioned components is uniformly applied to a predetermined surface to form a film. It can be carried out. Application is spin coating, roll coating, knife coating, bar coating, spray coating,
Meniscus coating, dip coating and the like can be used, but spin coating is particularly preferred. After coating, the coating film is dried and preferably baked to form a strong film.

【0035】本発明の低反射透明導電膜は、図1に示す
ように、透明導電膜1の上層に透明薄膜2が形成された
2層構成とされ、この積層された低反射透明導電膜の膜
厚は100nm未満とされることが好ましい。この膜厚
が100nm以上になると、光学的反射防止能力が低下
し、十分な反射防止効果が得られなくなることがわかっ
た。
As shown in FIG. 1, the low-reflection transparent conductive film of the present invention has a two-layer structure in which a transparent thin film 2 is formed on a transparent conductive film 1. Preferably, the film thickness is less than 100 nm. It was found that when the film thickness was 100 nm or more, the optical antireflection ability was lowered, and a sufficient antireflection effect could not be obtained.

【0036】本発明の低反射透明導電膜は、その最上層
に、凹凸を有する低屈折率透明膜が形成されていてもよ
い。この凹凸を有する低屈折率透明膜は、低反射透明導
電膜の層間の外光反射を防止すると共に、表面反射光を
散乱させ、フェースパネル面に防眩性を付与する効果が
ある。
In the low-reflection transparent conductive film of the present invention, a low-refractive-index transparent film having irregularities may be formed on the uppermost layer. The low-refractive-index transparent film having the unevenness has an effect of preventing external light reflection between layers of the low-reflection transparent conductive film, scattering surface reflected light, and imparting antiglare properties to the face panel surface.

【0037】また、本発明の低反射透明導電膜は、その
いずれか1層または複数の層に、透過画像の色調を調整
するための着色材が含有されていてもよい。この着色材
は、透明導電膜に含有されている金属に由来して可視光
の波長帯域である400nm〜800nmの範囲内にお
いて、特定波長帯域に吸収がみられる場合、フェースパ
ネルを通じての透過画像の色調が不自然に変化するのを
調整する目的、および/または透過画像のコントラスト
を改善する目的で添加される。この観点から、用いる着
色材の色調は青色、紫色または黒色などが好ましい。
In the low-reflection transparent conductive film of the present invention, one or more of the layers may contain a coloring material for adjusting the color tone of a transmitted image. This coloring material is derived from the metal contained in the transparent conductive film, and in the range of 400 nm to 800 nm, which is the wavelength band of visible light, when absorption is observed in a specific wavelength band, the transmission image through the face panel It is added for the purpose of adjusting the color tone to change unnaturally and / or for improving the contrast of a transmission image. In this respect, the color tone of the coloring material used is preferably blue, purple, or black.

【0038】例えば金属が銀である場合は、400nm
〜530nmの短波長可視光帯域に吸収があって、透過
画像の色相が黄色味を帯びて不自然に見えるのである
が、本発明の低反射透明導電膜のいずれかの層に紫色顔
料を添加すると、この紫色顔料が長波長可視光を適度に
吸収するので、可視光帯域における光の透過スペクトル
が平坦化され、透過画像の色相が紫味を帯びた自然な色
に改善される。
For example, when the metal is silver, 400 nm
Absorption is in the short wavelength visible light band of 5530 nm, and the hue of the transmitted image has a yellow tint and looks unnatural, but a violet pigment is added to any layer of the low reflection transparent conductive film of the present invention. Then, since the violet pigment appropriately absorbs long-wavelength visible light, the transmission spectrum of light in the visible light band is flattened, and the hue of the transmitted image is improved to a natural color with a purple tinge.

【0039】前記の透明導電膜と透明薄膜とを有する本
発明の低反射透明導電膜がフェースパネルの前面に形成
された本発明の表示装置は、フェースパネルの帯電が防
止されているので画像表示面に埃などが付着せず、電磁
波が遮蔽されるので各種の電磁波障害が防止され、しか
も従来の電磁波遮蔽膜に比べて光透過性に優れ、従って
画像が明るく、反射が抑制され、従って視認性が改善さ
れ、反射光の色むらが低減され、従ってフェースパネル
の外観が改善される。
The display device of the present invention, in which the low-reflection transparent conductive film of the present invention having the above-mentioned transparent conductive film and transparent thin film is formed on the front surface of the face panel, prevents the face panel from being charged. No dust adheres to the surface and electromagnetic waves are shielded, preventing various types of electromagnetic wave disturbances, and is also superior in light transmittance compared to conventional electromagnetic wave shielding films, so that images are bright and reflection is suppressed, and therefore visible. And the color unevenness of the reflected light is reduced, thus improving the appearance of the face panel.

【0040】[0040]

【実施例】以下、実施例により本発明を具体的に説明す
る。 (塗布液の調製) 銀コロイド分散液の調製:クエン酸ナトリウム二水和
物(14g)、硫酸第一鉄(7.5g)を溶解した溶液
60gを5℃に保持した状態で、硝酸銀(2.5g)を
溶解した溶液25gを加えて銀コロイドを生成させた。
得られた銀コロイドを遠心分離により水洗して不純物を
除去した後、38.1gの純水を加えて塗布液用の銀コ
ロイド分散液を調製した。得られた銀コロイド粒子の粒
径は5nm〜30nmであった。 反射防止塗料の調製:テトラエトキシシラン(0.8
g)と0.lN塩酸(0.8g)とエチルアルコール
(98.4g)とを混合して均一な溶液とした。
The present invention will be described below in detail with reference to examples. (Preparation of coating liquid) Preparation of silver colloid dispersion liquid: A solution of sodium citrate dihydrate (14 g) and ferrous sulfate (7.5 g) dissolved in 60 g of silver nitrate (2 (2.5 g) was added to form a silver colloid.
After the obtained silver colloid was washed with water by centrifugation to remove impurities, 38.1 g of pure water was added to prepare a silver colloid dispersion for a coating solution. The particle size of the obtained silver colloid particles was 5 nm to 30 nm. Preparation of anti-reflective coating: tetraethoxysilane (0.8
g) and 0. 1N hydrochloric acid (0.8 g) and ethyl alcohol (98.4 g) were mixed to form a uniform solution.

【0041】(実施例1)導電性塗布液の調製 : の銀コロイド分散液 15.0g 純水 65.0g ブチルセロソルブ 10.0g IPA 10.0g 上記の成分を配合して得られた混合液を超音波分散機
(セントラル科学貿易社製「ソニファイヤー450」)
で分散し、導電性塗布液を調製した。
(Example 1) Preparation of conductive coating liquid : 15.0 g of a silver colloid dispersion of 65.0 g of pure water 10.0 g of butyl cellosolve 10.0 g of IPA 10.0 g of a mixture obtained by mixing the above components Sonic disperser (“Sonifire 450” manufactured by Central Science Trading Co., Ltd.)
To prepare a conductive coating solution.

【0042】成膜:上記の導電性塗布液を、ブラウン管
のフェースパネル表面にスピンコーターを用いて塗布
し、乾燥後、の反射防止塗料を同様にスピンコーター
を用いて塗布し、乾燥機により150℃で1時間焼付け
て本発明の低反射透明導電膜を有する陰極線管を作成し
た。
Film formation : The above-mentioned conductive coating solution is applied to the surface of the face panel of a cathode ray tube using a spin coater, and after drying, the antireflection coating is applied using a spin coater in the same manner. The cathode ray tube having the low reflection transparent conductive film of the present invention was prepared by baking at 1 ° C. for 1 hour.

【0043】(比較例1)スピンコーターの回転数を下
げた他は実施例1に準じて、反射防止性高導電膜を有す
る比較例1の陰極線管を作成した。
Comparative Example 1 A cathode ray tube of Comparative Example 1 having an antireflective high conductive film was prepared in the same manner as in Example 1 except that the number of revolutions of the spin coater was reduced.

【0044】(比較例2)比較例1におけるスピンコー
ターの回転数よりも更にスピンコーターの回転数を下げ
た他は実施例1に準じて、反射防止性高導電膜を有する
比較例2の陰極線管を作成した。
Comparative Example 2 A cathode ray tube according to Comparative Example 2 having an anti-reflective highly conductive film according to Example 1 except that the rotational speed of the spin coater was further reduced from that of Comparative Example 1. A tube was created.

【0045】(比較例3)導電性塗布液の調製 : の銀コロイド分散液 15.0g 純水 74.99g IPA 10.0g シリコーンオイル 0.01g (信越シリコーン社製KF−355A)上記の成分を配
合し実施例1に準じて導電性塗布液を調製した。
(Comparative Example 3) Preparation of conductive coating solution : 15.0 g of silver colloid dispersion of pure water 74.99 g IPA 10.0 g silicone oil 0.01 g (KF-355A manufactured by Shin-Etsu Silicone Co., Ltd.) It was blended to prepare a conductive coating solution according to Example 1.

【0046】成膜:上記の導電性塗布液を用いた他は実
施例1に準じて反射防止性高導電膜を有する比較例3の
陰極線管を作成した。
Film formation : A cathode ray tube of Comparative Example 3 having an antireflective high conductive film was prepared in the same manner as in Example 1 except that the above-mentioned conductive coating solution was used.

【0047】(比較例4)導電性塗布液の調製 : の銀コロイド分散液 15.0g 純水 75.0g IPA 10.0g 上記の成分を配合し実施例1に準じて導電性塗布液を調
製した。
(Comparative Example 4) Preparation of conductive coating solution : 15.0 g of silver colloidal dispersion of pure water 75.0 g IPA 10.0 g The above components were blended to prepare a conductive coating solution according to Example 1. did.

【0048】成膜:上記の導電性塗布液を用いた他は実
施例1に準じて反射防止性高導電膜を有する比較例4の
陰極線管を作成した。
Film formation : A cathode ray tube of Comparative Example 4 having an antireflective high conductive film was prepared in the same manner as in Example 1 except that the above-mentioned conductive coating solution was used.

【0049】上記の実施例1、および比較例1〜比較例
4の各陰極線管試料について、それぞれの低反射透明導
電膜の評価試験を行った。評価項目およびその試験機
(または試験方法)を下に記す。 膜厚 :薄膜のエッチングを行い、エッチングレ
ートより算出。 透過率 :日本分光社製「U-Best 50 」 ヘーズ :東京電色社製「Automatic Haze meter H
III DP」 表面抵抗 :三菱油化社製「ロレスタAP」(4端針
法) 視感反射率 :EG&G GAMMA SCIENTIFIC社製 MODEL C-1
1 電磁波遮蔽性:0.5MHzを基準波長としで前記式1
により計算。 強度 :1kgの荷重下、消しゴムで膜表面を5
0回往復後、膜表面の擦傷の状態を目視により評価し
た。 ○;擦傷なし △;やや擦傷あり ×;擦傷多い 色差 :ミノルタカメラ社製「CR-300」にて膜の
任意の2点の反射色を測定しその色差(Δx,Δy)を
測定した。 外観 :上記の色差測定と同時に、目視によって
膜面反射の色むらを評価した。 ○;色むらなし △;やや色むらあり ×;全面に色むらが広がっている 試験結果を表1に示す。表1中の「C膜」は透明導電膜
を表し、「D膜」はC膜の上層に透明薄膜が積層されて
なる低反射透明導電膜を表す。
Each of the cathode ray tube samples of Example 1 and Comparative Examples 1 to 4 was subjected to an evaluation test of a low-reflection transparent conductive film. The evaluation items and the test machine (or test method) are described below. Film thickness: Calculate from the etching rate after etching the thin film. Transmittance: "U-Best 50" manufactured by JASCO Haze: "Automatic Haze meter H" manufactured by Tokyo Denshoku
III DP ”Surface resistance: Mitsubishi Yuka's“ Loresta AP ”(4-end needle method) Luminous reflectance: EG & G GAMMA SCIENTIFIC MODEL C-1
1 Electromagnetic wave shielding property: Using the above formula 1 with a reference wavelength of 0.5 MHz.
Calculated by Strength: 5 kg of film surface with eraser under 1 kg load
After reciprocating 0 times, the state of abrasion on the film surface was visually evaluated. ;: No abrasion △: Slight abrasion ×: Many abrasion Color difference: Reflection colors at any two points of the film were measured with “CR-300” manufactured by Minolta Camera Co., and the color difference (Δx, Δy) was measured. Appearance: Simultaneously with the above color difference measurement, the color unevenness of the film surface reflection was visually evaluated. ;: No color unevenness Δ: Slight color unevenness X: Color unevenness spreads over the entire surface Table 1 shows the test results. In Table 1, “C film” represents a transparent conductive film, and “D film” represents a low-reflection transparent conductive film in which a transparent thin film is laminated on the C film.

【0050】[0050]

【表1】 [Table 1]

【0051】表1の結果をみると、実施例1の試料は、
C膜(透明導電膜)の膜厚hが50nm未満であるため
に光透過率が70%台と高く、ヘーズも認められず、明
るく見やすい透過画像が得られることがわかる。またD
膜(低反射透明導電膜)の膜厚Hが100nm未満とさ
れているために視感反射率が0.3%と低くなってい
る。またグリコールエーテルを含む塗布液を用いてC膜
を形成しているので色差で表される色むらが少なく、外
観も良好であった。表面抵抗や電磁波遮蔽性は実用的に
十分な水準にあり、膜強度も良好であった。
Looking at the results in Table 1, the sample of Example 1 was
Since the film thickness h of the C film (transparent conductive film) is less than 50 nm, the light transmittance is as high as 70%, no haze is observed, and a bright and easy-to-view transmission image is obtained. Also D
Since the film thickness H of the film (low-reflection transparent conductive film) is less than 100 nm, the luminous reflectance is as low as 0.3%. In addition, since the C film was formed using a coating solution containing glycol ether, the color unevenness represented by the color difference was small and the appearance was good. The surface resistance and the electromagnetic wave shielding property were at a practically sufficient level, and the film strength was also good.

【0052】これに対して比較例1の試料は、C膜の膜
厚hが50nm以上であるために透過率が58%台と低
く、ヘーズも発生し、透過画像はやや暗く見にくいもの
となっている。またD膜Hが100nm以上とされてい
るので視感反射率が増加し視認性が低下している。比較
例1のC膜の成膜にはグリコールエーテルを含む塗布液
を用いているが、膜厚が厚いために膜厚むらが発生し外
観がやや低下した。
On the other hand, in the sample of Comparative Example 1, since the thickness h of the C film was 50 nm or more, the transmittance was as low as about 58%, haze occurred, and the transmitted image was slightly dark and hard to see. ing. Further, since the thickness of the D film H is 100 nm or more, the luminous reflectance increases and the visibility decreases. Although a coating solution containing glycol ether was used for forming the C film in Comparative Example 1, the film thickness was so large that the film thickness was uneven and the appearance was slightly reduced.

【0053】比較例2の試料は、C膜とD膜の膜厚がい
ずれも比較例1より更に大とされ、これに伴って透過率
は更に低下し、ヘーズ、視感反射率、色差がいずれも増
加し、総合的に視認性が大幅に低下していることがわか
る。
In the sample of Comparative Example 2, the film thickness of each of the C film and the D film was made larger than that of Comparative Example 1, and the transmittance was further decreased, and the haze, luminous reflectance and color difference were reduced. It can be seen that both increased and the overall visibility was significantly reduced.

【0054】比較例3の試料は、実施例1に準じ、ただ
し膜厚を均一化するためにグリコールエーテルの代わり
に、従来から使用されていたシリコーンオイルを用いて
いる。この場合はC膜の膜厚hの均一化が不十分であ
り、色むらが多く発生し外観を損ねている。また膜強度
も弱くなっている。比較例4の試料は、膜厚均一化のた
めのグリコールエーテルもシリコーンオイルも用いなか
った場合であるが、膜厚むらがきわめて大きいため、デ
ータがとれなかった。
The sample of Comparative Example 3 is the same as in Example 1, except that a conventionally used silicone oil is used in place of the glycol ether in order to make the film thickness uniform. In this case, the uniformity of the thickness h of the C film is insufficient, and color unevenness often occurs to impair the appearance. Also, the film strength is weak. The sample of Comparative Example 4 was a case where neither glycol ether nor silicone oil was used for uniforming the film thickness. However, data was not obtained because the film thickness unevenness was extremely large.

【0055】以上の実施例1と各比較例とを比べれば、
本発明の低反射透明導電膜、およびこれをフェースパネ
ルに施した本発明の陰極線管は、優れた光透過性を有し
て透過画像が明るく、ヘーズや反射が少なくて視認性が
良好であり、色むらが少なく外観が良好であり、しかも
帯電防止性、電磁波遮蔽性おび強度のいずれにも優れて
いることが明かである。
When comparing the above-mentioned Example 1 with each comparative example,
The low-reflection transparent conductive film of the present invention, and the cathode ray tube of the present invention in which the transparent conductive film is applied to a face panel, have excellent light transmittance, have a bright transmitted image, have low haze and reflection, and have good visibility. It is clear that the appearance is good with little color unevenness and excellent in both antistatic properties, electromagnetic wave shielding properties and strength.

【0056】[0056]

【発明の効果】本発明の低反射透明導電膜は、金属を含
み膜厚が5nm以上50nm未満の範囲内である透明導
電膜の上層および/または下層に、この透明導電膜の屈
折率とは異なる屈折率を有する透明薄膜が1層以上形成
されたものであるので、この低反射透明導電膜がフェー
スパネルの前面に形成された本発明の表示装置は、光透
過性が良好で透過画像が明るく、反射光やヘーズが軽減
されていて視認性に優れ、しかも優れた帯電防止性・電
磁波遮蔽性を有するものとなる。
According to the low reflection transparent conductive film of the present invention, the refractive index of the transparent conductive film is formed on the upper and / or lower layer of the transparent conductive film containing a metal and having a thickness in the range of 5 nm to less than 50 nm. Since one or more transparent thin films having different refractive indices are formed, the display device of the present invention in which this low-reflection transparent conductive film is formed on the front surface of the face panel has a good light transmittance and a good transmission image. It is bright, has reduced reflected light and haze, is excellent in visibility, and has excellent antistatic properties and electromagnetic wave shielding properties.

【0057】低反射透明導電膜を製造するに際して、少
なくとも金属微粒子とグリコールエーテルとを含む導電
性塗布液を用いて透明導電膜を形成すれば、透明導電膜
が50nm未満の薄膜であっても均一な成膜が可能とな
り、その結果、色むらが軽減され外観の良好な低反射透
明導電膜および陰極線管が得られる。
When the transparent conductive film is formed by using a conductive coating solution containing at least metal fine particles and glycol ether in manufacturing the low-reflection transparent conductive film, even if the transparent conductive film is a thin film of less than 50 nm, As a result, it is possible to obtain a low-reflection transparent conductive film and a cathode ray tube with reduced color unevenness and good appearance.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の陰極線管の一実施例を示す断面図。FIG. 1 is a sectional view showing one embodiment of a cathode ray tube of the present invention.

【符号の説明】[Explanation of symbols]

1……透明導電膜 2……透明薄膜 3……陰極線管フェースパネル 4……低反射透明導電膜 h……透明導電膜の膜厚 H……低反射透明導電膜の膜厚 DESCRIPTION OF SYMBOLS 1 ... Transparent conductive film 2 ... Transparent thin film 3 ... Cathode ray tube face panel 4 ... Low reflective transparent conductive film h ... Transparent conductive film thickness H ... Low reflective transparent conductive film thickness

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI C09D 7/12 C09D 7/12 Z G09F 9/00 313 G09F 9/00 313 H01J 9/20 H01J 9/20 A 29/89 29/89 ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 6 Identification symbol FI C09D 7/12 C09D 7/12 Z G09F 9/00 313 G09F 9/00 313 H01J 9/20 H01J 9/20 A 29/89 29 / 89

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 金属を含み膜厚が5nm以上50nm未
満の範囲内である透明導電膜の上層および/または下層
に、この透明導電膜の屈折率とは異なる屈折率を有する
透明薄膜が1層以上形成されたことを特徴とする低反射
透明導電膜。
1. A transparent thin film having a refractive index different from the refractive index of the transparent conductive film is provided as an upper layer and / or a lower layer containing a metal and having a thickness in a range of 5 nm or more and less than 50 nm. A low-reflection transparent conductive film formed as described above.
【請求項2】 前記金属の少なくとも1種が銀であるこ
とを特徴とする請求項1に記載の低反射透明導電膜。
2. The low-reflection transparent conductive film according to claim 1, wherein at least one kind of the metal is silver.
【請求項3】 前記の低反射透明導電膜が透明導電膜と
その上層に形成された透明薄膜との2層構成とされ、こ
の低反射透明導電膜の膜厚が100nm未満とされたこ
とを特徴とする請求項1に記載の低反射透明導電膜。
3. The low-reflection transparent conductive film has a two-layer structure of a transparent conductive film and a transparent thin film formed thereon, and the low-reflection transparent conductive film has a thickness of less than 100 nm. The low-reflection transparent conductive film according to claim 1.
【請求項4】 少なくとも金属微粒子とグリコールエー
テルとを含む導電性塗布液を用いて、前記の透明導電膜
を形成することを特徴とする請求項1に記載の低反射透
明導電膜の製造方法。
4. The method according to claim 1, wherein the transparent conductive film is formed using a conductive coating solution containing at least metal fine particles and glycol ether.
【請求項5】 請求項1ないし請求項3のいずれかに記
載の低反射透明導電膜がフェースパネルの前面に形成さ
れたことを特徴とする表示装置。
5. A display device, wherein the low-reflection transparent conductive film according to claim 1 is formed on a front surface of a face panel.
JP8295514A 1996-11-07 1996-11-07 Low-reflectivity transparent conductive film as well as its production and display device Pending JPH10142401A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8295514A JPH10142401A (en) 1996-11-07 1996-11-07 Low-reflectivity transparent conductive film as well as its production and display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8295514A JPH10142401A (en) 1996-11-07 1996-11-07 Low-reflectivity transparent conductive film as well as its production and display device

Publications (1)

Publication Number Publication Date
JPH10142401A true JPH10142401A (en) 1998-05-29

Family

ID=17821612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8295514A Pending JPH10142401A (en) 1996-11-07 1996-11-07 Low-reflectivity transparent conductive film as well as its production and display device

Country Status (1)

Country Link
JP (1) JPH10142401A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010103321A (en) * 2000-05-09 2001-11-23 츄, 자우-지어 Combination Process of Vacuum Sputtering and Wet Coating for High Conductivity Anti-Reflection Coating on CRT Surface
JP2003005659A (en) * 2001-04-17 2003-01-08 Tokai Rubber Ind Ltd Transparent electromagnetic wave shield film for plasma display, front surface filter for plasma display panel using it, and plasma display
US6569359B2 (en) 2000-07-25 2003-05-27 Sumitomo Metal Mining Co., Ltd. Transparent conductive layer forming coating liquid containing formamide
JP2005352303A (en) * 2004-06-11 2005-12-22 Pentax Corp Anti-reflection coating and optical element having anti-reflection coating
US7053126B2 (en) 2002-03-25 2006-05-30 Sumitomo Metal Mining Co., Ltd. Process for producing noble-metal type fine-particle dispersion, coating liquid for forming transparent conductive layer, transparent conductive layered structure and display device
US7438835B2 (en) 2002-03-25 2008-10-21 Sumitomo Metal Mining Co., Ltd. Transparent conductive film, coating liquid for forming such film, transparent conductive layered structure, and display device
US7507436B2 (en) 2003-07-04 2009-03-24 Nitto Denko Corporation Electroconductive cellulose-based film, a method of producing the same, an anti-reflection film, an optical element, and an image display
US7566360B2 (en) 2002-06-13 2009-07-28 Cima Nanotech Israel Ltd. Nano-powder-based coating and ink compositions
US7601406B2 (en) 2002-06-13 2009-10-13 Cima Nanotech Israel Ltd. Nano-powder-based coating and ink compositions
US7736693B2 (en) 2002-06-13 2010-06-15 Cima Nanotech Israel Ltd. Nano-powder-based coating and ink compositions
JP2011204649A (en) * 2010-03-26 2011-10-13 Panasonic Electric Works Co Ltd Base material having transparent conductive film
JP2012529978A (en) * 2009-06-12 2012-11-29 ロード コーポレイション How to protect substrates from lightning
WO2013047686A1 (en) * 2011-09-29 2013-04-04 日立マクセル株式会社 Transparent conductive sheet

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010103321A (en) * 2000-05-09 2001-11-23 츄, 자우-지어 Combination Process of Vacuum Sputtering and Wet Coating for High Conductivity Anti-Reflection Coating on CRT Surface
US6569359B2 (en) 2000-07-25 2003-05-27 Sumitomo Metal Mining Co., Ltd. Transparent conductive layer forming coating liquid containing formamide
JP2003005659A (en) * 2001-04-17 2003-01-08 Tokai Rubber Ind Ltd Transparent electromagnetic wave shield film for plasma display, front surface filter for plasma display panel using it, and plasma display
US7053126B2 (en) 2002-03-25 2006-05-30 Sumitomo Metal Mining Co., Ltd. Process for producing noble-metal type fine-particle dispersion, coating liquid for forming transparent conductive layer, transparent conductive layered structure and display device
US7438835B2 (en) 2002-03-25 2008-10-21 Sumitomo Metal Mining Co., Ltd. Transparent conductive film, coating liquid for forming such film, transparent conductive layered structure, and display device
US7601406B2 (en) 2002-06-13 2009-10-13 Cima Nanotech Israel Ltd. Nano-powder-based coating and ink compositions
US7736693B2 (en) 2002-06-13 2010-06-15 Cima Nanotech Israel Ltd. Nano-powder-based coating and ink compositions
US7566360B2 (en) 2002-06-13 2009-07-28 Cima Nanotech Israel Ltd. Nano-powder-based coating and ink compositions
US7507436B2 (en) 2003-07-04 2009-03-24 Nitto Denko Corporation Electroconductive cellulose-based film, a method of producing the same, an anti-reflection film, an optical element, and an image display
JP2005352303A (en) * 2004-06-11 2005-12-22 Pentax Corp Anti-reflection coating and optical element having anti-reflection coating
JP4497460B2 (en) * 2004-06-11 2010-07-07 Hoya株式会社 Method for manufacturing antireflection film
JP2012529978A (en) * 2009-06-12 2012-11-29 ロード コーポレイション How to protect substrates from lightning
JP2011204649A (en) * 2010-03-26 2011-10-13 Panasonic Electric Works Co Ltd Base material having transparent conductive film
WO2013047686A1 (en) * 2011-09-29 2013-04-04 日立マクセル株式会社 Transparent conductive sheet

Similar Documents

Publication Publication Date Title
US7135223B2 (en) Transparent conductive layered structure and method of producing the same, and transparent coat layer forming coating liquid used in the method of producing the same, and display device to which transparent conductive layered structure is applied
EP0848386A1 (en) Transparent conductive film, low-reflection transparent conductive film, and display
JPH10142401A (en) Low-reflectivity transparent conductive film as well as its production and display device
JP2000124662A (en) Transparent conductive film and display device
JP3266323B2 (en) Composite functional materials
JP3288557B2 (en) Cathode ray tube with transparent electromagnetic wave shielding film
JP3272111B2 (en) Paint for forming low refractive index film, antistatic / antireflective film, transparent laminate with antistatic / antireflective film, and cathode ray tube
JP3403578B2 (en) Antireflection colored transparent conductive film and cathode ray tube
US6524499B1 (en) Transparent conductive film and display device
JP2000357414A (en) Transparent conductive film and display device
JP3501942B2 (en) Paint for forming transparent conductive film, transparent conductive film, and display device
JP3356966B2 (en) Transparent conductive film, method of manufacturing the same, and display device
JPH10204336A (en) Coating material for forming transparent conductive film, low-reflectance transparent conductive film, and display
JP3652563B2 (en) Transparent conductive film forming paint, transparent conductive film and display device
JP3356968B2 (en) Transparent conductive film, method of manufacturing the same, and display device
JP3910393B2 (en) Transparent conductive film
JPH1135855A (en) Transparent conductive film and display device
JP3217275B2 (en) Low reflection conductive laminated film and cathode ray tube
JPH0953030A (en) Clear conductive coating material and clear conductive film
JP2002003746A (en) Coating for forming transparent electroconductive film, transparent electroconductive film and display device
JP2001126540A (en) Transparent conductive film and display device
JP3342818B2 (en) Low-reflection transparent conductive film, method for manufacturing the same, and display device
JPH10123965A (en) Transparent conductive film, its production and display device having this transparent conductive film
JP2002190214A (en) Transparent conductive film and display device using the film
JPH0978008A (en) Transparent electroconductive film of low reflection

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20020226